JP2010501068A5 - - Google Patents

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Publication number
JP2010501068A5
JP2010501068A5 JP2009524127A JP2009524127A JP2010501068A5 JP 2010501068 A5 JP2010501068 A5 JP 2010501068A5 JP 2009524127 A JP2009524127 A JP 2009524127A JP 2009524127 A JP2009524127 A JP 2009524127A JP 2010501068 A5 JP2010501068 A5 JP 2010501068A5
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JP
Japan
Prior art keywords
image
angle sensor
encoding
standard pattern
sensor according
Prior art date
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Application number
JP2009524127A
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English (en)
Japanese (ja)
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JP2010501068A (ja
JP5253394B2 (ja
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Priority claimed from EP06119146A external-priority patent/EP1890113A1/de
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Publication of JP2010501068A publication Critical patent/JP2010501068A/ja
Publication of JP2010501068A5 publication Critical patent/JP2010501068A5/ja
Application granted granted Critical
Publication of JP5253394B2 publication Critical patent/JP5253394B2/ja
Expired - Fee Related legal-status Critical Current
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JP2009524127A 2006-08-18 2007-08-16 軸周りの回転角度を測定する光電子角度センサとその測定方法 Expired - Fee Related JP5253394B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP06119146A EP1890113A1 (de) 2006-08-18 2006-08-18 Optoelektronischer winkelsensor und verfahren zum bestimmen eines drehwinkels um eine achse
EP06119146.6 2006-08-18
PCT/EP2007/007248 WO2008019855A1 (de) 2006-08-18 2007-08-16 Optoelektronischer winkelsensor und verfahren zum bestimmen eines drehwinkels um eine achse

Publications (3)

Publication Number Publication Date
JP2010501068A JP2010501068A (ja) 2010-01-14
JP2010501068A5 true JP2010501068A5 (enExample) 2010-08-05
JP5253394B2 JP5253394B2 (ja) 2013-07-31

Family

ID=37600770

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2009524127A Expired - Fee Related JP5253394B2 (ja) 2006-08-18 2007-08-16 軸周りの回転角度を測定する光電子角度センサとその測定方法
JP2009524133A Expired - Fee Related JP5260518B2 (ja) 2006-08-18 2007-08-17 光エレクトロニクス角度センサ

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2009524133A Expired - Fee Related JP5260518B2 (ja) 2006-08-18 2007-08-17 光エレクトロニクス角度センサ

Country Status (7)

Country Link
US (2) US8462979B2 (enExample)
EP (3) EP1890113A1 (enExample)
JP (2) JP5253394B2 (enExample)
CN (2) CN101506621B (enExample)
AU (2) AU2007286403B2 (enExample)
CA (2) CA2660999C (enExample)
WO (2) WO2008019855A1 (enExample)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4989313B2 (ja) * 2007-05-28 2012-08-01 株式会社トプコン 絶対角度演算装置
DE112008003711B4 (de) 2008-02-22 2024-01-25 Trimble Jena Gmbh Winkelmessgerät und -verfahren
EP2251647A1 (fr) 2009-05-13 2010-11-17 CSEM Centre Suisse d'Electronique et de Microtechnique SA - Recherche et Développement Dispositif et méthode de mesure de position angulaire absolue
JP5690053B2 (ja) * 2009-06-19 2015-03-25 株式会社エンプラス ロータリエンコーダ
EP2372302A1 (de) 2010-03-26 2011-10-05 Leica Geosystems AG Messverfahren für eine oberflächenvermessende Messmaschine
EP2498076A1 (en) 2011-03-11 2012-09-12 Hexagon Technology Center GmbH Wear-Monitoring of a Gearbox in a Power Station
CN102322882A (zh) * 2011-06-02 2012-01-18 浙江大学 基于阵列探测器的绝对轴角编码系统
AT510674B1 (de) * 2011-10-27 2014-05-15 Avl List Gmbh Verfahren und eine vorrichtung zum parametrieren eines sensors
JP6055179B2 (ja) * 2011-12-19 2016-12-27 株式会社トプコン 回転角検出装置及び測量装置
US9541382B2 (en) 2011-12-19 2017-01-10 Kabushiki Kaisha Topcon Rotation angle detecting apparatus and surveying instrument
CN104428629B (zh) * 2012-07-04 2017-12-05 赫克斯冈技术中心 具有模拟存储器单元的光学位置发送器
EP2682718A1 (de) * 2012-07-05 2014-01-08 Hexagon Technology Center GmbH Verfahren zum Erfassen einer Absolutcodierung einer optischen Codespur
DE102012218890A1 (de) * 2012-10-17 2014-04-17 Dr. Johannes Heidenhain Gmbh Absolutes Positionsmessgerät
EP2808653B1 (de) 2013-05-28 2016-07-13 SICK STEGMANN GmbH Drehwinkelsensor
CN103471529B (zh) * 2013-09-26 2015-12-02 中国科学院长春光学精密机械与物理研究所 基于图像处理的高精度小型光电角度传感器
US10252152B2 (en) * 2015-02-11 2019-04-09 Bmuse Group Llc Moving object detection system and method
CN106951812B (zh) 2017-03-31 2018-12-07 腾讯科技(深圳)有限公司 识别二维码的方法、装置和终端
CN107590522B (zh) * 2017-08-23 2020-08-21 阿里巴巴集团控股有限公司 一种识别码生成及识别的方法及装置
CN108592960B (zh) * 2018-05-10 2023-07-21 常州市新瑞得仪器有限公司 绝对值编码器及其工作方法
DE102020200032A1 (de) 2020-01-03 2021-07-08 Thyssenkrupp Ag Wälzlager mit Positionsbestimmungseinrichtung
CN112857411B (zh) * 2021-01-15 2022-10-14 广东工业大学 一种基于电流体喷印发光码道的旋转编码器及其测量方法
CN113566854B (zh) * 2021-07-06 2024-04-16 合肥工业大学 二进制编码盘和采用该二进制编码盘的层析成像系统
DE102023203701A1 (de) * 2023-04-21 2024-10-24 Joyson Safety Systems Germany Gmbh Verfahren und Einrichtung zur Absolutbestimmung eines Drehwinkels eines drehbaren Elements
CN118960664B (zh) * 2024-10-15 2025-01-07 大连探索者科技有限公司 一种针对反射式光电角度传感器产品的测试评估方法

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3865428A (en) 1972-11-13 1975-02-11 Carroll W Chester Window shade for a vehicle or the like
US3862428A (en) * 1973-10-11 1975-01-21 United Aircraft Corp Holographic spatial encoder
US4318225A (en) * 1979-12-04 1982-03-09 Mchenry Systems, Inc. Angle measuring apparatus
JPS5847212A (ja) 1981-09-17 1983-03-18 Fanuc Ltd ロ−タリエンコ−ダ
JPS5931017U (ja) 1982-08-20 1984-02-27 ミノルタ株式会社 パルスジエネレ−タ
JP2571689B2 (ja) 1987-04-02 1997-01-16 株式会社スペース 計測用標識
DE3924460A1 (de) * 1988-07-27 1990-02-01 Litton Precision Prod Int Winkelschrittgeber
US4953933A (en) * 1989-07-10 1990-09-04 The Boeing Company Optical encoder reading device
US5563591A (en) 1994-10-14 1996-10-08 Xerox Corporation Programmable encoder using an addressable display
JPH10206134A (ja) 1997-01-17 1998-08-07 Matsushita Electric Works Ltd 画像処理による位置検出方法
DE69831519T2 (de) * 1997-01-17 2006-06-14 Matsushita Electric Works Ltd System und Verfahren zur Lageermittlung
JPH10253393A (ja) 1997-03-10 1998-09-25 Yaskawa Electric Corp アブソリュートエンコーダ
DE19750474C2 (de) * 1997-11-14 2000-08-10 Stegmann Max Antriebstech Drehgeber
DE19944004A1 (de) * 1999-09-14 2001-03-15 Kostal Leopold Gmbh & Co Kg Optoelektronischer Drehwinkelsensor
EP1089059B1 (de) * 1999-09-28 2007-09-26 Snap-On Equipment GmbH Radauswuchtmaschine für ein Kraftfahrzeugrad mit kompaktem Drehwinkelgeber
DE10006675C2 (de) * 2000-02-15 2002-05-16 Kostal Leopold Gmbh & Co Kg Codescheibe für eine optoelektronische Weg- oder Winkelmeßeinrichtung
JP4444469B2 (ja) * 2000-08-07 2010-03-31 株式会社ミツトヨ 光学式変位測定装置
DE10325108A1 (de) * 2003-06-03 2005-01-05 Trw Automotive Electronics & Components Gmbh & Co. Kg Optoelektronischer Drehwinkelsensor
SE0301164D0 (sv) * 2003-04-22 2003-04-22 Trimble Ab Improved high accuracy absolute optical encoder
JP2004347382A (ja) 2003-05-21 2004-12-09 Microsignal Kk 光学式エンコーダ
JP4425220B2 (ja) * 2003-08-06 2010-03-03 浜松ホトニクス株式会社 アブソリュートエンコーダ
US7078677B2 (en) * 2004-01-21 2006-07-18 Chee Keong Chong Optical encoder disk having a region that continuously increases in size
US7145127B2 (en) * 2004-08-25 2006-12-05 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Optical encoding that utilizes total internal reflection
EP1722200B1 (en) 2005-05-13 2008-02-13 FAGOR, S.Coop Optoelectronic measuring device
EP1790953A1 (de) * 2005-11-04 2007-05-30 Leica Geosystems AG Optoelektrische Winkelmesseinrichtung
US7462815B2 (en) * 2005-12-13 2008-12-09 Avago Technologies General Ip (Singapore) Pte. Ltd. Absolute encoder utilizing a code pattern carrier having a varying mixture of phosphors deposited thereon
JP5053173B2 (ja) * 2008-05-16 2012-10-17 富士フイルム株式会社 位置検出センサ

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