JP2010231834A - Method for manufacturing glass substrate, glass substrate and magnetic recording medium - Google Patents
Method for manufacturing glass substrate, glass substrate and magnetic recording medium Download PDFInfo
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- JP2010231834A JP2010231834A JP2009076959A JP2009076959A JP2010231834A JP 2010231834 A JP2010231834 A JP 2010231834A JP 2009076959 A JP2009076959 A JP 2009076959A JP 2009076959 A JP2009076959 A JP 2009076959A JP 2010231834 A JP2010231834 A JP 2010231834A
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- 239000011521 glass Substances 0.000 title claims abstract description 114
- 239000000758 substrate Substances 0.000 title claims abstract description 95
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 32
- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000005498 polishing Methods 0.000 claims abstract description 68
- 150000002500 ions Chemical class 0.000 claims abstract description 23
- 239000000203 mixture Substances 0.000 claims abstract description 17
- 239000000463 material Substances 0.000 claims abstract description 14
- 238000003426 chemical strengthening reaction Methods 0.000 claims description 78
- 239000010410 layer Substances 0.000 claims description 29
- 230000001050 lubricating effect Effects 0.000 claims description 3
- 239000011241 protective layer Substances 0.000 claims description 3
- 239000007788 liquid Substances 0.000 abstract description 20
- 239000000126 substance Substances 0.000 abstract description 6
- 230000002787 reinforcement Effects 0.000 abstract 3
- 230000002093 peripheral effect Effects 0.000 description 10
- 239000006061 abrasive grain Substances 0.000 description 7
- 239000002994 raw material Substances 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000005728 strengthening Methods 0.000 description 3
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- MRELNEQAGSRDBK-UHFFFAOYSA-N lanthanum(3+);oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[La+3].[La+3] MRELNEQAGSRDBK-UHFFFAOYSA-N 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000007517 polishing process Methods 0.000 description 2
- FGIUAXJPYTZDNR-UHFFFAOYSA-N potassium nitrate Chemical compound [K+].[O-][N+]([O-])=O FGIUAXJPYTZDNR-UHFFFAOYSA-N 0.000 description 2
- SQGYOTSLMSWVJD-UHFFFAOYSA-N silver(1+) nitrate Chemical compound [Ag+].[O-]N(=O)=O SQGYOTSLMSWVJD-UHFFFAOYSA-N 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 229910001415 sodium ion Inorganic materials 0.000 description 2
- VWDWKYIASSYTQR-UHFFFAOYSA-N sodium nitrate Chemical compound [Na+].[O-][N+]([O-])=O VWDWKYIASSYTQR-UHFFFAOYSA-N 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- HBBGRARXTFLTSG-UHFFFAOYSA-N Lithium ion Chemical compound [Li+] HBBGRARXTFLTSG-UHFFFAOYSA-N 0.000 description 1
- 238000006124 Pilkington process Methods 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000005354 aluminosilicate glass Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 239000008119 colloidal silica Substances 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 238000003280 down draw process Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 229910001416 lithium ion Inorganic materials 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229910001414 potassium ion Inorganic materials 0.000 description 1
- 235000010333 potassium nitrate Nutrition 0.000 description 1
- 239000004323 potassium nitrate Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 229910001961 silver nitrate Inorganic materials 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 235000010344 sodium nitrate Nutrition 0.000 description 1
- 239000004317 sodium nitrate Substances 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000004506 ultrasonic cleaning Methods 0.000 description 1
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- Manufacturing Of Magnetic Record Carriers (AREA)
- Surface Treatment Of Glass (AREA)
Abstract
Description
本発明はガラス基板の製造方法、ガラス基板の製造方法により製造されたガラス基板、および磁気記録媒体に関するものである。 The present invention relates to a glass substrate manufacturing method, a glass substrate manufactured by a glass substrate manufacturing method, and a magnetic recording medium.
近年、情報化技術の高度化に伴い、情報記録技術、特に磁気記録技術は著しく進歩している。 In recent years, with the advancement of information technology, information recording technology, particularly magnetic recording technology, has made remarkable progress.
このような磁気記録技術のひとつであるHDD(ハードディスクドライブ)等の磁気記録媒体用基板としては、かつてはアルミニウム基板が広く用いられてきた。 An aluminum substrate has been widely used as a substrate for a magnetic recording medium such as an HDD (Hard Disk Drive) which is one of such magnetic recording techniques.
しかしながら、磁気ディスクの小型化、薄板化、および高密度記録化に伴い、近年は、アルミニウム基板に比べ基板表面の平坦性及び基板強度に優れたガラス基板の需要が高まっている。 However, with the downsizing, thinning, and high-density recording of magnetic disks, in recent years, there has been an increasing demand for glass substrates that have superior substrate surface flatness and substrate strength compared to aluminum substrates.
ガラス基板は、従来、例えば、特許文献1の段落〔0004〕に示すように、ガラスを円盤状に形成して面取りを行い、端面および主表面を研磨し、その後に耐衝撃性や耐振動性を向上させるための化学強化処理を施すことにより製造されていた(特許文献1)。 Conventionally, for example, as shown in paragraph [0004] of Patent Document 1, a glass substrate is chamfered by forming glass into a disk shape, and end faces and main surfaces are polished, and then impact resistance and vibration resistance are obtained. It has been manufactured by applying a chemical strengthening treatment for improving (Patent Document 1).
この化学強化処理を施す化学強化工程は、例えば、特許文献1の〔0014〕に記載のように、処理対象のガラス基板を化学強化液中に浸漬し、ガラス基板と化学強化液とをイオン交換させることによって行われる。 In the chemical strengthening step for performing the chemical strengthening treatment, for example, as described in [0014] of Patent Document 1, the glass substrate to be treated is immersed in the chemical strengthening solution, and the glass substrate and the chemical strengthening solution are ion-exchanged. Is done by letting
一方、化学強化は、ガラスに含まれていたイオンを、よりイオン半径の大きいイオンに置換を行う処理でもあるため、化学強化を行うと、ガラス基板の寸法、形状が変化する。 On the other hand, since chemical strengthening is also a process of replacing ions contained in glass with ions having a larger ion radius, the size and shape of the glass substrate change when chemical strengthening is performed.
そのため、磁気ディスクの高記録密度化の要求がさらに高まりつつあり、それに伴い、ガラス基板に対してより厳しい寸法精度が要求される現在では、特許文献1の〔0012〕に示すように、化学強化を行った後にガラス基板の主表面を研磨する場合がある。 For this reason, there is a growing demand for higher recording density of magnetic disks, and as a result, stricter dimensional accuracy is required for glass substrates. As shown in [0012] of Patent Document 1, chemical strengthening is required. In some cases, the main surface of the glass substrate may be polished after the above.
ここで、化学強化後に研磨を行う製法では、研磨により化学強化層が削られるため、研磨後に化学強化を行う製法と比較して、製造されたガラス基板における化学強化層が薄くなりやすい。 Here, in the manufacturing method in which polishing is performed after chemical strengthening, the chemically strengthened layer is scraped by polishing, and therefore the chemical strengthened layer in the manufactured glass substrate is likely to be thinner than in the manufacturing method in which chemical strengthening is performed after polishing.
また、化学強化液は、繰り返し使用すると、組成が変化する。 In addition, the chemical strengthening solution changes its composition when used repeatedly.
具体的には、イオン交換されたガラス基板に含まれていたイオンが増大し、一方で、当初、化学強化液に含まれていたイオンが減少する。 Specifically, ions included in the ion-exchanged glass substrate increase, while ions included in the chemical strengthening solution initially decrease.
そのため、化学強化液を繰り返し使用すると、ガラス基板における化学強化層は次第に薄くなり、化学強化後に研磨を行う製法では、研磨によりさらに化学強化層が薄くなる。 Therefore, when the chemical strengthening solution is repeatedly used, the chemical strengthening layer in the glass substrate is gradually thinned, and in the manufacturing method in which polishing is performed after chemical strengthening, the chemical strengthening layer is further thinned by polishing.
また、化学強化層が薄くなればなるほど、研磨工程で2つの主表面の研磨量が異なった場合に2つの主表面の化学強化層の厚さの不均一が顕著となる。 Also, the thinner the chemically strengthened layer, the more uneven the thickness of the chemically strengthened layers on the two main surfaces becomes different when the polishing amounts of the two main surfaces are different in the polishing step.
そのため、2つの主表面の化学強化層の厚さの不均一が原因でガラス基板が反ってしまい、寸法精度の悪化を招く恐れがある。 For this reason, the glass substrate is warped due to the non-uniformity of the thicknesses of the chemically strengthened layers on the two main surfaces, and there is a possibility that the dimensional accuracy is deteriorated.
しかしながら、特許文献1では、化学強化液を繰り返し使用することによる組成の変化を考慮していないので、化学強化液を繰り返し使用すると、ガラス基板の寸法精度の悪化を招く恐れがあった。 However, Patent Document 1 does not consider the change in the composition due to repeated use of the chemical strengthening solution. Therefore, when the chemical strengthening solution is used repeatedly, the dimensional accuracy of the glass substrate may be deteriorated.
本発明は上記の問題に鑑みてなされたものであり、その目的は、化学強化後に研磨を行う場合であっても、化学強化液の組成の変化によらず、寸法精度を維持可能なガラス基板の製造方法を提供することにある。 The present invention has been made in view of the above problems, and its purpose is a glass substrate capable of maintaining dimensional accuracy regardless of changes in the composition of the chemical strengthening solution, even when polishing is performed after chemical strengthening. It is in providing the manufacturing method of.
上記課題を解決するため、本発明は以下の構成を有する。 In order to solve the above problems, the present invention has the following configuration.
(構成1)ガラス基材をイオンを含む溶液である化学強化液に浸漬して、前記ガラス基材表面のイオンを前記化学強化液のイオンと置換することにより化学強化を行う工程(a)と、前記化学強化を行った前記ガラス基材の主表面を研磨する工程(b)と、を有し、前記工程(b)は、前記化学強化液の組成の変化に応じて、研磨量を変化させて研磨を行う工程であることを特徴とするガラス基板の製造方法。 (Configuration 1) Step (a) of performing chemical strengthening by immersing a glass base material in a chemical strengthening solution that is a solution containing ions and replacing ions on the surface of the glass base material with ions of the chemical strengthening solution. A step (b) of polishing the main surface of the glass substrate subjected to the chemical strengthening, and the step (b) changes the polishing amount in accordance with a change in the composition of the chemical strengthening solution. A method for producing a glass substrate, which is a step of performing polishing.
(構成2)前記工程(a)は、前記化学強化液の組成の変化によらず、一定の条件で化学強化を行う工程であることを特徴とする構成1記載のガラス基板の製造方法。 (Configuration 2) The method for manufacturing a glass substrate according to Configuration 1, wherein the step (a) is a step of performing chemical strengthening under a certain condition regardless of a change in the composition of the chemical strengthening solution.
(構成3)前記工程(a)は、ガラス基材をバッチ単位で化学強化液に浸漬する工程であり、前記工程(b)は、前記化学強化を行った前記ガラス基材の主表面をバッチ単位で研磨する工程であることを特徴とする構成2に記載のガラス基板の製造方法。 (Structure 3) The said process (a) is a process of immersing a glass base material in a chemical strengthening liquid per batch, and the said process (b) batches the main surface of the said glass base material which performed the said chemical strengthening. 3. The method for producing a glass substrate according to Configuration 2, which is a step of polishing in units.
(構成4)前記工程(b)は、所定のバッチ毎に研磨量を減少させて研磨を行う工程であることを特徴とする構成3に記載のガラス基板の製造方法。 (Configuration 4) The method for manufacturing a glass substrate according to Configuration 3, wherein the step (b) is a step of performing polishing by reducing the polishing amount for each predetermined batch.
(構成5)構成1〜4のいずれかに記載のガラス基板の製造方法により製造されたことを特徴とするガラス基板。 (Structure 5) A glass substrate manufactured by the method for manufacturing a glass substrate according to any one of Structures 1 to 4.
(構成6)構成5記載のガラス基板と、前記ガラス基板の主表面に設けられた下地層、磁性層、保護層、潤滑層と、を有することを特徴とする磁気記録媒体。 (Structure 6) A magnetic recording medium comprising: the glass substrate according to Structure 5; and an underlayer, a magnetic layer, a protective layer, and a lubricating layer provided on a main surface of the glass substrate.
本発明によれば、化学強化後に研磨を行う場合であっても、化学強化液の組成の変化によらず、寸法精度を維持可能なガラス基板の製造方法を提供することができる。 ADVANTAGE OF THE INVENTION According to this invention, even if it is a case where it grind | polishes after chemical strengthening, it can provide the manufacturing method of the glass substrate which can maintain a dimensional accuracy irrespective of the change of a composition of a chemical strengthening liquid.
以下、図面に基づき、本発明の実施形態を詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
まず、図1を参照して、本実施形態に係るガラス基板1の製造方法を用いて製造されるガラス基板1の構造について簡単に説明する。 First, with reference to FIG. 1, the structure of the glass substrate 1 manufactured using the manufacturing method of the glass substrate 1 which concerns on this embodiment is demonstrated easily.
図1(a)に示すように、ガラス基板1は、円板形状を有する本体3を有し、本体3の中心には内孔5が形成されている。 As shown in FIG. 1A, the glass substrate 1 has a main body 3 having a disc shape, and an inner hole 5 is formed at the center of the main body 3.
図1(b)に示すように、本体3は、実質的に平滑な主表面7a、7bを有している。 As shown in FIG. 1B, the main body 3 has substantially smooth main surfaces 7a and 7b.
主表面7a、7bは、情報を記録再生するための層が形成される面であり、例えば図1(c)に示すように、主表面7a、7bの一方または両方に、下地層18a、磁性層18b、保護層18c、潤滑層18dを設けることにより、ガラス基板1は、磁気記録媒体100となる(少なくとも磁性層18bは記録層として必要)。 The main surfaces 7a and 7b are surfaces on which a layer for recording / reproducing information is formed. For example, as shown in FIG. 1C, one or both of the main surfaces 7a and 7b are provided with an underlayer 18a and magnetic layers. By providing the layer 18b, the protective layer 18c, and the lubricating layer 18d, the glass substrate 1 becomes the magnetic recording medium 100 (at least the magnetic layer 18b is necessary as a recording layer).
また、図1(b)に示すように、本体3は主表面7a、7bに対して直交している内周端面11および外周端面9を有している。 Moreover, as shown in FIG.1 (b), the main body 3 has the inner peripheral end surface 11 and the outer peripheral end surface 9 which are orthogonal to the main surfaces 7a and 7b.
内周端面11および外周端面9は面取されており、それぞれ内周面取面13および外周面取面15が設けられている。 The inner peripheral end face 11 and the outer peripheral end face 9 are chamfered, and an inner peripheral chamfered face 13 and an outer peripheral chamfered face 15 are provided, respectively.
さらに、本体3は表面に化学強化層17が形成されている。 Furthermore, the chemical strengthening layer 17 is formed on the surface of the main body 3.
化学強化層17の詳細については後述するが、例えば、ガラス基板1の原料となるガラスのイオンの一部を、よりイオン半径の大きいイオンに置換し、圧縮応力層とした層である。 Although details of the chemical strengthening layer 17 will be described later, for example, a part of the glass ions used as the raw material of the glass substrate 1 is replaced with ions having a larger ion radius to form a compressive stress layer.
次に、図2〜図6を参照して、本実施形態に係るガラス基板1の製造方法について説明する。 Next, with reference to FIGS. 2-6, the manufacturing method of the glass substrate 1 which concerns on this embodiment is demonstrated.
なお、以下の説明では、製造工程中におけるガラスを「ガラス基材1a」と称し、完成品を「ガラス基板1」と称することにする。
In the following description, the glass in the manufacturing process is referred to as “
まず、製造方法の概略について、図2を参照して簡単に説明する。 First, an outline of the manufacturing method will be briefly described with reference to FIG.
まず、原料となるガラスを加工して図2に示すような円板状のガラス基材1aを製造する。
First, glass as a raw material is processed to produce a disk-
次に、ガラス基材1aに化学強化を行い、表面に圧縮応力層を形成する。
Next, the
次に、化学強化を行ったガラス基材1aの主表面7a、7bを研磨して、実質的に平滑にする。
Next, the main surfaces 7a and 7b of the
ここで、図2から明らかなように、本実施形態では、ガラス基材1aに化学強化を行った後に主表面7a、7bを研磨しており、化学強化後に研磨を行う製造方法である。
Here, as is apparent from FIG. 2, the present embodiment is a manufacturing method in which the main surfaces 7a and 7b are polished after chemically strengthening the
次に、図3〜図6を参照して、具体的な製造方法について説明する。 Next, a specific manufacturing method will be described with reference to FIGS.
まず、図3に示すように、原料となるガラスを円板状に成形してガラス基材1aを製造する(ステップ101)。
First, as shown in FIG. 3, glass as a raw material is formed into a disk shape to produce a
原料となるガラスとしては例えばフロート法、ダウンドロー法、リドロー法又はプレス法で製造されたソーダライムガラス、アルミノシリケートガラス、ボロシリケートガラス、結晶化ガラス等が挙げられる。 Examples of the glass used as a raw material include soda lime glass, aluminosilicate glass, borosilicate glass, and crystallized glass produced by a float method, a downdraw method, a redraw method, or a press method.
なお、以下の実施形態ではプレス法で製造されたガラスを例に説明する。 In the following embodiments, glass manufactured by a press method will be described as an example.
次に、図3に示すように、ガラス基材1aの板厚調整のため、研削装置21を用いて主表面7a、7bを研削(第1ラッピング)する(ステップ102)。
Next, as shown in FIG. 3, in order to adjust the plate thickness of the
ここで、研削に用いる研削装置21の構造および研削の方法の一例について、図4を参照して簡単に説明する。 Here, an example of the structure of the grinding apparatus 21 used for grinding and an example of the grinding method will be briefly described with reference to FIG.
図4に示すように、研削装置21は、太陽歯車23と、その外方に同心円状に配置される内歯歯車25と、太陽歯車23及び内歯歯車25に噛み合い、太陽歯車23や内歯歯車25の回転に応じて公転及び自転するキャリア27と、このキャリア27に保持されたガラス基材1aを挟持可能な上定盤29及び下定盤31と、上定盤29と下定盤31との間に研磨液を供給する研磨液供給部(図示せず)とを備えている。
As shown in FIG. 4, the grinding device 21 meshes with the sun gear 23, the internal gear 25 arranged concentrically on the outer side thereof, the sun gear 23 and the internal gear 25, and the sun gear 23 and the internal
研削装置21は、研削加工時には、キャリア27に保持されたガラス基材1aを上定盤29及び下定盤31とで挟持し、上定盤29及び下定盤31とガラス基材1aとの間に研磨液を供給しながら、太陽歯車23や内歯歯車25の回転に応じてキャリア27が公転及び自転することにより、ガラス基材1aの上下両面(主表面7a、7b)が研削加工される。
At the time of grinding, the grinding device 21 sandwiches the
また、研磨液は、例えば、アルミナ等の砥粒を水に分散させてスラリーとしたものが用いられる。 As the polishing liquid, for example, a slurry obtained by dispersing abrasive grains such as alumina in water is used.
次に、図3に示すように、ガラス基材1aの中心に内孔5(図1参照)を形成する(ステップ103)。
Next, as shown in FIG. 3, the inner hole 5 (see FIG. 1) is formed in the center of the
内孔5の形成は、例えばコアドリルを用いて行う。 The inner hole 5 is formed using, for example, a core drill.
なお、シートガラスを用いた場合は、ステップ101〜103は行わず、代わりに、カッターを用いてシート形状から円板形状にガラスを切り出し、さらに内孔5を切り出す工程(カッティング工程)を行う。
When sheet glass is used,
次に、図3に示すように、ガラス基材1aの端面のクラックを除去するため、内周端面11および外周端面9の面取を行う(ステップ104)。面取は、例えばダイヤモンド砥粒が付着した砥石を用いて行う。
Next, as shown in FIG. 3, the inner peripheral end face 11 and the outer peripheral end face 9 are chamfered to remove cracks on the end face of the
なお、面取後に主表面7a、7bを研削(第2ラッピング)する工程を追加してもよい。これにより、内孔5の形成や面取によって生じた凹凸を研削でき、研磨の際の負担を軽減できる。 In addition, you may add the process of grinding (2nd lapping) main surface 7a, 7b after chamfering. Thereby, the unevenness | corrugation produced by formation and chamfering of the inner hole 5 can be ground, and the burden at the time of grinding | polishing can be reduced.
次に、図3に示すように、ガラス基材1aの内周端面11および外周端面9の研磨、即ち端面研磨を行う(ステップ105)。
Next, as shown in FIG. 3, the inner peripheral end face 11 and the outer peripheral end face 9 of the
端面研磨は例えば回転ブラシを用いて行う。 The end surface polishing is performed using, for example, a rotating brush.
次に、図3に示すように、ガラス基材1aに化学強化を行い、化学強化層17を形成する(ステップ106)。
Next, as shown in FIG. 3, the
ここで、化学強化に用いる化学強化装置51の構造および化学強化の方法の一例について、図5を参照して簡単に説明する。 Here, an example of the structure of the chemical strengthening apparatus 51 used for chemical strengthening and an example of the chemical strengthening method will be briefly described with reference to FIG.
図5に示すように、化学強化装置51は、ガラス基材1aを保持するホルダ53と、化学強化液59で満たされた処理槽57を有している。
As shown in FIG. 5, the chemical strengthening apparatus 51 includes a holder 53 that holds the
ホルダ53にはガラス基材1aを保持するための保持部55が設けられている。
The holder 53 is provided with a holding portion 55 for holding the
図5から明らかなように、化学強化装置51は、ガラス基材1aを数10枚〜100枚程度の枚数ごとにバッチ単位で化学強化を行う構造であるが、本発明はバッチ単位での処理に限定されない。
As is clear from FIG. 5, the chemical strengthening apparatus 51 has a structure in which the
化学強化装置51を用いてガラス基材1aを化学強化する場合は、まず、保持部55にガラス基材1aを引っ掛けることによりホルダ53にガラス基材1aを収納し、ホルダ53ごと処理槽57内の化学強化液59にガラス基材1aを浸漬する。
When chemically strengthening the
化学強化液59の組成は例えば、硝酸カリウム、硝酸ナトリウム、硝酸銀等をそれぞれ単独、あるいは少なくとも2種を混合したものである。 The composition of the chemical strengthening liquid 59 is, for example, potassium nitrate, sodium nitrate, silver nitrate or the like alone or a mixture of at least two kinds.
化学強化液59の温度は、ガラス基材1aの材質の歪点よりも好ましくは50〜150℃程度低い温度であり、より好ましくは化学強化液59自体の温度が350〜400℃程度である。
The temperature of the chemical strengthening liquid 59 is preferably about 50 to 150 ° C. lower than the strain point of the material of the
化学強化液59にガラス基材1aを浸漬すると、化学強化液59に含まれているイオンと、ガラス基材1aに含まれているイオンとがイオン交換される。
When the
具体的には、例えばガラス基材1aに含まれているリチウムイオン、ナトリウムイオンが、それぞれ、化学強化液59に含まれているナトリウムイオン、カリウムイオンと交換される。
Specifically, for example, lithium ions and sodium ions contained in the
この際、ガラス基材1aに含まれているイオンよりもイオン半径が大きいイオンとイオン交換が生じることにより、化学強化層17は圧縮応力層となり、ガラス基材1aの表面の強度が上昇する。
At this time, when ion exchange occurs with ions having a larger ion radius than the ions contained in the
なお、化学強化の条件(温度、強化時間等)は一定で行うのが望ましい。理由は、本実施形態では、後述するように、化学強化液59の組成の変化に応じて、研磨量を変化させて研磨を行っているためである。 It is desirable that the chemical strengthening conditions (temperature, strengthening time, etc.) be constant. The reason is that, in this embodiment, as will be described later, the polishing is performed by changing the polishing amount in accordance with the change in the composition of the chemical strengthening solution 59.
次に、化学強化が終わると、ガラス基材1aを洗浄して表面の化学強化液を除去した後、図3に示すように、ガラス基材1aの主表面7a、7bの平坦度と表面粗さを調整する(実質的に平滑にする)ため、主表面7a、7bを研磨する(ステップ107)。
Next, after chemical strengthening is completed, the
ここで、研磨に用いる研磨装置21aの構造について図6を参照して説明する。 Here, the structure of the polishing apparatus 21a used for polishing will be described with reference to FIG.
研磨装置21aの構造は、研削装置21と同様であるが、図6に示すように、上定盤29及び下定盤31に研磨パッド33が貼り付けられている。 The structure of the polishing device 21a is the same as that of the grinding device 21, but a polishing pad 33 is attached to the upper surface plate 29 and the lower surface plate 31, as shown in FIG.
研磨装置21aは、研磨加工時には、キャリア27に保持されたガラス基材1aを上定盤29及び下定盤31とで挟持し、研磨パッド33とガラス基材1aとの間に研磨液を供給しながら、太陽歯車23や内歯歯車25の回転に応じてキャリア27が公転及び自転することにより、ガラス基材1aの上下両面(主表面7a、7b)が研磨加工される。
During the polishing process, the polishing apparatus 21a sandwiches the
研磨パッド33としては、軟質ポリッシャの研磨パッドであることが好ましい。研磨パッド33の硬度はアスカーC硬度で、60以上90以下とすることが好適である。研磨パッド33のガラス基材1aとの当接面は、発泡ポアが開口した発泡樹脂、特に発泡ポリウレタンとすることが好ましい。このようにして研磨を行うと、ガラス基材1aの主表面7a、7bを平滑な鏡面状に研磨することができる。
The polishing pad 33 is preferably a polishing pad of a soft polisher. The polishing pad 33 preferably has an Asker C hardness of 60 to 90. The contact surface of the polishing pad 33 with the
また、研磨液は、例えば、酸化セリウムや酸化ランタン、コロイダルシリカ等の砥粒を水に分散させてスラリーとしたものが用いられる。 As the polishing liquid, for example, a slurry obtained by dispersing abrasive grains such as cerium oxide, lanthanum oxide, and colloidal silica in water is used.
ここで、研磨の際は、化学強化液59の組成の変化に応じて、研磨量を変化させて研磨を行う。 Here, at the time of polishing, the polishing is performed by changing the polishing amount in accordance with the change in the composition of the chemical strengthening solution 59.
より具体的には、化学強化液59は、繰り返し使用するにつれて、当初、化学強化液59に含まれていたイオンが減少して化学強化層17が薄くなるため、それに対応させて、ステップ107において、主表面7a、7bの研磨量を減少させて研磨を行う。 More specifically, as the chemical strengthening liquid 59 is repeatedly used, the ions initially contained in the chemical strengthening liquid 59 are reduced and the chemical strengthening layer 17 is thinned. Polishing is performed by reducing the polishing amount of the main surfaces 7a and 7b.
このように、化学強化液59の組成の変化に応じて、研磨量を変化させて研磨を行うことにより、研磨後の化学強化層17が薄くなりすぎて、主表面7a、7bの化学強化層17の厚さの不均一が顕著となり、ガラス基材1aの反りにより寸法精度が悪化するのを防止できる。
In this way, by performing polishing while changing the polishing amount in accordance with the change in the composition of the chemical strengthening solution 59, the chemically strengthened layer 17 after polishing becomes too thin, and the chemical strengthened layer on the main surfaces 7a and 7b. The nonuniformity of the thickness of 17 becomes remarkable, and it can prevent that a dimensional accuracy deteriorates by the curvature of the
即ち、化学強化液59の組成の変化によらず、寸法精度を維持できる。 That is, the dimensional accuracy can be maintained regardless of the change in the composition of the chemical strengthening solution 59.
なお、この研磨量を変化させた研磨は、化学強化をバッチ単位で行っている場合は、所定のバッチごとにバッチ単位で行うのが望ましい。 In addition, it is desirable to perform the polishing with the polishing amount changed in batch units for each predetermined batch when chemical strengthening is performed in batch units.
また、研磨は2段階に分けて行っても良い。 Polishing may be performed in two stages.
具体的には、例えば、研磨液に含まれる砥粒として、粒径が異なる2種類の砥粒を用い、まず粒径が相対的に大きい砥粒を用いて第1研磨を行い、次に粒径が相対的に小さい砥粒を用いて第2研磨を行う。 Specifically, for example, as abrasive grains contained in the polishing liquid, two types of abrasive grains having different particle diameters are used, and first polishing is performed using abrasive grains having a relatively large particle diameter, and then the grains Second polishing is performed using abrasive grains having a relatively small diameter.
研磨が終了すると、ガラス基材1aを洗浄し、製造中に表面に付着した研磨剤や不純物を除去する(ステップ108)。
When polishing is completed, the
具体的にはスクラブ洗浄、超音波洗浄等の物理的な洗浄や、フッ化物、有機酸、過酸化水素、界面活性剤等を用いた薬液洗浄が挙げられる。 Specific examples include physical cleaning such as scrub cleaning and ultrasonic cleaning, and chemical cleaning using a fluoride, organic acid, hydrogen peroxide, surfactant, and the like.
最後に、製品検査(例えば主表面7a、7bの表面粗さやパーティクルの量の検査)を行う(ステップ109)。 Finally, product inspection (for example, inspection of the surface roughness of the main surfaces 7a and 7b and the amount of particles) is performed (step 109).
具体的には、例えばODT(Optical Defect Tester)やOSA(Optical Surface Analyzer)を用いて欠陥検査を行う。 Specifically, defect inspection is performed using, for example, ODT (Optical Defect Tester) or OSA (Optical Surface Analyzer).
以上の工程により、ガラス基板1が完成する。 The glass substrate 1 is completed by the above process.
このように、本実施形態に係るガラス基板1の製造方法によれば、ガラス基材1aに化学強化を行った後に主表面7a、7bを研磨しており、かつ、研磨工程においては、化学強化液59の組成の変化に応じて、研磨量を変化させて研磨を行っている。
Thus, according to the manufacturing method of the glass substrate 1 which concerns on this embodiment, after performing the chemical strengthening to the
そのため、化学強化後に研磨を行う場合であっても、化学強化液59の組成の変化によらず、ガラス基板1の寸法精度を維持可能である。 Therefore, even when polishing is performed after chemical strengthening, the dimensional accuracy of the glass substrate 1 can be maintained regardless of the change in the composition of the chemical strengthening solution 59.
上述した実施形態では、本発明を磁気記録媒体用のガラス基板1を製造する製造方法に適用した場合について説明したが、本発明は何らこれに限定されることなく、化学強化後に研磨を行う必要がある全てのガラスの製造方法に適用できる。 In the above-described embodiment, the case where the present invention is applied to the manufacturing method for manufacturing the glass substrate 1 for a magnetic recording medium has been described. However, the present invention is not limited to this, and it is necessary to perform polishing after chemical strengthening. It can be applied to all glass manufacturing methods.
1……………ガラス基板
1a…………ガラス基材
3……………本体
5……………内孔
7a…………主表面
17…………化学強化層
18b………磁性層
21…………研削装置
21a………研磨装置
51…………化学強化装置
59…………化学強化液
DESCRIPTION OF SYMBOLS 1 ...............
Claims (6)
前記化学強化を行った前記ガラス基材の主表面を研磨する工程(b)と、
を有し、
前記工程(b)は、前記化学強化液の組成の変化に応じて、研磨量を変化させて研磨を行う工程であることを特徴とするガラス基板の製造方法。 (A) performing chemical strengthening by immersing the glass base material in a chemical strengthening solution that is a solution containing ions and replacing the ions on the surface of the glass base material with ions of the chemical strengthening solution;
Polishing the main surface of the glass substrate subjected to the chemical strengthening (b);
Have
The process (b) is a process for polishing by changing the polishing amount in accordance with the change in the composition of the chemical strengthening solution.
前記工程(b)は、前記化学強化を行った前記ガラス基材の主表面をバッチ単位で研磨する工程であることを特徴とする請求項2に記載のガラス基板の製造方法。 The step (a) is a step of immersing the glass substrate in a chemical strengthening solution in batch units,
The said process (b) is a process of grind | polishing the main surface of the said glass base material which performed the said chemical strengthening in batch unit, The manufacturing method of the glass substrate of Claim 2 characterized by the above-mentioned.
前記ガラス基板の主表面に設けられた下地層、磁性層、保護層、潤滑層と、
を有することを特徴とする磁気記録媒体。 A glass substrate according to claim 5;
An underlayer, a magnetic layer, a protective layer, a lubricating layer provided on the main surface of the glass substrate;
A magnetic recording medium comprising:
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