JP2010054280A - Lsi tester, automatic creation tool of test program, and test system - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To alleviate a burden on an operator and shorten a period needed for preparation being carried out before a debugging operation, in the operation of debugging a test program by using an LSI tester. <P>SOLUTION: An automatic creation tool (10) of the test program is configured to have a function of defining a group of pins (setting pin group) used in accordance with a test, so as to correspond to a pin lineup. The tester (20) is configured to have functions (23, 24) of automatically choosing the pin lineup which meets the test in the debugging operation, when running the test program. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an LSI tester having a debugging tool and a test program automatic creation tool (program), and relates to a tool that provides a function of automatically generating pin lineup data of a test target LSI (large scale semiconductor integrated circuit). Is.

  The LSI tester applies a voltage or current to the object under test to determine the quality of the object under test such as an IC or LSI, measures the current or voltage output from the IC or LSI under test, It is used to perform a DC test for inspecting whether it is within a specified range, a function test for inspecting whether a desired logic output can be obtained by inputting pattern data, and the like.

  Recent LSI testers are equipped with a debugging tool for supporting debugging, and many of the test programs executed at the time of debugging are based on LSI layout data and simulation patterns designed by the user. It is created by an automatic creation tool (software) (see FIG. 5). An invention relating to an automatic test program creation device is disclosed in, for example, Patent Document 1.

There are several types of tests to be executed by the test program, such as DC tests, function tests, and DAC tests that measure analog levels, and even the same type of test is used depending on the circuit block and function to be tested. (External terminal) combination may be different. Therefore, in the test program automatic creation tool, as shown in FIG. 6, data called a pin group that specifies a combination of pins used for each test is set and output.
JP 2002-148317 A

  In recent LSI testers, level setting and timing setting are perpin processed. Therefore, in order to cope with it, the debug tool does not display the status of all pins on the monitor, but defines the combination of pins to be displayed as a group of pins according to the test. There is provided one provided with a pin line-up tool that allows an arbitrary one to be selected from (see FIG. 5).

  However, the conventional pin line-up tool defines and selects the pin line-up according to each test to be executed, so that the pin state is displayed in order from the important pin, or the state of the extra pin state is displayed. It can be omitted and only the necessary pin states can be displayed. This makes debugging easier, but the pin line definition and selection had to be done manually by the operator. For this reason, there are problems that preparation time before debugging becomes long and the function is not fully utilized because the work is troublesome.

  Note that the pin group set by the test program automatic creation tool based on the simulation pattern and the pin lineup defined and selected by the tester pin lineup tool are substantially the same when the test is specified. When the pins to be used in a test are determined, the types of pins that are desired to be displayed on the monitor in the debugging process are similar to the point of interest during simulation.

  SUMMARY OF THE INVENTION An object of the present invention is to reduce the burden on an operator and shorten the time required for preparation before debugging in debugging a test program using an LSI tester.

  Another object of the present invention is to improve the debugging efficiency by storing the information related to the correction of the pin lineup in the LSI tester and having the function of automatically correcting the pin lineup used in other tests. is there.

  In order to achieve the above object, an invention according to claim 1 is directed to a test control unit for executing an LSI test program on an LSI tester and debugging a test program executed by displaying a pin state related to a test content. Based on auxiliary data including a debug function to support, a data group specifying a combination of a plurality of pins related to the test contents given from the test program automatic creation tool, and data identification information attached to each data of the data group, And a pin lineup control function for selecting a combination of pins for displaying the status. As a result, the burden on the operator can be reduced and the time required for preparation before debugging can be shortened.

  According to a second aspect of the present invention, in the first aspect of the present invention, the LSI tester is provided with a correction function for correcting the data of the data group. Thereby, it is possible to obtain a favorite pin lineup in which the display order is adjusted.

  The invention described in claim 3 stores the contents corrected by the correction function in the invention described in claim 2, and the correction is performed when data that is the same as or similar to the data related to the correction is selected later. A learning function for correcting data according to the contents is provided. Thereby, it is possible to reduce the trouble of repeating the same correction as the correction already performed by the operator with respect to the pin lineup, and to improve the debugging efficiency.

  According to a fourth aspect of the present invention, a test program automatic creation tool has a function of creating a test program for testing an LSI based on LSI design data and simulation information, and a plurality of tests executed by the test program. A function of creating auxiliary data including a data group designating a combination of a plurality of pins corresponding to each content and data identification information attached to each data of the data group is provided. As a result, the burden on the operator can be reduced and the time required for preparation before debugging can be reduced.

  The invention according to claim 5 is a test system comprising the LSI tester according to any one of claims 1 to 3 and the test program automatic creation tool according to claim 4, wherein the test program is automatically created. The test program created by a tool, a data group designating a combination of the plurality of pins, and auxiliary data are supplied to the LSI tester.

  According to the present invention, in debugging a test program using an LSI tester, it is possible to reduce the burden on the operator and shorten the time required for preparation before debugging. In addition, it is possible to improve the debugging efficiency by storing the information related to the correction of the pin lineup in the tester and having the function of automatically correcting the pin lineup used in other tests.

  DESCRIPTION OF EXEMPLARY EMBODIMENTS Hereinafter, preferred embodiments of the invention will be described with reference to the drawings.

  FIG. 1 shows an embodiment of a test system to which the present invention is applied.

  The test system of this embodiment includes a test program automatic creation tool 10 and an LSI tester 20 that executes a test program created by the tool and performs debugging. The test program automatic creation tool 10 is software (program) and is mounted on a personal computer, a workstation, or the like, and is based on LSI layout data 11 and simulation patterns (signal data used for simulation) 12 designed by the user. Create a test program.

  The LSI tester 20 includes a test control unit 21 that executes the test program in response to a start command input from an input operation device such as a keyboard (not shown), and a test that is executed by displaying the state of the pins related to the content of the test on the monitor. A debug tool 22 for supporting program debugging, a pin line-up tool 23 for defining and selecting a pin line-up according to each test to be executed, and instructing the pin line-up tool 23 to switch the pin line-up tool A pin lineup control unit 24 is provided.

  The test control unit 21 is a kind of control program configured to set a breakpoint or the like, divide and execute a test program for each test and execute a trace process, and an MPU (microprocessor) or RAM for executing the control program. Firmware. An ATE (automatic test apparatus) is connected to the test control unit 21, and an LSI as a device under test is connected to the ATE.

  In this embodiment, the test program automatic creation tool 10 is provided with a function for defining a group of pins used in accordance with a test in association with the pin lineup. Specifically, as shown in FIG. 2, the setting pin group originally created by the test program automatic creation tool 10 is associated with the “pin lineup name” handled by the pin lineup tool 23 as auxiliary data. The test program automatic creation tool 10 has a function of creating and outputting together with the test program.

  FIG. 3 shows a procedure for outputting a test program description of each test having a new function provided in the test program automatic creation tool 10.

  The test program automatic creation tool 10 outputs, for example, a program description for a DC test whose “test ID” is “tno.1000” in FIG. 2 and then the same combination and order as the combination of pins used in the test. It is determined whether or not there is already data of a pin group having (step S2). Here, if “Yes”, that is, if the same data already exists, the pin group name of the test concerned is registered in the pin group (step S4). On the other hand, if “No” in step S2, that is, there is no same data, a combination of pins used in the test is created as data of a new pin lineup (step S3).

  Thereafter, the created pin lineup data is registered with the pin lineup name of the test concerned (step S4). The registered pin lineup name is output as pin lineup auxiliary data when the corresponding test program is output from the test program automatic creation tool 10 to the LSI tester 20. As the pin lineup auxiliary data, it is only necessary to include “test ID” and “pin lineup name” in FIG. The “test ID” may be any key as long as it is a key indicating the type of test content, such as a test number, a category number, and an FC pattern name, and may be determined by an AND condition of a plurality of pieces of information. .

  FIG. 4 shows a processing procedure by the pin lineup control unit 24 newly provided in the LSI tester 20.

  When the pin lineup control unit 24 receives a “pause” notification indicating that the execution of the test program is interrupted from the test control unit 21, it starts the processing of FIG. This “pause” notification is made when the test program executed by the test control unit 21 reaches a preset breakpoint or the like and stops executing the program.

  Upon receiving the “pause” notification, the pin lineup control unit 24 checks the ID (test number) of the current test, checks the pin lineup name corresponding to the test ID from the pin lineup auxiliary data, and performs the current test. It is determined whether or not it matches with the pin lineup name (step S5). If the pin lineup names are different, the pin lineup tool 23 is instructed to switch the pin lineup and the process is terminated (step S6). If the pin lineup name is the same, use the same pin lineup as before without switching the pin lineup when performing the next test.

  By the way, the pin group created by the test program automatic creation tool may be used as it is as a pin lineup, but the order is not optimal or the state of all pins set by the pin group depending on the user May not be displayed on the monitor. In such a case, the pin line-up tool 23 is used so that the definition of the pin line-up can be corrected. Further, when the pin line-up tool 23 switched by the instruction from the pin line-up control unit 24 is not appropriate, the user can manually switch to another pin line-up by the pin line-up tool 23. Yes.

  Since the pin group definition on the test program is originally created by the group on the simulation pattern and the group determined by the layout information, by outputting the pin lineup data on the debug display from the pin group definition, The user can save time and effort to define the pin lineup using the pin lineup tool, and an appropriate pin lineup can be automatically created in the LSI tester. Even if the order is not optimal, the order may be edited using the pin line-up tool 23, so that the work can be completed more easily than the case where the order is defined from the beginning.

  Furthermore, since the pin line-up control unit 24 automatically switches to the pin line-up that matches the current test, it is possible to save the user from switching the pin line-up. As a result, the user can perform debugging work while checking on the monitor information regarding a plurality of pins that are appropriately grouped according to the type of test, so that the debugging work can be performed efficiently. In addition, when there is a debugging tool that displays the measured values of each selected pin together, it improves visibility by collecting and displaying the test measurement pin information being debugged on the upper part of the monitor screen. You can also.

The pin lineup control unit 24 may be provided independently of the test control unit 21 and the pin lineup tool 23, but may be configured integrally with the test control unit 21 or the pin lineup tool 23. Further, the pin line-up control unit 24 may be configured as firmware in which a program and hardware are integrated in the same manner as the test control unit 21, but the test control unit 21 and hardware can be shared. In the case, it is configured as software (program). And this program may be provided independently of the control program etc. which comprise the test control part 21, and may be provided as a part of function of the control program. Similarly, it may be provided as a part of the function of the pin line-up tool 23.
(Modification)
There are various types of LSIs such as logic LSIs and analog LSIs, and various debugging tools with different debugging targets are provided according to the types of LSIs. Some have multiple debugging tools. Management by the pin line-up tool 23 of the embodiment can be performed commonly for a plurality of debug tools, but different pin line-up definitions can be made for each tool.

  In this case, the pin lineup name can be managed for each tool type when the pin lineup definition is automatically created. When the pin lineup definition is common to a plurality of debug tools, the pin lineup control unit 24 instructs each tool (pin lineup tool and debug tool) to individually switch the pin lineup. By doing this, it is possible to realize automatic pin line-up switching by tool.

  Furthermore, there is an inconvenience when the pin lineup is automatically switched based on the pin lineup auxiliary data at the initial debugging stage, and the user manually switches to another pinlineup or rearranges the pin order. In such a case, it is stored in the memory. Then, when the same pin lineup auxiliary data is read in the subsequent test, the pin lineup control unit 24 or the pin lineup tool 23 has a learning function for rewriting the pin lineup name and definition based on the memory. You may comprise.

  This learning function is separate from the pin lineup data management by the test program automatic creation tool 10, and the test program automatic creation tool 10 does not have the pin lineup data management function and the user manually creates the pin lineup data. Even in the system (see Fig. 5), it is possible to automatically switch the pin lineup by providing a pin lineup control unit with a learning function in the tester and memorizing the pin lineup manually set by the user It is.

  In addition, when the pin lineup is temporarily modified during debugging, a function may be provided that allows the user to select whether or not to rewrite the pin lineup name and definition of the corresponding test.

  Although the invention made by the present inventor has been specifically described based on the embodiment, the present invention is not limited to the above embodiment. For example, in the above-described embodiment, it has been described that the pin lineup is automatically switched based on the “pause” notification from the test control unit 24. However, a mode for performing such automatic switching and a mode for performing manual switching are provided so that the user The test line automatic creation tool 10 has a function of adding information indicating that automatic switching is not performed for a specific test as pin line auxiliary data, and the pin line line control unit 23. May be configured to have a function of recognizing the auxiliary data and not performing automatic switching.

It is a block diagram showing one embodiment of a test system to which the present invention is applied. It is explanatory drawing which shows the structural example of the setting pin group produced by the test program automatic creation tool in the test system of embodiment. It is a flowchart which shows the procedure of the process by the new function provided in the test program automatic creation tool. It is a flowchart which shows the procedure of the process by the pin lineup control part newly provided in the LSI tester. It is a block diagram which shows the structural example of the conventional test system provided with the pin lineup tool. It is explanatory drawing which shows the structural example of the setting pin group produced by the conventional test program automatic creation tool.

Explanation of symbols

10 Test Program Automatic Creation Tool 11 Layout Data 12 Simulation Pattern 20 LSI Tester 21 Test Control Unit 22 Debug Tool 23 Pin Lineup Tool 24 Pin Lineup Control Unit

Claims (5)

A test control unit for executing an LSI test program;
A debugging function that supports debugging of the executed test program by displaying the pin status related to the test contents,
Based on auxiliary data including a data group specifying a combination of a plurality of pins related to the test content given from the test program automatic creation tool and data identification information attached to each data of the data group, the pin of which the state is displayed Pin lineup control function to select the combination,
An LSI tester comprising:   The LSI tester according to claim 1, further comprising a correction function for correcting data of the data group.   The content corrected by the correction function is stored, and when data that is the same as or similar to the data related to the correction is selected later, a learning function for correcting data according to the correction content is provided. Item 3. The LSI tester according to Item 2. A function of creating a test program for testing the LSI based on the LSI design data and simulation information;
A function of creating auxiliary data including a data group designating a combination of a plurality of pins corresponding to the contents of a plurality of tests executed by the test program and data identification information attached to each data of the data group;
Test program automatic creation tool to make computer realize. An LSI tester according to any one of claims 1 to 3 and a test program automatic creation tool according to claim 4,
A test system configured to supply the LSI tester with a data group and auxiliary data for specifying a combination of the test program and the plurality of pins created by the test program automatic creation tool .

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