JP2010197056A - Data display, data display method and program - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a data display capable of easily comparing the changes in test execution time that accompany the correction of a device testing program. <P>SOLUTION: The data display includes an execution time data storage for storing execution time data obtained by measurement for each device-testing program; an operation reception section for receiving selection of execution time data to be used as a reference and execution time data to be an object of comparison, from among the pieces of execution time data being stored; and an execution-time display controller for displaying the difference value between the execution time data to be the object of comparison and the reference execution time data, concerning the selected pieces of execution time data. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a semiconductor device test, and more particularly, to a data display device, a data display method, and a program for displaying data of time required for a semiconductor device test.

  A semiconductor test apparatus is used to test a semiconductor device such as an IC or LSI. The semiconductor test apparatus tests a semiconductor device by applying a test signal to the semiconductor device according to the content of a test program created by a user and measuring the output result.

  In general, a test program is created by a user repeatedly making corrections according to characteristics of a semiconductor device to be tested, a test purpose, and the like. In the process of modifying the test program, various adjustments are made regarding the execution order of test items, the use of variables, parameter settings, etc. so that the test execution time can be shortened and the semiconductor test equipment can be operated efficiently. . The execution time of the semiconductor device test depends on the contents of these adjustments.

JP 2001-330651 A

  Changes in the test execution time associated with the modification of the test program greatly affect the productivity of semiconductor device tests. For this reason, there has been proposed a semiconductor test apparatus that measures and records the execution time of the test program so that the effect of the test program modification can be grasped.

  In such a semiconductor test apparatus, for example, the effect of the modification of the test program can be grasped by displaying the execution time numerically or graphically for each modified test program. However, it cannot be easily grasped to what extent the effect has been achieved, and it is necessary to further process information in order to perform a detailed comparison, which requires time and effort for the user.

  Therefore, an object of the present invention is to provide a data display device, a data display method, and a program capable of easily comparing changes in test execution time associated with correction of a device test program.

  In order to solve the above problems, a data display device according to a first aspect of the present invention includes an execution time data storage unit that stores execution time data measured for each device test program, and the stored execution time. An operation receiving unit that receives selection of execution time data to be compared with execution time data to be compared from data, and the execution time data to be compared and the execution time data to be the reference for the selected execution time data And an execution time display control unit that displays a difference value.

  Here, the test program is composed of a plurality of parts, and the execution time display control unit displays a difference value between the execution time data to be compared and the reference execution time data in the part unit. can do.

  In addition, a history recording unit that records difference information for each test program is further provided, and the execution time display control unit includes the test program corresponding to the reference execution time data and the execution time data to be compared. The difference from the test program corresponding to the above may be further displayed. Alternatively, the execution time display control unit may further display a ratio of the execution time data to be compared to the reference execution time data.

  In order to solve the above-described problem, a data display method according to a second aspect of the present invention includes an execution time data storage step of storing execution time data measured for each device test program, and the stored execution time. A selection receiving step for receiving selection of execution time data as a reference and execution time data as a comparison target from the data, and the execution time data as the comparison target and the execution time data as the reference for the selected execution time data And a display step for displaying a difference value.

  In order to solve the above problem, a program according to a third aspect of the present invention includes an execution time data storage unit that stores execution time data measured for each device test program, and the stored execution time data. An operation receiving unit that receives selection of execution time data to be compared with execution time data to be compared, and execution time data to be compared and reference execution time data for the selected execution time data The information processing apparatus is caused to function as an execution time display control unit that displays the difference value.

  ADVANTAGE OF THE INVENTION According to this invention, the data display apparatus, the data display method, and program which can compare easily the change of the test execution time accompanying the correction of the device test program are provided.

It is a block diagram which shows the structure of the semiconductor test apparatus which concerns on this embodiment. It is a figure which shows the structural example of the program for a test. It is a figure which shows the structural example of execution time data. It is a flowchart which shows the process of an execution time display control part. It is a figure which shows the example of an execution time data selection screen. It is a figure which shows the example of an execution time comparison screen. It is a figure which shows another example of an execution time comparison screen.

  Embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a block diagram showing a configuration of a semiconductor test apparatus according to the present embodiment. As shown in the figure, a semiconductor test apparatus 10 that tests a semiconductor device 70 includes a data display apparatus 100, a control apparatus 200, and a test processing apparatus 300. The semiconductor test apparatus 10 performs a test on the semiconductor device 70 in accordance with the contents of the test program 221. However, the test target is not limited to a semiconductor device, and various devices can be tested.

  The data display device 100 functions as a terminal device operated by a user, and includes a display unit 111 such as a monitor and an operation reception unit 112 such as a keyboard and a pointing device. In addition, the data display device 100 includes a program editing processing unit 120 that provides an editor function for enabling a user to create and edit a test program 221 and a history record that records a history of editing performed by the user. Part 130. For example, the history recording unit 130 manages the version of the test program 221 and records the history by recording a difference from the previous version when the version of the test program 221 is updated.

  Further, the data display device 100 includes an execution time display control unit 140 and an execution time data storage unit 150. The execution time data storage unit 150 acquires execution time data related to the execution time of the semiconductor device test by the test program 221 from the control device 200 and stores it. The execution time display control unit 140 controls screen display based on the execution time data stored in the execution time data storage unit 150. Specific processing performed by the execution time display control unit 140 will be described later.

  The control device 200 measures the execution time data by measuring the execution time of the semiconductor device test by the execution of the memory 220 that stores the test program 221, the program execution unit 210 that executes the test program 221, and the program execution unit 210. And an execution time measuring unit 230 to be generated. The program execution unit 210 can be configured using, for example, a CPU.

  FIG. 2 is a diagram illustrating a configuration example of the test program 221 stored in the memory 220. The test program 221 is actually written in a predetermined program language, but is schematically shown in this figure. As shown in this figure, the test program 221 has a hierarchical structure, and is configured in segment units according to test types, such as “first test segment”, “second test segment”. The segment is composed of cells as test units such as “test cell 1-1”, “test cell 1-2”. Further, the test program 221 includes information indicating the program version. Of course, the configuration of the test program 221 is not limited to this example.

  The execution time measuring unit 230 measures the execution time in units of cells defined by the test program 221 and generates execution time data. FIG. 3 is a diagram illustrating a configuration example of execution time data. As shown in the figure, in the execution time data, information on the execution date and time and information indicating the program version are recorded in the header portion, and the execution time is recorded in the main body portion for each test content. Here, the execution time for each test content includes the total sum of the semiconductor device test execution times by the test program 221 and the total time of the segments. The execution time measuring unit 230 can be configured on the data display device 100 by executing a program developed specifically for the execution time.

  The test processing apparatus 300 performs a test on the semiconductor device 70 based on the control of the program execution unit 210 that executes the test program 221. Specifically, in accordance with an instruction from the program execution unit 210, the signal generator 310 applies a voltage, current, signal waveform, etc. to the semiconductor device 70, and the measuring instrument 320 inputs an output signal from the semiconductor device 70. Perform various measurements. Further, other functional units (not shown) may perform various tests as necessary.

  Next, processing performed by the execution time display control unit 140 will be described with reference to the flowchart of FIG. The semiconductor test apparatus 10 has already performed a test on the semiconductor device 70 using a plurality of versions of the test program 221, and the execution time data storage unit 150 stores a plurality of execution time data. And Further, it is assumed that the history recording unit 130 records the editing history of the test program 221 by the user.

  First, the execution time display control unit 140 displays an execution time data list based on an instruction from the user (S101). The execution time data list can be displayed, for example, using an execution time data selection screen 510 as shown in FIG. On the execution time data selection screen 510, for example, an execution date and time, a program version, and a total of execution time are displayed. The execution time display control unit 140 creates the execution time data selection screen 510 by referring to the execution time data stored in the execution time data storage unit 150. It is desirable that the execution time data list can be sorted and displayed based on information such as execution date and time, program version, and total execution time.

  The execution time data selection screen 510 is provided with a selection area 511 and a “comparison display” button 512 for comparing and displaying the execution time data for each execution time data. The user can display the execution time data comparison screen by selecting the execution time data selection area 511 to be compared and clicking the “comparison display” button 512.

  That is, when the execution time display control unit 140 receives the execution time data serving as a reference and the execution time data to be compared on the execution time data selection screen 510 from the user (S102), the execution time display control unit 140 corresponds to the execution time data storage unit 150. Execution time data is acquired and comparison data is calculated (S103). Here, the comparison data is a difference in execution time. This makes it possible to directly grasp how much the execution time has changed. In this embodiment, execution time data with earlier execution date and time is used as a reference, and execution time data with later execution date and time is used as a comparison target. However, specification of execution time data serving as a reference may be received from the user. . Furthermore, the execution time data to be compared may be plural.

  Then, the execution time display control unit 140 generates an execution time comparison screen and displays it on the display unit 111 (S104). FIG. 6 is a diagram illustrating an example of an execution time comparison screen. As shown in the figure, the execution time comparison screen 520 displays a graph of the area 521 for displaying the execution time in the segment unit of the reference execution time data and the execution time in the segment unit of the execution time data to be compared. Region 522. The execution date and time and the program version information are displayed in any area so that the user can easily identify the displayed execution time data.

  In addition, the execution time comparison screen 520 is provided with a region 523 for displaying a difference between the reference execution time and the execution time to be compared for each segment. By referring to this area 523, the user can visually grasp how much the execution time has changed due to the version change of the test program 221.

  Further, the execution time comparison screen 520 is provided with a “ratio display” button 524, a “cell display” button 525, and a “program difference” button 526, and the user can change the execution time by changing the version of the test program 221. Can be easily analyzed.

  That is, by clicking the “ratio display” button 524, the execution time difference display can be changed to the ratio display. In the ratio display, for example, it is possible to visually grasp information that the execution time is 30% shorter than the reference execution time data.

  Further, by clicking the “cell display” button 524, the comparison result of the segment unit can be changed to the cell unit. Thereby, it becomes possible to grasp the change in the execution time in the test execution unit of the test program 221. Further, the comparison result of the total time may be displayed, or the measurement points may be recorded in the test program 221 so that the execution time comparison results can be displayed in units of measurement points.

  The user can display the difference between the versions of the test program 221 in the segment or cell corresponding to the graph by clicking the “program difference” 326 and indicating the graph in the comparison result area 523.

  For example, as shown in FIG. 7, when the graph of the comparison result is displayed in cell units, when the “program difference” button 526 is clicked and the graph corresponding to “test cell 1-1” is indicated, Differences in the “test cell 1-1” between the version “Dd2” of the reference test program 221 and the version “Dd4” of the test program 221 to be compared are displayed on the small screen 528. The display content of the small screen 528 can be created by referring to the history recording unit 130. As a result, the user can easily grasp what correction of the test program 221 is caused by the change in the execution time.

  As described above, according to the present embodiment, there is provided a semiconductor test apparatus that can easily compare changes in test execution time associated with correction of a semiconductor device test program.

DESCRIPTION OF SYMBOLS 10 ... Semiconductor test apparatus 70 ... Semiconductor device 100 ... Data display apparatus 111 ... Display part 112 ... Operation reception part 120 ... Program edit process part 130 ... History recording part 140 ... Execution time display control part 150 ... Execution time data storage part 200 ... Control device 210 ... Program execution unit 220 ... Memory 221 ... Test program 230 ... Execution time measurement unit 300 ... Test processing device 310 ... Signal generator 320 ... Measurement device

Claims (6)

An execution time data storage unit for storing execution time data measured for each device test program;
An operation reception unit that receives selection of execution time data to be compared with execution time data to be compared from the stored execution time data;
A data display device comprising: an execution time display control unit that displays a difference value between the execution time data to be compared and the reference execution time data for the selected execution time data. The data display device according to claim 1,
The test program is composed of a plurality of parts,
The execution time display control unit displays a difference value between the execution time data to be compared and the reference execution time data in the partial unit. The data display device according to claim 1,
A history recording unit for recording difference information for each test program;
The execution time display control unit further displays a difference between a test program corresponding to the reference execution time data and a test program corresponding to the execution time data to be compared. Display device. The data display device according to claim 1,
The execution time display control unit further displays a ratio of the execution time data to be compared to the reference execution time data. An execution time data storage step for storing execution time data measured for each device test program;
A selection receiving step for receiving selection of execution time data to be compared with execution time data to be compared from execution time data to be stored;
A data display method comprising: a display step of displaying a difference value between the execution time data to be compared and the reference execution time data for the selected execution time data. An execution time data storage unit for storing execution time data measured for each device test program;
An operation reception unit that receives selection of execution time data to be compared with execution time data to be compared from the stored execution time data;
A computer program that causes an information processing apparatus to function as an execution time display control unit that displays a difference value between execution time data to be compared and reference execution time data for selected execution time data.