JP2010045071A5 - Substrate bonding apparatus, substrate bonding method, detection apparatus, transfer apparatus, and substrate holding member - Google Patents

Substrate bonding apparatus, substrate bonding method, detection apparatus, transfer apparatus, and substrate holding member Download PDF

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JP2010045071A5
JP2010045071A5 JP2008206196A JP2008206196A JP2010045071A5 JP 2010045071 A5 JP2010045071 A5 JP 2010045071A5 JP 2008206196 A JP2008206196 A JP 2008206196A JP 2008206196 A JP2008206196 A JP 2008206196A JP 2010045071 A5 JP2010045071 A5 JP 2010045071A5
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detection hole
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静電力により基板を保持する保持面を有する基板保持部材の前記保持面に一端が開口する検知穴の内部圧力に基づいて、前記保持面への前記基板の保持状態を検知する検知部と、
それぞれが基板を保持する一対の前記基板保持部材に保持された前記各基板を相互に位置合わせする位置合わせ部と、
前記位置合わせ部で位置合わせされた前記各基板を接合する接合部と
を備える基板貼り合わせ装置。
A detection unit for detecting the holding state of the substrate on the holding surface based on the internal pressure of the detection hole having one end opened to the holding surface of the substrate holding member having the holding surface for holding the substrate by electrostatic force;
An alignment unit for mutually aligning the substrates held by a pair of the substrate holding members each holding a substrate;
And a bonding unit for bonding the substrates aligned by the alignment unit.
前記検知部は、前記保持面上の前記基板の有無を検知する請求項1に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 1, wherein the detection unit detects the presence or absence of the substrate on the holding surface. 前記検知部は、前記保持面上での所定の位置からのずれを検知する請求項1に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 1, wherein the detection unit detects a shift from a predetermined position on the holding surface. 前記検知部は、前記検知穴が前記基板により封止されたか否かを検知する請求項1から3のいずれか一項に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to any one of claims 1 to 3, wherein the detection unit detects whether the detection hole is sealed by the substrate. 前記検知部は、前記検知穴の内部を減圧する減圧部を有し、前記検知穴が基板により封止されていない場合に上昇する前記検知穴の内部圧力に基づいて前記検知穴が基板により封止されているか否かを検知する請求項4に記載の基板貼り合わせ装置。   The detection unit has a decompression unit that decompresses the inside of the detection hole, and the detection hole is sealed by the substrate based on the internal pressure of the detection hole that rises when the detection hole is not sealed by the substrate. The substrate bonding apparatus according to claim 4 which detects whether it has stopped. 前記検知部は、前記検知穴の内部に給気する給気部を有する請求項4に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 4, wherein the detection unit has an air supply unit that supplies air to the inside of the detection hole. 前記検知穴の内部に給気された気体が基板を押す力は、前記静電力が基板を引きつける力よりも小さい請求項6に記載の基板貼り合わせ装置。   7. The substrate bonding apparatus according to claim 6, wherein a force by which gas supplied into the detection hole pushes the substrate is smaller than a force by which the electrostatic force attracts the substrate. 前記給気部は、不活性ガスを供給する請求項6または請求項7に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 6, wherein the air supply unit supplies an inert gas. 前記検知部は、前記検知穴が基板により封止されていない場合に減少する前記検知穴の内部圧力に基づいて前記検知穴が基板により封止されているか否かを検知する請求項6から請求項8までのいずれか1項に記載の基板貼り合わせ装置。   The said detection part detects whether the said detection hole is sealed by the board | substrate based on the internal pressure of the said detection hole which reduces when the said detection hole is not sealed by the board | substrate. 9. The substrate bonding apparatus according to any one of items 1 to 8. 前記検知部は、前記検知穴が基板により封止されていない場合に、前記検知穴から漏出した気体を検出する請求項6から請求項8までのいずれか1項に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to any one of claims 6 to 8, wherein the detection unit detects the gas leaked from the detection hole when the detection hole is not sealed by the substrate. 前記基板保持部材には複数の前記検知穴が形成されており、
前記検知部は、前記検知穴が基板により封止されていない場合に、前記検知穴から漏出した気体の組成に対応づけて、前記複数の検知穴のうち当該気体が漏洩した検知穴を特定する請求項10に記載の基板貼り合わせ装置。
A plurality of the detection holes are formed in the substrate holding member,
When the detection hole is not sealed by the substrate, the detection unit identifies the detection hole to which the gas has leaked among the plurality of detection holes in association with the composition of the gas leaked from the detection hole. The substrate bonding apparatus according to claim 10.
前記基板保持部材には複数の前記検知穴が形成されており、
前記検知部は、前記検知穴から漏出した気体を検出した時期に対応づけて、前記複数の検知穴のうち当該気体が漏洩した検知穴を特定する請求項10に記載の基板貼り合わせ装置。
A plurality of the detection holes are formed in the substrate holding member,
The substrate bonding apparatus according to claim 10, wherein the detection unit specifies a detection hole in which the gas leaks among the plurality of detection holes in association with a time when the gas leaked from the detection hole is detected.
静電力により基板を保持する保持面を有する基板保持部材内を通して前記基板に光を照射し、前記基板からの反射光に基づいて、前記保持面への前記基板の保持状態を検知する検知部と、
それぞれが基板を保持する一対の前記基板保持部材に保持された前記各基板を相互に位置合わせする位置合わせ部と、
前記位置合わせ部で位置合わせされた前記各基板を接合する接合部と
を備える基板貼り合わせ装置。
A detection unit which irradiates light to the substrate through the inside of a substrate holding member having a holding surface for holding the substrate by electrostatic force, and detects a holding state of the substrate on the holding surface based on reflected light from the substrate; ,
An alignment unit for mutually aligning the substrates held by a pair of the substrate holding members each holding a substrate;
And a bonding unit for bonding the substrates aligned by the alignment unit.
前記検知部は、前記保持面上の前記基板の有無を検知する請求項13に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 13, wherein the detection unit detects the presence or absence of the substrate on the holding surface. 前記検知部は、前記保持面上での所定の位置からのずれを検知する請求項13に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to claim 13, wherein the detection unit detects a shift from a predetermined position on the holding surface. 前記検知部は、前記基板保持部材の検知穴が前記基板により封止されたか否かを検知する請求項13から15のいずれか一項に記載の基板貼り合わせ装置。   The substrate bonding apparatus according to any one of claims 13 to 15, wherein the detection unit detects whether a detection hole of the substrate holding member is sealed by the substrate. 前記検知部は、前記基板保持部材の保持面に一端が開口する検知穴を通じて前記光を前記基板に照射し、前記保持面に保持した前記基板により反射された前記光の検出結果に基づいて、前記検知穴が基板により封止されていることを検知する請求項16に記載の基板貼り合わせ装置。   The detection unit irradiates the light to the substrate through a detection hole whose one end is opened in the holding surface of the substrate holding member, and the detection unit is based on the detection result of the light reflected by the substrate held on the holding surface. The substrate bonding apparatus according to claim 16, which detects that the detection hole is sealed by the substrate. 前記基板保持部に前記基板が保持されていないことを前記検知部が検知した場合に、前記位置合わせ部および前記接合部の少なくとも一方の動作を停止させる制御部を更に備える請求項1から17のいずれか一項に記載の基板貼り合わせ装置。   18. The control device according to claim 1, further comprising: a control unit configured to stop the operation of at least one of the alignment unit and the bonding unit when the detection unit detects that the substrate is not held by the substrate holding unit. The board | substrate bonding apparatus as described in any one. 前記基板保持部材は、前記保持面のうち前記基板を保持する領域において当該基板の縁部近傍に各々が一端を開口する複数の検知穴を有し、
前記検知部は、前記検知穴の各々について前記基板の前記保持状態を個別に検知する請求項1から18のいずれか一項に記載の基板貼り合わせ装置。
The substrate holding member has a plurality of detection holes each of which opens at one end in the vicinity of the edge of the substrate in a region of the holding surface that holds the substrate,
The substrate bonding apparatus according to any one of claims 1 to 18, wherein the detection unit individually detects the holding state of the substrate for each of the detection holes.
前記検知部が、前記検知穴のひとつにおいて前記基板が保持されていることを検知し、且つ、前記検知穴の他のひとつは前記基板が保持されていることを検知しなかった場合に、前記基板保持部材を前記位置合わせ部および前記接合部とは別の領域に搬送させる制御部を更に備える請求項19に記載の基板貼り合わせ装置。   The detection unit detects that the substrate is held in one of the detection holes, and the other one of the detection holes does not detect that the substrate is held. 20. The substrate bonding apparatus according to claim 19, further comprising: a control unit for transporting the substrate holding member to an area different from the alignment unit and the bonding unit. 前記位置合わせ部は、一方の前記基板保持部材を保持する第一ステージと、他方の前記基板保持部材を保持する第二ステージとを有し、
前記検知部は、前記第一ステージおよび前記第二ステージの少なくとも一方に設けられている請求項1から20のいずれか一項に記載の基板貼り合わせ装置。
The alignment unit includes a first stage that holds one of the substrate holding members, and a second stage that holds the other of the substrate holding members.
The substrate bonding apparatus according to any one of claims 1 to 20, wherein the detection unit is provided on at least one of the first stage and the second stage.
静電力により基板を保持する保持面を有する基板保持部材の前記保持面に一端が開口する検知穴の内部圧力に基づいて、前記保持面への前記基板の保持状態を検知する検知工程と、
それぞれが基板を保持する一対の前記基板保持部材に保持された前記各基板を相互に位置合わせする位置合わせ工程と、
前記位置合わせ工程で位置合わせされた前記各基板を接合する接合工程と
を備える基板貼り合わせ方法。
Detecting the holding state of the substrate on the holding surface based on the internal pressure of the detection hole whose one end is opened to the holding surface of the substrate holding member having the holding surface holding the substrate by electrostatic force;
Aligning the substrates held by a pair of the substrate holding members, each holding a substrate, with each other;
And a bonding step of bonding the substrates aligned in the alignment step.
前記検知工程は、前記検知穴が前記基板により封止されたか否かを検知する工程を有する請求項22に記載の基板貼り合わせ方法。   The substrate bonding method according to claim 22, wherein the detection step has a step of detecting whether the detection hole is sealed by the substrate. 静電力により基板を保持する保持面を有する基板保持部材内を通して前記基板に光を照射し、前記基板からの反射光に基づいて、前記保持面への前記基板の保持状態を検知する検知工程と、
それぞれが基板を保持する一対の前記基板保持部材に保持された前記各基板を相互に位置合わせする位置合わせ工程と、
前記位置合わせ工程で位置合わせされた前記各基板を接合する接合工程と
を備える基板貼り合わせ方法。
A light is irradiated to the substrate through a substrate holding member having a holding surface for holding the substrate by electrostatic force, and a detection step of detecting a holding state of the substrate on the holding surface based on reflected light from the substrate; ,
Aligning the substrates held by a pair of the substrate holding members, each holding a substrate, with each other;
And a bonding step of bonding the substrates aligned in the alignment step.
前記検知工程では、前記基板保持部材の保持面に一端が開口する検知穴を通じて前記光を前記基板に照射し、前記保持面に保持した前記基板により反射された前記光の検出結果に基づいて、前記検知穴が基板により封止されていることを検知する請求項24に記載の基板貼り合わせ方法。   In the detection step, the light is irradiated to the substrate through a detection hole whose one end is opened on the holding surface of the substrate holding member, and the detection result of the light reflected by the substrate held on the holding surface is obtained. The substrate bonding method according to claim 24, detecting that the detection hole is sealed by the substrate. 前記基板保持部材は、前記保持面のうち前記基板を保持する領域において当該基板の縁部近傍に各々が一端を開口する複数の検知穴を有し、
前記検知工程では、前記検知穴の各々について前記基板の前記保持状態を個別に検知し、前記検知工程において、前記検知穴のひとつにおいて前記基板が保持されていることを検知し、且つ、前記検知穴の他のひとつにおいては前記基板が保持されていることを検知しなかった場合に、前記基板保持部材を位置合わせ部および接合部とは別の領域に搬送する搬送工程を有する請求項24または25に記載の基板貼り合わせ方法。
The substrate holding member has a plurality of detection holes each of which opens at one end in the vicinity of the edge of the substrate in a region of the holding surface that holds the substrate,
In the detection step, the holding state of the substrate is individually detected for each of the detection holes, and in the detection step, it is detected that the substrate is held in one of the detection holes, and the detection is performed. 25. The method according to claim 24, further comprising a transfer step of transferring the substrate holding member to an area other than the alignment portion and the bonding portion when it is not detected that the substrate is held in the other one of the holes. The board | substrate bonding method as described in 25.
前記搬送工程の後、前記別の領域に搬送された前記基板保持部材に前記基板を搭載し直す工程を有する請求項26に記載の基板貼り合わせ方法。   The substrate bonding method according to claim 26, further comprising the step of reloading the substrate on the substrate holding member transferred to the other area after the transfer step. 前記基板保持部に前記基板が保持されていないことを前記検知工程で検知した場合に、前記位置合わせ工程および前記接合工程のすくなくとも一方の工程を停止させる工程を有する請求項24から27のいずれか一項に記載の基板貼り合わせ方法。   28. The method according to any one of claims 24 to 27, further comprising the step of stopping at least one of the alignment step and the bonding step when it is detected in the detection step that the substrate is not held by the substrate holding portion. The board | substrate bonding method as described in one term. 静電力により基板を保持する保持面を有する基板保持部材の前記保持面に一端が開口する検知穴の内部圧力に基づいて、前記保持面への前記基板の保持状態を検知する検知部を備える検知装置。   A detection unit including a detection unit that detects the holding state of the substrate on the holding surface based on the internal pressure of the detection hole having one end opened to the holding surface of the substrate holding member having the holding surface that holds the substrate by electrostatic force apparatus. 前記検知部は、前記保持面上の前記基板の有無を検知する請求項29に記載の検知装置。   The detection device according to claim 29, wherein the detection unit detects the presence or absence of the substrate on the holding surface. 前記検知部は、前記保持面上での所定の位置からのずれを検知する請求項29に記載の検知装置。   The detection device according to claim 29, wherein the detection unit detects a deviation from a predetermined position on the holding surface. 前記検知部は、前記検知穴が前記基板により封止されたか否かを検知する請求項29から31のいずれか一項に記載の検知装置。   The detection device according to any one of claims 29 to 31, wherein the detection unit detects whether the detection hole is sealed by the substrate. 前記検知部は、前記検知穴の内部を減圧する減圧部を有し、前記検知穴が基板により封止されていない場合に上昇する前記検知穴の内部圧力に基づいて前記検知穴が基板により封止されているか否かを検知する請求項32に記載の検知装置。   The detection unit has a decompression unit that decompresses the inside of the detection hole, and the detection hole is sealed by the substrate based on the internal pressure of the detection hole that rises when the detection hole is not sealed by the substrate. The detection device according to claim 32, which detects whether or not it is stopped. 前記検知部は、前記検知穴の内部に給気する給気部を有する請求項32に記載の検知装置。   The detection device according to claim 32, wherein the detection unit has an air supply unit that supplies air to the inside of the detection hole. 静電力により基板を保持する保持面を有する基板保持部材内を通して前記基板に光を照射し、前記基板からの反射光に基づいて、前記保持面への前記基板の保持状態を検知する検知部を備える検知装置。   A light is irradiated to the substrate through a substrate holding member having a holding surface for holding the substrate by electrostatic force, and a detection unit for detecting the holding state of the substrate on the holding surface based on the reflected light from the substrate Detection device provided. 前記検知部は、前記保持面上の前記基板の有無を検知する請求項35に記載の検知装置。   The detection device according to claim 35, wherein the detection unit detects the presence or absence of the substrate on the holding surface. 前記検知部は、前記保持面上での所定の位置からのずれを検知する請求項35に記載の検知装置。   The detection device according to claim 35, wherein the detection unit detects a deviation from a predetermined position on the holding surface. 前記検知部は、前記基板保持部材の検知穴が前記基板により封止されたか否かを検知する請求項35から37のいずれか一項に記載の検知装置。   The detection device according to any one of claims 35 to 37, wherein the detection unit detects whether the detection hole of the substrate holding member is sealed by the substrate. 前記検知部は、前記基板保持部材の保持面に一端が開口する検知穴を通じて前記光を前記基板に照射し、前記保持面に保持した前記基板により反射された前記光の検出結果に基づいて、前記検知穴が基板により封止されていることを検知する請求項38に記載の検知装置。   The detection unit irradiates the light to the substrate through a detection hole whose one end is opened in the holding surface of the substrate holding member, and the detection unit is based on the detection result of the light reflected by the substrate held on the holding surface. The detection device according to claim 38, which detects that the detection hole is sealed by a substrate. 基板を保持する保持面を有する基板保持部材の前記保持面に形成された検知穴と前記保持面に保持された前記基板との位置関係に基づいて、前記保持面への前記基板の保持状態を検知する検知部を備える検知装置。   The holding state of the substrate to the holding surface is determined based on the positional relationship between the detection hole formed in the holding surface of the substrate holding member having the holding surface and the substrate held by the holding surface. A detection device provided with a detection unit that detects. 請求項29から40のいずれか一項に記載の検知装置と、
前記基板が保持された前記基板保持部材を移動させる搬送部とを備える搬送装置。
41. A sensing device according to any one of claims 29 to 40,
And a transfer unit configured to move the substrate holding member holding the substrate.
前記検知部は、基板を保持する保持面を有する基板保持部材の前記保持面に一端が開口する検知穴の内部圧力に基づいて、前記保持面への前記基板の保持状態を検知し、
前記搬送部は、前記基板保持部材を負圧により保持する保持領域、および、前記保持領域とは別の領域に開口し、前記検知穴に連通する検知穴延長部を有する請求項41に記載の搬送装置。
The detection unit detects a holding state of the substrate to the holding surface based on an internal pressure of a detection hole having one end opened to the holding surface of the substrate holding member having the holding surface holding the substrate.
42. The carrier according to claim 41, further comprising: a holding area for holding the substrate holding member under negative pressure; and a detection hole extension which is open in an area different from the holding area and which communicates with the detection hole. Transport device.
静電力により基板を保持する保持面と、
前記保持面に一端が開口するように形成された検知穴とを備え、
前記検知穴の内部圧力に基づいて前記保持面への前記基板の保持状態が検知部により検知される基板保持部材。
A holding surface for holding the substrate by electrostatic force;
And a detection hole formed to open at one end to the holding surface,
A substrate holding member in which a holding state of the substrate to the holding surface is detected by a detection unit based on an internal pressure of the detection hole.
静電力により基板を保持する保持面を有するホルダ本体と、
前記保持面に一端が開口するように前記ホルダ本体に形成された検知穴と
を備え、
検知部からの光が前記検知穴を通して前記基板に照射され、前記基板からの反射光に基づいて前記保持面への前記基板の保持状態が検知部により検知される基板保持部材。
A holder body having a holding surface for holding the substrate by electrostatic force;
And a detection hole formed in the holder body such that one end is open in the holding surface,
A substrate holding member, wherein light from a detection unit is irradiated to the substrate through the detection hole, and a holding state of the substrate on the holding surface is detected by the detection unit based on reflected light from the substrate.
前記検知穴は、前記保持面の領域のうち前記保持面に保持された前記基板のデバイスが形成されていない部分に対応する領域に形成されている請求項43または44に記載の基板保持部材。   45. The substrate holding member according to claim 43, wherein the detection hole is formed in a region corresponding to a portion of the region of the holding surface held by the holding surface, in which the device is not formed. 前記検知穴は、前記保持面から前記基板を取り外すときに前記基板を押す押し具が挿通される請求項43から45のいずれか一項に記載の基板保持部材。   46. The substrate holding member according to any one of claims 43 to 45, wherein a pressing tool for pushing the substrate is removed when the substrate is removed from the holding surface. 静電力により基板を保持する保持面と、
前記保持面に形成された検知穴とを有し、
前記検知穴と前記基板との位置関係に基づいて、前記保持面への前記基板の保持状態が検知部により検知される基板保持部材。
A holding surface for holding the substrate by electrostatic force;
And a detection hole formed in the holding surface,
A substrate holding member in which a holding state of the substrate to the holding surface is detected by a detection unit based on a positional relationship between the detection hole and the substrate.
JP2008206196A 2008-08-08 2008-08-08 Detecting device, substrate holding member, transfer device, and bonding device Pending JP2010045071A (en)

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JP2011181632A (en) * 2010-02-26 2011-09-15 Tokyo Electron Ltd Joining method, program, and computer recording medium
JP5477053B2 (en) * 2010-03-02 2014-04-23 株式会社ニコン Overlay apparatus, wafer holder, position detection method, and device manufacturing method
JP5798721B2 (en) * 2010-04-07 2015-10-21 株式会社ニコン Substrate alignment apparatus, substrate bonding apparatus, substrate alignment method, and laminated semiconductor manufacturing method
JP5871453B2 (en) * 2010-05-20 2016-03-01 東京エレクトロン株式会社 Plasma processing apparatus, substrate holding mechanism, and substrate misalignment detection method
JP5707793B2 (en) * 2010-09-08 2015-04-30 株式会社ニコン Substrate bonding apparatus, substrate bonding method, and laminated semiconductor device manufacturing method
JP2012253269A (en) * 2011-06-06 2012-12-20 Nikon Corp Substrate holder and substrate bonding apparatus
JP7186646B2 (en) 2019-03-22 2022-12-09 東京エレクトロン株式会社 SUBSTRATE PROCESSING APPARATUS AND METHOD FOR DETECTING PRESENCE OF FOCUS RING ON PLACEMENT

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6319835A (en) * 1986-07-14 1988-01-27 Hitachi Ltd Wafer supporting condition detecting apparatus
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JPH05335400A (en) * 1992-05-28 1993-12-17 Canon Inc Substrate housing device
JPH11135393A (en) * 1997-10-27 1999-05-21 Mitsubishi Materials Corp Method for alignment in bonding substrates together
JP2006024837A (en) * 2004-07-09 2006-01-26 Olympus Corp Holding mechanism and holding device using same
JP4364106B2 (en) * 2004-11-08 2009-11-11 株式会社東京精密 Vacuum chuck device and adsorption pressure control method
JP2006332563A (en) * 2005-05-30 2006-12-07 Nikon Corp Wafer conveyor, wafer lamination conveyor and method for manufacturing laminated semiconductor device
JP4753888B2 (en) * 2007-01-15 2011-08-24 東京エレクトロン株式会社 Substrate holding mechanism and plasma processing apparatus

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