JP2010043887A - Method of manufacturing radiation detection panel, method of manufacturing radiation image detector, radiation detection panel, and radiation image detector - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a radiation detection panel and the like capable of detecting a radiation image with uniform sharpness in the whole image by uniforming a distance between an end face of a phosphor of a scintillator and a photoelectric conversion element or the like. <P>SOLUTION: The method of manufacturing a radiation detection panel 3 includes: a substrate placing step S2 of placing a substrate 4 on which a plurality of photoelectric conversion elements 15 are formed on a base table 31; a support placing step S3 of placing a support 5 supporting the scintillator 6 on the substrate 4 so that the scintillator 6 is disposed opposite the photoelectric conversion elements 15; an adhesive arrangement step S1 of arranging an adhesive 22 at the periphery part of the scintillator 6 at a gap part between the substrate 4 and the support 5; a film placing step S4 of placing a film 32 so that the support 5 is covered from a surface side opposite a surface 5a of the support 5 on which the scintillator 6 is provided; and a depressurized lamination step S5 of laminating the substrate 4 and the support 5 by depressurizing a space R1 between the base table 31 and the film 32. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a method for manufacturing a radiation detection panel, a method for manufacturing a radiation image detector, a radiation detection panel, and a radiation image detector.

  A radiation image detector (Flat Panel Detector (FPD)) using a radiation detection panel in which a plurality of photoelectric conversion elements such as photodiodes are two-dimensionally arranged on a substrate and a scintillator is arranged on the radiation incident side of the photoelectric conversion element ) Has been developed. Such a radiation image detector usually converts radiation irradiated to the radiation detection panel into light of other wavelengths such as visible light with a scintillator, and makes the converted light incident on a photoelectric conversion element to charge inside the element. And taking out the generated charge, the radiation information is converted and finally detected as an electrical signal.

  As a radiation detection panel, for example, as shown in Patent Document 1, a transparent resin or the like is applied so as to cover a photoelectric conversion element or the like formed on one surface of a substrate, and a planarization layer (scintillator underlayer) ) Is formed, and a scintillator is disposed above, that is, on the radiation incident side thereof. At this time, as a scintillator, as shown in FIG. 27, for example, a phosphor 102 in which a luminescent center substance is activated is grown into a columnar crystal in a base material such as CsI: Tl to form a columnar crystal. There are cases where a large number of scintillators 101 are used. In that case, the scintillators 101 are usually arranged so that the axial direction of the columnar structure is orthogonal to the substrate surface (not shown).

  With this arrangement, light is generated inside each phosphor 102 of the scintillator 101 that has been irradiated with radiation, and the light propagates in the columnar crystal of the phosphor 102 in the axial direction as if it were an optical fiber. Then, it accurately enters a photoelectric conversion element (not shown) located immediately below the columnar crystal of the phosphor 102. Therefore, there is an advantage that the diffusion of the light generated in the phosphor 102 in the direction orthogonal to the axial direction is suppressed, and the sharpness of the obtained radiation image is improved.

  By the way, in Patent Document 1, the phosphor 102 is grown directly or via a support film (not shown) on a flattening layer (scintillator underlayer) for flattening the substrate surface on which the photoelectric conversion element or the like is formed. An embodiment of forming is shown. In this case, as shown in FIG. 28, the end surface Pb of the columnar crystal of the phosphor 102 on the flattening layer 103 side has a flat tip end portion, but the opposite end tip Pa is formed with an acute angle.

  As described above, when the light generated in the phosphor 102 upon irradiation with radiation propagates in the axial direction of the columnar crystal, the light is output from the acute-angled tip Pa as shown by an arrow B in FIG. Compared to the case where light is output, light is more likely to diffuse in the direction perpendicular to the axial direction of the columnar crystal when output from the flat end face Pb. Therefore, the sharpness of the obtained radiographic image may not be improved so much.

  On the other hand, when light is output from the acute-angled tip Pa of the columnar crystal, diffusion of light output from the tip Pa is suppressed as shown by an arrow A in FIG. If the acute-angled tip Pa is disposed so as to face a photoelectric conversion element (not shown), the sharpness of the obtained radiation image is further improved.

Therefore, in Patent Document 1, the scintillator 101 having the columnar crystal structure phosphor 102 is formed on a support substrate (not shown), and the support substrate and the substrate on which the photoelectric conversion element is formed are used as the fluorescence of the scintillator 101. A technique for forming a radiation detection panel is described in which an acute-angled tip Pa of a body 102 and a photoelectric conversion element are bonded to each other. At that time, a scintillator protective layer is formed by covering the sharp-angled tip Pa side of the phosphor 102 of the scintillator 101 with a hot-melt resin, and the substrate and the support substrate are bonded by utilizing the adhesiveness of the scintillator protective layer. It is proposed to match.
JP 2006-78471 A

  However, when the scintillator 101 and the photoelectric conversion element (or the planarization layer 103) are bonded together through a scintillator protective layer having an adhesive action or a newly applied adhesive, as shown in FIG. The length of each columnar crystal of the phosphor 102 of the scintillator 101 is not uniform, the thickness of the scintillator protective layer 104 is not uniform, or the adhesive 105 is not applied with a uniform thickness, The radiation detection panel 100 in which the distance L between the acute-angled tip Pa of the phosphor 102 and the photoelectric conversion element 106 is not necessarily uniform as a whole may be formed.

  29, reference numeral 107 denotes a substrate on which the photoelectric conversion element 106 is formed, 108 denotes a support substrate for the scintillator 101, and 109 denotes wiring such as signal lines. Further, the relative size and thickness of each member, the interval between members, and the like do not necessarily reflect the actual structure of the radiation detection panel.

  As described above, if the distance L between the acute-angled tip Pa of the phosphor 102 and the photoelectric conversion element 106 is not uniform, the light output from the acute-angled tip Pa of the phosphor 102 is generated at a portion where the distance L is short. Since the light is incident on the photoelectric conversion element 106 before being diffused so much, the sharpness of the image is increased. However, in the portion where the distance L is long, the ratio that a part of the light output from the tip Pa of the phosphor 102 is diffused in the direction orthogonal to the axial direction of the columnar crystal and is not incident on the photoelectric conversion element 106 directly below is increased. In that portion, the sharpness of the image is lowered. Therefore, there is a problem that the sharpness of the obtained radiographic image is different for each part of the radiographic image and is not uniform.

  This problem is the same not only when the phosphor 102 of the scintillator 101 is formed in a columnar crystal as described above, but also when it is formed in a layer as shown in FIG. That is, for example, the adhesive 105 applied between the phosphor 102 of the scintillator 101 formed in a layered manner and the photoelectric conversion element 106 or the planarization layer 103 is not applied with a uniform thickness. When the distance L between the end face Pc on the photoelectric conversion element 106 side of the phosphor 102 and the photoelectric conversion element 106 is long or short, the degree of diffusion of light output from the phosphor 102 to the photoelectric conversion element 106 changes depending on the distance L. In some cases, the sharpness of the obtained radiographic image varies for each part of the radiographic image, and is not uniform.

  The present invention has been made in view of the above-described problems, and aims to make the distance between the phosphor end face of the scintillator and the photoelectric conversion element uniform, and detect a radiation image with uniform sharpness in the entire image. An object of the present invention is to provide a method for manufacturing a radiation detection panel, a method for manufacturing a radiation image detector, a radiation detection panel, and a radiation image detector.

In order to solve the above problem, a method for manufacturing a radiation detection panel of the present invention includes
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on a base;
On the substrate, a support for supporting a scintillator that converts radiation into light, and a support mounting step for mounting the scintillator so that the scintillator faces the photoelectric conversion element;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the support from the surface opposite to the surface on which the scintillator of the support is provided;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
It is characterized by having.

The manufacturing method of the radiation detection panel of the present invention,
On the base, a support placing step for placing a support provided with a scintillator that converts radiation into light on one surface;
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on the support so that the photoelectric conversion elements face the scintillator;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the substrate from the surface opposite to the surface on which the plurality of photoelectric conversion elements of the substrate are arranged;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
You may comprise so that it may have.

Moreover, the manufacturing method of the radiographic image detector of the present invention includes:
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on a base;
On the substrate, a support for supporting a scintillator that converts radiation into light, and a support mounting step for mounting the scintillator so that the scintillator faces the photoelectric conversion element;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the support from the surface opposite to the surface on which the scintillator of the support is provided;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
A radiation image detector is manufactured using the radiation detection panel manufactured by the manufacturing process of the radiation detection panel which has this.

A manufacturing method of the radiation image detector of the present invention,
On the base, a support placing step for placing a support provided with a scintillator that converts radiation into light on one surface;
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on the support so that the photoelectric conversion elements face the scintillator;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the substrate from the surface opposite to the surface on which the plurality of photoelectric conversion elements of the substrate are arranged;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
You may comprise so that a radiographic image detector may be manufactured using the radiation detection panel manufactured by the manufacturing process of the radiation detection panel which has this.

Furthermore, the radiation detection panel of the present invention is
A substrate formed by two-dimensionally arranging a plurality of photoelectric conversion elements on one surface;
A support that supports a scintillator that converts radiation into light;
With
The support is placed on the substrate so that the scintillator faces the photoelectric conversion element,
An adhesive is disposed in a gap portion between the substrate and the support and in a portion around the scintillator,
And the internal space partitioned and sealed with the said board | substrate, the said support body, and the said adhesive agent is pressure-reduced from atmospheric pressure, It is characterized by the above-mentioned.

The radiological image detector of the present invention is
A substrate formed by two-dimensionally arranging a plurality of photoelectric conversion elements on one surface;
A support that supports a scintillator that converts radiation into light;
A radiation detection panel having
The support of the radiation detection panel is placed on the substrate so that the scintillator faces the photoelectric conversion element,
An adhesive is disposed in a portion around the scintillator in the gap portion between the substrate and the support of the radiation detection panel,
And the internal space partitioned and sealed with the said board | substrate of the said radiation detection panel, the said support body, and the said adhesive agent is pressure-reduced from atmospheric pressure, It is characterized by the above-mentioned.

  According to the method for manufacturing a radiation detection panel, the method for manufacturing a radiation image detector, the radiation detection panel, and the radiation image detector according to the present invention, the radiation separated by the substrate, the support and the adhesive is sealed. By optimizing the internal space of the detection panel from atmospheric pressure, the end face (tip) of the scintillator phosphor formed into a columnar crystal or layer inside the internal space using the external air pressure is appropriately photoelectric conversion element In addition, the distance between the phosphor and the photoelectric conversion element can be made uniform over the entire area of the radiation detection panel without damaging the scintillator by being brought into contact with the flattening layer. Therefore, the distance between the end face of the phosphor of the scintillator and the photoelectric conversion element can be made uniform.

  Further, since the distance between the end face of the phosphor of the scintillator and the photoelectric conversion element is uniform, the sharpness is uniform in all the photoelectric conversion elements on the substrate of the radiation detection panel, and the sharpness is uniform in the entire image. A radiation image can be detected.

  Furthermore, since the end surface (tip) of the phosphor of the scintillator formed in a columnar crystal form or a layer is in contact with the photoelectric conversion element or the flattening layer without using an adhesive or the like, the end face (tip) of the phosphor. And the photoelectric conversion element are close to each other. Therefore, the light output from the end face (tip) of the phosphor enters the photoelectric conversion element before diffusing in the surface direction of the substrate of the radiation detection panel, and the sharpness in each photoelectric conversion element is further improved. It is possible to improve the overall sharpness of the obtained image.

  DESCRIPTION OF EMBODIMENTS Hereinafter, embodiments of a method for manufacturing a radiation detection panel, a method for manufacturing a radiation image detector, a radiation detection panel, and a radiation image detector according to the present invention will be described with reference to the drawings.

[Radiation detection panel and radiation image detector]
Hereinafter, first, embodiments of the radiation detection panel and the radiation image detector will be described.

  In the following, regarding the relative positional relationship of each member in the radiation detection panel 3 and the radiation image detector 1, particularly the vertical relationship, the radiation incident surface X side of the housing 2 of the radiation image detector 1 is directed upward, A description will be given based on the positional relationship when the surface Y side of the housing 2 opposite to the radiation incident surface X is disposed downward.

  FIG. 1 is an external perspective view of the radiation image detector according to the present embodiment, and FIG. 2 is a cross-sectional view taken along the line AA of FIG. As shown in FIGS. 1 and 2, the radiation image detector 1 is configured by housing a radiation detection panel 3 in a housing 2.

  The housing 2 is formed of a material such as a carbon plate or plastic. 1 and 2 show a case in which the casing 2 is formed of a frame plate 51 and a back plate 52, that is, a lunch box type. However, the casing 2 is integrally formed. A monocoque type is also possible. Further, an indicator 53 and a lid 54 made up of LEDs and the like, a terminal 55 connected to an external device, a power switch 56 and the like are disposed on the side surface portion of the housing 2.

  As shown in FIG. 2, a radiation detection panel 3 including a substrate 4, a support 5, a scintillator 6, and the like is disposed inside the housing 2. A base 7 is disposed below the radiation detection panel 3 via a lead thin plate (not shown), and the base 7 has a PCB substrate 9 on which electronic components 8 and the like are disposed, a buffer member 10, and the like. Is attached.

  In the present embodiment, the substrate 4 is made of a glass substrate. FIG. 3 is a plan view showing a configuration on the substrate 4. A plurality of scanning lines 11 and a plurality of signal lines 12 are arranged on the upper surface (that is, the surface facing the scintillator 6 (see FIG. 2)) 4a of the substrate 4 so as to intersect each other. A plurality of bias lines 13 are arranged in parallel with the plurality of signal lines 12. In this embodiment, each bias line 13 is bound by one connection 14 at one end on the substrate 4. Has been.

  Further, photoelectric conversion elements 15 are respectively provided in the small regions R partitioned by the plurality of scanning lines 11 and the plurality of signal lines 12 on the upper surface 4a of the substrate 4. Thus, in this embodiment, the substrate 4 is formed by arranging a plurality of photoelectric conversion elements in a two-dimensional manner on the upper surface 4a, which is one surface thereof. The photoelectric conversion elements 15 are connected to the bias lines 13 respectively. In this embodiment, a reverse bias voltage is applied from the bias lines 13 to the photoelectric conversion elements 15.

  In this embodiment, as the photoelectric conversion element 15, when irradiated with light output from the scintillator 6 that has been irradiated with radiation, the light energy is absorbed and an electron-hole pair is generated inside, thereby converting the light energy into electric charge. A photodiode for conversion is used. As shown in the enlarged view of FIG. 4, each region R is provided with one TFT (Thin Film Transistor) 16 for each photoelectric conversion element 15, and the source electrode 16s of the TFT 16 is photoelectrically converted. One electrode of the element 15, the drain electrode 16 d is connected to the signal line 12, and the gate electrode 16 g is connected to the scanning line 11.

  Here, the structure of the photoelectric conversion element 15 and the TFT 16 in the present embodiment will be briefly described with reference to enlarged cross-sectional views shown in FIGS. 5 is a cross-sectional view taken along the line BB in FIG. 4, and FIG. 6 is a cross-sectional view taken along the line CC in FIG.

In the portion of the TFT 16, a gate electrode 16g of the TFT 16 is laminated on the upper surface 4a of the substrate 4, and a gate insulating layer 161 made of silicon nitride (SiN _x ) or the like is laminated on the gate electrode 16g. Yes. Further, a semiconductor layer 162 is laminated above, and above that, a source electrode 16 s connected to a first electrode 153 of the photoelectric conversion element 15 described later and the signal line 12 are formed integrally. The drain electrode 16 d is stacked in a state where it is divided by the passivation layer 163.

  In the photoelectric conversion element 15, an insulating layer 151 formed integrally with the gate insulating layer 161 is laminated on the upper surface 4 a of the substrate 4, and formed integrally with the passivation layer 163 thereon. Insulating layer 152 is stacked. A first electrode 153 is stacked on the insulating layer 152, and the first electrode 153 is connected to the source electrode 16 s of the TFT 16 through a hole H formed in the passivation layer 163.

  On the first electrode 153, a so-called n-layer 154 formed in an n-type by doping a hydrogenated amorphous silicon with a group V element, formed of hydrogenated amorphous silicon, and irradiated with electromagnetic waves, forms electron-hole pairs. A so-called i layer 155 which is a conversion layer to be generated, and a so-called p layer 156 formed in a p-type by doping a group III element into hydrogenated amorphous silicon are sequentially stacked from below. Note that the n layer 154, i layer 155, and p layer 156 may be arranged in the reverse order. In addition, the photoelectric conversion element 15 is not limited to a PIN type photodiode, and may be configured by another type of photodiode such as a MIS (Metal-Insulator-Semiconductor) type.

  On the p layer 156, a second electrode 157 made of a transparent electrode such as ITO (Indium Tin Oxide) is laminated and formed so that light reaches the i layer 155 and the like. A bias line 13 for applying a voltage to the second electrode 157 and applying a reverse bias to the photoelectric conversion element 15 is connected to the upper surface of the second electrode 157. The photoelectric conversion element 15 of the present embodiment is driven by applying the reverse bias in this way, and when the TFT 16 is turned on, the charge accumulated in the first electrode 153 is changed in the TFT 16. The signal line 12 is taken out via the source electrode 16s and the drain electrode 16d.

The second electrode 157 and the bias line 13 of the photoelectric conversion element 15 are covered with a coating layer 17 made of silicon nitride (SiN _x ) or the like from above. The coating layer 17 is also formed on the TFT 16 side integrally therewith, and is configured to cover the passivation layer 163, the extended portion of the first electrode 153 of the photoelectric conversion element 15 and the like from above.

  In the radiation detection panel 3, on the upper surface 4a of the substrate 4 configured as described above, input / output terminals (pads) are respectively provided at the edge portions of the scanning lines 11, the signal lines 12, and the connection lines 14 as shown in FIG. 18) is also formed. In each input / output terminal 18, as shown in FIG. 7, a COF (Chip On Film) 19 is anisotropic such as an anisotropic conductive adhesive film (Anisotropic Conductive Film) or an anisotropic conductive paste (Anisotropic Conductive Paste). Crimping is performed through the conductive adhesive material 20. The COF 19 is routed to the back surface 4b side of the substrate 4, and the PCB substrate 9 and the COF 19 are pressure-bonded and connected to each other on the back surface 4b side.

  Further, as shown in FIG. 7, the surface of the upper surface 4a of the substrate 4 where the plurality of photoelectric conversion elements 15 and the like are formed is flattened with surface irregularities due to the plurality of photoelectric conversion elements 15 and the like. When the scintillator 6 to be omitted is disposed so as to face the photoelectric conversion element 15, a transparent resin or the like is applied so as to cover the plurality of photoelectric conversion elements 15, and the planarization layer 21. Is formed.

  In the present embodiment, the planarizing layer 21 is made of a transparent photosensitive resin (that is, transmitting light output from the phosphor 6a of the scintillator 6). In FIG. 7, in addition to the scintillator 6, the electronic component 8 and the like are not shown.

  The scintillator 6 (see FIG. 2) converts incident radiation into light, and has a phosphor as a main component. Specifically, in this embodiment, the scintillator 6 outputs an electromagnetic wave having a wavelength of 300 nm to 800 nm, that is, light ranging from ultraviolet light to infrared light centering on visible light when radiation such as X-rays enters. Is being used. As the phosphor, for example, a material in which a luminescent center substance is activated in a base material such as CsI: Tl is preferably used.

  In this embodiment, the scintillator 6 is formed of various polymer materials such as a cellulose acetate film, a polyester film, and a polyethylene terephthalate film, as shown in the enlarged view of FIG. 8, similarly to the scintillator 100 shown in FIG. 27. The phosphor 6a is formed on the support film 6b by, for example, vapor phase growth, and is made of columnar crystals of the phosphor 6a. As the vapor phase growth method, an evaporation method, a sputtering method, or the like is preferably used.

  In either method, the phosphor 6a can be vapor-phase grown as an independent elongated columnar crystal on the support film 6b. Each columnar crystal of the phosphor 6a is thick in the vicinity of the support film 6b, and becomes thinner toward the tip (lower end in FIG. 8) Pa, and the tip Pa has an acute-angled substantially conical shape. Grown and formed.

  In the present embodiment, the scintillator 6 in which the phosphor 6a is formed as a columnar crystal in this way has the acute-angled tip Pa of the columnar crystal of the phosphor 6a on the lower side, that is, the plurality of photoelectric conversion elements of the substrate 4 described above. The support film 6b is attached to the lower surface 5a side of the support 5 so as to face the 15 side. In this way, the scintillator 6 is supported by the support body 5.

  In the present embodiment, the support 5 is made of a glass substrate, but in addition, it can be made of a resin plate or a resin film such as PET (polyethylene terephthalate).

  FIG. 9 is an enlarged view of an end portion of the radiation detection panel in FIG. In FIG. 9, the relative size and thickness of each member of the radiation detection panel 3, the interval between the members, and the like do not necessarily reflect the actual structure of the radiation detection panel 3.

  As shown in FIG. 9, the radiation detection panel 3 has a support 5 on the substrate 4 so that the acute-angled tip Pa of the phosphor 6 a of the scintillator 6 faces the plurality of photoelectric conversion elements 15 and the planarization layer 21. It is formed on the substrate 4 from above.

  Further, an adhesive 22 is disposed in the gap between the substrate 4 and the support 5 and around the scintillator 6. That is, both the substrate 4 and the support 5 are connected by the adhesive 22, and an internal space C partitioned from the outside by the substrate 4, the support 5 and the adhesive 22 is formed.

  The adhesive 22 is disposed over the entire periphery of the scintillator 6 and is bonded to the substrate 4 and the support 5. The internal space C including the scintillator 6, the photoelectric conversion element 15, and the like is connected to the substrate 4 and the support 5. And the adhesive 22. In addition, the interior of the internal space C is reduced in pressure so that the internal pressure of the internal space C is lower than atmospheric pressure.

  As the adhesive 22, for example, a photo-curing adhesive that cures when irradiated with light or a thermosetting adhesive that cures by heating is preferably used. In addition, since the scintillator 6 may deteriorate when there is moisture, it is more preferable that the air inside the decompressed internal space C is further replaced with an inert gas such as dry air or Ar.

  In the present embodiment, the adhesive 22 contains a bar-shaped spacer S (Sa) having a circular cross section as shown in FIG. 10A or a spherical spacer S (Sb as shown in FIG. 10B). )It is included. Therefore, as shown in FIG. 11, even if an external pressure is applied to the internal space C that is depressurized from the atmospheric pressure and an external force is applied so that the substrate 4 and the support 5 approach each other, the spacer S in the adhesive 22 However, the distance between the substrate 4 and the support 5 is secured against the approach between the substrate 4 and the support 5.

  Next, operations of the radiation image detector and the radiation detection panel according to the present embodiment will be described.

  When radiation is incident from a radiation incident surface X (see FIGS. 1 and 2) of the radiation image detector 1 through a subject (not shown), the radiation is applied to the support 5 of the radiation detection panel 3 (see FIG. 9 and the like). The light passes through and enters the scintillator 6, and is absorbed by the phosphor 6 a of the scintillator 6. Then, light is generated in the phosphor 6 a and is output toward the photoelectric conversion element 15 formed on the substrate 4 in a two-dimensional array.

  At this time, if the acute-angled tip Pa of the columnar crystal of the phosphor 6a of the scintillator 6 is arranged so as to face the photoelectric conversion element 15 as in this embodiment, the generated light passes through the columnar crystal of the phosphor 6a. When propagating in the axial direction and outputting from the tip Pa, diffusion of light in the direction orthogonal to the axial direction is suppressed (see FIG. 27 described above), so the output light is directly below the phosphor 6a. Is accurately incident on the photoelectric conversion element 15 and converted into an electric signal by the photoelectric conversion element 15. Therefore, the sharpness of the obtained radiation image is improved.

  In the radiation image detector 1 and the radiation detection panel 3 according to the present embodiment, the internal space C partitioned from the external space by the substrate 4, the support 5, and the adhesive 22 is sealed, and the internal pressure is higher than atmospheric pressure. Since the inside of the internal space C is depressurized so as to be lowered, the substrate 4 and the support 5 are constantly pressed from the outside toward the internal space C side by the external air pressure.

  Therefore, the acute-angled tip Pa of the phosphor 6a of the scintillator 6 is in contact with the photoelectric conversion element 15 and the planarizing layer 21, and the distance between the acute-angled tip Pa of the phosphor 6a and the photoelectric conversion element 15 is It becomes uniform throughout the radiation detection panel 3.

  That is, in this embodiment, if the planarization layer 21 is formed on the plurality of photoelectric conversion elements 15 so that the thickness of the planarization layer 21 is constant over the entire area of the radiation detection panel 3, the planarization layer 21 is flat. When the tip Pa of the phosphor 6a of the scintillator 6 is in contact with the surface of the scintillator 6, the distance between the tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 is the distance corresponding to the thickness of the planarization layer 21. It becomes.

  Then, the internal space C is depressurized from the atmospheric pressure, and the tip Pa of all the phosphors 6a of the scintillator 6 is brought into contact with the surface of the flattening layer 21 by the external air pressure. The distance between the tip Pa and the photoelectric conversion element 15 can be configured to be uniform over the entire area of the radiation detection panel 3.

  Then, the acute-angled tip Pa of the phosphor 6a of the scintillator 6 is brought into contact with the photoelectric conversion element 15 and the planarization layer 21 in this way, so that the distance between the acute-angled tip Pa of the phosphor 6a and the photoelectric conversion element 15 is increased. By making it uniform throughout the radiation detection panel 3, it is possible to obtain a radiation image having a uniform sharpness throughout the image.

  Note that the adhesive 22 may be crushed by being pressed by the external pressure during the production of the radiation detection panel 3 or with time. In addition, the diameter of the spacer S in the adhesive 22 described above, that is, if the rod-shaped spacer Sa has a circular cross section as shown in FIG. In the case of the spherical spacer Sb as shown, when the adhesive 22 is crushed by the external pressure when the spherical diameter is too small, the adhesive 22 can maintain the distance between the substrate 4 and the support 5. As shown in FIG. 12, the substrate 4 and the support 5 may approach each other.

  As described above, when the substrate 4 and the support 5 come close to each other, an external force due to the external pressure works strongly between the scintillator 6 and the photoelectric conversion element 15 or the planarization layer 21 via the substrate 4 or the support 5. Therefore, the acute-angled tip Pa of the phosphor 6a of the scintillator 6 may be strongly pressed against the planarizing layer 21 or the like and damaged. When the acute-angled tip Pa of the phosphor 6a is damaged, the sharpness of the obtained radiographic image is lowered.

  If the diameter of the spacer S is too large, the acute-angled tip Pa of the phosphor 6a of the scintillator 6 is separated from the planarization layer 21 at a portion close to the adhesive 22, and the distance between the scintillator 6 and the photoelectric conversion element 15 is increased. Will be far away. On the other hand, in the scintillator 6 portion far from the adhesive 22, the tip Pa of the phosphor 6 a comes into contact with the surface of the planarization layer 21 due to the external air pressure, so that the distance between the scintillator 6 and the photoelectric conversion element 15 becomes short. Therefore, the distance between the acute-angled tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 is not uniform throughout the radiation detection panel 3, and the sharpness of the obtained radiographic image is impaired.

  Therefore, as shown in FIG. 11, the spacer S has a diameter equal to the thickness of the scintillator 6 or the flattening layer 21, that is, the sharp tip Pa of the phosphor 6 a of the scintillator 6. It is preferable to use a spacer that is substantially the same as the distance between the substrate 4 and the support 5 when placed so as to contact the surface of the substrate.

  Further, by using such a spacer S, the acute angle tip Pa of the phosphor 6a of the scintillator 6 is appropriately brought into contact with the planarization layer 21 by utilizing the external pressure, and the scintillator 6 is not damaged. The distance between the acute-angled tip Pa of the phosphor 6a and the photoelectric conversion element 15 can be made uniform over the entire area of the radiation detection panel 3. For this reason, it is possible to obtain a radiation image with uniform sharpness in the entire image.

  As described above, according to the radiation image detector 1 and the radiation detection panel 3 according to the present embodiment, the sealed internal space C defined by the substrate 4, the support 5, and the adhesive 22 is depressurized from the atmospheric pressure. In this way, the acute angle tip Pa of the phosphor 6a of the scintillator 6 is appropriately brought into contact with the flattening layer 21 inside the internal space C using the external air pressure, and the scintillator 6 is not damaged. The distance between the acute-angled tip Pa of the body 6a and the photoelectric conversion element 15 can be made uniform throughout the radiation detection panel 3, and the tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 or the like It becomes possible to make the distance uniform.

  Further, since the distance between the tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 and the like is uniform, the sharpness is uniform in all the photoelectric conversion elements 15 on the substrate 4 of the radiation detection panel 3, and the image It is possible to detect a radiographic image with uniform sharpness as a whole.

  Furthermore, since the tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 and the flattening layer 21 contact each other without an adhesive or the like, the distance between the tip Pa of the phosphor and the photoelectric conversion element 15 is increased. Get closer. Therefore, the light output from the tip Pa of the phosphor enters the photoelectric conversion element 15 before diffusing in the surface direction of the substrate 4 of the radiation detection panel 3, and the sharpness in each photoelectric conversion element 15 is further improved. In addition, it is possible to improve the overall sharpness of the obtained image.

  In the present embodiment, the case where the phosphor 6a of the scintillator 6 has a columnar crystal structure as described above is described. However, the phosphor 6a of the scintillator 6 does not necessarily have a columnar crystal structure. The present invention can be similarly applied to the case where a scintillator in which the phosphor is formed in layers as shown in FIG. 30 is used.

That is, as shown in FIG. 13, a phosphor 6a made of, for example, GOS (Gd ₂ O ₂ S: Tb) or the like is applied to a support 5 to form a scintillator 6 ^* in a layer shape, and the scintillator 6 ^* The support 5 is placed on the substrate 4 so as to face the conversion element 15, and the internal space C is sealed with the substrate 4, the support 5, and the adhesive 22 to reduce the pressure.

With this configuration, the end surface Pc of the scintillator 6 ^* on the side of the photoelectric conversion element 15 of the phosphor 6 a of the scintillator 6 ^* with respect to the planarization layer 21 is caused by the external air pressure, as in the case of the present embodiment. Since it comes into contact with the entire surface, the distance between the end face Pc of the phosphor 6a and the photoelectric conversion element 15 can be made uniform over the entire area of the radiation detection panel 3, and the end face of the phosphor 6a of the scintillator 6 can be made uniform. It is possible to make the distance between Pa and the photoelectric conversion element 15 uniform. Therefore, the sharpness is uniform in all the photoelectric conversion elements 15 on the substrate 4 of the radiation detection panel 3, and it is possible to detect a radiation image having a uniform sharpness in the entire image.

Further, since the end face Pc of the phosphor 6a of the scintillator 6 ^* formed in a layer form and the photoelectric conversion element 15 and the planarizing layer 21 are brought into contact without an adhesive or the like, the end face Pc of the phosphor 6a and the photoelectric conversion element 15 The distance with the conversion element 15 approaches. Therefore, the light output from the end face Pc of the phosphor 6a enters the photoelectric conversion element 15 before diffusing in the surface direction of the substrate 4 of the radiation detection panel 3, and the sharpness in each photoelectric conversion element 15 is further increased. This improves the overall sharpness of the obtained image.

  The scintillator in which the phosphors 6a are formed in layers can be used as the scintillator 6. The same applies to the manufacturing method of the radiation detection panel and the manufacturing method of the radiation image detector according to the present invention described below. .

On the other hand, as described above, the length of each columnar crystal of the phosphor 6a is not uniform in the scintillator 6 shown in FIG. 9, or the thickness of the phosphor 6a is not uniform in the scintillator 6 ^* shown in FIG. There is.

  In such a case, the acute-angled tip Pa of the columnar crystal of the phosphor 6a and the end surface Pc of the layered phosphor 6a are pressed against the surfaces of the photoelectric conversion element 15 and the planarizing layer 21 by being pressed by the external pressure. Then, the substrate 4 and the support 5 do not become flat as shown in FIGS. 9 and 13, and the substrate 4 and the support 5 are formed according to the non-uniformity of the length and thickness of the columnar crystals of the phosphor 6a. The support 5 may be undulated or uneven. However, even if the substrate 4 and the support 5 of the radiation detection panel 3 of the radiation image detector 1 are wavy or uneven, the radiation image normally detected by the radiation detection panel 3 is not affected. .

[Method for manufacturing radiation detection panel and method for manufacturing radiation image detector]
Next, a method for manufacturing a radiation detection panel and a method for manufacturing a radiation image detector according to the present embodiment will be described. The radiation detection panel 3 and the radiation image detector 1 are manufactured according to the flowcharts shown in FIGS.

  In manufacturing the radiation detection panel 3 and the radiation image detector 1, there are roughly two methods. First, the support 5 that supports the scintillator 6 is placed on the substrate 4 according to the flowchart of FIG. A method for manufacturing the radiation detection panel 3 will be described.

  In the present embodiment, a chamber 30 having a base 31, a film 32, and a lid member 33 as shown in FIG.

  O-ring-shaped seal members 34 a and 34 b are respectively disposed on the side surfaces of the base 31 and the lid member 33 of the chamber 30. The seal members 34 a of the base 31 and the seal member 34 b of the lid member 33 move up and down. The film 32 is hermetically fixed so as to sandwich the film 32.

  The bottom portion of the base 31 is formed in a planar shape, and a decompression pump 35 is attached through an opening (not shown). The film 32 is made of a material that transmits ultraviolet rays and has elasticity. In the present embodiment, an ultraviolet irradiation device 36 is attached inside the lid member 33. Furthermore, in this embodiment, the pump 37 is attached to the lid member 33 through an opening (not shown). Note that the lid member 33 can be configured to provide a simple opening instead of providing the pump 37.

  In manufacturing the radiation detection panel 3, first, as shown in FIG. 18, an adhesive 22 including a spacer S is applied around the photoelectric conversion element 15 and the planarization layer 21 on the upper surface 4 a of the substrate 4. Arrange (step S1 in FIG. 14). As will be described later, the substrate 4 and the support 5 are placed so that the photoelectric conversion element 15 and the scintillator 6 face each other. At this time, the adhesive 22 is positioned in a portion around the scintillator 6. The adhesive 22 is applied on the upper surface 4a of the substrate 4 in advance.

  Subsequently, as shown in FIG. 19, the substrate 4 on which the adhesive 22 is arranged in this way is placed on the base 31 of the chamber 30 (step S2 in FIG. 14). Then, as shown in FIG. 20, the support 5 is placed on the substrate 4 from above so that the scintillator 6 faces the photoelectric conversion element (step S3 in FIG. 14). In the present embodiment, by placing the support 5 on the substrate 4 to which the adhesive 22 has been applied in this way, the adhesive 22 is placed in the gap between the substrate 4 and the support 5 in the scintillator. 6 is arranged around the periphery of 6.

  Instead of placing the adhesive 22 by placing the support 5 on the substrate 4 to which the adhesive 22 has been applied in advance as in the present embodiment, as shown in FIG. It is also possible to apply the adhesive 22 in the gap portion between the substrate 4 and the support 5 by applying it on the support 5 in advance and placing it on the substrate 4. At that time, the adhesive 22 is applied in advance around the scintillator 6 of the support 5. Further, after the support 5 is placed on the substrate 4, the adhesive 22 is inserted into the gap portion between the substrate 4 and the support 5, and the adhesive 22 is disposed around the scintillator 6. It is also possible to do.

  Subsequently, as shown in FIG. 17, a film 32 is placed so as to cover the support 5 from above the support 5 of the radiation detection panel 3 placed on the base 31 (see FIG. 14). Step S4), the lid member 33 of the chamber 30 is attached from above.

  As described above, in order to eliminate moisture (water vapor) in the internal space C partitioned from the outside by the substrate 4, the support 5, and the adhesive 22, air in the chamber 30, or at least a radiation detection panel. 3, the air in the space between the base 31 of the chamber 30 and the film 32 (hereinafter referred to as the lower space R1; see FIG. 17) is replaced with dry air or inert gas.

  Then, the vacuum pump 35 is driven to depressurize the space between the base 31 of the chamber 30 including the radiation detection panel 3 and the film 32 (hereinafter, referred to as a lower space R1; see FIG. 17). The internal space C (see FIG. 9 and the like) of the detection panel 3 is depressurized to a pressure lower than atmospheric pressure (for example, 0.2 atmospheric pressure to 0.5 atmospheric pressure).

  Since the space between the lid member 33 of the chamber 30 and the film 32 (hereinafter referred to as the upper space R2; see FIG. 17) remains at atmospheric pressure, when the lower space R1 of the chamber 30 is depressurized, FIG. As shown in FIG. 3, the film 32 comes to stick from above the support 5 of the radiation detection panel 3, and the radiation detection panel 3 is connected to the atmospheric pressure of the upper space R 2 and the weight of the support 5 from above through the film 32. And the substrate 4 and the support 5 are bonded together (step S5 in FIG. 14).

  At that time, if the spacer 22 as described above is included in the adhesive 22, the sharp tip Pa of the phosphor 6 a of the scintillator 6 is strongly pressed against the flattening layer 21 and the like due to an external force due to the external pressure. It is possible to prevent the sharp edge Pa of the phosphor 6a from floating from the surface of the planarizing layer 21 or the like.

  At this time, the pump 37 on the lid member 33 side of the chamber 30 is driven to appropriately pressurize the upper space R2 of the chamber 30 so that the substrate 4 and the support 5 of the radiation detection panel 3 are securely bonded together. The pressure adjustment of the upper space R2 of the chamber 30 is appropriately performed.

  In the present embodiment, basically, the substrate 4 and the support 5 are bonded together under a reduced pressure environment via the adhesive 22 as described above, and the substrate 4, the support 5, and the adhesive 22 are bonded together. Thus, the internal space C (see FIG. 9) partitioned from the outside is in a state where the internal pressure is reduced so as to be lower than the atmospheric pressure. Then, the radiation detection panel 3 is flattened so that the acute-angled tip Pa of the phosphor 6a of the scintillator 6 and the end surface Pc of the layered phosphor 6a cover the plurality of photoelectric conversion elements 15 formed on the substrate 4 and the same. It can form in the state contact | abutted on the surface of the formation layer 21. FIG.

  In the present embodiment, the adhesive 22 is cured by further irradiating the radiation detection panel 3 bonded in the state of FIG. 22 with ultraviolet rays from the ultraviolet irradiation device 36 provided on the lid member 33 of the chamber 30. The board | substrate 4 and the support body 5 are bonded together reliably (step S6 of FIG. 15). For this reason, in the present embodiment, a photo-curing type, in particular, an ultraviolet curing type adhesive is used as the adhesive 22, and the support 5 is formed of a material that transmits light, particularly ultraviolet rays.

  Further, in order to prevent the ultraviolet rays transmitted through the support 5 from adversely affecting the scintillator 6, the photoelectric conversion element 15, etc., as shown in FIG. 23, light (ultraviolet light) is interposed between the support 5 and the scintillator 6. ) Is preferably formed. The light shielding layer 23 is not provided between the support 5 and the scintillator 6 or between the support 5 and the scintillator 6 and the surface of the support 5 opposite to the surface on which the scintillator 6 is provided. It is also possible to form on the side.

  On the other hand, as described above, in the adhesive placement step (step S1) and the support placing step (step S3 in FIGS. 14 and 15), the lower space R1 of the chamber 30 is in an atmospheric pressure state where the pressure has not yet been reduced. When the adhesive 22 is disposed over the entire periphery of the scintillator 6 from the beginning, the pressure inside the internal space C that is partitioned and sealed by the substrate 4, the support 5, and the adhesive 22 becomes atmospheric pressure.

  In this state, when the pressure in the lower space R1 of the chamber 30 is reduced in the decompression bonding step (step S5), the air inside the internal space C (or dry air or inert gas; the same applies hereinafter) is not successfully drawn. The pressure inside the internal space C remains at atmospheric pressure, or the seal by the soft adhesive 22 is broken and air is blown out from the internal space C to the lower space R1, and the seal by the adhesive 22 is broken. It may be done.

  In these cases, when at least the radiation detection panel 3 is taken out from the chamber 30 to atmospheric pressure, the pressure inside the internal space C partitioned from the outside by the substrate 4, the support 5 and the adhesive 22 remains atmospheric pressure. Therefore, the requirement essential to the present invention that the internal space C is depressurized from the atmospheric pressure may not be realized.

  Therefore, in the present embodiment, as shown in FIG. 24A, the adhesive 22 is disposed in the gap portion between the substrate 4 and the support 5 of the radiation detection panel 3, but is bonded over the entire periphery of the scintillator 6. Rather than disposing the agent 22, the adhesive 22 is formed on the substrate 4 or the support 5 so that one or a plurality of openings 24 that communicate the internal space C with the outer space are formed in the adhesive 22 portion. They are arranged in advance (step S1 in FIGS. 14 and 15).

  In this state, when the decompression bonding step (step S5) is executed to decompress the lower space R1 of the chamber 30, the air inside the internal space C is drawn out from the opening 24 of the adhesive 22, and the internal space C The pressure inside is also reliably reduced. If the size of the opening of the opening 24 is formed in an appropriate size in advance, as shown in FIG. 24B, the atmospheric pressure from the upper space R2 in the decompression bonding step (step S5). When the substrate 4 and the support 5 of the radiation detection panel 3 come close to each other by pressing or the like, the adhesive 22 is thereby spread in the horizontal direction, so that the opening 24 is automatically sealed.

  Then, in this state, as shown in FIG. 22, ultraviolet rays are irradiated from the ultraviolet irradiation device 36 in the chamber 30, and the adhesive 22 is cured (step S 6 in FIG. 15), and the substrate 4, the support 5, Is securely bonded, and the internal space C is sealed in a state where the pressure is reduced from the atmospheric pressure (step S7). It is also possible to configure such that the sealing is ensured by applying a new adhesive to the automatically sealed opening 24 and curing it.

  Alternatively, the opening 24 of the adhesive 22 can be formed larger, and after the reduced pressure bonding step (step S5), the adhesive can be applied again to the opening 24 and sealed. is there. As shown in FIG. 25, when the opening 24 of the adhesive 22 is formed wider, in that state, a decompression bonding step (step S5 in FIGS. 14 and 15) is executed to decompress the lower space R1 of the chamber 30. Then, the air inside the internal space C is drawn out from the opening 24 of the adhesive 22, and the pressure inside the internal space C is reduced.

  Then, as shown in FIG. 22, ultraviolet rays are irradiated from the ultraviolet irradiation device 36 in the chamber 30 in this state, the adhesive 22 is cured, and the substrate 4 and the support 5 are securely bonded together (FIG. 15). Step S6). However, in this case, unlike the above case, even if the adhesive 22 is spread in the horizontal direction, the opening 24 is not sealed and remains open.

  In the chamber 30 of the present embodiment, when the lower space R1 is depressurized, the film 32 of the chamber 30 sticks to the radiation detection panel 3, and in this state, a new adhesive is applied to the opening 24 to open the opening. It is difficult to perform the operation of sealing the portion 24. Therefore, although not shown in the drawings, in the present embodiment, after the reduced pressure bonding step (step S5), the radiation detection panel 3 is once taken out from the chamber 30 and transferred to another chamber equipped with a syringe-like dispenser and an ultraviolet irradiation device. Change.

  During this transfer, air enters the interior space C from the opening 24 and the pressure in the interior space C returns to atmospheric pressure. In this state, the space C is depressurized, and an ultraviolet curable adhesive 25 made of the same material as the adhesive 22 is applied from the dispenser to the opening 24 in this state (see FIG. 26). A different type of adhesive 25 from the adhesive 22 may be applied. Then, the adhesive 25 is cured by irradiating ultraviolet rays from the ultraviolet curing device, and the opening 24 is sealed (step S7 in FIG. 15).

  In addition, before depressurizing the inside of the other chamber and depressurizing the internal space C of the radiation detection panel 3, the air in the chamber is replaced with an inert gas such as dry air or Ar and then depressurized. For example, the air inside the internal space C is preferably replaced with dry air or the like, and deterioration of the scintillator 6 due to moisture can be prevented.

  Next, in the manufacture of the radiation image detector 1, as shown in the flowchart of FIG. 16, when the manufacturing process (step S10) of the radiation detection panel 3 is completed as described above, then, as described above, Attaching an anisotropic conductive adhesive film or applying an anisotropic conductive paste to the input / output terminal 18 (see FIG. 7) formed on the substrate 4 bonded to the support 5 of the scintillator 6, A COF crimping process for crimping the COF 19 is performed (step S11 in FIG. 16), and further, a COF energization inspection process (step S12) for inspecting the energization between the input / output terminal 18 and the COF 19 is performed.

  Subsequently, a PCB substrate crimping process is performed in which the COF 19 is routed to the back surface 4b (see FIG. 7) side of the substrate 4 and the PCB substrate 9 and the COF 19 are crimped and connected (FIG. 16). Step S13).

  And after the corrosion prevention process which apply | coats silicon rubber and resin for corrosion prevention with respect to the part which may corrode, such as the exposed part of the metal members in the board | substrate 4 etc. (step S14), A module forming process is performed in which a support base, a base, etc. (not shown) are fixed to the radiation detection panel 3 to which the COF 19 and the PCB substrate 9 are attached as described above to be modularized (step S15).

  Finally, the modularized radiation detection panel 3 is accommodated in the housing 2 (see FIG. 1 and the like) (step S16 in FIG. 16), and the radiation image detector 1 is manufactured. .

  As described above, according to the manufacturing method of the radiation detection panel and the manufacturing method of the radiation image detector according to the present embodiment, the substrate 4 and the support 5 of the radiation detection panel 3 in a reduced-pressure atmosphere reduced from the atmospheric pressure. Can be bonded together via the adhesive 22, and the sealed internal space C defined by the substrate 4, the support 5 and the adhesive 22 can be reliably depressurized from the atmospheric pressure.

  Therefore, in the radiation detection panel 3 of the radiation image detector 1 manufactured by the manufacturing method according to the present embodiment, the acute-angled tip of the phosphor 6a of the scintillator 6 is used inside the internal space C using the external pressure. The distance between the acute-angled tip Pa of the phosphor 6a and the photoelectric conversion element 15 is made uniform over the entire area of the radiation detection panel 3 without damaging the scintillator 6 by appropriately bringing Pa into contact with the planarization layer 21. It becomes possible to do. Therefore, the distance between the end face Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 or the like can be made uniform.

  Further, in the radiation image detector 1 and the radiation detection panel 3 manufactured by the manufacturing method according to the present embodiment, the distance between the end face Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 or the like becomes uniform. The sharpness is uniform in all the photoelectric conversion elements 15 on the substrate 4 of the radiation detection panel 3, and it is possible to detect a radiation image having a uniform sharpness in the entire image.

  Furthermore, since the tip Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 and the flattening layer 21 contact each other without an adhesive or the like, the distance between the tip Pa of the phosphor and the photoelectric conversion element 15 is increased. Get closer. Therefore, the light output from the tip Pa of the phosphor enters the photoelectric conversion element 15 before diffusing in the surface direction of the substrate 4 of the radiation detection panel 3, and the sharpness in each photoelectric conversion element 15 is further improved. In addition, it is possible to improve the overall sharpness of the obtained image.

  In this embodiment, as shown in FIG. 22 and the like, the substrate 4 of the radiation detection panel 3 is placed on the base 31 of the chamber 30, and the support 5 is placed from above the support 4. A case has been described in which the lower space R1 of the film 32 placed so as to cover the support 5 from the upper side of 5 is decompressed and the substrate 4 and the support 5 are attached.

  When the radiation detection panel 3 is manufactured in this way, the length of each columnar crystal of the phosphor 6a in the scintillator 6 is not uniform or fluorescent, although it varies depending on the thickness and rigidity of the substrate 4 and the support 5. When the thickness of the body 6a is not uniform, the substrate 4 placed on the flat base 31 of the chamber 30 has a flat plate shape, and corrugations and irregularities are likely to occur on the support 5 side.

  However, as described above, even if the support 5 of the radiation detection panel 3 of the radiation image detector 1 is wavy or uneven, the radiation image normally detected by the radiation detection panel 3 is not affected. Since the distance between the end face Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion elements 15 and the like becomes uniform, and the sharpness is uniform in all the photoelectric conversion elements 15 on the substrate 4 of the radiation detection panel 3, the entire image In this case, the above-described effect that it becomes possible to detect a radiation image with uniform sharpness is effectively exhibited.

  Contrary to the present embodiment, the support 5 of the radiation detection panel 3 is placed on the base 31 of the chamber 30 and the substrate 4 is placed from above, so that the radiation detection panel 3 and It is also possible to configure so as to manufacture the radiation image detector 1 using

  In this case, in the flowcharts shown in FIG. 14 and FIG. 15, the order of the substrate placing process (step S2) and the support placing process (step S3) is switched. In each drawing shown in FIG. 17 and subsequent figures, the vertical relationship between the substrate 4 and the support 5 (and the photoelectric conversion element 15 and the scintillator 6 associated therewith) in the chamber 30 is switched.

  In this case, if the length of each columnar crystal of the phosphor 6a in the scintillator 6 is not uniform or the thickness of the phosphor 6a is not uniform, the flat base of the chamber 30 is contrary to the above. The support 5 placed on the substrate 31 has a flat plate shape and is likely to have undulations and irregularities on the substrate 4 side. However, as described above, even if undulations and irregularities occur in the substrate 4, radiation detection is usually performed. The radiation image detected by the panel 3 is not affected, the distance between the end face Pa of the phosphor 6a of the scintillator 6 and the photoelectric conversion element 15 and the like is uniform, and all photoelectric elements on the substrate 4 of the radiation detection panel 3 are present. Since the sharpness is uniform in the conversion element 15, the above-described effect that it is possible to detect a radiation image with uniform sharpness in the entire image is effectively exhibited.

  In this case, in the state shown in FIG. 22 (the substrate 4 exists above the support 5), the adhesive 22 is cured by irradiating ultraviolet rays from the ultraviolet irradiation device 36 to support the substrate 4. When the body 5 is bonded together, the substrate 4 is previously formed of a material that transmits ultraviolet rays. Further, in order to prevent the ultraviolet rays transmitted through the substrate 4 from adversely affecting the scintillator 6, the photoelectric conversion element 15, etc., the substrate 4, the photoelectric conversion element 15, etc., as in the case of the support 5 shown in FIG. 23. It is preferable to form a light-shielding layer that shields ultraviolet rays between them. Further, the light shielding layer is not provided between the substrate 4 and the photoelectric conversion element 15 or the like, or between the substrate 4 and the photoelectric conversion element 15 or the like, and the surface of the substrate 4 provided with the photoelectric conversion element 15 or the like May be formed on the opposite surface side.

  On the other hand, when a thermosetting adhesive is used as the adhesive 22, another chamber for sealing the inside of the chamber 30 or the opening 24 (see FIG. 26 and the like) of the adhesive 22 with the adhesive 25. A heating device (not shown) is provided in advance, and the adhesives 22 and 25 are heated and cured by the heating device.

It is an external appearance perspective view of the radiographic image detector which concerns on this embodiment. It is sectional drawing which follows the AA line of FIG. It is a top view which shows the structure on a board | substrate. It is an enlarged view which shows the structure of the photoelectric conversion element, thin film transistor, etc. which were formed in the small area | region on the board | substrate of FIG. It is sectional drawing which follows the BB line in FIG. It is sectional drawing which follows the CC line in FIG. It is a figure explaining the board | substrate with which COF, a PCB board | substrate, etc. were attached. It is an expansion schematic diagram explaining the structure of the scintillator in which fluorescent substance has a columnar structure, and the sticking to the support body. It is an expanded sectional view of the radiation detection panel in FIG. It is a figure which shows the example of the spacer contained in an adhesive agent, (A) represents the cross-section circular rod-shaped spacer, (B) represents the spherical spacer. It is a figure explaining the function of the spacer which secures the space | interval of a board | substrate and a support body against the approach of a board | substrate and a support body by external force. It is a figure showing the state which the substrate and the support body approached because the diameter of the spacer was too small. It is an expanded sectional view of a radiation detection panel when the phosphor of a scintillator is formed in layers. It is a flowchart which shows the manufacturing method of the radiation detection panel which concerns on this embodiment. It is a flowchart which shows the manufacturing method of the radiation detection panel which concerns on this embodiment. It is a flowchart which shows the manufacturing method of the radiographic image detector which concerns on this embodiment. It is a figure explaining the structure of the chamber used for manufacture of a radiation detection panel. It is a figure showing the adhesive agent containing the spacer previously apply | coated to the board | substrate. It is a figure showing the board | substrate mounted on the base of a chamber. It is a figure showing the support body mounted on the board | substrate on the base of a chamber. It is a figure showing the adhesive agent containing the spacer previously apply | coated to the support body. It is a figure explaining the state where the space between a chamber base and a film was pressure-reduced and the board | substrate and the support body were bonded together. It is a figure showing the light shielding layer provided between the support body and the scintillator. (A) It is a figure showing the opening part formed in the adhesive agent part between the board | substrate of a radiation detection panel, and a support body, (B) The opening part by which the adhesive agent was expanded in the horizontal direction and was sealed. FIG. It is a figure showing the opening part formed in the adhesive agent part between the board | substrate of a radiation detection panel, and a support body. It is a figure showing the adhesive agent apply | coated in order to seal the opening part of an adhesive agent. It is an expansion schematic diagram explaining the structure of the scintillator in which fluorescent substance has a columnar structure. It is a figure showing the scintillator formed by growing a fluorescent substance directly on a planarization layer. It is a figure showing the scintillator with which the length of each columnar crystal of fluorescent substance is not uniform. It is a figure showing the scintillator to which the adhesive agent between fluorescent substance and the planarization layer is not apply | coated with equal thickness.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Radiation image detector 3 Radiation detection panel 4 Substrate 4a Surface 5 Support body 5a Surface 6 provided with scintillator 6 Scintillator 6a Phosphor 15 Photoelectric conversion element 22, 25 Adhesive 23 Light shielding layer 24 Opening 31 Base 32 Film C Inside Space Pa An acute-angled tip R1 of the columnar crystal of the phosphor A space between the base and the film (lower space)
S spacer

Claims (23)

A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on a base;
On the substrate, a support for supporting a scintillator that converts radiation into light, and a support mounting step for mounting the scintillator so that the scintillator faces the photoelectric conversion element;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the support from the surface opposite to the surface on which the scintillator of the support is provided;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
The manufacturing method of the radiation detection panel characterized by having. As the adhesive, a photocurable adhesive is used,
As the support, a support formed of a light transmissive material is used,
The light-shielding layer is formed between the support and the scintillator or on the surface of the support opposite to the surface on which the scintillator is provided. The manufacturing method of the radiation detection panel of description. On the base, a support placing step for placing a support provided with a scintillator that converts radiation into light on one surface;
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on the support so that the photoelectric conversion elements face the scintillator;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the substrate from the surface opposite to the surface on which the plurality of photoelectric conversion elements of the substrate are arranged;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
The manufacturing method of the radiation detection panel characterized by having. As the adhesive, a photocurable adhesive is used,
As the substrate, a substrate formed of a light transmissive material is used,
And the light shielding layer is formed between the said board | substrate and the said photoelectric conversion element, or the surface side on the opposite side to the surface in which the said photoelectric conversion element was provided of the said board | substrate. A method for producing the radiation detection panel according to 3.   The method for manufacturing a radiation detection panel according to claim 1, wherein a thermosetting adhesive is used as the adhesive.   The method for producing a radiation detection panel according to claim 1, further comprising an adhesive curing step of curing the adhesive after the decompression bonding step.   In the adhesive placement step, the substrate and the support are placed such that the adhesive disposed in advance around the scintillator on the surface of the support is opposed to the photoelectric conversion element and the scintillator. The radiation according to any one of claims 1 to 6, wherein the radiation is disposed in a gap portion between the substrate and the support body and in a portion around the scintillator. Detection panel manufacturing method.   In the adhesive placement step, when the substrate and the support are placed so that the photoelectric conversion element and the scintillator face each other, the support is positioned around the scintillator. An adhesive is preliminarily disposed on the surface of the substrate on which the photoelectric conversion element is provided, and the adhesive is a gap portion between the substrate and the support, and the scintillator The method for manufacturing a radiation detection panel according to claim 1, wherein the radiation detection panel is disposed in a peripheral portion of.   The adhesive includes a spacer for securing a space between the substrate and the support when the space between the base and the film is decompressed in the decompression bonding step. The manufacturing method of the radiation detection panel as described in any one of Claims 1-8 characterized by the above-mentioned.   10. The spacer according to claim 9, wherein the spacer is formed in a spherical shape having a diameter substantially the same as the thickness of the scintillator, or a rod having a circular cross section having a diameter substantially the same as the thickness of the scintillator. Manufacturing method of radiation detection panel.   When the substrate and the support are placed so that the photoelectric conversion element and the scintillator face each other, an internal space formed by partitioning the substrate, the support, and the adhesive, and The adhesive is preliminarily disposed on the surface of the substrate or the surface of the support so that one or more openings are formed in the adhesive portion to communicate with the outer space. The manufacturing method of the radiation detection panel as described in any one of Claims 7-10.   The opening of the adhesive portion is sealed in a reduced-pressure atmosphere by the adhesive being pushed out by the substrate and the support that are close to each other during the reduced-pressure bonding step. Item 12. A method for producing a radiation detection panel according to Item 11.   13. The radiation detection panel according to claim 11, wherein the opening of the adhesive portion is sealed by applying an adhesive under a reduced pressure atmosphere after the reduced pressure bonding step. Method.   The method of manufacturing a radiation detection panel according to any one of claims 1 to 13, wherein the scintillator is formed of a columnar crystal of a phosphor.   The method of manufacturing a radiation detection panel according to claim 14, wherein the scintillator is arranged so that an acute-angled tip of the columnar crystal of the phosphor faces the photoelectric conversion element. A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on a base;
On the substrate, a support for supporting a scintillator that converts radiation into light, and a support mounting step for mounting the scintillator so that the scintillator faces the photoelectric conversion element;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the support from the surface opposite to the surface on which the scintillator of the support is provided;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
A radiation image detector is manufactured using the radiation detection panel manufactured by the manufacturing process of the radiation detection panel which has this, The manufacturing method of the radiation image detector characterized by the above-mentioned. On the base, a support placing step for placing a support provided with a scintillator that converts radiation into light on one surface;
A substrate mounting step of mounting a substrate formed by arranging a plurality of photoelectric conversion elements in a two-dimensional array on one surface on the support so that the photoelectric conversion elements face the scintillator;
An adhesive disposing step of disposing an adhesive in a gap portion between the substrate and the support and in a portion around the scintillator;
A film placing step of placing a film so as to cover the substrate from the surface opposite to the surface on which the plurality of photoelectric conversion elements of the substrate are arranged;
A reduced pressure laminating step of depressurizing a space between the base and the film, including the substrate and the support, and bonding the substrate and the support;
A radiation image detector is manufactured using the radiation detection panel manufactured by the manufacturing process of the radiation detection panel which has this, The manufacturing method of the radiation image detector characterized by the above-mentioned. A substrate formed by two-dimensionally arranging a plurality of photoelectric conversion elements on one surface;
A support that supports a scintillator that converts radiation into light;
With
The support is placed on the substrate so that the scintillator faces the photoelectric conversion element,
An adhesive is disposed in a gap portion between the substrate and the support and in a portion around the scintillator,
And the radiation detection panel characterized by the internal space divided and sealed by the said board | substrate, the said support body, and the said adhesive agent being pressure-reduced from atmospheric pressure.   The radiation detection panel according to claim 18, wherein the scintillator is formed of a columnar crystal of a phosphor.   The radiation detection panel according to claim 19, wherein the scintillator is disposed so that an acute-angled tip of the columnar crystal of the phosphor faces the photoelectric conversion element.   The radiation detection panel according to any one of claims 18 to 20, wherein the adhesive includes a spacer for ensuring a space between the substrate and the support.   The spacer is formed in a spherical shape having a diameter substantially the same as the thickness of the scintillator or a rod having a circular cross section having a diameter substantially the same as the thickness of the scintillator. Radiation detection panel. A substrate formed by two-dimensionally arranging a plurality of photoelectric conversion elements on one surface;
A support that supports a scintillator that converts radiation into light;
A radiation detection panel having
The support of the radiation detection panel is placed on the substrate so that the scintillator faces the photoelectric conversion element,
An adhesive is disposed in a portion around the scintillator in the gap portion between the substrate and the support of the radiation detection panel,
And the radiographic image detector characterized by the internal space divided and sealed by the said board | substrate of the said radiation detection panel, the said support body, and the said adhesive agent being pressure-reduced from atmospheric pressure.

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