JP2010038572A5 - - Google Patents

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Publication number
JP2010038572A5
JP2010038572A5 JP2008198651A JP2008198651A JP2010038572A5 JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5 JP 2008198651 A JP2008198651 A JP 2008198651A JP 2008198651 A JP2008198651 A JP 2008198651A JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5
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Japan
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inspected
inspection target
imaging
inspection
rotation angle
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JP2008198651A
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English (en)
Japanese (ja)
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JP5466382B2 (ja
JP2010038572A (ja
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Publication of JP2010038572A5 publication Critical patent/JP2010038572A5/ja
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JP2008198651A 2008-07-31 2008-07-31 部品検査装置および部品検査方法 Active JP5466382B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008198651A JP5466382B2 (ja) 2008-07-31 2008-07-31 部品検査装置および部品検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008198651A JP5466382B2 (ja) 2008-07-31 2008-07-31 部品検査装置および部品検査方法

Publications (3)

Publication Number Publication Date
JP2010038572A JP2010038572A (ja) 2010-02-18
JP2010038572A5 true JP2010038572A5 (enrdf_load_stackoverflow) 2011-07-21
JP5466382B2 JP5466382B2 (ja) 2014-04-09

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JP2008198651A Active JP5466382B2 (ja) 2008-07-31 2008-07-31 部品検査装置および部品検査方法

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JP (1) JP5466382B2 (enrdf_load_stackoverflow)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103673908B (zh) * 2013-12-23 2016-07-06 江苏理工学院 自动化通孔尺寸检测装置及其检测方法
CN104062451B (zh) * 2014-07-04 2016-01-27 东莞职业技术学院 螺丝检测机
CN105004370A (zh) * 2015-06-30 2015-10-28 张家港华日法兰有限公司 一种检测法兰质量的方法
CN105004371A (zh) * 2015-06-30 2015-10-28 张家港华日法兰有限公司 一种对法兰质量检测的方法
CN104990698A (zh) * 2015-06-30 2015-10-21 张家港华日法兰有限公司 一种质量检测工艺
CN104990927A (zh) * 2015-06-30 2015-10-21 张家港华日法兰有限公司 用于检测法兰质量的方法
JP7220104B2 (ja) * 2019-03-20 2023-02-09 東洋ガラス株式会社 容器検査装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS628045A (ja) * 1985-07-04 1987-01-16 Nireko:Kk 欠陥検出装置
JPH07248300A (ja) * 1994-03-09 1995-09-26 Kyoritsu Denko Kk 部品検査装置
JPH1183754A (ja) * 1997-09-04 1999-03-26 Mitsui High Tec Inc リードフレーム検査装置
JP2002039948A (ja) * 2000-07-27 2002-02-06 Sony Corp 外観検査装置及び外観検査方法
JP2002195811A (ja) * 2000-12-27 2002-07-10 Nachi Fujikoshi Corp 輪郭形状計測方法
JP2005121570A (ja) * 2003-10-20 2005-05-12 Kirin Techno-System Corp 異物検査方法及び異物検査装置

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