JP2010038572A5 - - Google Patents
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- JP2010038572A5 JP2010038572A5 JP2008198651A JP2008198651A JP2010038572A5 JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5 JP 2008198651 A JP2008198651 A JP 2008198651A JP 2008198651 A JP2008198651 A JP 2008198651A JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5
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- JP
- Japan
- Prior art keywords
- inspected
- inspection target
- imaging
- inspection
- rotation angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Claims (2)
被検査部品を自転させ、かつその自転速度及び回転角を変更可能に構成された自転ユニットと、
被検査部品の外周面を連続的に撮像する撮像手段と、
被検査部品の自転に伴って撮像手段の撮像エリア内に被検査部品の検査対象箇所が最初に撮像エリア内に現れるまでの回転角度が不明な段階では自転ユニットを低速駆動し、続いて検査対象箇所の個数に対応する回転角度までは自転ユニットを高速駆動した後、撮像エリア内に現れる次の検査対象箇所を撮像すべく一時的に自転ユニットを低速駆動し、これら検査対象箇所を撮像した撮像画像に基づいて検査対象箇所の成形良否を判定する制御ユニットと、
を備えることを特徴とする部品検査装置。 A component to be inspected having a plurality of inspection target portions provided at equal intervals on the outer peripheral surface;
A rotation unit configured to rotate the part to be inspected and to change its rotation speed and rotation angle;
Imaging means for continuously imaging the outer peripheral surface of the part to be inspected;
The rotation unit is driven at a low speed at the stage where the rotation angle until the inspection target part of the inspection part first appears in the imaging area in the imaging area of the imaging means as the part to be inspected rotates, and then the inspection object After the rotation unit is driven at high speed up to the rotation angle corresponding to the number of locations, the rotation unit is temporarily driven at a low speed to image the next inspection target location appearing in the imaging area, and the imaging is performed by imaging these inspection target locations. A control unit for determining the molding quality of the inspection target location based on the image;
A component inspection device comprising:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008198651A JP5466382B2 (en) | 2008-07-31 | 2008-07-31 | Component inspection apparatus and component inspection method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008198651A JP5466382B2 (en) | 2008-07-31 | 2008-07-31 | Component inspection apparatus and component inspection method |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010038572A JP2010038572A (en) | 2010-02-18 |
JP2010038572A5 true JP2010038572A5 (en) | 2011-07-21 |
JP5466382B2 JP5466382B2 (en) | 2014-04-09 |
Family
ID=42011299
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008198651A Active JP5466382B2 (en) | 2008-07-31 | 2008-07-31 | Component inspection apparatus and component inspection method |
Country Status (1)
Country | Link |
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JP (1) | JP5466382B2 (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103673908B (en) * | 2013-12-23 | 2016-07-06 | 江苏理工学院 | Automatization's clear size of opening detecting device and detection method thereof |
CN104062451B (en) * | 2014-07-04 | 2016-01-27 | 东莞职业技术学院 | Screw detecting machine |
CN105004371A (en) * | 2015-06-30 | 2015-10-28 | 张家港华日法兰有限公司 | Method for detecting flange quality |
CN105004370A (en) * | 2015-06-30 | 2015-10-28 | 张家港华日法兰有限公司 | Method for detecting flange quality |
CN104990698A (en) * | 2015-06-30 | 2015-10-21 | 张家港华日法兰有限公司 | Quality detection technology |
CN104990927A (en) * | 2015-06-30 | 2015-10-21 | 张家港华日法兰有限公司 | Method for detecting quality of flanges |
JP7220104B2 (en) | 2019-03-20 | 2023-02-09 | 東洋ガラス株式会社 | Container inspection device |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS628045A (en) * | 1985-07-04 | 1987-01-16 | Nireko:Kk | Apparatus for detecting flaw |
JPH07248300A (en) * | 1994-03-09 | 1995-09-26 | Kyoritsu Denko Kk | Part inspection device |
JPH1183754A (en) * | 1997-09-04 | 1999-03-26 | Mitsui High Tec Inc | Lead frame inspecting device |
JP2002039948A (en) * | 2000-07-27 | 2002-02-06 | Sony Corp | Apparatus and method for inspecting appearance |
JP2002195811A (en) * | 2000-12-27 | 2002-07-10 | Nachi Fujikoshi Corp | Contour measuring method |
JP2005121570A (en) * | 2003-10-20 | 2005-05-12 | Kirin Techno-System Corp | Foreign substance inspecting method and foreign substance inspecting apparatus |
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2008
- 2008-07-31 JP JP2008198651A patent/JP5466382B2/en active Active
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