JP2010038572A5 - - Google Patents

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Publication number
JP2010038572A5
JP2010038572A5 JP2008198651A JP2008198651A JP2010038572A5 JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5 JP 2008198651 A JP2008198651 A JP 2008198651A JP 2008198651 A JP2008198651 A JP 2008198651A JP 2010038572 A5 JP2010038572 A5 JP 2010038572A5
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Japan
Prior art keywords
inspected
inspection target
imaging
inspection
rotation angle
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JP2008198651A
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Japanese (ja)
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JP5466382B2 (en
JP2010038572A (en
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Priority to JP2008198651A priority Critical patent/JP5466382B2/en
Priority claimed from JP2008198651A external-priority patent/JP5466382B2/en
Publication of JP2010038572A publication Critical patent/JP2010038572A/en
Publication of JP2010038572A5 publication Critical patent/JP2010038572A5/ja
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Claims (2)

外周面に等間隔に設けられた複数個の検査対象箇所を有する被検査部品と、
被検査部品を自転させ、かつその自転速度及び回転角を変更可能に構成された自転ユニットと、
被検査部品の外周面を連続的に撮像する撮像手段と、
被検査部品の自転に伴って撮像手段の撮像エリア内に被検査部品の検査対象箇所が最初に撮像エリア内に現れるまでの回転角度が不明な段階では自転ユニットを低速駆動し、続いて検査対象箇所の個数に対応する回転角度までは自転ユニットを高速駆動した後、撮像エリア内に現れる次の検査対象箇所を撮像すべく一時的に自転ユニットを低速駆動し、これら検査対象箇所を撮像した撮像画像に基づいて検査対象箇所の成形良否を判定する制御ユニットと、
を備えることを特徴とする部品検査装置
A component to be inspected having a plurality of inspection target portions provided at equal intervals on the outer peripheral surface;
A rotation unit configured to rotate the part to be inspected and to change its rotation speed and rotation angle;
Imaging means for continuously imaging the outer peripheral surface of the part to be inspected;
The rotation unit is driven at a low speed at the stage where the rotation angle until the inspection target part of the inspection part first appears in the imaging area in the imaging area of the imaging means as the part to be inspected rotates, and then the inspection object After the rotation unit is driven at high speed up to the rotation angle corresponding to the number of locations, the rotation unit is temporarily driven at a low speed to image the next inspection target location appearing in the imaging area, and the imaging is performed by imaging these inspection target locations. A control unit for determining the molding quality of the inspection target location based on the image;
A component inspection device comprising:
外周面に等間隔に設けられた複数個の検査対象箇所を有する被検査部品を自転させながら外周面を連続的に撮像し、被検査部品の自転に伴って被検査部品の検査対象箇所が最初に撮像エリア内に現れるまでの回転角度が不明な段階では、被検査部品を低速で自転させ、続いて検査対象箇所の個数に対応する回転角度までは被検査部品を高速で自転させた後、撮像エリア内に現れる次の検査対象箇所を撮像すべく一時的に被検査部品を低速で自転させ、これら検査対象箇所を撮像した撮像画像に基づいて検査対象箇所の成形良否を判定する部品検査方法。The outer peripheral surface is continuously imaged while rotating a part to be inspected having a plurality of inspection target parts provided at equal intervals on the outer peripheral surface, and the inspection target part of the part to be inspected first as the part to be inspected rotates. In the stage where the rotation angle until it appears in the imaging area is unknown, the part to be inspected is rotated at a low speed, and then the part to be inspected is rotated at a high speed up to the rotation angle corresponding to the number of inspection target parts. A component inspection method for temporarily rotating a component to be inspected at a low speed so as to image the next inspection target location appearing in the imaging area, and determining molding quality of the inspection target location based on a captured image obtained by imaging these inspection target locations .
JP2008198651A 2008-07-31 2008-07-31 Component inspection apparatus and component inspection method Active JP5466382B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008198651A JP5466382B2 (en) 2008-07-31 2008-07-31 Component inspection apparatus and component inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008198651A JP5466382B2 (en) 2008-07-31 2008-07-31 Component inspection apparatus and component inspection method

Publications (3)

Publication Number Publication Date
JP2010038572A JP2010038572A (en) 2010-02-18
JP2010038572A5 true JP2010038572A5 (en) 2011-07-21
JP5466382B2 JP5466382B2 (en) 2014-04-09

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ID=42011299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008198651A Active JP5466382B2 (en) 2008-07-31 2008-07-31 Component inspection apparatus and component inspection method

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JP (1) JP5466382B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103673908B (en) * 2013-12-23 2016-07-06 江苏理工学院 Automatization's clear size of opening detecting device and detection method thereof
CN104062451B (en) * 2014-07-04 2016-01-27 东莞职业技术学院 Screw detecting machine
CN105004371A (en) * 2015-06-30 2015-10-28 张家港华日法兰有限公司 Method for detecting flange quality
CN105004370A (en) * 2015-06-30 2015-10-28 张家港华日法兰有限公司 Method for detecting flange quality
CN104990698A (en) * 2015-06-30 2015-10-21 张家港华日法兰有限公司 Quality detection technology
CN104990927A (en) * 2015-06-30 2015-10-21 张家港华日法兰有限公司 Method for detecting quality of flanges
JP7220104B2 (en) 2019-03-20 2023-02-09 東洋ガラス株式会社 Container inspection device

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS628045A (en) * 1985-07-04 1987-01-16 Nireko:Kk Apparatus for detecting flaw
JPH07248300A (en) * 1994-03-09 1995-09-26 Kyoritsu Denko Kk Part inspection device
JPH1183754A (en) * 1997-09-04 1999-03-26 Mitsui High Tec Inc Lead frame inspecting device
JP2002039948A (en) * 2000-07-27 2002-02-06 Sony Corp Apparatus and method for inspecting appearance
JP2002195811A (en) * 2000-12-27 2002-07-10 Nachi Fujikoshi Corp Contour measuring method
JP2005121570A (en) * 2003-10-20 2005-05-12 Kirin Techno-System Corp Foreign substance inspecting method and foreign substance inspecting apparatus

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