WO2008084548A1 - Camera unit inspection equipment and camera unit inspection method - Google Patents

Camera unit inspection equipment and camera unit inspection method Download PDF

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Publication number
WO2008084548A1
WO2008084548A1 PCT/JP2007/050291 JP2007050291W WO2008084548A1 WO 2008084548 A1 WO2008084548 A1 WO 2008084548A1 JP 2007050291 W JP2007050291 W JP 2007050291W WO 2008084548 A1 WO2008084548 A1 WO 2008084548A1
Authority
WO
WIPO (PCT)
Prior art keywords
camera unit
inspection
unit inspection
chart
inspection equipment
Prior art date
Application number
PCT/JP2007/050291
Other languages
French (fr)
Japanese (ja)
Inventor
Yoshinori Iijima
Akira Mano
Hideho Miyake
Original Assignee
Pioneer Corporation
Pioneer Fa Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corporation, Pioneer Fa Corporation filed Critical Pioneer Corporation
Priority to JP2008552988A priority Critical patent/JP4906128B2/en
Priority to PCT/JP2007/050291 priority patent/WO2008084548A1/en
Publication of WO2008084548A1 publication Critical patent/WO2008084548A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B43/00—Testing correct operation of photographic apparatus or parts thereof

Abstract

Camera unit inspection equipment is utilized suitably for inspecting a camera unit based on a chart image obtained by imaging a chart. More specifically, the camera unit inspection equipment rotates the camera unit by a rotation control means at the time of performing inspection, and performs inspection based on a chart image picked up by means of the camera unit during rotation. In other words, inspection is performed while deflecting the angle of the camera unit in many directions within the range of view angle of the camera unit. Consequently, the size of the chart can be reduced as compared with a case where inspection is performed with the camera unit fixed. Since the inspection equipment can be made compact, it can be installed easily and the space of a mass production factory can be utilized effectively.
PCT/JP2007/050291 2007-01-12 2007-01-12 Camera unit inspection equipment and camera unit inspection method WO2008084548A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2008552988A JP4906128B2 (en) 2007-01-12 2007-01-12 Camera unit inspection apparatus and camera unit inspection method
PCT/JP2007/050291 WO2008084548A1 (en) 2007-01-12 2007-01-12 Camera unit inspection equipment and camera unit inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/050291 WO2008084548A1 (en) 2007-01-12 2007-01-12 Camera unit inspection equipment and camera unit inspection method

Publications (1)

Publication Number Publication Date
WO2008084548A1 true WO2008084548A1 (en) 2008-07-17

Family

ID=39608451

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2007/050291 WO2008084548A1 (en) 2007-01-12 2007-01-12 Camera unit inspection equipment and camera unit inspection method

Country Status (2)

Country Link
JP (1) JP4906128B2 (en)
WO (1) WO2008084548A1 (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010107425A (en) * 2008-10-31 2010-05-13 Fujitsu Ltd Method and device for inspecting imaging module
JP2012144721A (en) * 2010-12-21 2012-08-02 Sumitomo Chemical Co Ltd Macromolecular compound and organic el element using the same
CN104834177A (en) * 2015-05-06 2015-08-12 福建省光学技术研究所 Lens testing and calibration device
CN105074569A (en) * 2013-02-25 2015-11-18 泰拉丁公司 Rotatable camera module testing system
CN106324976A (en) * 2015-07-03 2017-01-11 群光电子股份有限公司 Test system and test method
CN106406020A (en) * 2016-10-25 2017-02-15 北京小米移动软件有限公司 Auto-focusing test device
CN106768863A (en) * 2016-12-26 2017-05-31 苏州龙雨电子设备有限公司 A kind of reverse image camera lens camera bellows test device and method
JP2020534513A (en) * 2017-08-09 2020-11-26 レオナルド・エッセ・ピ・ア Geometric and radiometric calibration and test equipment for electro-optical thermal IR instruments, with different angular spread heat having different geometries and thermal IR radiation with different hot-cold transitions. Geometric and radiometric calibration and testing equipment designed to simulate IR sources

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102081958B1 (en) * 2019-07-12 2020-04-24 주식회사 코아시스 Camera module control apparatus and method for testing camera module using the same

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197833A (en) * 1987-10-12 1989-04-17 Nec Corp Measuring apparatus of high resolution
JPH11101712A (en) * 1997-09-25 1999-04-13 Sharp Corp Panel surface inspection device
JPH11234706A (en) * 1998-02-16 1999-08-27 Sharp Corp Adjustment device for video image of television camera
JP2002357506A (en) * 2001-05-31 2002-12-13 Olympus Optical Co Ltd Camera mtf measuring machine
JP2006343143A (en) * 2005-06-07 2006-12-21 Nikon Corp Inspection system for imaging device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0197833A (en) * 1987-10-12 1989-04-17 Nec Corp Measuring apparatus of high resolution
JPH11101712A (en) * 1997-09-25 1999-04-13 Sharp Corp Panel surface inspection device
JPH11234706A (en) * 1998-02-16 1999-08-27 Sharp Corp Adjustment device for video image of television camera
JP2002357506A (en) * 2001-05-31 2002-12-13 Olympus Optical Co Ltd Camera mtf measuring machine
JP2006343143A (en) * 2005-06-07 2006-12-21 Nikon Corp Inspection system for imaging device

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010107425A (en) * 2008-10-31 2010-05-13 Fujitsu Ltd Method and device for inspecting imaging module
JP2012144721A (en) * 2010-12-21 2012-08-02 Sumitomo Chemical Co Ltd Macromolecular compound and organic el element using the same
CN105074569A (en) * 2013-02-25 2015-11-18 泰拉丁公司 Rotatable camera module testing system
JP2016514282A (en) * 2013-02-25 2016-05-19 テラダイン、 インコーポレイテッド Rotating camera module test system
CN105074569B (en) * 2013-02-25 2018-08-17 泰拉丁公司 Rotatable camera model tests system
CN104834177A (en) * 2015-05-06 2015-08-12 福建省光学技术研究所 Lens testing and calibration device
CN106324976A (en) * 2015-07-03 2017-01-11 群光电子股份有限公司 Test system and test method
CN106406020A (en) * 2016-10-25 2017-02-15 北京小米移动软件有限公司 Auto-focusing test device
CN106768863A (en) * 2016-12-26 2017-05-31 苏州龙雨电子设备有限公司 A kind of reverse image camera lens camera bellows test device and method
JP2020534513A (en) * 2017-08-09 2020-11-26 レオナルド・エッセ・ピ・ア Geometric and radiometric calibration and test equipment for electro-optical thermal IR instruments, with different angular spread heat having different geometries and thermal IR radiation with different hot-cold transitions. Geometric and radiometric calibration and testing equipment designed to simulate IR sources
JP7328209B2 (en) 2017-08-09 2023-08-16 レオナルド・エッセ・ピ・ア Geometric and radiometric calibration and test apparatus for electro-optical thermal IR instruments having different angular spread thermal with different geometries and with thermal IR emissions containing different hot-cold transitions Geometric and radiometric calibration and test equipment designed to simulate IR sources

Also Published As

Publication number Publication date
JPWO2008084548A1 (en) 2010-04-30
JP4906128B2 (en) 2012-03-28

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