JP2010008238A - Spectrophotometer and spectroscopic analysis method - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To solve problems wherein, it is difficult for inexperienced persons to perform an analysis since a spectroscopic analysis requires an analyzer to have experience and confirmation operation to be repeated on data measured, and it is necessary to repeat an analysis until a result with improved accuracy is provided. <P>SOLUTION: A spectrophotometer includes: a light emitting means for irradiating a measuring light to a sample; a spectroscopy means for dispersing the measuring light into optional wavelengths; an inputting means for inputting a wavelength scanning range and a wavelength scanning speed to be measured, a measuring means for performing measurement; a data processing means for processing data obtained, a memorizing means for performing a wavelength scan to memorize a noise width determination value at each wavelength; and a controlling means for controlling each of the above means. It has steps of: performing comparative determination between a noise width value obtained at an optional wavelength during the wavelength scan and a noise width determination value in the memorizing means; and finding a wavelength scanning speed for a wavelength in the measurement from the result of the comparable determination processing. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to a spectrophotometer and a spectroscopic analysis method for scanning measurement light separated by a spectroscopic means and executing measurement, and more particularly to wavelength scanning (wavelength scanning).

  In the past, when a spectrophotometer is installed in a spectrophotometer to perform wavelength scan measurement, the measurement conditions are set on the measurement condition setting screen before measurement and measurement is performed in advance (baseline correction). . In this measurement, the set wavelength scanning range is the same or the measurement is performed under the measurement conditions at two wavelength scanning speeds. The wavelength scanning speed is determined by a skilled measurer in balance with the noise width (Abs).

  The term noise width is used as a technical term in the photometer field. For example, in the drawing showing the results of spectroscopic analysis, the horizontal axis is the wavelength, the vertical axis is the absorbance (Abs), and the maximum absorbance (Abs) at the wavelength (10 nm) for confirming the noise width in the measured wavelength region. The width between the height of the value and the minimum value is defined as the noise width.

  When the wavelength scanning speed, which is a measurement condition, is increased, the measurement time is shortened, but the number of data that can be captured during scanning is reduced, so that the number of integrations in data processing is reduced and measurement accuracy is deteriorated.

  If the wavelength scanning speed, which is a measurement condition, is reduced, the measurement time becomes longer, but the number of data that can be captured during scanning increases, so that the number of integrations in data processing increases and the measurement accuracy improves.

  In addition, the detector, which is a detection means, has wavelength sensitivity characteristics, and the noise width in each wavelength range fluctuates. It was necessary to set conditions and measure.

JP-A-2005-227120

  In the conventional measurement procedure, it is necessary to repeat the experience of the analyst and the confirmation work of the measurement data. Therefore, it is difficult for the non-experienced person to analyze, and it is necessary to repeat the analysis until a highly accurate result is obtained.

  Further, since the noise width in each wavelength region is different, it is necessary to examine the scanning speed for each wavelength.

  One object of the present invention is to obtain an appropriate measurement accuracy with one or a small number of measurements without determining the appropriate wavelength scanning speed and without repeating the measurement many times without depending on the experience of the analyst. The realization of a spectrophotometer.

  One feature of the present invention is that in a spectrophotometer, a light emitting means for irradiating a sample with measurement light, a spectroscopic means for splitting the measurement light at an arbitrary wavelength, and photometric detection for the wavelength split by the spectroscopic means Detecting means for performing measurement, input means for inputting a wavelength scanning range to be measured and a wavelength scanning speed, measuring means for performing measurement, data processing means for processing the obtained data, and a noise width judgment value are stored. Storage means and control means for controlling each means, and in the data processing means, the wavelength scanning is performed to store the noise width at each wavelength, and for any wavelength during the wavelength scanning. The comparison between the obtained noise width value and the noise width determination value of the storage means is performed, and the wavelength scanning speed for each wavelength in the measurement is set from the result of the comparison determination.

  Another feature of the present invention is that a noise width determination value is obtained in a spectroscopic analysis method that irradiates a sample with measurement light, disperses the measurement light at an arbitrary wavelength, and performs photometric detection for the dispersed wavelength. Store the wavelength scan range and wavelength scan speed to be measured, execute the wavelength scan to store the noise width at each wavelength, and obtain the noise width obtained for any wavelength during the wavelength scan. A comparison is made between the value and the stored noise width determination value, and the wavelength scanning speed for each wavelength in the measurement is obtained from the result of the comparison determination.

  According to one embodiment of the present invention, an appropriate wavelength scanning speed is obtained without depending on the analyst's experience, and an appropriate measurement accuracy can be obtained with one or a small number of measurements without repeating the measurement many times. Can be realized.

  Below, for example, the purpose of obtaining the optimum scanning speed for each wavelength region is to measure once before measuring the sample, record the noise width value in each wavelength region, and calculate the wavelength scanning speed from the noise width value. An embodiment that realizes obtaining by one measurement count by determining will be described.

  Examples of the present invention will be described with reference to FIGS. 1 to 3 and Tables 1 and 2.

  First, the outline of the spectrophotometer of Example 1 will be described with reference to FIG. The spectrophotometer 1 includes a light source 2, a spectroscope 3, a sample chamber 4, and a detector 5. The measuring light 6 emitted from the light source 2 is guided to the spectrometer 3. The spectroscope 3 spectrally divides the light so that an arbitrary wavelength can be selected and wavelength scanning is performed. The measurement light 6 spectrally separated by the spectroscope 3 passes through the sample chamber 4 and is guided to the detector 5.

  The control method of the spectrophotometer will be described with reference to FIG. The spectrophotometer 20 includes a control unit 22 that controls the spectrophotometer, a measurement unit 23, a storage unit 24, a data processing unit 25, and a determination unit 26. The spectrophotometer 20 includes an input unit 21 and a display unit 27 as external devices. The input means 21 includes a keyboard and a mouse, and the display means 27 includes a display.

  The input means 21 designates and inputs a noise width judgment value and a wavelength scanning speed table in advance. Further, the input means 21 inputs a wavelength scanning range and a wavelength scanning speed as measurement conditions. The measurement conditions input by the input unit 21 are temporarily stored in the control unit 22 and sent to the measurement unit 23. The transmitted measurement conditions are set by the measurement means 23.

  Further, the noise width judgment value and wavelength scanning speed table inputted by the input means 21 are sent to the storage means 24 via the control means 22 and stored therein.

  Baseline correction measurement is performed under the measurement conditions set by the measurement means 23. The baseline is a reference value for each wavelength under the currently set measurement conditions. The result of the baseline correction is A / D converted in the data processing means 25 based on the result obtained by the measurement means 23, and the result is sent to the determination means 26.

  The determination unit 26 performs a comparison determination between the result of A / D conversion by the data processing unit 25 and the noise width determination value stored in the storage unit 24. Based on the result determined by the determination means 26, the wavelength scanning speed of each wavelength band is automatically set. The set wavelength scanning speed is sent to the measuring means 23 and the storage means 24 via the control means 22.

  Based on the conditions sent in the above, the baseline correction measurement is again performed by the measuring means 23. After the baseline correction measurement is completed, the baseline correction result is temporarily stored in the data processing means 25, and then the measurement means 23 performs sample measurement.

  After the measurement of the sample is completed, A / D conversion is performed by the data processing unit 25 based on the baseline correction result temporarily stored in the data processing unit 25, and the result is displayed by the display unit 27 via the control unit 22. The

  The measurement flow of the spectrophotometer will be described.

  Before setting the measurement conditions, the noise width judgment value is input in Table 1 of Table 1 or Table 2 of Table 2. Table 1 relates to the embodiment of the present invention, and is a table showing the relationship between the noise width judgment value and the wavelength scanning speed table 1. Table 2 relates to the embodiment of the present invention, and is a table showing the relationship between the noise width judgment value and the wavelength scanning speed table 2.

  There are two or more noise width judgment values, and in this embodiment, there are five types of symbols A to E. Each noise width determination value has a unique wavelength scanning speed. Further, the wavelength scanning speeds of Table 1 in Table 1 and Table 2 in Table 2 are provided for one noise width determination value. The method of setting the wavelength scanning speed differs between Table 1 and Table 2.

  Hereinafter, each step of the measurement flow from the setting of the noise width determination value using the table 1 of Table 1 to the end of the sample measurement will be described with reference to FIG.

  Before the measurement condition setting 53 is performed, the noise width determination value setting 52 is performed in advance. The noise width judgment value is input as absorbance Abs, and the wavelength scanning speed is set in Table 1 of Table 1 here.

  In Table 1, the noise width judgment value can be set by symbols A to E, and the settable ranges are different. The wavelength scanning speed is input in accordance with the noise width judgment value from among specific wavelength scanning speeds. In Table 1 of Table 1, initial values are input, and the wavelength scanning speed is changed as necessary. The symbol A has a large noise width judgment value, and accordingly, the wavelength scanning speed is decreased to increase the number of data points that can be captured during scanning. Although the measurement time becomes longer, the number of integrations in data processing increases, so the noise width becomes smaller. Symbol E has a small noise width judgment value, and accordingly, the wavelength scanning speed is increased to reduce the number of data points that can be captured during scanning. Although the measurement time is shortened, the number of integrations in data processing is reduced, so that the noise width is increased. For example, when the noise width determination value of the baseline correction result is 1 <Abs of symbol A, the wavelength scanning speed is slowed down to increase the number of data points that can be captured during scanning. Since the number of integrations in data processing increases, the measurement result has a small noise width. For example, when the wavelength scanning range is 200 to 900 nm and the wavelength scanning speed is 30 nm / min, the measurement time takes about 1400 seconds (about 24 minutes). However, since the number of data points is large, the noise width is reduced as a whole.

  In the same wavelength range, if the noise width judgment value of the baseline correction result is Abs ≦ 0.001 Abs of symbol E, the wavelength scanning speed is increased to reduce the number of data points that can be captured during scanning. Since the number of integrations in data processing decreases, the measurement result is a result with a large noise width. For example, when the wavelength scanning speed is 1,200 nm / min in the same wavelength range, the measurement time can be completed in about 35 seconds. However, since the number of data points decreases, the noise width increases as a whole.

  After the noise width judgment value setting 52, the measurement condition setting 53 is performed. In the measurement conditions, a wavelength scanning range and a wavelength scanning speed are input. For example, the wavelength scanning range: 200 to 900 nm and the wavelength scanning speed: 300 nm / min are input.

  Baseline correction 54 is performed before sample measurement. By executing the baseline correction 54 under the measurement condition input in the measurement condition setting 53, the noise width of each wavelength 55 is stored 55 in the designated wavelength scanning range and wavelength scanning speed.

  A comparison 56 is made between the noise width determination value input in advance in the noise width determination value setting 52 and the noise width at each wavelength obtained when the baseline correction is performed 54 with the noise width determination value. Determination is performed for each wavelength region (at intervals of 10 nm).

  In the wavelength region 57 (in the case of YES in the figure) where the result of the comparison 56 with the noise width determination value is within the noise width determination value, the current wavelength scanning speed is maintained 58.

  When the noise width of the wavelength scanning range measured by the baseline correction is larger than the noise width judgment value (in the case of NO in the figure), the wavelength scanning speed at the wavelength is set to be slow. Further, when the measured noise width of the wavelength scanning range is smaller than the noise width determination value (in the case of NO in the figure), the wavelength scanning speed at the wavelength is set faster.

  For example, scanning is performed at a wavelength scanning speed at the time of baseline correction: 300 nm / min, and the result is a wavelength scanning range: 200 to 350 nm, a noise width of 0.06 Abs at a wavelength of 750 to 900 nm, and a noise at a wavelength scanning range of 350 to 750 nm. In the case of the width: 0.01 Abs, the wavelength scanning speed corresponding to the noise width is determined from step 59 to step 65. That is, when the wavelength scanning range is 200 to 350 nm, the noise width is 0.06 Abs, NO in step 59, YES in step 61, and wavelength scanning speed: 120 nm / min in step 62. Wavelength scanning speed during line correction: set slower than 300 nm / min, and proceeds to step 68. When the wavelength scanning range is 350 to 750 nm and the noise width is 0.01, step 59 is NO, step 61 is NO, step 63 is YES, step 64 is wavelength scanning speed: 300 nm / min, Wavelength scanning speed at the time of baseline correction: It is set to maintain the same wavelength scanning speed as 300 nm / min, and the process proceeds to step 68 for resetting optimum measurement conditions.

  As a result, from FIG. 3 and Table 1, the wavelength scanning range: 200 to 350 nm, 750 to 900 nm is set to the wavelength scanning speed: 120 nm / min, and the wavelength scanning range 350 to 750 nm is within the noise width judgment value. The scanning speed was maintained at 300 nm / min and optimized.

  The optimum measurement conditions are reset 68 at the optimum wavelength scanning speed at each wavelength determined above, and the baseline correction is re-executed 69.

  After the completion of the baseline correction re-execution 69, the sample is set 70 and the sample measurement is executed 71.

  After the sample measurement, the display unit 27 of FIG. 2 displays a sample measurement result display 72 in which the sample measurement is corrected based on the baseline correction result.

  The displayed measurement result is confirmed 73 and the measurement is completed 74.

  The contents of FIG. 3 will be supplemented. For example, if the noise width is greater than 1 Abs, YES is determined in step 59, and the wavelength scanning speed is set to 120 nm / min in step 60. If the noise width is greater than 0.05 Abs and less than or equal to 1 Abs, NO is determined in step 59, YES is determined in step 61, the wavelength scanning speed is set to 120 nm / min in step 62, and the process proceeds to step 68. If the noise width is greater than 0.005 Abs and less than or equal to 0.05 Abs, NO is determined in step 59, NO is determined in step 61, YES is determined in step 63, and wavelength scanning speed is set to 300 nm / min in step 64. Then, the process proceeds to step 68. If the noise width is greater than 0.001 Abs and less than or equal to 0.005 Abs, NO in step 59, NO in step 61, NO in step 63, YES in step 65, and wavelength scanning speed in step 66 Is set to 600 nm / min, and the process proceeds to Step 68. When the noise width is 0.001 Abs or less, NO is determined in step 59, NO is determined in step 61, NO is determined in step 63, NO is determined in step 65, and wavelength scanning speed is 1200 nm / min in step 67. Is set, and the process proceeds to step 68.

  Next, Example 2 of the measurement flow from the setting of the noise width determination value to the end of the sample measurement using Table 2 of Table 2 will be described with reference to FIG.

  Before the measurement condition setting 53 is performed, the noise width determination value setting 52 is performed in advance. The noise width judgment value is input as absorbance Abs. Here, Table 2 in Table 2 is set as the wavelength scanning speed.

  In Table 2, the noise width judgment values can be set by symbols A to E, and the settable ranges are different. The wavelength scanning speed in Table 2 is set by multiplying the reference value by the coefficient (Y). In this embodiment, the wavelength scanning speed of 300 nm / min is initially set, and here, a table with C in Table 2 as a reference value is used. Therefore, A in Table 2 is 30 nm / min (= 300 nm / min × 0.1), B is 120 nm / min (= 300 nm / min × 0.4), and C is 300 nm / min (= 300 nm / min × 1.0). 0), D is set to a wavelength scanning speed of 600 nm / min (= 300 nm / min × 2.0), and E is set to 1,200 nm / min (= 300 nm / min × 4.0). An initial value is input as the value of the coefficient (Y), and the value of the coefficient (Y) can be arbitrarily changed. In this embodiment, instead of inputting and setting a specific wavelength scanning speed value, the value of the coefficient (Y) can be input and set, so that the labor of inputting a specific numerical value can be saved, Even if specific numerical values of all types (symbols A to E) are not grasped, parameters such as an appropriate wavelength scanning speed can be set.

  The symbol A has a large noise width judgment value, and accordingly, the wavelength scanning speed is decreased to increase the number of data points that can be captured during scanning. Although the measurement time becomes longer, the number of integrations in data processing increases, so the noise width becomes smaller. Symbol E has a small noise width judgment value, and accordingly, the wavelength scanning speed is increased to reduce the number of data points that can be captured during scanning. Although the measurement time is shortened, the number of integrations in data processing is reduced, so that the noise width is increased. For example, when the noise width determination value of the baseline correction result is 1 <Abs of A, the wavelength scanning speed is decreased to increase the number of data points that can be captured during scanning. Since the number of integrations in data processing increases, the measurement result has a small noise width. For example, when the wavelength scanning range is 200 to 900 nm and the wavelength scanning speed is 30 nm / min, the measurement time takes about 1400 seconds (about 24 minutes). However, since the number of data points is large, the noise width is reduced as a whole.

  In the same wavelength range, when the noise width judgment value of the baseline correction result is Abs ≦ 0.001 Abs of E, the wavelength scanning speed is increased to reduce the number of data points that can be captured during scanning. Since the number of integrations in data processing decreases, the measurement result is a result with a large noise width. For example, when the wavelength scanning speed is 1,200 nm / min in the same wavelength range, the measurement time can be completed in about 35 seconds. However, since the number of data points decreases, the noise width increases as a whole.

  In the flow of FIG. 3, the process is started 51, and after setting the noise width determination value 52, the measurement condition is set 53. In the measurement conditions, a wavelength scanning range and a wavelength scanning speed are input. For example, a wavelength scanning range: 200 to 900 nm and a wavelength scanning speed: 300 nm / min are input.

  Baseline correction 54 is performed before sample measurement. By executing the baseline correction 54 under the measurement condition input in the measurement condition setting 53, the noise width of each wavelength 55 is stored 55 in the designated wavelength scanning range and wavelength scanning speed.

  A comparison 56 is performed between the noise width determination value input in advance in the noise width determination value setting 52 and the noise width determination value based on the noise width at each wavelength obtained when the baseline correction is performed 54. Judgment is performed every time (at intervals of 10 nm).

  In the wavelength region 57 (in the case of YES in the figure) where the result of the comparison 56 with the noise width determination value is within the noise width determination value, the current wavelength scanning speed is maintained 58.

  When the noise width of the wavelength scanning range measured by the baseline correction is larger than the noise width judgment value (in the case of NO in the figure), the wavelength scanning speed at the wavelength is set to be slow. Further, when the measured noise width of the wavelength scanning range is smaller than the noise width determination value (in the case of NO in the figure), the wavelength scanning speed at the wavelength is set faster. For example, scanning is performed at a wavelength scanning speed of 300 nm / min at the time of baseline correction, and the result is a wavelength scanning range: 200 to 350 nm, a noise width of 0.06 Abs at a wavelength of 750 to 900 nm, and a noise at a wavelength scanning range of 350 to 750 nm. When the width is 0.01 Abs, the wavelength scanning speed corresponding to the noise width is determined. From FIG. 3 and Table 2, the wavelength scanning range: 200 to 350 nm, 750 to 900 nm is set to the wavelength scanning speed: 120 nm / min (= 300 nm / min × 0.4), and the wavelength scanning range 350 to 750 nm is within the noise width judgment value. Therefore, the wavelength scanning speed: 300 nm / min (= 300 nm / min × 1.0) is maintained and optimized.

  The optimum measurement conditions are reset 68 at the optimum wavelength scanning speed at each wavelength determined above, and the baseline correction is re-executed 69.

  After the completion of the baseline correction re-execution 69, the sample is set 70 and the sample measurement is executed 71.

  After the sample measurement, the display unit 27 of FIG. 2 displays a sample measurement result display 72 in which the sample measurement is corrected based on the baseline correction result.

  The displayed measurement result is confirmed 73 and the measurement is completed 74.

  From the contents of the previous examples, by setting the noise width judgment value in advance and performing baseline correction before sample measurement, if the noise width is larger than the judgment value at each wavelength, the wavelength scanning speed is reduced. On the contrary, when the noise width is smaller than the determination value, the wavelength scanning speed is increased, and the optimum measurement accuracy can be obtained at one time or the minimum number of measurements, and the time can be shortened. Therefore, the optimum measurement accuracy can be obtained once or with the minimum number of measurements without depending on the experience of the analyst.

  In the embodiment of the present invention, for example, in order to suppress the noise width to a certain predetermined range in the entire wavelength scanning range, two or more kinds of inherent wavelength scanning speeds can be varied, and the optimum for each wavelength. The wavelength scanning speed is determined. In addition, by varying the wavelength scanning speed, it is possible to consider wavelength sensitivity characteristics having a high or low wavelength range of the detector. Therefore, regardless of the analyst's experience, optimal measurement conditions and measurement accuracy can be obtained once or with a minimum number of measurements, and the measurement time can be shortened.

  In the embodiment of the present invention, for example, after acquiring basic data (baseline data) without bothering the measurer, correction is performed based on the data, and scanning is performed once or at the minimum number of times of measurement. The noise width in the wavelength range can be suppressed within a certain value.

  In this specification, for example, (1) a light emitting unit that irradiates a sample with measurement light, a spectroscopic unit that divides the measurement light into an arbitrary wavelength, and photometric detection for the wavelength that is split by the spectroscopic unit. Detecting means for performing, input means for inputting the wavelength scanning range and wavelength scanning speed to be measured, measuring means for performing the measurement, data processing means for processing the obtained data, and memory for storing the noise width judgment value And a spectrophotometer comprising control means for controlling each means, means for performing wavelength scanning and storing a noise width at each wavelength in a data processing unit, and any wavelength during the wavelength scanning A step of comparing and determining the obtained noise width value and the noise width determination value of the storage means, and obtaining a wavelength scanning speed for each wavelength in the measurement from the result of the comparison determination process. It is. Further, for example, (2) In the above (1), the control means has two or more kinds of noise width judgment values of the storage means according to the value of the noise width, and a unique wavelength scan for each noise width judgment value. Having speed is disclosed. Further, for example, (3) in the above (1) and (2), it is disclosed that the control means has two or more kinds of inherent wavelength scanning speeds for one noise width judgment value of the storage means. The In addition, for example, (4) in the above (1), the noise width value required by the measurer is provided in the input means, and the noise width value obtained at an arbitrary wavelength during the wavelength scanning and the input means require It is disclosed that the method includes a step of performing comparison determination with a noise width value, and a step of changing a wavelength scanning speed for each wavelength in measurement from a result of the comparison determination processing.

It is a figure which concerns on the Example of this invention and shows the outline | summary of a spectrophotometer. It is a figure which concerns on the Example of this invention and shows the control method of a spectrophotometer. It is a flowchart of a measurement which concerns on the Example of this invention.

Explanation of symbols

1,20 Spectrophotometer 2 Light source 3 Spectrometer 4 Sample chamber 5 Detector 6 Measuring light 21 Input means 22 Control means 23 Measuring means 24 Storage means 25 Data processing means 26 Judgment means 27 Display means 51 Start 52 Noise width judgment value Setting 53 Setting measurement conditions 54 Executing baseline correction 55 Storage of noise width of each wavelength 56 Comparison with noise width judgment value 57 Wavelength range within noise width judgment value 58 Maintaining current wavelength scanning speed 59 Noise width judgment value 1 <Abs
60 Wavelength scanning speed 30nm / min
61 Noise width judgment value 0.05 <Abs ≦ 1
62 Wavelength scanning speed 120nm / min
63 Noise width judgment value 0.005 <Abs ≦ 0.05
64 Wavelength scanning speed 300nm / min
65 Noise width judgment value 0.001 <Abs ≦ 0.005
66 Wavelength scanning speed 600nm / min
67 Wavelength scanning speed 1,200nm / min
68 Re-setting of optimum measurement conditions 69 Re-execution of baseline correction 70 Sample setting 71 Sample measurement execution 72 Measurement result display 73 Measurement result confirmation 74 End

Claims (8)

In the spectrophotometer,
A light emitting means for irradiating the sample with measurement light;
A spectroscopic means for splitting the measurement light into an arbitrary wavelength;
Detection means for performing photometric detection on the wavelength dispersed by the spectroscopic means;
An input means for inputting a wavelength scanning range to be measured and a wavelength scanning speed;
Measuring means for performing the measurement;
Data processing means for processing the obtained data;
Storage means for storing a noise width judgment value;
Control means for controlling each means,
In the data processing means, a wavelength scan is performed to store a noise width at each wavelength, a noise width value obtained for an arbitrary wavelength during the wavelength scan, and a noise width determination value of the storage means The spectrophotometer is characterized in that the wavelength scanning speed for each wavelength in the measurement is set from the result of the comparison determination. In claim 1,
According to the obtained noise width value, the storage means has two or more noise width judgment values,
A spectrophotometer having a predetermined wavelength scanning speed for each noise width determination value. In claim 1 or 2,
A spectrophotometer having two or more predetermined wavelength scanning speeds for one noise width judgment value of the storage means. In claim 1,
In the input means, a required noise width value is input,
In the data processing means, the noise width value obtained at an arbitrary wavelength during the wavelength scanning is compared with the required noise width value, and the wavelength scanning for each wavelength in the measurement is performed based on the result of the comparison determination processing. A spectrophotometer characterized by changing the speed. Irradiate the sample with measurement light,
Spectroscopic measurement light at an arbitrary wavelength,
In the spectroscopic analysis method for performing photometric detection on the spectrally dispersed wavelength,
The noise width judgment value is stored,
Enter the wavelength scanning range and wavelength scanning speed to be measured,
Perform a wavelength scan to store the noise width at each wavelength,
The noise width value obtained for an arbitrary wavelength during the wavelength scanning is compared with the stored noise width determination value,
A spectral analysis method characterized in that a wavelength scanning speed for each wavelength in measurement is obtained from a result of the comparison determination. In claim 5,
Depending on the value of the noise width, there are two or more noise width judgment values,
A spectroscopic analysis method characterized by having a predetermined wavelength scanning speed for each noise width determination value. In claim 5 or 6,
A spectroscopic analysis method characterized by having two or more predetermined wavelength scanning speeds for one noise width determination value. In claim 5,
Perform a comparison judgment between the noise width value obtained at an arbitrary wavelength during the wavelength scanning and the required noise width value,
A spectroscopic analysis method characterized by changing a wavelength scanning speed for each wavelength in measurement from the result of the comparison determination.

Images