JP2009538549A5 - - Google Patents

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Publication number
JP2009538549A5
JP2009538549A5 JP2009507984A JP2009507984A JP2009538549A5 JP 2009538549 A5 JP2009538549 A5 JP 2009538549A5 JP 2009507984 A JP2009507984 A JP 2009507984A JP 2009507984 A JP2009507984 A JP 2009507984A JP 2009538549 A5 JP2009538549 A5 JP 2009538549A5
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JP
Japan
Prior art keywords
circuit
output
logic
elements
inverter
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JP2009507984A
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English (en)
Japanese (ja)
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JP5158607B2 (ja
JP2009538549A (ja
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Priority claimed from US11/740,180 external-priority patent/US7504851B2/en
Priority claimed from US11/740,168 external-priority patent/US7505304B2/en
Application filed filed Critical
Priority claimed from PCT/US2007/067622 external-priority patent/WO2007127917A2/en
Publication of JP2009538549A publication Critical patent/JP2009538549A/ja
Publication of JP2009538549A5 publication Critical patent/JP2009538549A5/ja
Application granted granted Critical
Publication of JP5158607B2 publication Critical patent/JP5158607B2/ja
Active legal-status Critical Current
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JP2009507984A 2006-04-27 2007-04-27 耐故障性非同期回路 Active JP5158607B2 (ja)

Applications Claiming Priority (11)

Application Number Priority Date Filing Date Title
US79612506P 2006-04-27 2006-04-27
US60/796,125 2006-04-27
US81733506P 2006-06-28 2006-06-28
US81750806P 2006-06-28 2006-06-28
US60/817,508 2006-06-28
US60/817,335 2006-06-28
US11/740,168 2007-04-25
US11/740,180 2007-04-25
US11/740,180 US7504851B2 (en) 2006-04-27 2007-04-25 Fault tolerant asynchronous circuits
US11/740,168 US7505304B2 (en) 2006-04-27 2007-04-25 Fault tolerant asynchronous circuits
PCT/US2007/067622 WO2007127917A2 (en) 2006-04-27 2007-04-27 Fault tolerant asynchronous circuits

Publications (3)

Publication Number Publication Date
JP2009538549A JP2009538549A (ja) 2009-11-05
JP2009538549A5 true JP2009538549A5 (enExample) 2010-06-17
JP5158607B2 JP5158607B2 (ja) 2013-03-06

Family

ID=38656414

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009507984A Active JP5158607B2 (ja) 2006-04-27 2007-04-27 耐故障性非同期回路

Country Status (4)

Country Link
EP (1) EP2020085B1 (enExample)
JP (1) JP5158607B2 (enExample)
KR (1) KR101060270B1 (enExample)
WO (1) WO2007127917A2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7505304B2 (en) 2006-04-27 2009-03-17 Achronix Semiconductor Corporation Fault tolerant asynchronous circuits
US7504851B2 (en) 2006-04-27 2009-03-17 Achronix Semiconductor Corporation Fault tolerant asynchronous circuits
WO2011155532A1 (ja) * 2010-06-11 2011-12-15 国立大学法人京都工芸繊維大学 フリップフロップ回路、半導体装置および電子機器
FR2998688B1 (fr) * 2012-11-29 2014-12-26 Electricite De France Procede de durcissement logique par partitionnement d'un circuit electronique
JP6310933B2 (ja) * 2013-10-16 2018-04-11 株式会社日立製作所 半導体装置
CN109991531B (zh) * 2019-03-28 2021-12-24 西北核技术研究所 低概率条件下大气中子单粒子效应截面测量方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4785204A (en) * 1985-06-21 1988-11-15 Mitsubishi Denki Kabushiki Kaisha Coincidence element and a data transmission path
JP4904154B2 (ja) * 2003-07-14 2012-03-28 フルクラム・マイクロシステムズ・インコーポレーテッド 非同期スタティックランダムアクセスメモリ
US7157934B2 (en) * 2003-08-19 2007-01-02 Cornell Research Foundation, Inc. Programmable asynchronous pipeline arrays
WO2006026676A2 (en) * 2004-08-30 2006-03-09 California Institute Of Technology Seu-tolerant qdi circuits
US7301362B2 (en) * 2005-03-14 2007-11-27 California Institute Of Technology Duplicated double checking production rule set for fault-tolerant electronics

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