JP2009536335A5 - - Google Patents

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Publication number
JP2009536335A5
JP2009536335A5 JP2009508473A JP2009508473A JP2009536335A5 JP 2009536335 A5 JP2009536335 A5 JP 2009536335A5 JP 2009508473 A JP2009508473 A JP 2009508473A JP 2009508473 A JP2009508473 A JP 2009508473A JP 2009536335 A5 JP2009536335 A5 JP 2009536335A5
Authority
JP
Japan
Prior art keywords
probe
variable
stylus
threshold
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2009508473A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009536335A (ja
Filing date
Publication date
Priority claimed from GBGB0608999.9A external-priority patent/GB0608999D0/en
Application filed filed Critical
Publication of JP2009536335A publication Critical patent/JP2009536335A/ja
Publication of JP2009536335A5 publication Critical patent/JP2009536335A5/ja
Withdrawn legal-status Critical Current

Links

JP2009508473A 2006-05-08 2007-05-08 表面測定プローブ Withdrawn JP2009536335A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0608999.9A GB0608999D0 (en) 2006-05-08 2006-05-08 Surface measurement probe
PCT/GB2007/001667 WO2007129075A2 (en) 2006-05-08 2007-05-08 Surface measurement probe

Publications (2)

Publication Number Publication Date
JP2009536335A JP2009536335A (ja) 2009-10-08
JP2009536335A5 true JP2009536335A5 (enExample) 2010-06-24

Family

ID=36604074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009508473A Withdrawn JP2009536335A (ja) 2006-05-08 2007-05-08 表面測定プローブ

Country Status (6)

Country Link
US (1) US20090320553A1 (enExample)
EP (1) EP2027436A2 (enExample)
JP (1) JP2009536335A (enExample)
CN (1) CN101438130A (enExample)
GB (1) GB0608999D0 (enExample)
WO (1) WO2007129075A2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008132483A1 (en) 2007-04-30 2008-11-06 Renishaw Plc Analogue probe with temperature control and method of operation
EP3128287A1 (en) 2015-08-06 2017-02-08 Renishaw plc Method of measurement of a slot
JP6727306B2 (ja) * 2015-12-22 2020-07-22 株式会社ミツトヨ Ｃｍｍタッチプローブのためのセンサ信号オフセット補正システム
FR3052559B1 (fr) 2016-06-10 2020-06-12 Onera (Office National D'etudes Et De Recherches Aerospatiales) Systeme et procede pour fournir l'amplitude et le retard de phase d'un signal sinusoidal
EP3460384A1 (en) 2017-09-26 2019-03-27 Renishaw PLC Measurement probe
JP6898966B2 (ja) * 2019-06-07 2021-07-07 株式会社ミツトヨ 不具合判定ユニット
JP2021183926A (ja) * 2020-05-21 2021-12-02 株式会社ミツトヨ 測定器
CN112179298B (zh) * 2020-08-21 2021-11-26 成都现代万通锚固技术有限公司 一种通过固有频率检测锚杆长度的方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6147502A (ja) * 1984-08-13 1986-03-08 Mitsutoyo Mfg Co Ltd タツチ信号検出回路
US5247751A (en) * 1990-09-29 1993-09-28 Nikon Corporation Touch probe
JPH07167638A (ja) 1993-12-15 1995-07-04 Nikon Corp タッチプローブ
JP2889196B2 (ja) 1996-10-08 1999-05-10 株式会社ミツトヨ センサ信号の直流レベル変化検知回路
US6708420B1 (en) * 1999-01-06 2004-03-23 Patrick M. Flanagan Piezoelectric touch probe
US7532202B2 (en) * 2002-05-08 2009-05-12 3M Innovative Properties Company Baselining techniques in force-based touch panel systems
US7041963B2 (en) * 2003-11-26 2006-05-09 Massachusetts Institute Of Technology Height calibration of scanning probe microscope actuators

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