JP2009534669A - 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化 - Google Patents

離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化 Download PDF

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JP2009534669A
JP2009534669A JP2009506767A JP2009506767A JP2009534669A JP 2009534669 A JP2009534669 A JP 2009534669A JP 2009506767 A JP2009506767 A JP 2009506767A JP 2009506767 A JP2009506767 A JP 2009506767A JP 2009534669 A JP2009534669 A JP 2009534669A
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ダン−クリスチャン ディンカ，
リチャード マストロナルディ，
ピーター ジェイ． ロスチャイルド，
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American Science and Engineering Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation

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  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Carbon And Carbon Compounds (AREA)
JP2009506767A 2006-04-21 2007-04-19 離散供給源のアレイおよび複数の平行ビームを用いた荷物および人間のｘ線画像化 Pending JP2009534669A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US79429506P 2006-04-21 2006-04-21
PCT/US2007/066936 WO2008063695A2 (en) 2006-04-21 2007-04-19 X-ray imaging of baggage and personnel using arrays of discrete sources and multiple collimated beams

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JP2009534669A true JP2009534669A (ja) 2009-09-24
JP2009534669A5 JP2009534669A5 (https=) 2011-05-12

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US (1) US7505562B2 (https=)
EP (1) EP2010943A2 (https=)
JP (1) JP2009534669A (https=)
KR (1) KR20090015929A (https=)
CN (1) CN101467071B (https=)
IL (1) IL194851A (https=)
MX (1) MX2008013595A (https=)
RU (1) RU2411506C2 (https=)
WO (1) WO2008063695A2 (https=)

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JP2015207559A (ja) * 2014-04-18 2015-11-19 エフ・イ−・アイ・カンパニー 高アスペクト比ｘ線ターゲットおよびその使用
US12259341B2 (en) 2021-11-04 2025-03-25 Rapiscan Holdings, Inc. Targeted collimation of detectors using rear collimators

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IL194851A (en) 2012-06-28
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