JP2009532725A5 - - Google Patents
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- JP2009532725A5 JP2009532725A5 JP2009503431A JP2009503431A JP2009532725A5 JP 2009532725 A5 JP2009532725 A5 JP 2009532725A5 JP 2009503431 A JP2009503431 A JP 2009503431A JP 2009503431 A JP2009503431 A JP 2009503431A JP 2009532725 A5 JP2009532725 A5 JP 2009532725A5
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- optical system
- mirror
- projection objective
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Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US79338706P | 2006-04-07 | 2006-04-07 | |
| US60/793387 | 2006-04-07 | ||
| EPPCT/EP2006/008869 | 2006-09-12 | ||
| PCT/EP2006/008869 WO2007031271A1 (en) | 2005-09-13 | 2006-09-12 | Microlithography projection optical system, method for manufacturing a device and method to design an optical surface |
| PCT/EP2007/000068 WO2007115597A1 (en) | 2006-04-07 | 2007-01-05 | Microlithography projection optical system, tool and method of production |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013206713A Division JP5830508B2 (ja) | 2006-04-07 | 2013-10-01 | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009532725A JP2009532725A (ja) | 2009-09-10 |
| JP2009532725A5 true JP2009532725A5 (enExample) | 2012-11-15 |
| JP5479890B2 JP5479890B2 (ja) | 2014-04-23 |
Family
ID=40381811
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009503431A Expired - Fee Related JP5479890B2 (ja) | 2006-04-07 | 2007-01-05 | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
| JP2009503430A Expired - Fee Related JP5479889B2 (ja) | 2006-04-07 | 2007-01-05 | デバイス製造用のマイクロリソグラフィ投影光学システム及び方法 |
| JP2013206713A Expired - Fee Related JP5830508B2 (ja) | 2006-04-07 | 2013-10-01 | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009503430A Expired - Fee Related JP5479889B2 (ja) | 2006-04-07 | 2007-01-05 | デバイス製造用のマイクロリソグラフィ投影光学システム及び方法 |
| JP2013206713A Expired - Fee Related JP5830508B2 (ja) | 2006-04-07 | 2013-10-01 | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (5) | US20090052073A1 (enExample) |
| EP (2) | EP2005249A1 (enExample) |
| JP (3) | JP5479890B2 (enExample) |
| KR (1) | KR101475956B1 (enExample) |
| CN (1) | CN101416117B (enExample) |
| TW (2) | TWI451186B (enExample) |
| WO (2) | WO2007115597A1 (enExample) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0602897D0 (en) * | 2006-02-13 | 2006-03-22 | Jagotec Ag | Improvements In Or Relating To Dry Powder Inhaler Devices |
| JP5479890B2 (ja) | 2006-04-07 | 2014-04-23 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
| DE102007033967A1 (de) * | 2007-07-19 | 2009-01-29 | Carl Zeiss Smt Ag | Projektionsobjektiv |
| DE102007045396A1 (de) * | 2007-09-21 | 2009-04-23 | Carl Zeiss Smt Ag | Bündelführender optischer Kollektor zur Erfassung der Emission einer Strahlungsquelle |
| DE102007062198A1 (de) | 2007-12-21 | 2009-06-25 | Carl Zeiss Microimaging Gmbh | Katoptrisches Objektiv zur Abbildung eines im Wesentlichen linienförmigen Objektes |
| KR101656534B1 (ko) | 2008-03-20 | 2016-09-09 | 칼 짜이스 에스엠티 게엠베하 | 마이크로리소그래피용 투영 대물렌즈 |
| DE102008033340B3 (de) * | 2008-07-16 | 2010-04-08 | Carl Zeiss Smt Ag | Abbildende Optik |
| DE102008042438B4 (de) * | 2008-09-29 | 2010-11-04 | Carl Zeiss Smt Ag | Mikrolithographie-Projektionsbelichtungsanlage mit mindestens zwei Arbeitszuständen |
| JP5525550B2 (ja) * | 2009-03-06 | 2014-06-18 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ用の照明光学系及び光学系 |
| WO2010115500A1 (en) | 2009-03-30 | 2010-10-14 | Carl Zeiss Smt Ag | Imaging optics and projection exposure installation for microlithography with an imaging optics of this type |
| DE102009034028A1 (de) * | 2009-03-30 | 2010-10-07 | Carl Zeiss Smt Ag | Abbildende Optik sowie Projektionsbelichtungsanlage für die Mikrolithographie mit einer derartigen abbildenden Optik |
| US8743342B2 (en) * | 2009-11-17 | 2014-06-03 | Nikon Corporation | Reflective imaging optical system, exposure apparatus, and method for producing device |
| EP2506061A4 (en) * | 2009-11-24 | 2017-12-20 | Nikon Corporation | Image-forming optical system, exposure apparatus, and device producing method |
| US8600186B2 (en) * | 2010-04-26 | 2013-12-03 | City University Of Hong Kong | Well focused catadioptric image acquisition |
| US8317344B2 (en) | 2010-06-08 | 2012-11-27 | Nikon Corporation | High NA annular field catoptric projection optics using Zernike polynomial mirror surfaces |
| WO2012013241A1 (en) * | 2010-07-30 | 2012-02-02 | Carl Zeiss Smt Gmbh | Imaging optical system and projection exposure installation for microlithography with an imaging optical system of this type |
| JP5695197B2 (ja) * | 2010-09-29 | 2015-04-01 | 東友ファインケム株式会社 | 露光システム |
| DE102010062597A1 (de) * | 2010-12-08 | 2012-06-14 | Carl Zeiss Smt Gmbh | Reflektives optisches Abbildungssystem |
| LT2691803T (lt) * | 2011-03-31 | 2017-08-25 | Next Scan Technology Bvba | Plokščio lauko telecentrinis skeneris su difrakcijos ribojamomis eksploatacijos savybėmis |
| KR102330570B1 (ko) | 2012-02-06 | 2021-11-25 | 가부시키가이샤 니콘 | 반사 결상 광학계, 노광 장치, 및 디바이스 제조 방법 |
| DE102012219545A1 (de) * | 2012-10-25 | 2014-04-30 | Carl Zeiss Smt Gmbh | Projektionsbelichtungssystem für EUV-Lithographie und Verfahren zum Betreiben des Projektionsbelichtungssystems |
| US20140218704A1 (en) * | 2013-02-04 | 2014-08-07 | Nikon Corporation | High na (numerical aperture) rectangular field euv catoptric projection optics using tilted and decentered zernike polynomial mirror surfaces |
| DE102014208770A1 (de) * | 2013-07-29 | 2015-01-29 | Carl Zeiss Smt Gmbh | Projektionsoptik zur Abbildung eines Objektfeldes in ein Bildfeld sowie Projektionsbelichtungsanlage mit einer derartigen Projektionsoptik |
| US10226173B2 (en) * | 2014-07-07 | 2019-03-12 | University Of Rochester | System and method for real-time montaging from live moving retina |
| KR20170092522A (ko) | 2014-09-08 | 2017-08-11 | 더 리서치 파운데이션 포 더 스테이트 유니버시티 오브 뉴욕 | 금속 격자 및 이의 측정 방법 |
| DE102014223811B4 (de) | 2014-11-21 | 2016-09-29 | Carl Zeiss Smt Gmbh | Abbildende Optik für die EUV-Projektionslithographie, Projektionsbelichtungsanlage und Verfahren zur Herstellung eines strukturierten Bauteils |
| CN105068381A (zh) * | 2015-07-27 | 2015-11-18 | 江苏影速光电技术有限公司 | 一种曝光机光阑承载结构及曝光机光阑更换方法 |
| CN105511075B (zh) * | 2016-01-13 | 2017-10-13 | 中国科学院上海技术物理研究所 | 一种大视场摆扫二维像移补偿双通道成像仪光学系统 |
| FR3060135A1 (fr) * | 2016-12-13 | 2018-06-15 | Thales Sa | Telescope compact presentant une pluralite de focales compense par des composants optiques aspheriques |
| DE102018200167A1 (de) | 2018-01-08 | 2019-07-11 | Carl Zeiss Smt Gmbh | Pupillenfacettenspiegel, Beleuchtungsoptik und optisches System für eine Projektionsbelichtungsanlage |
| DE102019208961A1 (de) * | 2019-06-19 | 2020-12-24 | Carl Zeiss Smt Gmbh | Projektionsoptik und Projektionsbelichtungsanlage mit einer solchen Projektionsoptik |
| CN110187596B (zh) * | 2019-06-26 | 2021-05-04 | 业成科技(成都)有限公司 | 光学投影装置与电子设备 |
| CN110908098B (zh) * | 2019-11-11 | 2021-10-01 | 中国科学院上海技术物理研究所 | 一种大视场消畸变离轴反射光学系统及设计方法 |
| CN112330556B (zh) * | 2020-11-03 | 2022-04-19 | 燕山大学 | 一种基于有理贝塞尔曲面的球幕投影几何校正方法 |
| WO2025072053A1 (en) * | 2023-09-25 | 2025-04-03 | University Of Rochester | Compact high na all-reflective microscope objectives |
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| JP5479890B2 (ja) | 2006-04-07 | 2014-04-23 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ投影光学システム、装置、及び製造方法 |
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2007
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- 2007-01-05 WO PCT/EP2007/000068 patent/WO2007115597A1/en not_active Ceased
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- 2007-01-05 CN CN200780012528.9A patent/CN101416117B/zh not_active Expired - Fee Related
- 2007-01-05 EP EP07702604A patent/EP2005249A1/en not_active Withdrawn
- 2007-01-05 JP JP2009503430A patent/JP5479889B2/ja not_active Expired - Fee Related
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- 2007-02-15 TW TW103118396A patent/TWI498664B/zh active
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2008
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- 2008-09-23 US US12/235,957 patent/US8970819B2/en active Active
- 2008-11-07 KR KR1020087027380A patent/KR101475956B1/ko active Active
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2010
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2013
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2014
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