JP2009295655A5 - Substrate processing apparatus and substrate processing method - Google Patents
Substrate processing apparatus and substrate processing method Download PDFInfo
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- JP2009295655A5 JP2009295655A5 JP2008145423A JP2008145423A JP2009295655A5 JP 2009295655 A5 JP2009295655 A5 JP 2009295655A5 JP 2008145423 A JP2008145423 A JP 2008145423A JP 2008145423 A JP2008145423 A JP 2008145423A JP 2009295655 A5 JP2009295655 A5 JP 2009295655A5
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- microbubbles
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Description
本発明は、基板処理装置および基板処理方法に関する。 The present invention relates to a substrate processing apparatus and a substrate processing method .
本発明の基板処理装置は、マイクロバブル、マイクロナノバブル、あるいはナノバブルのいずれかの微小気泡を含む液体を基板に供給して当該基板の洗浄処理を行う基板処理装置であって、
前記微小気泡を含む液体を生成する微小気泡液生成部と、
前記微小気泡液生成部から供給される前記微小気泡を含む液体から有機系の汚染物を除去する有機汚染除去装置であって、前記液体中に含まれる前記微小気泡を圧壊することなく、その波長またはエネルギー強度がコントロールされた紫外線を照射する有機汚染除去装置を含む異物除去機構部と、
を備え、
この異物除去機構部を通過した前記液体並びに当該液体に含まれる前記微小気泡を前記基板に供給するチューブとを備え、
このチューブを介して前記基板に供給される、前記微小気泡を含む液体を用いて、前記基板の洗浄処理を行うことを特徴とする。
The substrate processing apparatus of the present invention is a substrate processing apparatus that supplies a liquid containing microbubbles, either microbubbles, micronanobubbles, or nanobubbles, to the substrate to perform cleaning processing on the substrate
A microbubble liquid generator that generates a liquid containing the microbubbles;
An organic decontamination apparatus that removes organic contaminants from a liquid containing the microbubbles supplied from the microbubble liquid generation unit, the wavelength of the organic bubbles removing without crushing the microbubbles contained in the liquid Or a foreign matter removal mechanism including an organic contamination removal device that irradiates ultraviolet rays with controlled energy intensity
With
A tube that supplies the liquid that has passed through the foreign matter removing mechanism and the microbubbles contained in the liquid to the substrate;
The substrate is cleaned using the liquid containing the microbubbles supplied to the substrate through the tube.
また、本発明の微細気泡生成方法は、マイクロバブル、マイクロナノバブル、あるいはナノバブルのいずれかの微小気泡を含む液体を生成する微小気泡液生成部から供給される前記微小気泡を含む液体から、異物除去機構部にて異物を除去した、前記微小気泡を含む前記液体を基板に供給して当該基板の洗浄処理を行う基板処理方法であって、
前記微小気泡液生成部により、前記微小気泡を含む液体を生成し、
前記異物除去機構部により、前記微小気泡液生成部から供給される前記微小気泡を含む液体に、当該液体中に含まれる前記微小気泡を圧壊することなく、その波長またはエネルギー強度がコントロールされた紫外線を照射して前記液体から有機系の汚染物を除去し、
前記異物除去機構部を通過した前記液体並びに当該液体に含まれる前記微小気泡を前記基板に供給して当該基板の洗浄処理を行うことを特徴とする。
In addition, the method for generating fine bubbles according to the present invention removes foreign matter from the liquid containing microbubbles supplied from the microbubble liquid generation unit that generates a liquid containing microbubbles of microbubbles, micronanobubbles, or nanobubbles. A substrate processing method in which foreign substances are removed by a mechanism part, the liquid containing the microbubbles is supplied to a substrate, and the substrate is cleaned .
The microbubble liquid generation unit generates a liquid containing the microbubbles,
Ultraviolet light whose wavelength or energy intensity is controlled by the foreign matter removing mechanism unit without crushing the microbubbles contained in the liquid to the liquid containing the microbubbles supplied from the microbubble liquid generating unit. To remove organic contaminants from the liquid ,
A cleaning process for the substrate is performed by supplying the liquid that has passed through the foreign matter removing mechanism and the microbubbles contained in the liquid to the substrate .
本発明によれば、異物を確実に除去することができる基板処理装置および基板処理方法を提供することができる。
ADVANTAGE OF THE INVENTION According to this invention, the substrate processing apparatus and substrate processing method which can remove a foreign material reliably can be provided.
Claims (4)
前記微小気泡を含む液体を生成する微小気泡液生成部と、A microbubble liquid generator that generates a liquid containing the microbubbles;
前記微小気泡液生成部から供給される前記微小気泡を含む液体から有機系の汚染物を除去する有機汚染除去装置であって、前記液体中に含まれる前記微小気泡を圧壊することなく、その波長またはエネルギー強度がコントロールされた紫外線を照射する有機汚染除去装置を含む異物除去機構部と、An organic decontamination apparatus that removes organic contaminants from a liquid containing the microbubbles supplied from the microbubble liquid generation unit, the wavelength of the organic bubbles removing without crushing the microbubbles contained in the liquid Or a foreign matter removal mechanism including an organic contamination removal device that irradiates ultraviolet rays with controlled energy intensity,
を備え、With
この異物除去機構部を通過した前記液体並びに当該液体に含まれる前記微小気泡を前記基板に供給するチューブとを備え、A tube that supplies the liquid that has passed through the foreign matter removing mechanism and the microbubbles contained in the liquid to the substrate;
このチューブを介して前記基板に供給される、前記微小気泡を含む液体を用いて、前記基板の洗浄処理を行うことを特徴とする基板処理装置。A substrate processing apparatus, wherein the substrate is subjected to a cleaning process using a liquid containing microbubbles supplied to the substrate through the tube.
前記微小気泡液生成部により、前記微小気泡を含む液体を生成し、
前記異物除去機構部により、前記微小気泡液生成部から供給される前記微小気泡を含む液体に、当該液体中に含まれる前記微小気泡を圧壊することなく、その波長またはエネルギー強度がコントロールされた紫外線を照射して前記液体から有機系の汚染物を除去し、
前記異物除去機構部を通過した前記液体並びに当該液体に含まれる前記微小気泡を前記基板に供給して当該基板の洗浄処理を行うことを特徴とする基板処理方法。 The micro-bubbles, micro-nano-bubbles, or micro-bubbles that have been removed from the liquid containing the micro-bubbles supplied from the micro-bubble liquid generating unit that generates the liquid containing micro-bubbles of the micro-bubbles. A substrate processing method for supplying a liquid containing bubbles to a substrate to perform a cleaning process on the substrate ,
The microbubble liquid generation unit generates a liquid containing the microbubbles,
Ultraviolet light whose wavelength or energy intensity is controlled by the foreign matter removing mechanism unit without crushing the microbubbles contained in the liquid to the liquid containing the microbubbles supplied from the microbubble liquid generating unit. To remove organic contaminants from the liquid ,
A substrate processing method comprising: supplying the liquid that has passed through the foreign matter removing mechanism and the microbubbles contained in the liquid to the substrate to perform a cleaning process on the substrate .
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008145423A JP5243849B2 (en) | 2008-06-03 | 2008-06-03 | Substrate processing apparatus and substrate processing method |
TW098117438A TWI389746B (en) | 2008-06-03 | 2009-05-26 | A substrate processing apparatus, and a substrate processing method |
CNA2009101454509A CN101599424A (en) | 2008-06-03 | 2009-06-01 | Micro-bubble generating apparatus, micro-bubble generation method and substrate board treatment |
KR1020090048592A KR101154094B1 (en) | 2008-06-03 | 2009-06-02 | Microbubble generating device, microbubble generating method, and substrate processing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008145423A JP5243849B2 (en) | 2008-06-03 | 2008-06-03 | Substrate processing apparatus and substrate processing method |
Publications (3)
Publication Number | Publication Date |
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JP2009295655A JP2009295655A (en) | 2009-12-17 |
JP2009295655A5 true JP2009295655A5 (en) | 2012-10-11 |
JP5243849B2 JP5243849B2 (en) | 2013-07-24 |
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Application Number | Title | Priority Date | Filing Date |
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JP2008145423A Expired - Fee Related JP5243849B2 (en) | 2008-06-03 | 2008-06-03 | Substrate processing apparatus and substrate processing method |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5243849B2 (en) |
KR (1) | KR101154094B1 (en) |
CN (1) | CN101599424A (en) |
TW (1) | TWI389746B (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5740549B2 (en) * | 2010-05-26 | 2015-06-24 | 株式会社コアテクノロジー | Production method of nanobubble water containing saturated gas and production device of nanobubble water containing saturated gas |
CN103406322A (en) * | 2013-07-22 | 2013-11-27 | 彩虹显示器件股份有限公司 | Device and method for cleaning glass substrate |
KR101607521B1 (en) | 2014-07-08 | 2016-03-31 | 세메스 주식회사 | Apparatus and Method for treating substrate |
JP5804175B1 (en) * | 2014-11-19 | 2015-11-04 | 有限会社神野工業 | Microbubble generator |
CN104759432B (en) * | 2015-04-23 | 2016-10-12 | 成都市笑脸科技有限公司 | Bubble washer and bubble cleaning method |
CN105668663B (en) * | 2016-03-24 | 2018-12-21 | 佛山市顺德区美的饮水机制造有限公司 | Water purification system and bubble formation device for water purification system |
KR102075233B1 (en) * | 2018-03-06 | 2020-02-07 | 주식회사 우리선테크 | Apparatus for Pretreatment of PCB Plating |
KR102074223B1 (en) * | 2018-09-10 | 2020-02-07 | (주)신우에이엔티 | Organic compounds decomposition and removal structure for wafer handling device |
CN110473773B (en) * | 2019-08-22 | 2022-03-22 | 北京北方华创微电子装备有限公司 | Wafer cleaning method and wafer cleaning equipment |
DE112021005594T5 (en) * | 2020-10-23 | 2023-08-03 | Sumco Corporation | Method for cleaning a pipeline of a single wafer processing wafer cleaning device |
CN115069673B (en) * | 2022-08-18 | 2023-04-11 | 苏州智程半导体科技股份有限公司 | Process strengthening system for semiconductor tank type cleaning equipment |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH08288249A (en) * | 1995-04-19 | 1996-11-01 | Sharp Corp | Chemical treatment apparatus |
JP3797775B2 (en) * | 1997-12-11 | 2006-07-19 | 栗田工業株式会社 | Wet cleaning device for electronic material and processing method for cleaning liquid for electronic material |
JP2002151459A (en) * | 2000-11-10 | 2002-05-24 | Kurita Water Ind Ltd | Cleaning method |
JP4449080B2 (en) * | 2005-04-15 | 2010-04-14 | オルガノ株式会社 | Cleaning method for ultrapure water production and supply equipment |
JP2008080230A (en) | 2006-09-27 | 2008-04-10 | Dainippon Screen Mfg Co Ltd | Apparatus and method of treating substrate |
JP2008086925A (en) | 2006-10-03 | 2008-04-17 | Dainippon Screen Mfg Co Ltd | Method for treating substrate and apparatus for treating substrate |
JP2008098439A (en) * | 2006-10-12 | 2008-04-24 | Dainippon Screen Mfg Co Ltd | Wash water feeding unit and substrate washer |
-
2008
- 2008-06-03 JP JP2008145423A patent/JP5243849B2/en not_active Expired - Fee Related
-
2009
- 2009-05-26 TW TW098117438A patent/TWI389746B/en not_active IP Right Cessation
- 2009-06-01 CN CNA2009101454509A patent/CN101599424A/en active Pending
- 2009-06-02 KR KR1020090048592A patent/KR101154094B1/en active IP Right Grant
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