JP2009289299A - Cleaning method of aluminum substrate for magnetic recording medium - Google Patents

Cleaning method of aluminum substrate for magnetic recording medium Download PDF

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JP2009289299A
JP2009289299A JP2008138031A JP2008138031A JP2009289299A JP 2009289299 A JP2009289299 A JP 2009289299A JP 2008138031 A JP2008138031 A JP 2008138031A JP 2008138031 A JP2008138031 A JP 2008138031A JP 2009289299 A JP2009289299 A JP 2009289299A
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substrate
end surface
cleaning
magnetic recording
peripheral end
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Takahiro Shiroma
貴浩 城間
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Fuji Electric Co Ltd
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Fuji Electric Device Technology Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate for a magnetic recording medium having high cleanness, while securing a smooth data surface. <P>SOLUTION: In a cleaning method of an aluminum substrate for the magnetic recording medium subjected to Ni-P plating, the substrate is immersed in an acid electrolyte; the substrate is brought into contact with an anode; an insoluble electrode (cathode) is disposed in the vicinity of an end surface of the substrate; and only the end surface of the substrate is selectively subjected to etching treatment, by applying DC voltage between both electrodes to clean the end surface of the substrate. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本発明は、コンピュータの外部記憶装置を始めとする各種磁気記録装置に搭載される磁気記録媒体用アルミ基板の洗浄方法に関する。   The present invention relates to a method for cleaning an aluminum substrate for a magnetic recording medium mounted on various magnetic recording devices including an external storage device of a computer.

磁気記録媒体用のNi−Pめっきを施したアルミ基板は、ハードディスクドライブに組み込む際に基板内周端面にパーティクルが存在すると発塵し、不良の原因となるために洗浄する必要がある。   An aluminum substrate plated with Ni-P for a magnetic recording medium generates dust if particles are present on the inner peripheral surface of the substrate when it is incorporated into a hard disk drive, and needs to be cleaned to cause defects.

また、基板外周端面の汚れはスパッタ成膜前の最終洗浄で浸漬超音波洗浄を行う際に、データ面に移動してきてエラーの原因となる。   Also, the contamination on the outer peripheral end surface of the substrate moves to the data surface and causes an error when performing immersion ultrasonic cleaning in the final cleaning before sputtering film formation.

これら問題となる基板端面の汚れの原因はアルミナやコロイダルシリカなどの研磨砥粒であり、単に付着しているのみならず突き刺さり等で残留するものが殆どである。   The cause of the contamination of the substrate end face, which is a problem, is abrasive grains such as alumina and colloidal silica, and most of them are not only adhered but remain due to sticking.

従来はPVAやウレタンなどを素材とするスポンジでの擦り洗い(例えば、特許文献1参照。)や酸などの薬液浸漬超音波洗浄(例えば、特許文献2参照。)で除去を行っていた。   Conventionally, removal is performed by rubbing with a sponge made of PVA, urethane, or the like (for example, see Patent Document 1) or chemical solution immersion ultrasonic cleaning with acid (for example, see Patent Document 2).

特開昭62−141634号公報Japanese Patent Laid-Open No. 62-141634 特開2005−44488号公報JP 2005-44488 A

しかし、特許文献1に記載のようなスポンジ擦り洗いではスポンジへの汚れの蓄積で洗浄効果が低下する。また、このようなスポンジ擦り洗いでは基板に突き刺さっている砥粒の除去には効果が不十分である。   However, in the sponge scrubbing as described in Patent Document 1, the cleaning effect decreases due to accumulation of dirt on the sponge. Further, such sponge scrubbing is not sufficient for removing abrasive grains sticking to the substrate.

また、特許文献2に記載のような酸などの薬液浸漬超音波洗浄では、エッチング効果により突き刺さり砥粒に対しても除去効果が高いが、長時間、高温、或いは強酸で処理した場合、アルミ基板データ面の粗さRaが大きくなり高記録密度用媒体用基板としては適用が困難となる。また、内周端面においては超音波が当りにくく洗浄し難いといった欠点があった。   In addition, in the ultrasonic cleaning with a chemical solution such as an acid described in Patent Document 2, the removal effect is high for the pierced abrasive grains due to the etching effect, but when treated with a high acid or a strong acid for a long time, the aluminum substrate The roughness Ra of the data surface increases, making it difficult to apply as a high recording density medium substrate. Further, the inner peripheral end face has a drawback that ultrasonic waves are difficult to hit and it is difficult to clean.

本発明はこのような状況に鑑みなされたもので、本発明の磁気記録媒体用アルミ基板の洗浄方法は、磁気記録媒体用のNi−Pめっきを施したアルミ基板の洗浄方法であって、酸性電解液中に基板を浸漬し、且つ、基板を陽極に接触させ、一方で基板端面近傍に不溶性電極(陰極)を配置し、両電極間に直流電圧を印加して基板端面のみを選択的にエッチング処理を施し、基板端面を洗浄することを特徴とする。   The present invention has been made in view of such circumstances, and the method for cleaning an aluminum substrate for a magnetic recording medium of the present invention is a method for cleaning an aluminum substrate subjected to Ni-P plating for a magnetic recording medium, and is acidic. The substrate is immersed in the electrolyte and the substrate is brought into contact with the anode. On the other hand, an insoluble electrode (cathode) is disposed in the vicinity of the substrate end surface, and a DC voltage is applied between both electrodes to selectively select only the substrate end surface. Etching is performed to clean the end face of the substrate.

本発明の磁気記録媒体用アルミ基板の洗浄方法によれば、Ni−Pめっきアルミ基板の端面部を選択的にエッチングすることにより、データ面の粗さを損なうこと無く基板端面部の付着物を除去できる。   According to the method for cleaning an aluminum substrate for a magnetic recording medium of the present invention, by selectively etching the end surface portion of the Ni-P plated aluminum substrate, deposits on the end surface portion of the substrate can be removed without impairing the roughness of the data surface. Can be removed.

本発明の洗浄方法によれば、磁気記録媒体用のNi−Pめっきを施したアルミ基板を酸性電解液中に浸漬し、基板を陽極に接触させ、一方で基板端面近傍に不溶性電極(陰極)を配置し、両電極間に直流電圧を印加して基板端面のみを選択的にエッチング処理を施す。この基板は、図1に示すように、中心孔を有する円形ディスク状の基板であり、本発明の洗浄方法においては、中心孔の縁及び外周の縁をエッチングにより洗浄する。
不溶性電極とは、電圧印加時に電解液中に電極成分が溶出しない電極を意味し、このような電極として、ステンレス鋼電極、白金電極・チタン電極・炭素電極などを挙げることができる。
ここで用いる酸性電解液としては、燐酸、塩酸、硝酸、硫酸などの無機酸水溶液、クエン酸・酒石酸などの有機酸水溶液などを挙げることができる。
According to the cleaning method of the present invention, a Ni-P plated aluminum substrate for a magnetic recording medium is immersed in an acidic electrolyte solution, and the substrate is brought into contact with the anode, while an insoluble electrode (cathode) is provided in the vicinity of the substrate end face. And a DC voltage is applied between both electrodes to selectively etch only the substrate end face. As shown in FIG. 1, this substrate is a circular disk-shaped substrate having a center hole. In the cleaning method of the present invention, the edge of the center hole and the edge of the outer periphery are cleaned by etching.
An insoluble electrode means an electrode in which electrode components do not elute into the electrolyte when a voltage is applied. Examples of such an electrode include a stainless steel electrode, a platinum electrode, a titanium electrode, and a carbon electrode.
Examples of the acidic electrolytic solution used here include inorganic acid aqueous solutions such as phosphoric acid, hydrochloric acid, nitric acid, and sulfuric acid, and organic acid aqueous solutions such as citric acid and tartaric acid.

本発明においては、基板を陽極に接触させる。陽極に接触する基板の部位は、基板内周端面であってもよく、基板外周端面であってもよい。どちらの場合も、陽極を基板受け具として用いてよい。   In the present invention, the substrate is brought into contact with the anode. The portion of the substrate in contact with the anode may be the inner peripheral end surface of the substrate or the outer peripheral end surface of the substrate. In either case, the anode may be used as a substrate holder.

陽極を図2に示すように基板外周端面に接触させた場合は、不溶性電極(陰極)を基板内周端面が形成する円の中心部に、基板と接触しないように配置する。この状態で両極間に電圧を印加すると、陰極に最も近い基板内周端面がエッチングされるとともに、基板内周端面上に付着した、あるいは基板内周端面に突き刺さった砥粒などのパーティクルが除去される。   When the anode is brought into contact with the outer peripheral end surface of the substrate as shown in FIG. 2, the insoluble electrode (cathode) is arranged at the center of the circle formed by the inner peripheral end surface of the substrate so as not to contact the substrate. When a voltage is applied between the two electrodes in this state, the inner peripheral surface of the substrate closest to the cathode is etched, and particles such as abrasive grains adhering to or stuck into the inner peripheral surface of the substrate are removed. The

また、陽極を図3に示すように基板内周端面に接触させた場合は、基板外周端面が形成する円より大きい円周のリング状または筒状の不溶性電極(陰極)を基板と同心円となるように、かつ基板と接触しないように配置する。この状態で両極間に電圧を印加すると、陰極に最も近い基板外周端面がエッチングされるとともに、基板外周端面上に付着した、あるいは基板外周端面に突き刺さった砥粒などのパーティクルが除去される。   In addition, when the anode is brought into contact with the inner peripheral end surface of the substrate as shown in FIG. 3, a ring-shaped or cylindrical insoluble electrode (cathode) having a larger circumference than the circle formed by the outer peripheral end surface of the substrate is concentric with the substrate. And so as not to contact the substrate. When a voltage is applied between the two electrodes in this state, the substrate outer peripheral end surface closest to the cathode is etched, and particles such as abrasive grains adhering to the substrate outer peripheral end surface or sticking to the substrate outer peripheral end surface are removed.

両極間に印加する電圧は5〜60Vであることが好ましく、通電する電流は3〜20Aであることが好ましい。基板を浸漬する酸性電解液の温度は20〜50℃であることが好ましく、エッチング処理時間は30〜150秒であることが好ましい。電圧、電流、処理時間が上記下限未満であるとパーティクル除去効果が不十分となり、電圧、電流、処理時間が上記上限を超えるとエッチングが過度に進んで、データ面(図1参照)を傷める惧れがある。   The voltage applied between the two electrodes is preferably 5 to 60 V, and the current to be applied is preferably 3 to 20A. The temperature of the acidic electrolyte for immersing the substrate is preferably 20 to 50 ° C., and the etching treatment time is preferably 30 to 150 seconds. If the voltage, current, and processing time are less than the above lower limit, the particle removal effect is insufficient, and if the voltage, current, and processing time exceeds the upper limit, etching proceeds excessively, and the data surface (see FIG. 1) may be damaged. There is.

以下に、実施例を用いて本発明をさらに説明する。   The present invention will be further described below with reference to examples.

<実施例1>
図2に示すように樹脂製水槽中に45℃、pH2.5の燐酸水溶液を入れて酸性電解液を準備した。この水溶液中にNi−Pめっき基板保持と陽極を兼ねたSUS316製の冶具にNi−Pめっき基板を保持させ、この基板と基板外周端面と接触した状態の冶具が完全に漬かるまで浸漬した。
<Example 1>
As shown in FIG. 2, an acidic electrolyte solution was prepared by placing a phosphoric acid aqueous solution at 45 ° C. and pH 2.5 in a resin water tank. In this aqueous solution, the Ni-P plated substrate was held by a SUS316 jig that also held the Ni-P plated substrate and the anode, and was immersed until the jig in contact with the substrate and the peripheral edge of the substrate was completely immersed.

次に基板中央の孔に、基板に接触しないように棒状のSUS316で作成された陰極を差し込み、直流で電圧50V、電流5Aを100sec通電して基板内周端面をエッチングするとともに、基板内周端面上に付着した、あるいは基板内周端面に突き刺さった砥粒などのパーティクルを除去した。   Next, a cathode made of a rod-shaped SUS316 is inserted into the hole in the center of the substrate so as to etch the inner peripheral end surface of the substrate by applying a voltage of 50 V and a current of 5 A for 100 seconds with direct current and etching the inner peripheral end surface of the substrate. Particles such as abrasive grains adhering to the top or sticking to the inner peripheral edge of the substrate were removed.

その後、水槽より引き上げて基板外周端面をスポンジで擦り洗いし、洗浄剤での超音波浸漬洗浄を行い、更に純水で数段すすぎ洗いを行った後乾燥した。洗浄後の基板の測定視野内の基板内周端面における500nm以上のパーティクルの個数を電子顕微鏡による外観検査で調べた。その結果を図4に示す。なお、図4には、通常洗浄(純水を染み込ませたスポンジによる端面の擦り洗い)及び燐酸のみの洗浄(燐酸水溶液を染み込ませたスポンジによる端面の擦り洗い)と通常洗浄の組み合わせ後の基板内周端面における500nm以上のパーティクルの個数を比較のために示した。   Thereafter, the substrate was lifted from the water tank, and the outer peripheral end surface of the substrate was scrubbed with a sponge, subjected to ultrasonic immersion cleaning with a cleaning agent, rinsed with pure water several steps, and then dried. The number of particles of 500 nm or more on the inner peripheral end face of the substrate within the measurement field of view after the cleaning was examined by appearance inspection using an electron microscope. The result is shown in FIG. FIG. 4 shows a substrate after a combination of normal cleaning (rubbing of the end surface with a sponge soaked with pure water) and cleaning with phosphoric acid only (rubbing of the end surface with a sponge soaked with phosphoric acid aqueous solution) and normal cleaning. The number of particles of 500 nm or more on the inner peripheral end face is shown for comparison.

<実施例2>
図2に示すように樹脂製水槽中に45℃、pH2.5の燐酸水溶液を入れて酸性電解液を準備した。
<Example 2>
As shown in FIG. 2, an acidic electrolyte solution was prepared by placing a phosphoric acid aqueous solution at 45 ° C. and pH 2.5 in a resin water tank.

SUS316で作成された櫛歯状に溝を切った陽極棒を準備し、この陽極棒をNi−Pめっき基板の中央の孔に差込み基板をフックさせて基板を固定すると同時に基板内周端面と接触させた。   Prepare an anode rod made of SUS316 with grooves in a comb shape, and insert this anode rod into the center hole of the Ni-P plated substrate to hook the substrate and fix the substrate at the same time as contacting the inner peripheral end surface of the substrate I let you.

次にSUS316で作成された、基板外周端面が形成する円より大きい円周のリング状の陰極を基板と同心円となるように、かつ基板と接触しないように配置した。次いで、直流で電圧50V、電流5Aを100sec通電して基板内周端面をエッチングするとともに、基板内周端面上に付着した、あるいは基板内周端面に突き刺さった砥粒などのパーティクルを除去した。   Next, a ring-shaped cathode made of SUS316 and having a circumference larger than the circle formed by the outer peripheral end face of the substrate was arranged so as to be concentric with the substrate and not in contact with the substrate. Next, a DC voltage of 50 V and a current of 5 A were applied for 100 seconds to etch the inner peripheral end surface of the substrate, and particles such as abrasive grains adhering to or stuck into the inner peripheral end surface of the substrate were removed.

その後、水槽より引き上げて基板外周端面をスポンジで擦り洗いし、洗浄剤での超音波浸漬洗浄を行い、更に純水で数段すすぎ洗いを行った後乾燥した。洗浄後の基板の測定視野内の基板外周端面における500nm以上のパーティクルの個数を電子顕微鏡による外観検査で調べた。その結果を図5に示す。なお、図5には、通常洗浄及び燐酸水溶液中での超音波洗浄と通常洗浄の組み合わせ後の基板外周端面における500nm以上のパーティクルの個数を比較のために示した。   Thereafter, the substrate was lifted from the water tank, and the outer peripheral end surface of the substrate was scrubbed with a sponge, subjected to ultrasonic immersion cleaning with a cleaning agent, rinsed with pure water several steps, and then dried. The number of particles of 500 nm or more on the outer peripheral end face of the substrate within the measurement field of the substrate after cleaning was examined by appearance inspection using an electron microscope. The result is shown in FIG. FIG. 5 shows, for comparison, the number of particles of 500 nm or more on the outer peripheral end face of the substrate after the combination of normal cleaning and ultrasonic cleaning in a phosphoric acid aqueous solution and normal cleaning.

図4、5から、通常洗浄及び燐酸水溶液中での超音波洗浄と通常洗浄の組み合わせに比べて、本発明の洗浄方法が高い洗浄性を示していることがわかる。   4 and 5, it can be seen that the cleaning method of the present invention exhibits higher cleaning properties than the combination of normal cleaning and ultrasonic cleaning in a phosphoric acid aqueous solution and normal cleaning.

本発明の研磨方法により、平滑なデータ面を確保しつつ、より清浄度の高い磁気記録媒体用基板を得ることが可能になる。
また、洗浄性がよくなることで磁気記録媒体とした場合の品質も向上するため、より高品質の磁気記録媒体の提供が可能となる。
The polishing method of the present invention makes it possible to obtain a magnetic recording medium substrate with higher cleanliness while ensuring a smooth data surface.
Further, since the quality of the magnetic recording medium is improved by improving the cleaning property, it is possible to provide a higher quality magnetic recording medium.

磁気記録媒体用アルミ基板を示す模式図である。It is a schematic diagram which shows the aluminum substrate for magnetic recording media. 本発明による基板内周端面洗浄を示す図である。It is a figure which shows the board | substrate inner peripheral end surface washing | cleaning by this invention. 本発明による基板外周端面洗浄を示す図である。It is a figure which shows the board | substrate outer periphery end surface washing | cleaning by this invention. 本発明による基板内周端面洗浄の洗浄性を示す図である。It is a figure which shows the washability of the board | substrate inner peripheral end surface washing | cleaning by this invention. 本発明による基板外周端面洗浄の洗浄性を示す図である。It is a figure which shows the washability of the board | substrate outer periphery end surface washing | cleaning by this invention.

符号の説明Explanation of symbols

1:基板内周端面
2:基板外周端面
3:データ面
10:基板(陽極)
11:冶具(陽極)
12:陰極
13:水槽
14:燐酸水溶液
1: substrate inner peripheral end surface 2: substrate outer peripheral end surface 3: data surface 10: substrate (anode)
11: Jig (anode)
12: Cathode 13: Water tank 14: Phosphoric acid aqueous solution

Claims (3)

磁気記録媒体用のNi−Pめっきを施したアルミ基板の洗浄方法であって、酸性電解液中に基板を浸漬し、且つ、基板を陽極に接触させ、一方で基板端面近傍に不溶性電極(陰極)を配置し、両電極間に直流電圧を印加して基板端面のみを選択的にエッチング処理を施し、基板端面を洗浄することを特徴とする磁気記録媒体用アルミ基板の洗浄方法。   A method for cleaning a Ni-P plated aluminum substrate for a magnetic recording medium, wherein the substrate is immersed in an acidic electrolyte and the substrate is brought into contact with the anode, while an insoluble electrode (cathode) is formed near the substrate end face. ), And a DC voltage is applied between the electrodes to selectively etch only the substrate end face, thereby cleaning the end face of the magnetic recording medium. 前記基板端面近傍に不溶性電極(陰極)を配置することが、基板内周端面が形成する円の中心部に、基板と接触しないように不溶性電極(陰極)を配置することであり、陽極が基板外周端面と接触するように設けられていることを特徴とする請求項1に記載の磁気記録媒体用アルミ基板の洗浄方法。   The disposition of the insoluble electrode (cathode) in the vicinity of the substrate end surface means that the insoluble electrode (cathode) is disposed at the center of the circle formed by the inner peripheral end surface of the substrate so as not to contact the substrate, and the anode is the substrate. The method for cleaning an aluminum substrate for a magnetic recording medium according to claim 1, wherein the cleaning method is provided so as to be in contact with an outer peripheral end face. 前記基板端面近傍に不溶性電極(陰極)を配置することが、基板外周端面が形成する円より大きい円周のリング状または筒状の不溶性電極(陰極)を基板と同心円となるように、かつ基板と接触しないように配置することであり、陽極が基板内周端面が形成する円内に、基板内周端面全面と接触するように設けられていることを特徴とする請求項1に記載の磁気記録媒体用アルミ基板の洗浄方法。   Arranging the insoluble electrode (cathode) in the vicinity of the substrate end surface is such that the ring-shaped or cylindrical insoluble electrode (cathode) having a circumference larger than the circle formed by the substrate outer peripheral end surface is concentric with the substrate. 2. The magnetism according to claim 1, wherein the anode is disposed in a circle formed by the inner peripheral end surface of the substrate so as to be in contact with the entire inner peripheral end surface of the substrate. Cleaning method for aluminum substrate for recording media.
JP2008138031A 2008-05-27 2008-05-27 Cleaning method of aluminum substrate for magnetic recording medium Pending JP2009289299A (en)

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JPS52149104A (en) * 1976-06-07 1977-12-12 Hitachi Ltd Preparation of magnetic disc with high recording density
JPS63137200A (en) * 1986-11-28 1988-06-09 Toray Precision Kk Method for electropolishing inner surface of hollow body
JPH09180183A (en) * 1995-12-28 1997-07-11 Kao Corp Production of substrate for magnetic recording medium
JP2002292525A (en) * 2001-03-30 2002-10-08 National Institute Of Advanced Industrial & Technology High speed electrolytic polishing method for inner surface of small diameter hole
JP2005044488A (en) * 2003-07-09 2005-02-17 Fuji Electric Device Technology Co Ltd Substrate for magnetic recording medium, method for manufacturing magnetic recording medium, and substrate cleaning device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52149104A (en) * 1976-06-07 1977-12-12 Hitachi Ltd Preparation of magnetic disc with high recording density
JPS63137200A (en) * 1986-11-28 1988-06-09 Toray Precision Kk Method for electropolishing inner surface of hollow body
JPH09180183A (en) * 1995-12-28 1997-07-11 Kao Corp Production of substrate for magnetic recording medium
JP2002292525A (en) * 2001-03-30 2002-10-08 National Institute Of Advanced Industrial & Technology High speed electrolytic polishing method for inner surface of small diameter hole
JP2005044488A (en) * 2003-07-09 2005-02-17 Fuji Electric Device Technology Co Ltd Substrate for magnetic recording medium, method for manufacturing magnetic recording medium, and substrate cleaning device

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