JP2009281959A - Adapter for measuring device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an adapter for a measuring device capable of short circuiting between test bars of a measuring device only by being attached to the test bars of a measuring device, easily switching to a non short circuit state, and positively avoid breakage of an object to be measured caused by overvoltage or overcurrent. <P>SOLUTION: The adapter for a measuring device includes: an adapter 10a electrically connected to a tester lead TL-a; and an adapter 10b electrically connected to a tester lead TL-b. The adapter 10b includes a probe 2b electrically connected to the tester lead TL-b. When the probe 2b is not in contact with the object to be measured, a probe 2a (tester lead TL-a) of the adaptor 10a and the probe 2b (tester lead TL-b) of the adapter 10b are in conduction. When the probe 2b contacts with the object to be measured, the probe 2a (tester lead TL-a) of the adaptor 10a and the probe 2b (tester lead TL-b) of the adapter 10b are not in conduction. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

  The present invention relates to an adapter for a measuring device that can be attached to a test rod provided in a measuring device in order to contact an object to be measured and measure its electrical characteristics.

  2. Description of the Related Art Conventionally, testers have been widely used as measurement devices for measuring electrical characteristics of measurement objects such as electric circuits and electric elements.

  This “tester” is an abbreviation and is formally called “circuit meter” and is a measuring device having three or more types of measuring functions. Note that the measuring device for measuring electrical characteristics is not limited to a device having a plurality of functions such as a circuit meter, and measures each of voltage, current, and electrical resistance, which are electrical characteristics of a measurement target. For this purpose, voltmeters, ammeters, resistance meters, and the like are often used.

  Usually, the measurement object is measured for electrical characteristics such as voltage, current, and electrical resistance by directly contacting a test bar of a tester. However, when this tester is used as an ohmmeter, there is generally a problem that a large current (overcurrent) flows suddenly from one test bar in contact with the measurement object to the other test bar.

  In particular, when evaluating the reliability of a semiconductor or the like, it is necessary to examine, for example, “elementary” transistors and wirings used in an LSI (large-scale integration). Here, “elementary” means a device that is not provided with an overvoltage protection circuit or the like, and has characteristics that are vulnerable to overvoltage and overcurrent.

  For example, transistors used in recent LSIs are premised on operation in the vicinity of 1V, so if a voltage of 5V or higher is suddenly applied thereto, dielectric breakdown occurs. In addition, if a current of 10 mA is passed through a wiring inside the LSI, for example, a wiring assuming a maximum current = 10 μA, the wiring is burned out (it burns out on the same principle as the life of an incandescent light bulb). End up).

  First, the essence of such a problem will be described in detail with reference to FIGS. 5 (a) to 6 (c). FIG. 5A is a schematic diagram showing a state in which a test bar of a tester is brought into direct contact with an IC (integrated circuit) or the like. FIG. 5B is a circuit diagram showing a state where the voltage source of the tester shown in FIG. 5A is replaced with an equivalent circuit with V = 9 (V).

If the resistance value of the IC or the like shown in FIG. 5B is 90Ω, the power P consumed when the test bar of the tester is brought into direct contact is P = V ² /R=0.9 (W) It becomes. In such a case, the rated power of a sample such as an IC is often less than 0.01 W. Therefore, when the test bar of the tester is brought into direct contact, the IC is broken.

  Therefore, in the past, when an electrically fragile sample was measured using a general-purpose tester, a sample in which two crocodile clips were connected was used, and the test bars of the tester were sandwiched between crocodile clips to temporarily In general, a jig circuit for setting the potential difference between the two test bars to 0 V was configured for measurement.

  Here, based on FIG. 6A to FIG. 6C, when measuring the resistance value of a semiconductor or the like with a tester, both test bars of the tester are short-circuited in advance (the potential difference is set to 0 V). Explain the significance of. First, FIG. 6A is an equivalent circuit diagram of a tester for explaining the problem of overvoltage / overcurrent caused to the measurement object (measurement object) by the tester.

  As shown in the equivalent circuit of FIG. 6A, in general, a tester is a voltage source for supplying power to the entire circuit, a constant current generating circuit for supplying a predetermined constant current (also referred to as a constant current source). , And a combination of voltage measurement circuits. Then, it can be seen that a constant current generating circuit must be used for resistance measurement by a tester.

  That is, when a known constant current I (unit: amperes) is passed through a measurement target having a resistance R of unknown resistance R (unit: ohms), the voltage generated at both ends of the resistance is V (unit: volts) Then, in principle, the unknown resistance R can be measured by Ohm's law (R = V / I).

  Here, the constant current generating circuit is a constant current source that allows a constant current to flow regardless of the resistance value to be measured. Then, if the resistance R is small, the voltage V is small, but if the resistance R is large, the voltage V is also large.

  The state in which the tester is not connected to the resistor R can be considered as an infinite limit where the resistance R is the largest. In this case, the voltage V across the test bar is almost equal to the voltage of the voltage source.

  That is, if the voltage source of the tester is 9V, the tester before the measurement is on standby with the voltage V at both ends of the test bar being 9V.

  Therefore, if the test bar is suddenly connected to the measurement object, this 9V is applied to the measurement object as it is, and the measurement object is destroyed due to overvoltage / overcurrent.

  Next, based on FIG. 6 (b) and FIG. 6 (c), the case where a general tester operating two AA batteries, that is, 3V, is considered.

  FIG. 6B is a circuit diagram showing an equivalent circuit for explaining a state in which both test bars of the tester are in direct contact with the measurement object, and FIG. 6C is a short circuit between both test bars of the tester. It is a circuit diagram which shows the equivalent circuit for demonstrating the state made to contact with a measuring object after letting it do.

  Here, it is assumed that the constant current generating circuit passes a constant current of 100 μA, the resistance R to be measured is 10Ω, and is destroyed when a current of 10 mA or more flows.

  Replacing the above-described situation where the test bar is suddenly connected to the measurement target with an equivalent circuit corresponds to the operation of “closing SW1 from the state where SW1 is open” in the circuit with SW1 shown in FIG. 6B. .

  Then, the current that flows at the moment when SW1 is closed becomes I = V / R = 210 = 0.3 (A) = 200 (mA) ≧ 10 (mA) regardless of the presence or absence of the constant current generation circuit. Before investigating the characteristics, the measurement object will be destroyed by overcurrent and overvoltage.

  By the way, the “constant current generation circuit (constant current source)” is a story in a steady state and transiently behaves like a constant voltage source.

  Therefore, when the situation in which the potential difference between both test bars is temporarily set to 0 V is replaced with an equivalent circuit, “SW2 is closed and SW1 is opened” in the circuit with SW1 and SW2 shown in FIG. 6C. Corresponds to the operation. At this time, a current of 100 μA flows through the path including SW2 due to the operation of the constant current circuit, but since both ends thereof are short-circuited, the potential difference is 0V.

  Furthermore, even if SW1 is closed in this state, the potential difference between both ends of SW2 remains 0 V, so that no current flows through resistor R.

  Next, when SW2 is opened with SW1 closed, current begins to flow through resistor R. However, as an initial condition, the potential difference between both ends of SW2 is 0 V, so that a constant current source of 100 μA suddenly flows into resistor R. There is no flow. Thereafter, the current flowing through the resistor R transiently becomes 100 μA and reaches a steady state.

  From the above consideration, considering the case where an electrically fragile sample is measured using the above-mentioned alligator clip jig circuit and a general-purpose tester, a tester test rod using two crocodile clips connected by a conductive wire is used. A state in which the potential difference between both the test bars is temporarily set to 0 V so that each of these is sandwiched between the alligator clips is a state shown in FIG.

  In this state, since the test bars are short-circuited, even if the test bars are directly brought into contact with the measurement object (even when SW1 is closed), no current flows through the measurement object.

  Next, when one of the alligator clips is removed (SW2 is opened with SW1 closed) and the short-circuit state between the test bars is released, a current from 0 μA to 100 μA flows transiently in the measurement target. However, it can be seen that a current exceeding 100 μA does not flow, and the measurement object is not destroyed by the overvoltage / overcurrent.

  However, the work of opening and closing SW1 and SW2 and the work of attaching and removing the alligator clip at the time of measurement are very complicated, and if the order of the switch opening and closing operations is wrong, after all, There is a problem that the measurement object may be destroyed.

  As a conventional similar technique for measuring the resistance value of a measurement object by bringing a test rod into contact with the measurement object, there is an insulation resistance meter 100 disclosed in Patent Document 1. FIG. 7 is a circuit diagram showing the configuration of this conventional insulation resistance meter 100.

  As shown in FIG. 7, the insulation ohmmeter 100 includes a measurement main body 101 including a measurement switch 111 and a measurement circuit 102, and a test for a measurement electrode electrically connected to the main body 101 via a connection cable 105. It is composed of a rod 103, a ground electrode lead wire 107, and a clip 109.

Further, the measurement test rod 103 of the insulation resistance meter 100 is provided with a measurement switch (changeover switch) 110, and the movable contact 110a of the measurement switch 110 is appropriately moved to the fixed contact 110b side and the fixed contact 110c side. By doing so, the connection between the measurement side and the ground side can be switched by a switch operation at hand.
Japanese Utility Model Publication No. 5-81741 (published on November 5, 1993)

  Here, although different from the purpose of discharging the electric charge of the measuring object M disclosed in Patent Document 1, the conventional insulation resistance meter 100 is connected when the movable contact 110a is switched to the fixed contact 110b side. Since the cable 105 and the ground electrode lead wire 107 are short-circuited, this corresponds to a state in which the potential difference between both test bars is temporarily set to 0 V by sandwiching each of the test bars of the tester with a crocodile clip. It is thought that it has the function to do.

  Therefore, if the configuration of the insulation resistance meter 100 is used, it is considered possible to prevent the measurement target from being destroyed by overvoltage / overcurrent.

  However, as shown in FIG. 5A, when an IC or the like is a measurement target, the maximum is as small as 5 cm. Therefore, in the conventional insulation resistance meter 100, it can be said that the switch operation is at hand. There is a problem that the measurement operation becomes very difficult and complicated, and although not disclosed in Patent Document 1, depending on the size of the measurement test rod 103, the measurement operation itself becomes impossible. It may be possible to end up.

  In addition, when a plurality of measurements are repeated, if the operation for switching to a short circuit state by a switch operation in the previous stage of measurement is forgotten, there is also a problem that the measurement target is eventually destroyed.

  In addition, as a method of preventing an erroneous operation such as a wrong switch opening / closing operation order, there is a method of eliminating troublesome manual work of switching between a short-circuit state and a non-short-circuit state such as a switch opening / closing operation, or a method for preventing a switch from being short-circuited. Unless the operation | work which switches to a short circuit state is performed, the method of maintaining a short circuit state can be considered. Also, this manual operation is preferably simple.

  The present invention has been made in view of the above-mentioned conventional problems, and the object thereof is to simply put the test bars of the measuring device into a short-circuit state between the test bars of the measuring device. It is an object of the present invention to provide an adapter for a measuring device that can be easily mounted on a test bar and that can be easily switched to a state and can reliably prevent a measurement object from being destroyed by an overvoltage / overcurrent.

  In order to solve the above-mentioned problems, the adapter for a measuring device according to the present invention is configured to contact a measurement object and measure the electrical characteristics of the first and second test bars having different polarities, and the first test bar. A measuring device adapter mounted on a measuring device having a constant current source for allowing a predetermined constant current to flow between a test bar and the second test bar, wherein the adapter is electrically connected to the first test bar. A first connection portion connected to the second test rod; and a second connection portion connected to the second test rod. The second connection portion includes a probe electrically connected to the second test rod. When the probe is not in contact with the measurement target, the first connection portion and the probe are in a conductive state, and when the probe is in contact with the measurement target, 1 connection part and the probe It is characterized in that a state of but not conducting.

  Here, the measuring apparatus to which the adapter for the measuring apparatus is attached includes a first test bar and a second test bar having different polarities for contacting the object to be measured and measuring the electrical characteristics thereof, and the first test bar. And a constant current source for supplying a predetermined constant current between the second test bars.

  Therefore, in a steady state in which the first test bar and the second test bar are connected to the measurement object, a predetermined constant current flows between the first test bar and the second test bar by the operation of the constant current source. . Therefore, if the constant current flowing through the measurement target is set in advance below the rated current of the measurement target, it is possible to prevent the measurement target from being destroyed.

  Here, the constant current source has a function of flowing a constant current regardless of the resistance to be measured. Then, if the resistance is small, the voltage is small, but if the resistance is large, the voltage is large. When the measuring device is not connected to the measuring object, it can be considered that the measuring device is connected to the measuring object having an infinite resistance. In this case, the voltage across the test bar is almost the same as that of the measuring device. It becomes equal to the voltage of the voltage source.

  Therefore, the adapter for a measuring device according to the present invention includes a first connection portion that is electrically connected to the first test rod, and a second connection portion that is connected to the second test rod. 2 connection part, when the probe is not in contact with the measurement object, the first connection part and the probe are in a conductive state (hereinafter also referred to as "short-circuit state"), the probe is When the measurement object is contacted, the first connection portion and the probe are not in a conductive state (hereinafter also referred to as “non-short-circuit state”).

  Here, when the first test bar and the second test bar are attached to the measuring device adapter of the present invention, the first connection portion is electrically connected to the first test bar, and the probe is The second test bar is electrically connected.

  In addition, as a structure of the said 1st connection part, you may always connect the said 1st test stick | rod and the said 1st connection part, such as a screwing type, a clip type, and a plug-in type. In this case, at the time of measurement, the object to be measured is brought into contact with either the first connection part and the probe, or the first test bar and the probe to which the first connection part is connected.

  As described above, in the adapter for a measuring apparatus according to the present invention, before the measurement, the probe of the first connection portion (or the first test rod) and the second connection portion are in contact with the measurement object. In this case, since the first connection portion and the probe are in a conductive state, between the first connection portion and the probe (between the first test rod and the second test rod). Is maintained at 0V.

  In the measurement, the first connection part (or the first test rod) and the probe of the second connection part are in contact with the measurement object, and the first connection part and the probe It is comprised so that it may be in the state which is not conducting between.

  Therefore, the potential difference between the first connection part (or the first test bar) and the probe (between the first test bar and the second test bar) at the moment when the probe is brought into contact with the measurement object. Since the initial condition is 0 V, the current flowing between the first test bar and the second test bar is also 0 A. When the first connection part and the probe are not conductive, the first The current flowing between the test bar and the second test bar increases transiently, eventually rises to a constant current of the constant current source, and reaches a steady state.

  Here, with regard to “when the probe is not in contact with the measurement object, the first connection portion and the probe are in a conductive state”, the intended purpose of the present invention is achieved. In such a case, it is necessary to bring both the probe of the second connection portion and the first connection portion (or the first test rod) into contact with the measurement object. This means that it is sufficient that the first connection portion and the probe are not electrically connected to each other when they come into contact with the measurement target.

  Therefore, even if the first connection part (or the first test rod) and the probe are suddenly brought into contact with the measurement object, no current exceeding the rated current flows to the measurement object, so measurement is performed with overvoltage / overcurrent. The target is never destroyed.

  In addition, when the probe is in contact with the measurement object, the first connection portion and the probe are not in a conductive state. It is not necessary to switch between short-circuit and non-short-circuit states between the second test bars by troublesome manual work such as switch operation, and the measurement object can be reliably prevented from being destroyed by overvoltage and overcurrent.

  From the above, it is possible to short-circuit between the test bars of the measuring device simply by attaching them to the measuring device's test bars, making it easy to switch to a non-short-circuited state, and reliably measuring objects with overvoltage and overcurrent. It is possible to provide an adapter for a measuring device that can be attached to a test rod that can prevent the device from being broken.

  In addition to the above-described configuration, the adapter for a measuring device according to the present invention includes a fitting insertion port for fitting the second test rod so that the second test rod can be electrically connected to the probe. The probe is provided on a side of the rod support facing the fitting insertion port, and the rod receiver is formed of a conductor, and An elastic force is applied so that the terminal connected to the connecting portion and the conductive wire, the housing that accommodates the rod holder so as to be slidable in the fitting insertion direction, and the rod receiver are in contact with the terminal. You may provide the 1st elastic body which acts.

  According to the said structure, the adapter for measuring devices of this invention is equipped with the rod holder in which the to-be-inserted insertion port for inserting the said 2nd test rod so that electrical connection with the said probe was possible was provided. Yes. In addition, the probe is provided on the side of the rod receiver that faces the fitting insertion opening. The rod holder is made of a conductor.

  Moreover, the adapter for a measuring device of the present invention includes a terminal to which a conducting wire capable of conducting with the first connection portion is connected, a housing that slidably accommodates the rod support in the insertion direction, And a first elastic body on which an elastic force acts so as to bring the rod receiver into contact with the terminal.

  Therefore, the probe and the first connection portion are brought into a conductive state simply by inserting the second test rod into the insertion opening of the rod receiver and attaching the measuring device adapter to the measuring device. Can do.

  In the measurement, the probe of the first connection part (or the first test rod) and the second connection part are brought into contact with the measurement object to counter the elastic force of the first elastic body. Then, if the terminal and the rod support are separated, the conductive state between the first connection portion and the probe can be released.

  In addition to the above-described configuration, the adapter for a measuring device according to the present invention is configured so that the first elastic body has an elastic force so that the side of the rod support on which the probe is provided contacts the terminal. When the second test rod is mounted, the second connecting portion is provided with a tip of the second test rod and a fitting insertion opening provided on the rod holder. You may be comprised so that a clearance gap may arise between the said probe-side inner surfaces.

  According to the above configuration, in the state where the measuring device adapter of the present invention is attached to the measuring device (before measurement), the side of the rod support on which the probe is provided by the action of the elastic force of the first elastic body is: The terminal is in contact with the terminal, and as described above, the terminal is connected to a conductive wire that can be electrically connected to the first connecting portion. Thereby, it becomes possible to make the said 1st connection part and the said probe into a short circuit state.

  In the measuring device adapter according to the present invention, the first elastic body is a position where an elastic force acts so that the side of the rod support on which the probe is provided contacts the terminal in the housing. When the second test rod is mounted, the second connection portion is provided on the probe side of the tip of the second test rod and the fitting insertion port provided in the rod holder. A gap is formed between the inner surface and the inner surface.

  Therefore, during measurement, the first test bar and the second test bar are held in hand, the first connection part (or the first test bar) and the probe are brought into contact with the measurement object, and the housing is In the body, the probe of the rod receiver is provided by sliding the rod receiver toward the second test rod so that the gap is filled with the elastic force of the first elastic body. The side that is in contact with the terminal can be kept out of contact.

  As a result, the first connection portion and the probe (the first test bar and the second test bar) are brought into a non-short circuit state. The first elastic body may be a metallic spring such as a helical spring or a leaf spring, or may be a non-metallic elastic body such as rubber.

  As described above, when the measuring device adapter of the present invention is attached to the measuring device, the first test rod and the second test rod (the first connecting portion) are measured before the measurement due to the action of the elastic force of the first elastic body. And the probe) are held in a short-circuited state, and the first connecting portion (or the first test rod) and the probe are brought into contact with the measurement object during measurement, and the first elastic body is placed in the casing. The first test bar and the second test bar (the first test bar) can be simply operated by sliding the bar receiver toward the second test bar so that the gap is filled with the elastic force of the first test bar and the second test bar. 1 connection part and the said probe) can be made into a non-short-circuit state.

  In addition to the above-described configuration, the adapter for a measuring device according to the present invention is configured such that the terminal is formed of a second elastic body made of metal, and the second elastic body is free from the gap and is connected to the second test rod. It is preferable that the state is not elastically deformed before contacting with the rod support.

  According to the above configuration, the probe of the rod receiver is provided while the second elastic body is elastically deformed before the gap is eliminated and the second test rod and the rod holder are in contact with each other. The contacted side and the terminal are kept in contact with each other.

  Therefore, while the second elastic body is elastically deformed, the contact state between the side of the rod support on which the probe is provided and the terminal is maintained.

  Therefore, a predetermined grace period can be provided until the side of the rod support where the probe is provided and the terminal are separated from the contact state.

  This predetermined grace period can be appropriately adjusted according to the degree of elastic deformation of the second elastic body constituting the terminal.

  According to the above, it is possible to provide a predetermined grace period between the first connection portion and the probe from the short-circuited state to the non-short-circuited state, and since the short-circuited state cannot be released during the grace period, In a state where the voltage between the first connection part (or the first test bar) and the probe has returned to the voltage level of the voltage source of the measuring device, the first connection part (or the first test bar) and the It is possible to prevent malfunctions such as overvoltage / overcurrent occurring when the probe contacts the measurement object.

  In addition to the above configuration, the adapter for a measuring device according to the present invention may be configured such that the first elastic body is in contact with the terminal on the side of the rod receiver on which the fitting insertion opening is provided. Is provided at a position where an elastic force acts on the casing, and the casing is made of an insulator, and includes a cylindrical body in which a hollow portion into which the probe is inserted in the axial direction is formed, The length of the hollow portion in the axial direction is such that the probe is in the hollow portion when the side where the fitting insertion opening of the rod support is in contact with the terminal, and the tip of the probe is When the outlet of the hollow portion on the measurement target side is reached, the first connection portion and the probe may not be connected.

  According to the above configuration, when the measuring device adapter of the present invention is attached to the measuring device (before measurement), the fitting insertion opening of the rod receiver is provided by the action of the elastic force of the first elastic body. The side in contact with the terminal is in contact with the terminal, and as described above, the terminal is connected to a conductive wire that can be electrically connected to the first connection portion. Thereby, it becomes possible to make the said 1st connection part and the said probe into a short circuit state.

  The casing is made of an insulator and includes a cylindrical body having a hollow portion into which the probe is inserted in the axial direction.

  In addition, the axial length of the hollow portion is such that the probe is in the hollow portion when the side of the rod support on which the fitting insertion opening is provided is in contact with the terminal. When the tip reaches the outlet on the measurement target side of the hollow portion, the first connection portion and the probe are set in a non-conductive state.

  Therefore, when the side of the rod support where the fitting insertion opening is provided is in contact with the terminal, the probe is in the hollow portion, and the first connection portion and the probe are short-circuited. .

  Here, “the probe is in the hollow part” means that the side of the hollow part where the probe is inserted is an “inlet” and the side of the hollow part opposite to the “inlet” is an “outlet” (the above-mentioned Means that the probe is inserted from the “inlet” and the tip of the probe does not reach the outlet. That is, it means that the “exit” and the tip of the probe are separated by a predetermined distance.

  On the other hand, when the tip of the probe reaches the outlet on the measurement target side of the hollow portion, the first connection portion and the probe are not electrically connected (non-short circuit state).

  The first elastic body may be a metallic spring such as a helical spring or a leaf spring, or may be a non-metallic elastic body such as rubber.

  As described above, when the measuring device adapter of the present invention is attached to the measuring device, the first test rod and the second test rod (the first connecting portion) are measured before the measurement due to the action of the elastic force of the first elastic body. And a short-circuit state between the probe and the probe), and at the time of measurement, the tip of the probe reaches the outlet on the measurement object side of the hollow portion so as to come into contact with the measurement object. The first test bar and the second test bar (the first connection part and the probe) can be brought into a non-short circuit state.

  From the above, it is possible to short-circuit between the test bars of the measuring device simply by attaching them to the measuring device's test bars, making it easy to switch to a non-short-circuited state, and reliably measuring objects with overvoltage and overcurrent. It is possible to provide an adapter for a measuring device that can be attached to a test rod that can prevent the device from being broken.

  As described above, the adapter for a measuring apparatus of the present invention includes the first connection portion that is electrically connected to the first test rod and the second connection portion that is connected to the second test rod. The second connection portion includes a probe electrically connected to the second test rod, and when the probe is not in contact with the measurement object, the second connection portion is connected between the first connection portion and the probe. When the probe comes into contact with the measurement object, the first connection portion and the probe are not conductive.

  Therefore, it is possible to short-circuit between the test bars of the measuring device simply by attaching them to the test bar of the measuring device, and it is possible to easily switch to the non-short-circuited state, and to reliably measure overvoltage and overcurrent. This provides an effect of providing an adapter for a measuring device that can be attached to a test bar that can prevent damage to the test rod.

  One embodiment of the present invention will be described below with reference to FIGS. 1 to 4D and 6A.

[Embodiment 1]
A tester adapter (measurement device adapter) 10 according to an embodiment of the present invention will be described below with reference to FIGS. 1, 2, and 6A.

  First, based on FIG.1 and FIG.2, the structure of the adapter 10 for testers which is one Embodiment of this invention is demonstrated.

  FIG. 1 is a cross-sectional view showing a state when the tester adapter 10 is mounted on a measuring device (not shown) such as a tester. Here, the state before contacting the measurement object on the right side toward the paper surface is shown.

  As a premise, the tester to which the tester adapter 10 is attached is brought into contact with a measurement object, and a tester lead (first test rod) TL-a having a different polarity for measuring its electrical characteristics, and a tester lead (first test rod) 2 test rod) TL-b, and a constant current source (see FIG. 6A, etc.) for supplying a predetermined constant current between the tester lead TL-a and the tester lead TL-b. .

  Therefore, in a steady state in which the tester lead TL-a and the tester lead TL-b are connected to the measurement target, a constant current determined in advance between the tester lead TL-a and the tester lead TL-b is caused by the operation of the constant current source. Flowing. Therefore, if the constant current flowing through the measurement target is set in advance below the rated current of the measurement target, it is possible to prevent the measurement target from being destroyed.

  Here, the constant current source has a function of flowing a constant current regardless of the resistance to be measured. Then, if the resistance is small, the voltage is small, but if the resistance is large, the voltage is large. The state in which the measuring device is not connected to the measuring object can be regarded as being connected to the measuring object having an infinite resistance, and in this case, between the tester lead TL-a and the tester lead TL-b. The voltage will be approximately equal to the voltage of the voltage source of the measuring device.

  As shown in FIG. 1, the tester adapter 10 according to the present embodiment for solving the above problems includes an adapter (first connection portion) 10 a electrically connected to the tester lead TL-a, and It is the structure provided with the adapter (2nd connection part) 10b and the conducting wire 9 which are electrically connected to tester lead TL-b.

  The adapter 10a includes a tester lead receiver (bar receiver) 1a, a probe (probe) 2a, a coil spring (first elastic body) 4a, a cover (housing) 5a, a leaf spring 6a, a terminal 7a, and a drawer portion ( Terminal) 8a.

  The adapter 10b includes a tester lead receiver (bar receiver) 1b, a probe (probe) 2b, a coil spring (first elastic body) 4b, a leaf spring (terminal, second elastic body) 4c (see FIG. 2), a cover. (Housing) 5b, leaf spring 6b, terminal 7b, and lead portion (terminal) 8b. In the present embodiment, the plate spring 4c is provided, but a configuration in which the plate spring 4c is not provided may be employed.

  Here, as described below, the adapter 10b includes a probe 2b that is electrically connected to the tester lead TL-b. When the probe 2b is not in contact with the measurement target, the adapter 10b The probe 2a (tester lead TL-a) 10a and the probe 2b (tester lead TL-b) of the adapter 10b are in a conductive state (hereinafter also referred to as "short circuit state"). When contacted with the measuring object, the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b are not electrically connected (hereinafter referred to as “non-short circuit state”). It is also configured to be.

  First, each component of the adapter 10a will be described, and then each component of the adapter 10b will be described.

  As shown in FIG. 1, the tester lead receiver 1a has a fitting insertion opening (left side toward the paper surface of FIG. 1) for fitting the tester lead TL-a so as to be electrically connected to the probe 2a. Is provided. Further, a probe 2a is provided on the side of the tester lead receiver 1a facing the fitting insertion opening (on the right side in FIG. 1), and the tester lead receiver 1a is made of a conductor. Yes.

  Therefore, the probe 2a and the tester lead TL-a are electrically connected by inserting the tester lead TL-a into the insertion opening of the tester lead receiver 1a and attaching the tester adapter 10 to the tester. be able to.

  The shape of the insertion opening may be a cylindrical hole, for example, a cylindrical hole formed by removing a column, a rectangular tube hole formed by removing a rectangular parallelepiped, or the like. Conceivable.

  The probe 2a is brought into contact with the measurement object in order to check the electrical characteristics of the measurement object.

  The coil spring 4a is in contact with the terminal 7a. The coil spring 4a may be brought into contact with the terminal 7a, or may be bonded or welded. Thereby, in this embodiment, it will be in the state by which the tester lead receptacle 1a and the terminal 7a were always connected via the coil spring 4a.

  In the present embodiment, the coil spring 4a is used from the viewpoint of sharing the parts of the adapter 10a and the adapter 10b. However, the coil spring 4a is not provided, and the tester lead receiver 1a and the terminal 7a are directly connected. You may employ | adopt the structure to do.

  Further, since it is only necessary to always connect the tester lead TL-a and the terminal 7a, it is not necessary to adopt a configuration of an adapter with a probe such as the adapter 10a. From such a viewpoint, Embodiment 3 below describes a configuration that is not an adapter with a probe.

  The cover 5a is a case made of an insulator, and the tester lead receiver 1a does not move in the insertion direction of the tester lead TL-a (left-right direction toward the paper surface) (the tester lead TL-a and the terminal 7a) Any structure may be adopted as long as it can be fixed so as not to separate.

  The leaf spring 6a forms a protrusion on the side surface on the inner peripheral side of the insertion opening of the tester lead receiver 1a, and can be elastically deformed to press and fix the tester lead TL-a. In the present embodiment, three leaf springs 6a are provided, but one or more leaf springs may be provided.

  Accordingly, when the tester adapter 10 is attached to the tester lead TL-a, the elastically deformable leaf spring 6a provided on the inner peripheral side surface of the insertion opening of the tester lead receiver 1a is caused by the action of elastic force. Since the mounted tester lead TL-a is pressed and fixed, it is possible to prevent the mounting state between the tester adapter 10 and the measuring device from being easily released. In addition, the electrical connection between the tester lead TL-a and the probe 2a can be improved.

  The terminal 7a and the lead portion 8a are electrically connected to each other, and a lead wire 9 that can be electrically connected to the probe 2b is connected to the lead portion 8a.

  Next, in the tester adapter 10, the main function of the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b is short-circuited or non-short-circuited. Each component of the adapter 10b which is a part will be described.

  As shown in FIG. 1, the tester lead receptacle 1b has a fitting insertion slot (left side toward the paper surface of FIG. 1) for fitting the tester lead TL-b so as to be electrically connected to the probe 2b. Is provided.

  Further, a probe 2b is provided on the side of the tester lead receiver 1b facing the insertion opening (right side as viewed in FIG. 1), and the tester lead receiver 1b is made of a conductor. Yes.

  The probe 2b is brought into contact with the measurement object in order to investigate the electrical characteristics of the measurement object.

  In the cover 5b, the coil spring 4b is in contact with the insertion opening side (left side toward the paper surface) of the tester lead receiver 1b, and an elastic force acts so as to contact the terminal 7b and the tester lead receiver 1b. It is supposed to be.

  The coil spring 4b is a push spring, and utilizes the force to return to the original when the spring is pushed from one end side (from the left side to the right side of the paper), that is, the elastic force of the coil spring 4b. The elastic force acts so that the side of the tester lead receiver 1b on which the probe 2b is provided (the right side as viewed in the drawing) is brought into contact with the terminal 7b.

  The coil spring 4b is a spring that tries to push the tester lead receiver 1b back to the right side as viewed in the drawing. In this embodiment, the elastic body is configured by using the coil spring 4b. However, the elastic body may be a metal spring such as a helical spring or a leaf spring, or a non-metallic elastic body such as rubber. It may be.

  The tester lead receiver 1b and the coil spring 4b may be adhered to each other or may be in contact with each other. However, it is a condition that the electrical connection between the terminal 7b and the tester lead receiver 1b is ensured before the measurement.

  The cover 5b is a case made of an insulator, and accommodates the tester lead receiver 1b so as to be slidable in the insertion direction of the tester lead TL-b (left and right direction with respect to the paper surface).

  The leaf spring 6b forms a protrusion on the inner peripheral side surface of the insertion opening of the tester lead receiver 1b, and is elastically deformable in order to press and fix the tester lead TL-b. In the present embodiment, three leaf springs 6b are provided, but one or more may be provided.

  Accordingly, when the tester adapter 10 is mounted on the tester lead TL-b, the elastically deformable leaf spring 6b provided on the inner peripheral side surface of the insertion opening of the tester lead receiver 1b is caused by the action of the elastic force. Since the mounted test rod is pressed and fixed, it is possible to prevent the mounting state between the tester adapter 10 and the tester lead TL-b from being easily released. In addition, the electrical connection between the tester lead TL-b and the probe 2b can be improved.

  The terminal 7b and the lead portion 8b are electrically connected to each other, and a lead wire 9 capable of conducting with the probe 2a is connected to the lead portion 8b. In the present embodiment, the state in which the side of the tester lead receiver 1b on which the probe 2b is provided (the right side with respect to the paper surface) abuts (contacts) the terminal 7b is maintained by the elastic force of the coil spring 4b. Yes.

  Further, when the tester lead TL-b is mounted on the adapter 10b, a gap A exists between the tip of the tester lead TL-b and the inner surface of the right end of the tester lead receiver 1b.

  According to the above configuration, when the tester adapter 10 is attached to the measuring device (before measurement), the side on which the probe 2b of the tester lead receiver 1b is provided by the action of the elastic force of the coil spring 4b is the terminal 7b. In addition, as described above, the conductor 7 that can be electrically connected to the adapter 10a is connected to the terminal 7b.

  Accordingly, the probe 2a (tester lead TL-a) of the adapter 10a and the adapter can be obtained simply by inserting the tester lead TL-b into the insertion opening of the tester lead receiver 1b and attaching the tester adapter 10 to the measuring device. The probe 2b (tester lead TL-b) 10b can be made conductive.

  In the measurement, the probe 2a of the adapter 10a and the probe 2b of the adapter 10b are brought into contact with the measurement object, and the terminal 7b and the tester lead receiver 1b are separated against the elastic force of the coil spring 4b. By doing so, the conduction state between the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b can be released.

  Here, as shown in FIG. 1, the coil spring 4b is located at a position where the elastic force acts so that the side of the tester lead receiver 1b on which the probe 2b is provided contacts the terminal 7b, as shown in FIG. When the tester lead TL-b is attached, the adapter 10b is provided between the tip of the tester lead TL-b and the inner surface on the terminal 7b side of the insertion opening provided in the tester lead receiver 1b. It is comprised so that the clearance gap A may arise in this.

  Therefore, during measurement, the tester lead TL-a and the tester lead TL-b are held in the hand, the probe 2a and the probe 2b are brought into contact with the measurement object, and the coil spring 4b is placed in the cover 5b. Therefore, by sliding the tester lead receiver 1b toward the tester lead TL-b so that the gap A is filled, the side of the tester lead receiver 1b on which the probe 2b is provided contacts the terminal 7b. It can be in a state that is not. As a result, the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b are not short-circuited.

  As described above, when the tester adapter 10 is attached to the measuring device, the tester lead TL-a (probe 2a) and the tester lead TL-b (probe 2b) are measured before the measurement due to the elastic force of the coil spring 4b. The tester leads are held so that the probe 2a and the probe 2b are brought into contact with the object to be measured and the gap A is filled in the cover 5b between the coil springs 4b. The tester lead TL-a (probe 2a) and the tester lead TL-b (probe 2b) can be brought into a non-short circuit state by a simple operation of sliding the receiver 1b toward the tester lead TL-b. .

  Here, as shown in FIG. 2, a leaf spring 4c (terminal, second elastic body) made of a metal elastic body is provided, and the leaf spring 4c eliminates the gap A, and the tester lead TL-b and the tester. It is preferable to configure so that the lead receiver 1b is not elastically deformed before contacting.

  According to the above configuration, the probe 2b of the tester lead receiver 1b is in a state where the leaf spring 4c is elastically deformed before the gap A disappears and the tester lead TL-b contacts the tester lead receiver 1b. The side where the spring is provided and the leaf spring 4c are maintained in contact with each other.

  Accordingly, while the leaf spring 4c is elastically deformed, the contact state between the side of the tester lead receiver 1b where the probe 2b is provided and the leaf spring 4c (and hence the terminal 7b) is maintained.

  Therefore, a predetermined grace period can be provided until the side where the probe 2b of the tester lead receiver 1b is provided and the leaf spring 4c are separated from each other.

  This predetermined grace period can be appropriately adjusted according to the degree of elastic deformation of the leaf spring 4c.

  According to the above, the predetermined grace period between the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b is changed from the short-circuited state to the non-short-circuited state. Since the short-circuit state cannot be released during the grace period, the voltage between the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b In this state, the probe 2a of the adapter 10a and the probe 2b of the adapter 10b come into contact with the object to be measured, and an overvoltage / overcurrent is prevented. be able to.

  In the case of a probe-type adapter such as the tester adapter 10 of the present embodiment, it is preferable that the adapter 10a and the adapter 10b are configured from the same parts as much as possible. In this case, since the adapter 10a and the adapter 10b can share parts, it is possible to reduce the production cost.

  As described above, the tester adapter 10 is a case where the probe 2a of the adapter 10a and the probe 2b of the adapter 10b are not in contact with the object to be measured before the measurement. Since the probe 2a (tester lead TL-a) and the probe 2b (tester lead TL-b) of the adapter 10b are electrically connected, the probe 2a (tester lead TL-a) of the adapter 10a and the adapter 10b The potential difference between the probe 2b (tester lead TL-b) is kept at 0V.

  In the measurement, the probe 2a of the adapter 10a and the probe 2b of the adapter 10b are in contact with the measurement target. The probe 2a (tester lead TL-a) of the adapter 10a and the probe 10b The needle 2b (tester lead TL-b) is not electrically connected.

  Therefore, the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b at the moment when the probe 2a of the adapter 10a and the probe 2b of the adapter 10b are brought into contact with the measurement object. ) Is 0 V, the current flowing between the tester lead TL-a and the tester lead TL-b is also 0 A, and the probe 2 a (tester lead TL-a) of the adapter 10 a and the probe of the adapter 10 b When the needle 2b (tester lead TL-b) is not conductive, the current flowing between the tester lead TL-a and the tester lead TL-b increases transiently, and finally the constant current source becomes constant. It rises to current and reaches a steady state.

  Therefore, even if the probe 2a of the adapter 10a and the probe 2b of the adapter 10b are suddenly brought into contact with the measurement object, current exceeding the rated current does not flow to the measurement object, so the measurement object is destroyed by overvoltage / overcurrent. It is never done.

  Further, when the probe 2b is in contact with the measurement target, the probe 2a (tester lead TL-a) of the adapter 10a and the probe 2b (tester lead TL-b) of the adapter 10b are not electrically connected. Since it is configured to be in a state, there is no need to switch between short-circuit and non-short-circuit states between the tester lead TL-a and the tester lead TL-b of the measuring device by troublesome manual work such as switch operation, It is possible to ensure that the measurement object is not destroyed by overvoltage / overcurrent.

  From the above, it is possible to short-circuit between the test bars of the measuring device simply by attaching them to the measuring device's test bars, making it easy to switch to a non-short-circuited state, and reliably measuring objects with overvoltage and overcurrent. It is possible to provide a tester adapter 10 that can be attached to a test rod that can prevent damage to the test rod.

[Embodiment 2]
A tester adapter (measurement device adapter) 20 according to another embodiment of the present invention will be described below with reference to FIGS. 3 (a) and 3 (b). Configurations other than those described in the present embodiment are the same as those in the first embodiment. For convenience of explanation, explanation of members having the same functions as those shown in the drawings of Embodiment 1 is omitted.

  Here, only the adapter 20b, which is important in switching between the short-circuit state and the non-short-circuit state between the adapter (first connection portion) 20a (not shown) and the adapter (second connection portion) 20b, will be described.

  FIG. 3A is a cross-sectional view showing the adapter 20b before the measuring device is mounted on the tester adapter 20, and FIG. 3B shows the probe 22b in contact with the measurement object. It is a cross-sectional view which shows the state at the time.

  As shown in FIGS. 3A and 3B, the coil spring 24b of the adapter 20b contacts the terminal 27b on the side of the cover 25b where the fitting insertion opening of the tester lead receiver 21b is provided. It is provided at a position where the elastic force acts so as to make it.

  Further, as shown in FIG. 3A, the cover 25b is made of an insulator, and the probe 22b includes a cylindrical body in which a hollow portion into which the probe 22b is inserted in the axial direction is formed.

  Further, as shown in FIG. 3A, the length of the hollow portion in the axial direction is determined when the side of the tester lead receiver 21b where the fitting insertion opening is provided is in contact with the terminal 27b. When the tip of the probe 22b reaches the outlet on the measurement target side of the hollow portion as shown in FIG. 3B, the tester lead TL-a (probe 22a: not shown) is located in the hollow portion. ) And the tester lead TL-b (probe 22b).

  Therefore, when the side of the tester lead receiver 21b where the fitting insertion opening is provided is in contact with the terminal 27b, the probe 22b is in the hollow portion, and the tester lead TL-a (probe 22a) and the tester The lead TL-b (probe 22b) is short-circuited.

  Here, “the probe 22b is in the hollow part” means that the side of the hollow part where the probe 22b is inserted is “inlet”, and the side of the hollow part opposite to the “inlet” is “exit” "Means that the probe 22b is inserted from the" inlet "and the tip of the probe 22b does not reach the outlet. That is, it means that the “exit” (exit on the measurement target side of the hollow portion) and the tip of the probe 22b are separated by a predetermined distance.

  On the other hand, when the tip of the probe 22b reaches the outlet on the measurement target side of the hollow portion, the tester lead TL-a (probe 22a) and the tester lead TL-b (probe 22b) are not electrically connected. (Non-short circuit state).

  The coil spring 24b may be a metallic spring such as a helical spring or a leaf spring, or may be a non-metallic elastic body such as rubber.

  As described above, when the measuring device adapter of the present invention is attached to the measuring device, the probe 22a (tester lead TL-a) of the adapter 20a and the probe of the adapter 20b are measured before the measurement due to the elastic force of the coil spring 24b. The short-circuit state between the needles 22b (tester leads TL-b) is maintained, and at the time of measurement, the tip of the probe 22b reaches the outlet on the measurement target side of the hollow portion so as to come into contact with the measurement target. By a simple operation, the probe 22a (tester lead TL-a) of the adapter 20a and the probe 22b (tester lead TL-b) of the adapter 20b can be brought into a non-short circuit state.

[Embodiment 3]
It will be as follows if the adapter for testers which is further another embodiment of this invention is demonstrated with reference to Fig.4 (a)-FIG.4 (d). Configurations other than those described in the present embodiment are the same as those in the first and second embodiments. For convenience of explanation, explanation of members having the same functions as those shown in the drawings of Embodiments 1 and 2 is omitted.

  Here, another configuration example of the first connection portion attached to the tester lead TL-a that does not switch between the short-circuit state and the non-short-circuit state will be described.

  FIG. 4A is a schematic diagram illustrating a configuration example when the first connection portion in the adapter for a measuring device is a plug-in type, and FIG. 4B is a diagram illustrating the first connection portion as a screwing type. FIG. 4C is a schematic diagram illustrating a configuration example when the first connection portion is a clip type, and FIG. 4D is a schematic diagram illustrating the first connection portion. It is a schematic diagram which shows the structural example at the time of making a connection part into a U-shaped connection part.

  As described above, the first connecting portion attached to the tester lead TL-a does not need to have a short-circuit / non-short-circuit releasing function similar to that of the probe-type adapter 10b or the like. The conducting wire and the tester lead TL-a may be always connected.

  Accordingly, various configuration examples can be considered for the first connection portion.

  For example, as shown to Fig.4 (a), the 1st connection part comprised from the insertion part 30a, the drawer | drawing-out part 38a, and the conducting wire 39 can be considered. The insertion part 30a may adopt any shape as long as a hole for inserting the tester lead TL-a is provided. However, from the viewpoint of convenience, the size of the insertion portion 30a is preferably as small as possible. Hereinafter, the description regarding the same size is omitted.

  As another example, as shown in FIG. 4B, a first connection portion including a female screw 40 a, a male screw 48 a, and a conductive wire 49 is also conceivable.

  As yet another example, as shown in FIG. 4 (c), a first connecting portion composed of a clip 50a and a conductive wire 59 can be considered, and FIG. 4 (d) shows a tester lead of a tester. In view of the fact that the test rod at the distal end is often screwed, an example is shown in which a first connection portion composed of a U-shaped connection portion 60 a and a conductive wire 69 is configured.

  The configuration of the first connection portion is not limited to the above configuration example, and any configuration may be adopted as long as the lead wire from the second connection portion and the tester lead TL-a can always be connected. You may do it.

  According to the configuration described in each of the above embodiments, the test bars of the measuring device can be short-circuited simply by being attached to the test rods of the measuring device, and the switching to the non-short-circuited state can be easily performed. Thus, it is possible to provide an adapter for a measuring device that can be attached to a test rod that can reliably prevent a measurement object from being destroyed by overvoltage and overcurrent.

  The present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the claims, and the technical means disclosed in different embodiments can be appropriately combined. Such embodiments are also included in the technical scope of the present invention.

  The present invention is preliminarily determined between a first test bar and a second test bar having different polarities and a first test bar and a second test bar, which are in contact with a measurement object and measure the electrical characteristics thereof. The adapter can be applied to any apparatus as long as the measuring apparatus includes a constant current source for supplying a constant current.

It is a cross-sectional view which shows a state when mounting | wearing with a measuring apparatus regarding one Embodiment of the adapter for measuring apparatuses in this invention. It is a cross-sectional view which shows a state when it is made to contact the measuring object in the said adapter for measuring devices. (A) is other embodiment of the measuring device adapter in this invention, It is a cross-sectional view which shows the state before a measuring device is mounted | worn with the said measuring device adapter, (b) is the said measuring device. It is a cross-sectional view which shows a state when a probe is made to contact a measuring object after a measuring apparatus is mounted | worn with the adapter for measurement. (A) is a schematic diagram which shows one structural example of the 1st connection part in the said adapter for measuring devices, (b) is a schematic diagram which shows the other structural example of the said 1st connection part, (c) ) Is a schematic diagram illustrating still another configuration example of the first connection portion, and (d) is a schematic diagram illustrating still another configuration example of the first connection portion. (A) is the schematic which shows a mode in the case of measuring the electrical property of samples, such as IC, with a tester, (b) is a figure which shows the equivalent circuit. (A) is a circuit diagram for demonstrating the problem in measuring the electrical property of samples, such as IC, with a tester, (b) made both the test bars of a tester contact the measuring object directly. It is a circuit diagram which shows the equivalent circuit for demonstrating a state, (c) is a circuit diagram which shows the equivalent circuit for demonstrating the state which made the both test bars of a tester short-circuit one end, and was made to contact with a measuring object. It is. It is a circuit diagram which shows the structure of the conventional insulation resistance meter.

Explanation of symbols

1a Tester lead holder (stick holder)
1b, 21b Tester lead receiver (bar holder)
2a Probe
2b, 22b Probe (probe)
4a Coil spring (first elastic body)
4b, 24b Coil spring (first elastic body)
5a Cover (housing)
5b, 25b Cover (housing)
6a leaf spring 6b, 26b leaf spring 7a terminal 7b, 27b terminal 8a lead-out part (terminal)
8b, 28b Lead (terminal)
4c leaf spring (terminal, second elastic body)
9, 29, 39, 49, 59, 69 Conductor 10, 20 Tester adapter (measurement device adapter)
10a Adapter (first connection part)
10b, 20b adapter (second connection part)
30a plug part (first connection part)
40a Female thread (1st connection part)
48a Male thread (first connection part)
50a clip (first connection)
60a U-shaped connecting part (first connecting part)
A Clearance TL-a Tester lead (first test bar)
TL-b tester lead (second test bar)

Claims (5)

A predetermined constant current is applied between the first test bar and the second test bar and the first test bar and the second test bar having different polarities for contacting the measurement object and measuring the electrical characteristics thereof. An adapter for a measuring device mounted on a measuring device having a constant current source for flowing,
A first connection part electrically connected to the first test bar; and a second connection part connected to the second test bar;
The second connection portion includes a probe that is electrically connected to the second test rod. When the probe is not in contact with the measurement target, the first connection portion and the probe are not connected. An adapter for a measuring apparatus, wherein the adapter is in a conductive state, and when the probe comes into contact with the measurement object, the first connection portion and the probe are not in a conductive state. The second connection portion is
A rod holder provided with a fitting insertion opening for fitting the second test rod so as to be electrically connectable with the probe;
The probe is provided on the side of the rod support facing the fitting insertion opening,
The rod support is made of a conductor,
A terminal to which a conducting wire capable of conducting with the first connection portion is connected;
A housing that accommodates the rod support so as to be slidable in the insertion direction;
The measuring device adapter according to claim 1, further comprising: a first elastic body on which an elastic force acts so that the rod support comes into contact with the terminal. The first elastic body is provided in a position where an elastic force acts so that the side of the rod support on which the probe is provided contacts the terminal in the housing.
The second connection portion is
When the second test rod is mounted, a gap is formed between the tip of the second test rod and the inner surface on the probe side of the fitting insertion opening provided in the rod receiver. The adapter for a measuring device according to claim 2, wherein the adapter is a measuring device.   The terminal is composed of a second elastic body made of metal, and the second elastic body is not elastically deformed before the gap is removed and the second test rod and the rod support come into contact with each other. The adapter for a measuring apparatus according to claim 3, wherein the adapter is in a state. In the housing, the first elastic body is provided at a position where an elastic force acts so as to bring the side of the rod holder on which the fitting insertion opening is provided into contact with the terminal,
The casing is configured by an insulator, and includes a cylindrical body in which a hollow portion into which the probe is inserted in the axial direction is formed.
The axial length of the hollow portion is
When the side of the rod holder on which the fitting insertion opening is provided is in contact with the terminal, the probe is in the hollow portion, and the tip of the probe is at the outlet of the hollow portion on the measurement target side. 2. The measuring device adapter according to claim 1, wherein the measuring device adapter is set so that the first connection portion and the probe are not in a conductive state when the first connection portion is reached.

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