JP2009244256A5 - - Google Patents
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- Publication number
- JP2009244256A5 JP2009244256A5 JP2009042541A JP2009042541A JP2009244256A5 JP 2009244256 A5 JP2009244256 A5 JP 2009244256A5 JP 2009042541 A JP2009042541 A JP 2009042541A JP 2009042541 A JP2009042541 A JP 2009042541A JP 2009244256 A5 JP2009244256 A5 JP 2009244256A5
- Authority
- JP
- Japan
- Prior art keywords
- receiving region
- light receiving
- light
- value
- storage unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009042541A JP5446316B2 (ja) | 2008-03-14 | 2009-02-25 | 光学式センサ装置 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008065180 | 2008-03-14 | ||
| JP2008065180 | 2008-03-14 | ||
| JP2009042541A JP5446316B2 (ja) | 2008-03-14 | 2009-02-25 | 光学式センサ装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2009244256A JP2009244256A (ja) | 2009-10-22 |
| JP2009244256A5 true JP2009244256A5 (enExample) | 2012-03-15 |
| JP5446316B2 JP5446316B2 (ja) | 2014-03-19 |
Family
ID=41306294
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009042541A Expired - Fee Related JP5446316B2 (ja) | 2008-03-14 | 2009-02-25 | 光学式センサ装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5446316B2 (enExample) |
| KR (1) | KR100998781B1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5601984B2 (ja) * | 2010-11-16 | 2014-10-08 | 東洋鋼鈑株式会社 | 多孔板表面検査方法及び多孔板表面検査装置 |
| JP5702990B2 (ja) * | 2010-11-16 | 2015-04-15 | 東洋鋼鈑株式会社 | 板材検査方法及び板材検査装置 |
| JP5927010B2 (ja) | 2012-04-09 | 2016-05-25 | 株式会社日立ハイテクノロジーズ | 検査装置 |
| JP7181828B2 (ja) * | 2019-03-29 | 2022-12-01 | 古野電気株式会社 | 分析装置 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4534877B2 (ja) | 2005-06-17 | 2010-09-01 | オムロン株式会社 | 光学式センサ装置 |
| JP4616120B2 (ja) * | 2005-08-08 | 2011-01-19 | 株式会社日立ハイテクノロジーズ | 画像処理装置及び検査装置 |
| KR100775086B1 (ko) | 2006-06-02 | 2007-11-08 | 주식회사 케이씨텍 | 이물질 감지 장치 및 방법 |
| JP4648880B2 (ja) * | 2006-07-31 | 2011-03-09 | パナソニック電工Sunx株式会社 | 異物検出装置 |
| JP4700574B2 (ja) * | 2006-07-31 | 2011-06-15 | パナソニック電工Sunx株式会社 | 異物検出装置 |
-
2009
- 2009-01-20 KR KR1020090004375A patent/KR100998781B1/ko not_active Expired - Fee Related
- 2009-02-25 JP JP2009042541A patent/JP5446316B2/ja not_active Expired - Fee Related
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