JP2009156805A - Contact structure and mounting method of contact - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a contact structure and a mounting method of contacts capable of implementing correct mounting easily without the damage of contacts difficult to be held by grasping and the like. <P>SOLUTION: The contact structure is produced which has both a holding section and an apical section connected each other through a section to be scheduled to be cut and holds a contact embedded in the apical section so as to expose the mounting section thereof in order to carry out mounting using the contact structure concerned. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

The present invention relates to a contactor structure and a contactor mounting method that enable mounting of a contactor that is difficult to hold and hold.

At the time of individual mounting of a contact such as an interposer used for electrical connection between a probe and a substrate to the substrate, the contact itself is currently held and held (see Patent Document 1 below). As a result, it has become difficult to grasp the contact itself. For example, when a cantilever type probe having a total length (indicated by a symbol w in FIG. 1) of about 0.3 mm is mounted in a high density and matrix manner, the mounting area must be 0.3 mm or less of the probe size. However, in such a case, a mechanical hand for grasping and holding cannot be created from the viewpoint of mechanism and manufacturing. Moreover, if it is forcibly mounted, problems such as damage to the contacts and occurrence of a short circuit due to inaccurate positioning occur. Although it is conceivable to attach the holding member to the contact and hold the holding member with tweezers or the like, it is not practical because the entire contact becomes large.
JP 2006-105682 A

  It is an object of the present invention to obtain a contactor structure and a contactor mounting method that can be easily and accurately mounted without damaging a contactor that is difficult to hold and hold.

(1) A contactor structure for holding a contactor, which has a holding part and a tip part connected via a scheduled cutting part, and is embedded in the tip part so that the mounting part is exposed.

(2) The contactor structure according to (1), wherein the tip portion is mainly made of copper.

(3) The contactor structure according to (1) or (2), wherein a contactor is embedded so that a side surface of the contactor is exposed on a surface of the contactor structure.

(4) (I) The step of holding the holding part of the contactor structure according to (1) and positioning it on the electrode on the substrate surface
(II) joining the contact mounting portion embedded in the contact structure to the electrode;
(III) a step of cutting and removing the holding portion from the distal end portion in the planned cutting portion of the contactor structure;
(IV) dissolving the tip by etching to expose the contact;
A contactor mounting method characterized by comprising:

By using the contactor structure and the mounting method of the present invention, even if the contactor is difficult to hold, such as when high-density mounting is required, the contactor is damaged or positioning is inaccurate. Therefore, it is possible to easily hold the contactor and perform accurate mounting without causing a problem such as occurrence of a short circuit.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a side view of a contact structure for holding a contact that is an example of an embodiment of the present invention. The contactor structure 2 has a holding part 2b and a tip part 2a connected via a planned cutting part 2c, and is formed by embedding the contactor 1 in the tip part 2a so that the mounting part 1a is exposed. . A conductive fixing agent 3 such as solder for fixing to the electrode during mounting is applied to the exposed mounting portion 1a.

In the contactor structure of the present invention, the shape and size of the holding part and the tip part are not particularly limited as long as the action of the present invention is not hindered. As shown in FIGS. Alternatively, the contact may be embedded. By adopting a form in which two or more contacts are embedded, the mounting speed can be increased. 4 and 5, reference numerals 2a 'and 2a' 'denote tip portions, 2b' and 2b '' denote holding portions, and 2c 'and 2c' 'denote cutting portions, respectively. Further, as shown in FIG. 6 according to the holding state at the time of mounting, a convex portion (indicated by reference numeral 2d in FIG. 6) or the like may be further provided on the holding portion 2b in the contact structure of FIG. .

The shape of the planned cutting portion is not particularly limited as long as it can be cut, and it is preferable that the width of the portion where the holding portion and the tip end face each other is narrowed so as to be easily cut so as to have a constricted shape. Further, the constricted shape is preferably an acute angle shape. Further, as shown in FIG. 7, the constricted shape is provided with a cut in the thickness direction of the contact structure as shown in FIG. 8, even if a cut is provided in a direction perpendicular to the thickness direction of the contact structure. However, when a cut is provided in a direction orthogonal to the thickness direction of the contact structure as shown in FIG. 7, an external force is applied to the contact by bending it in the arrow direction A as shown in FIG. It is more preferable because it can be cut without using a cutting jig. In the case of the configuration as shown in FIG. 8, it is necessary to use a cutting jig so as not to apply an external force to the contact.

Further, in the case where the planned cutting part is in the form as shown in FIG. 7, the width of the narrowest part of the constricted shape needs to be a width that does not affect positioning during mounting and is easy to cut, When the total length of the contact (indicated by the symbol w in FIG. 1) is about 0.3 mm, it is preferable that the range is 0.02 to 0.1 mm.

The material for forming the contactor structure according to the present invention is not particularly limited as long as a part other than the contactor can be removed at the time of mounting. However, the tip part in which the contactor is embedded needs to be removable by etching. Also, in the step (II) described below, when the contact mounting part is melted and solidified with the conductive adhesive, the contact is overheated by directly or indirectly heating the mechanical hand. Since the process is preferable because it is simple to melt the adhesive, the material for forming the contact structure of the present invention does not denature by heat, and generates heat by a material having excellent thermal conductivity, induction heating, or the like. It is preferred to use materials. From the above points, it is particularly preferable that the tip portion is mainly formed of copper. The holding portion does not have to be formed of the same material as the tip portion. As shown in FIG. 9, the tip portion 2a '"'" and the holding portion 2b "'"' are formed of different materials and are scheduled to be cut. It may be in the form of being connected by the part 2c '"'", but in the process of manufacturing the contactor structure, it is formed of the same material as the tip, such as copper, or formed of the same nickel as the contactor It is preferable to reduce the number of steps.

  When copper is used as a material for forming at least the tip of the contact structure of the present invention, the contact is embedded in the tip by a method such as electroforming. For example, when the entire contactor structure is formed of copper, the contactor 1 is placed on a die 8 made of a resist material as shown in FIG. 11, and portions other than the contactor 1 are formed of copper by electroforming.

In the contactor structure of the present invention, the contactor is embedded so that the side surface of the contactor is exposed on the surface of the contactor structure, than the contactor side surface is completely embedded in the contactor structure. This is preferable because it is less affected by heat during mounting.

Note that, for example, the contact mounting portion may have a concave shape as shown in FIG. 3 (a) so that the conductive adhesive adheres to the contact mounting portion and the electrode during mounting. By adopting such a shape, at the time of mounting, as shown in FIG. 3B, the conductive fixing agent 3 'after being melted and solidified is brought into close contact with the mounting portion and the electrode of the contact.

  The contact mounting method according to the present invention includes (I) a step of holding the holding portion of the contact structure and positioning the electrode on the substrate surface, and (II) a contact embedded in the contact structure. A step of bonding the mounting portion to the electrode, (III) a step of cutting and removing the holding portion from the tip portion in the portion to be cut of the contactor structure, and (IV) melting and contacting the tip portion by etching. And the step of exposing the child.

  FIG. 2 is a diagram showing a mounting method of the present invention using the contactor structure of FIG. As shown in FIG. 2A, the holding part 2 b of the contactor structure 2 is sucked and held by the suction part 5 of the mechanical hand 4. Next, as shown in FIG. 2B, the contact mounting portion 1a is positioned on the electrode 7 on the surface of the contact substrate 6 while holding the holding portion 2b of the contact structure 2 (step (I )). After the positioning, as shown in FIG. 2C, the contact mounting portion 1a is melted and solidified with the conductive fixing agent 3 and joined to the electrode 7 (step (II). The fixing agent is indicated by reference numeral 3 ′). The conductive fixing agent is melted by a method in which the mechanical hand is directly or indirectly heated to overheat the contact as described above, or a method in which the contact is directly irradiated with a laser. Furthermore, as shown in FIG.2 (d), the holding | maintenance part 2b is cut | disconnected and removed from the front-end | tip part 2a in the scheduled cutting part 2c of the contactor structure 2 (process (III)). Finally, as shown in FIG. 2E, the tip 2a of the contactor structure is dissolved by etching to expose the contactor 1 (step (IV)), and the mounting is completed.

  The etching solution used for etching in the step (IV) is selected so that the tip can be dissolved and the contactor, contactor substrate, electrode and the like are not damaged. For example, when the tip is formed of copper, ferric chloride solution or the like is used.

In the step (I) in the mounting method of the present invention, when holding the holding part of the contactor structure and positioning it on the electrode on the substrate surface, to hold the holding part in an accurate position on the mechanical hand for holding It is preferable to have a positioning reference of (1) because there is no positional deviation during mounting.

  FIG. 12 shows a process of actually creating a probe unit having a large number of probes as contacts by the mounting method of the present invention. When mounting a large number of probes, a large number of contactor structures as described above are prepared in advance, and the steps (I) to (III) of the mounting method of the present invention are repeated to embed the probe in the tip portion. After a large number of the contacts 1 are mounted on the electrodes 7 on the contact substrate surface 6 (FIG. 12A), in step (IV), the contact substrate 6 is immersed in the etching solution 9, and the tip 2a is etched. Is dissolved (FIG. 12B), the probe (contact 1) is exposed (FIG. 12C), and the probe unit 10 is manufactured.

FIG. 13 shows an example in which the probe unit 10 produced as described above is used for a probe card using the mounting method of the present invention. The probe card 11 in FIG. 13 is formed by electrically connecting the probe unit 10 and the main board 12 with connection pins 13 and has a reinforcing plate 14 that suppresses the deflection of the probe card board due to the probe contact load. Connect the connector 15 of the main board 12 and the tester 16;
A probe (contact 1) is brought into contact with the electrode of the semiconductor device to conduct an electrical inspection of the semiconductor device.

  In the present invention, examples of the “contact” include pins for electrical connection between substrates such as an interposer, in addition to the probe in the above embodiment.

Even if it is difficult to hold the contact itself, the contactor structure and the mounting method of the present invention can be easily held and accurately mounted. Useful when implementing contacts in density.

It is a side view of a contactor structure which is an example of an embodiment of the present invention. (A)-(e) is a figure which shows the mounting method of this invention using the contactor structure of FIG. (A) is a figure which shows the example of a shape of the mounting part of a contactor, (b) is a figure which shows the state at the time of the mounting of the contactor of (a). It is a side view of the contactor structure which is the other example of embodiment of this invention. It is a side view of the contactor structure which is the other example of embodiment of this invention. It is a side view of the contactor structure which is the other example of embodiment of this invention. FIG. 2 is a side perspective view of the contact structure of FIG. It is a side perspective view of the contactor structure which is the other example of embodiment of this invention. It is a side view of the contactor structure which is the other example of embodiment of this invention. It is explanatory drawing of the state which cut | disconnects a holding | maintenance part from a front-end | tip part in the cutting scheduled part of a contactor structure. It is explanatory drawing of the formation method of the contactor structure of embodiment of this invention. (A)-(c) is a figure which shows the process of producing a probe unit using the mounting method of this invention. It is a figure which shows the example which used the probe unit produced using the mounting method of this invention for the probe card.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Contactor 1a Mounting part 2 Contactor structure 2a, 2a ', 2a'',2a'"',2a'"'"Tip part 2b, 2b', 2b '', 2b '"', 2b '"''Holding part 2c, 2c', 2c '', 2c ''',2c''''Planned part 2d Convex part 3 Conductive fixing agent 3' Conductive fixing agent after melting and solidification 4 Mechanical hand 5 Adsorbing part 6 Contact board 7 Electrode 8 Mold made of resist material 9 Etching solution 10 Probe unit 11 Probe card 12 Main board 13 Connection pin 14 Reinforcement plate 15 Connector 16 Tester w Total length of contact

Claims (4)

A contactor structure for holding a contactor, which has a holding part and a tip part connected via a scheduled cutting part, and is embedded in the tip part so that the mounting part is exposed. 2. The contactor structure according to claim 1, wherein the tip portion is mainly made of copper. The contactor structure according to claim 1 or 2, wherein a contactor is embedded so that a side surface of the contactor is exposed on a surface of the contactor structure. (I) a step of holding the holding part of the contactor structure according to claim 1 and positioning it on an electrode on a substrate surface;
(II) joining the contact mounting portion embedded in the contact structure to the electrode;
(III) a step of cutting and removing the holding portion from the distal end portion in the planned cutting portion of the contactor structure;
(IV) dissolving the tip by etching to expose the contact;
A contactor mounting method characterized by comprising:

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