JP2009147229A - Carrier for washing and drying substrate - Google Patents

Carrier for washing and drying substrate Download PDF

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Publication number
JP2009147229A
JP2009147229A JP2007325093A JP2007325093A JP2009147229A JP 2009147229 A JP2009147229 A JP 2009147229A JP 2007325093 A JP2007325093 A JP 2007325093A JP 2007325093 A JP2007325093 A JP 2007325093A JP 2009147229 A JP2009147229 A JP 2009147229A
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substrate
carrier
cleaning
frames
angle
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JP2007325093A
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Japanese (ja)
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Seiichi Endo
誠一 遠藤
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Tosoh Quartz Corp
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Tosoh Quartz Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To prevent liquid from remaining on a substrate surface, and also to reduce particles discharged from a carrier as much as possible. <P>SOLUTION: In a carrier, connecting materials 11 made of resin are fixed to an upper portion of a U-shaped frame 1 having electrolytically polished and treated surfaces and being made of stainless, and right and left frames 1 are spaced by spacer materials 12. The bottom sections of the frames 1 are fixed with screws, arranging holding bars 20, 21 and 22 forming a V-shaped holding groove 3 to a round bar made of a polyvinylidene fluoride at proper interval in a triangular shape between both frames 1. Holes 13 and 13 for fixing the holding bars for the frames 1 are formed in slots, and the positions of fixings can be adjusted finely. The angle of the V-shaped holding groove of the holding bar 2 is set at 106&deg;, and the thread surface of a substrate is formed in a point contact, so that a washing liquid is spread. <P>COPYRIGHT: (C)2009,JPO&amp;INPIT

Description

本発明は、フォトマスク用ガラス基板、液晶ディスプレイ用基板、あるいはウエハー等を洗浄装置において洗浄する際に使用する基板洗浄・乾燥用のキャリアに関する。   The present invention relates to a substrate cleaning / drying carrier used when a photomask glass substrate, a liquid crystal display substrate, a wafer, or the like is cleaned in a cleaning apparatus.

洗浄装置において基板を洗浄する際に使用する洗浄・乾燥用キャリアとして図5に示すポリフッ化ビニリデン(PVDF)製のものが知られている。これは、ポリフッ化ビニリデン製の左右のフレーム1の間に3本の基板支持棒2が三角形に配置され、基板支持棒には通常90度(θ1)のV型保持溝が形成されている。フレーム1の中間部には、補強材15が設けてある。ポリフッ化ビニリデンは、フッ素樹脂としては加工性が良く、機械的強度が比較的大きいものであり、この洗浄・乾燥用キャリアに基板をV型保持溝内に保持させて洗浄装置で洗浄し、乾燥している。
フォトマスク基板やウエハー等の基板の洗浄・乾燥に使用するキャリアの材質や形状によっては溶剤や洗浄水が基板表面に残留し、これが基板にしみとして残るという問題があった。この問題を解決するため、本出願人は、特許文献1(実用新案登録第2565386号)にあるように、V型保持溝に被洗浄・乾燥対象となる基板の板厚未満の開口を設け、更に、この開口に、末広がりの三角形の液逃溝を設けることを提案した。
実用新案登録第2565386号
A carrier made of polyvinylidene fluoride (PVDF) shown in FIG. 5 is known as a cleaning / drying carrier used when cleaning a substrate in a cleaning apparatus. This is because three substrate support bars 2 are arranged in a triangle between left and right frames 1 made of polyvinylidene fluoride, and a V-shaped holding groove of 90 degrees (θ 1 ) is usually formed on the substrate support bars. . A reinforcing material 15 is provided in the middle portion of the frame 1. Polyvinylidene fluoride has good processability and relatively high mechanical strength as a fluororesin. The carrier for cleaning and drying is held in a V-shaped holding groove, cleaned with a cleaning device, and dried. is doing.
Depending on the material and shape of the carrier used for cleaning / drying a substrate such as a photomask substrate or a wafer, there is a problem that a solvent or cleaning water may remain on the substrate surface and remain on the substrate. In order to solve this problem, the present applicant, as disclosed in Patent Document 1 (utility model registration No. 2565386), provided an opening less than the thickness of the substrate to be cleaned and dried in the V-shaped holding groove, Furthermore, it has been proposed to provide a triangular liquid escape groove at the end of the opening.
Utility model registration No. 2565386

フォトマスク基板の側面は、45度の面取り角(θ2)で面取りがしてあるので、V字溝の角度(θ1)が90度の場合、洗浄・乾燥用キャリアにセットすると、基板は、図6に示すように、支持棒のV字溝に基板の面取り部(糸面)が密着し、洗浄液が充分に回らず、また、微細な隙間に液が残留して乾燥が不十分となる。更に、近年、キャリア自体から出るパーティクルが基板に付着することが問題とされてきている。
本発明は、槽式洗浄装置において使用する洗浄・乾燥用キャリアにおいて、基板表面に付着した液の残留を防止すると共に、キャリアからのパーティクルの放出を極力少なくすることを目的とするものである。
また、洗浄液が基板にあたるのを阻害する部材を少なくし、洗浄液が効率よく対象物である基板にあたるようにして洗浄効果を高めることを目的とする。
The side surface of the photomask substrate is chamfered at a chamfer angle of 45 degrees (θ 2 ). Therefore, when the angle of the V-groove (θ 1 ) is 90 degrees, the substrate is placed on a cleaning / drying carrier. As shown in FIG. 6, the chamfered portion (thread surface) of the substrate is in close contact with the V-shaped groove of the support rod, the cleaning liquid does not rotate sufficiently, and the liquid remains in a fine gap, resulting in insufficient drying. Become. Furthermore, in recent years, it has been a problem that particles emitted from the carrier itself adhere to the substrate.
SUMMARY OF THE INVENTION An object of the present invention is to prevent a liquid adhering to a substrate surface from remaining in a cleaning / drying carrier used in a bath-type cleaning apparatus, and to minimize the emission of particles from the carrier.
It is another object of the present invention to increase the cleaning effect by reducing the number of members that hinder the cleaning liquid from hitting the substrate and allowing the cleaning liquid to efficiently hit the target substrate.

そこで、基板を側面と下部のV型保持溝で保持する槽式洗浄・乾燥用キャリアにおいて、V型保持溝の角度(θ1)を、基板をセットした時の基板糸面とV型保持溝のなす角(θ3)が5〜15度の範囲となるようにして洗浄液の残留を抑止するものである。
更に、キャリアの左右フレームを表面を電解研磨したステンレス製とすることによって、従来のキャリアに比較して、パーティクルの基板への付着数を減少させるものである。
Therefore, in the tank-type cleaning / drying carrier for holding the substrate by the side and lower V-shaped holding grooves, the angle (θ 1 ) of the V-shaped holding groove is set so that the substrate yarn surface and the V-type holding groove when the substrate is set are set. angle of (theta 3) are intended to suppress the residual of the cleaning liquid as in the range of 5 to 15 degrees.
Further, the left and right frames of the carrier are made of stainless steel whose surface is electropolished, thereby reducing the number of particles adhering to the substrate as compared with the conventional carrier.

本発明によれば、電解研磨したステンレス材を左右のフレーム材として使用することにより、従来のPVDFを使用したものに比して断面を薄くすることができた。また、ステンレス材としたのでPVDFより剛性が高く、フレームの補強部材が不要となり、従って洗浄液が基板にあたるのを阻害する部材が少なくなったので、洗浄液が効率よく対象物である基板にあたり洗浄効果が高まる。
また、V字溝が基板糸面と平行にならず、基板とV型保持溝の接触が点接触となり、洗浄液の残留をほぼなくすことができるので、洗浄・乾燥時のシミの発生を防止することができると共に、接触面からの基板へのパーティクル付着を極力防止することができる。
更に、電解研磨されたステンレスからはパーティクルが殆ど発生しないので、パーティクルの基板への付着数を従来のものに比較して3分の1以下に激減させ、半導体製造において、製品の歩留まりを向上させることができる。
According to the present invention, by using an electropolished stainless steel material as the left and right frame materials, the cross section can be made thinner than that using conventional PVDF. In addition, since it is made of stainless steel, it has higher rigidity than PVDF, and no frame reinforcing member is required. Therefore, there are fewer members that impede the cleaning liquid from hitting the substrate. Rise.
In addition, the V-shaped groove is not parallel to the substrate yarn surface, and the contact between the substrate and the V-shaped holding groove becomes a point contact, and the residue of the cleaning liquid can be almost eliminated, thereby preventing the occurrence of stains during cleaning and drying. In addition, the adhesion of particles from the contact surface to the substrate can be prevented as much as possible.
Furthermore, since almost no particles are generated from the electropolished stainless steel, the number of particles adhering to the substrate is drastically reduced to one-third or less compared with the conventional one, and the yield of products is improved in semiconductor manufacturing. be able to.

以下、面取り角(θ2)が45度の基板用の場合を例にし、図面に基づいて本発明を詳細に説明する。なお、V字溝角度(θ1)、基板の面取り角(θ2)及び基板糸面とV字溝がなす角度(θ3)の関係は、θ3=θ1/2+θ2−90である。
図1は、本発明の基板洗浄・乾燥用キャリアの正面図と平面図を、図2は側面図、図3はV型保持溝を有する保持棒の拡大図である。
キャリアは、表面を電解研磨したステンレス(SUS316)製のコの字型のフレーム1の上部に連結材11が固定してあり、左右のフレーム1は、スペーサ材12によって間隔が保持されている。フレーム1の底部は、ポリフッ化ビニリデン製の丸棒(φ16mm)に適宜の間隔でV字溝を形成した保持棒20、21、22が両フレーム1の間に三角形に配置してネジで固定してある。フレーム1の保持棒を固定するための穴13、13は長穴にしてあり、固定位置を微調整することができる。
本実施例では、保持棒2のV型保持溝3は、図3に示すようにθ1が約106度の角度にしてある。このV型保持溝3の深さは、洗浄対象物の基板の厚さに応じて変更し、基板がV字溝の中間部で接するようにするのが、安定性の面からみて好ましい。
Hereinafter, the present invention will be described in detail with reference to the drawings, taking as an example the case of a substrate having a chamfer angle (θ 2 ) of 45 degrees. Incidentally, the V-groove angle (theta 1), the relationship of the chamfered angle of the substrate (theta 2) and the angle (theta 3) formed by the substrate fiber surface and V-shaped groove is a θ 3 = θ 1/2 + θ 2 -90 .
1 is a front view and a plan view of a substrate cleaning / drying carrier of the present invention, FIG. 2 is a side view, and FIG. 3 is an enlarged view of a holding rod having a V-shaped holding groove.
The carrier has a connecting material 11 fixed to the upper part of a U-shaped frame 1 made of stainless steel (SUS316) whose surface is electropolished, and the left and right frames 1 are held at intervals by spacer materials 12. At the bottom of the frame 1, holding rods 20, 21, and 22 having V-shaped grooves formed at appropriate intervals on a round bar made of polyvinylidene fluoride (φ16mm) are arranged in a triangle between both frames 1 and fixed with screws. It is. The holes 13 and 13 for fixing the holding rod of the frame 1 are elongated holes, and the fixing position can be finely adjusted.
In the present embodiment, the V-shaped holding groove 3 of the holding rod 2 has an angle θ 1 of about 106 degrees as shown in FIG. It is preferable from the viewpoint of stability that the depth of the V-shaped holding groove 3 is changed in accordance with the thickness of the substrate of the object to be cleaned so that the substrate is in contact with the middle portion of the V-shaped groove.

本発明のキャリアと従来のポリフッ化ビニリデン製のキャリアを使用してガラス基板を洗浄して、付着残留していた0.3μm以上のパーティクルの数をカウントした結果を図4に示す。パーティクルの数が最大でも80個であり、従来品に比較して約1/4であり、平均では約1/3の20個であった。   FIG. 4 shows the result of counting the number of particles having a particle size of 0.3 μm or more remaining on the glass substrate by cleaning the glass substrate using the carrier of the present invention and a conventional carrier made of polyvinylidene fluoride. The maximum number of particles was 80, which was about 1/4 compared with the conventional product, and the average was about 20, which was about 1/3.

V字溝の角度(θ1)について95度から1度刻みで角度を変更し、面取り角度(θ2)を45度とした通常のガラス基板を保持し、洗浄した後の洗浄水の残留の様子及びしみの発生を調べたところ、100度以上、すなわち、V字溝と基板糸面のなす角(θ3)が5度以上あれば、ガラス基板の糸面と保持棒のV型保持溝の間には空間が形成されて残留水は殆どなく、しみの発生はなかった。角度を更に大きくするとV字溝の間隔が大きくなって不経済となり、V字溝の底に水が残留する恐れがあるので、120度程度、すなわちV字溝と基板糸面のなす角(θ3)の上限は15度である。基板と支持棒溝との間の空間の確保と基板支持の安定性からは、105度から110度とするのがより望ましい。 The angle of the V-shaped groove (θ 1 ) is changed from 95 degrees in increments of 1 degree, and a normal glass substrate with a chamfer angle (θ 2 ) of 45 degrees is held and washed water remaining after cleaning When the appearance and the occurrence of stains were examined, if the angle (θ 3 ) between the V-shaped groove and the substrate yarn surface was 5 ° or more, the glass surface yarn surface and the holding rod V-shaped holding groove A space was formed between them, there was almost no residual water, and no spots were generated. If the angle is further increased, the distance between the V-shaped grooves is increased, which is uneconomical, and water may remain at the bottom of the V-shaped grooves. Therefore, about 120 degrees, that is, the angle formed between the V-shaped groove and the substrate yarn surface (θ 3 ) The upper limit is 15 degrees. From the viewpoint of securing the space between the substrate and the support rod groove and the stability of the substrate support, it is more preferable that the angle is 105 degrees to 110 degrees.

本発明の洗浄・乾燥用キャリアの正面図、平面図。The front view and top view of the washing | cleaning / drying carrier of this invention. 本発明の洗浄・乾燥用キャリアの側面図。The side view of the carrier for washing | cleaning and drying of this invention. 本発明の洗浄・乾燥用キャリアの保持棒の拡大図。The enlarged view of the holding | maintenance rod of the carrier for washing | cleaning and drying of this invention. パーティクル数の比較グラフ。Comparison graph of the number of particles. 従来の洗浄・乾燥用キャリアの正面図。The front view of the conventional washing | cleaning and drying carrier. V字溝と基板面取り角の関係の説明図。Explanatory drawing of the relationship between a V-shaped groove and a substrate chamfering angle.

符号の説明Explanation of symbols

1 フレーム
2 保持棒
3 V型保持溝
θ1 V型保持溝角度
θ2 面取り角度
1 Frame 2 Holding rod 3 V-type holding groove θ 1 V-type holding groove angle θ 2 Chamfering angle

Claims (2)

面取りした基板の両側辺と下辺をV型保持溝を形成した支持棒で保持する洗浄・乾燥用キャリアにおいて、V型保持溝が、基板の糸面とV型保持溝のなす角度(θ3)が5〜15度となるようにした角度(θ1)である基板洗浄・乾燥用キャリア。 In a cleaning / drying carrier in which both sides and lower side of a chamfered substrate are held by a support rod having a V-shaped holding groove, an angle (θ 3 ) between the yarn surface of the substrate and the V-shaped holding groove Is a substrate cleaning / drying carrier having an angle (θ 1 ) of 5 to 15 degrees. 請求項1において、キャリアのフレームがステンレスで構成され、ステンレスの表面が電解研磨処理したものである基板洗浄・乾燥用キャリア。 2. The substrate cleaning / drying carrier according to claim 1, wherein the carrier frame is made of stainless steel, and the surface of the stainless steel is subjected to electrolytic polishing treatment.
JP2007325093A 2007-12-17 2007-12-17 Carrier for washing and drying substrate Pending JP2009147229A (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06286869A (en) * 1993-04-05 1994-10-11 Japan Energy Corp Substrate holder
JPH07231035A (en) * 1994-02-15 1995-08-29 Yodogawa Kasei Kk Holding member of plate body, and plate-body holder using the same
JPH1055997A (en) * 1996-05-20 1998-02-24 Tokyo Electron Ltd Dry treating device and dry treatment
JP2005013963A (en) * 2003-06-30 2005-01-20 Showa Denko Kk Polishing and washing method, and polishing and washing apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06286869A (en) * 1993-04-05 1994-10-11 Japan Energy Corp Substrate holder
JPH07231035A (en) * 1994-02-15 1995-08-29 Yodogawa Kasei Kk Holding member of plate body, and plate-body holder using the same
JPH1055997A (en) * 1996-05-20 1998-02-24 Tokyo Electron Ltd Dry treating device and dry treatment
JP2005013963A (en) * 2003-06-30 2005-01-20 Showa Denko Kk Polishing and washing method, and polishing and washing apparatus

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