JP2009147036A - Vacuum heating device for wafer - Google Patents

Vacuum heating device for wafer Download PDF

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JP2009147036A
JP2009147036A JP2007321472A JP2007321472A JP2009147036A JP 2009147036 A JP2009147036 A JP 2009147036A JP 2007321472 A JP2007321472 A JP 2007321472A JP 2007321472 A JP2007321472 A JP 2007321472A JP 2009147036 A JP2009147036 A JP 2009147036A
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shutter
shafts
longitudinal direction
wafer
opening
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JP5279253B2 (en
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Kosaku Saino
耕作 才野
Yasuyuki Sato
泰之 佐藤
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Tatsumo KK
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Tatsumo KK
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Abstract

<P>PROBLEM TO BE SOLVED: To smoothly vertically move a shutter through a plurality of shafts sliding in a guide hole, even when longitudinal thermal deformation is produced in the shutter. <P>SOLUTION: This vacuum heating device 10 for a wafer supplies moving force for vertical movement to the shutter 3 from a drive mechanism 7 via the shafts 4 and 5. The shaft 5 is divided into two portions, such as, an upper first member 51 and a lower second member 52, and an engaging groove 521 for sliding an engaging piece 513 formed on the upper first member 51 in the longitudinal direction (the direction of the arrow X) of the shutter 3 is formed on the lower second member. The upper end of the shaft 4 and the first member 51 are fixed to the shutter 3. When thermal expansion is produced in the direction of in the arrow X in the shutter 3, the first member 51 is displaced in the direction of the arrow X, with respect to the second member 52, and deformation will not be produced in the shaft 4 and the second member 52. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

この発明は、真空状態で半導体ウェハを加熱するウェハ用真空加熱装置に関し、特に、半導体ウェハが搬入出される開口部を開閉するシャッタの構造に関する。   The present invention relates to a wafer vacuum heating apparatus that heats a semiconductor wafer in a vacuum state, and more particularly to a shutter structure that opens and closes an opening through which a semiconductor wafer is carried in and out.

半導体製造工程には、半導体ウェハを真空状態で1000℃程度に加熱するアニール処理等の真空加熱処理が含まれる場合があり、ウェハ用真空加熱装置が用いられる(例えば、特許文献1参照。)。   The semiconductor manufacturing process may include a vacuum heating process such as an annealing process for heating the semiconductor wafer to about 1000 ° C. in a vacuum state, and a wafer vacuum heating apparatus is used (see, for example, Patent Document 1).

ウェハ用真空加熱装置は、半導体ウェハを水平に保持して収納する処理部を備えている。処理部には、長手方向を水平にした開口部が設けられている。処理部には、開口部を経由してウェハが1枚ずつ搬入及び搬出される。処理部内はウェハの処理に際して内部を真空状態にして高温に保持される。   The wafer vacuum heating apparatus includes a processing unit that holds and holds a semiconductor wafer horizontally. The processing unit is provided with an opening having a horizontal longitudinal direction. Wafers are carried into and out of the processing unit one by one via the opening. The inside of the processing unit is kept at a high temperature by evacuating the inside of the wafer during processing.

このため、ウェハの処理中に開口部を閉鎖しておく必要があり、ウェハ用真空加熱装置には、開口部を開閉するシャッタが備えられている。シャッタは、開口部の前面で支持部を介して高さ方向に移動自在に支持されており、例えば空圧シリンダ等の駆動機構によって昇降することで、開口部を開閉する。   For this reason, it is necessary to close the opening during the processing of the wafer, and the vacuum heating apparatus for wafer is provided with a shutter for opening and closing the opening. The shutter is movably supported in the height direction via a support portion on the front surface of the opening portion, and opens and closes the opening portion by moving up and down by a driving mechanism such as a pneumatic cylinder.

支持部は、加熱処理時に処理部からの熱伝導による温度変化に拘らずシャッタを円滑に昇降させることができるとともに、処理部の気密性を維持できる構造にする必要がある。   The support portion needs to have a structure capable of smoothly raising and lowering the shutter regardless of a temperature change due to heat conduction from the processing portion during heat treatment and maintaining the airtightness of the processing portion.

このため、シャッタの長手方向の両端部近傍に、垂直方向のガイド孔を貫通した円柱形状のシャフトの一方の端部を固定し、駆動機構から2本のシャフトを介してシャッタに昇降動作を伝達することが考えられる。駆動機構の駆動力は、ガイド孔内を摺動するシャフトを介してシャッタに伝達される。
特開2004−335621号公報
For this reason, one end of a cylindrical shaft passing through a vertical guide hole is fixed near both ends in the longitudinal direction of the shutter, and the lifting operation is transmitted from the drive mechanism to the shutter via the two shafts. It is possible to do. The driving force of the driving mechanism is transmitted to the shutter via a shaft that slides in the guide hole.
JP 2004-335621 A

しかし、シャッタは、熱処理時に処理部からの熱輻射や熱伝導による温度上昇によって長手方向に伸びを生じ、2本のシャフトの間隔がシャッタに固定されている一方の端部側で拡がる。このため、2本のシャフトがガイド孔内を摺動する際に大きな抵抗が生じ、シャッタを円滑に昇降させることができなくなる問題がある。   However, the shutter expands in the longitudinal direction due to a temperature rise due to heat radiation or heat conduction from the processing section during heat treatment, and the interval between the two shafts expands on one end side fixed to the shutter. For this reason, there is a problem that a large resistance is generated when the two shafts slide in the guide hole, and the shutter cannot be raised and lowered smoothly.

この発明の目的は、シャッタに長手方向の熱変形を生じた場合でも、ガイド孔内を摺動する複数のシャフトを介してシャッタを円滑に昇降させることができるウェハ用真空加熱装置を提供することにある。   An object of the present invention is to provide a vacuum heating apparatus for a wafer that can smoothly lift and lower a shutter through a plurality of shafts that slide in a guide hole even when the shutter undergoes thermal deformation in the longitudinal direction. It is in.

この発明のウェハ用真空加熱装置は、処理部、シャッタ、複数のシャフト、ガイド部材及び駆動機構を備えている。処理部は、スリット状の開口部を有し、開口部から内部に挿入されたウェハを真空状態で加熱する。シャッタは、開口部の長手方向に直交する方向に沿って往復移動して開口部を開閉する。複数のシャフトは、それぞれの軸方向を前記長手方向に直交させて配置され、シャッタにおける長手方向に沿う複数の位置に軸方向の一方の端部が取り付けられる。ガイド部材は、複数のシャフトのそれぞれが軸方向に沿って摺動自在に貫通する複数のガイド孔を備えている。駆動機構は、複数のシャフトに軸方向の移動力を供給する。複数のシャフトのうち長手方向の最も外側の一方に位置するシャフトは、一端部を長手方向に沿う所定範囲内でシャッタに対して移動自在にされた可動シャフトである。   The vacuum heating apparatus for a wafer according to the present invention includes a processing unit, a shutter, a plurality of shafts, a guide member, and a drive mechanism. The processing unit has a slit-shaped opening, and heats the wafer inserted into the inside through the opening in a vacuum state. The shutter reciprocates along a direction orthogonal to the longitudinal direction of the opening to open and close the opening. The plurality of shafts are arranged with their respective axial directions orthogonal to the longitudinal direction, and one end in the axial direction is attached to a plurality of positions along the longitudinal direction of the shutter. The guide member includes a plurality of guide holes through which each of the plurality of shafts slidably penetrates along the axial direction. The drive mechanism supplies axial movement force to the plurality of shafts. The shaft located on the outermost side in the longitudinal direction among the plurality of shafts is a movable shaft whose one end is movable with respect to the shutter within a predetermined range along the longitudinal direction.

シャッタは、駆動機構から複数のシャフトに供給される移動力により、開口部の長手方向に直交する方向に沿って往復移動し、処理部の開口部を開閉する。処理部におけるウェハの加熱処理時に処理部からの熱輻射や熱伝導による温度上昇によってシャッタが長手方向に伸びを生じた場合に、可動シャフトがシャッタに対して相対的に移動する。他のシャフトから離れる方向の応力が可動シャフトの一方の端部側に作用することがなく、複数のシャフトの間隔が維持される。このため、シャッタに温度変化による熱変形を生じた場合にも、複数のシャフトはガイド部材のガイド孔内を円滑に摺動する。   The shutter reciprocates along a direction orthogonal to the longitudinal direction of the opening by the moving force supplied to the plurality of shafts from the drive mechanism, and opens and closes the opening of the processing unit. When the shutter is elongated in the longitudinal direction due to a temperature rise due to heat radiation or heat conduction from the processing unit during the heat treatment of the wafer in the processing unit, the movable shaft moves relative to the shutter. Stress in a direction away from the other shaft does not act on one end side of the movable shaft, and the interval between the plurality of shafts is maintained. For this reason, even when the shutter is thermally deformed due to a temperature change, the plurality of shafts slide smoothly in the guide hole of the guide member.

この構成において、長手方向におけるシャッタの両端部に合計2本のシャフトを備えてもよい。最小数のシャフトによって駆動機構の移動力をシャッタに安定して伝達できる。   In this configuration, a total of two shafts may be provided at both ends of the shutter in the longitudinal direction. The moving force of the drive mechanism can be stably transmitted to the shutter by the minimum number of shafts.

また、可動シャフトは、一方の端部側で軸方向に沿う第1部材と第2部材とに分割したものであってもよい。第1部材を軸方向の一端側の露出部をシャッタから露出させてシャッタに固定し、露出部と第2部材の軸方向における第1部材側の連結部とのそれぞれに、長手方向の係合溝と係合溝に長手方向に摺動自在に係合する係合片との何れかを形成する。シャッタの熱変形に伴って第1部材が長手方向に移動しても、第2部材が長手方向に移動することはなく、シャッタに温度変化による熱変形を生じた場合にも、複数のシャフトをガイド部材のガイド孔内で円滑に摺動させることができる。   The movable shaft may be divided into a first member and a second member along the axial direction on one end side. The exposed portion on one end side in the axial direction is exposed from the shutter to be fixed to the shutter, and the exposed portion and the connecting portion on the first member side in the axial direction of the second member are engaged in the longitudinal direction. Either a groove or an engagement piece that is slidably engaged with the engagement groove in the longitudinal direction is formed. Even if the first member moves in the longitudinal direction along with the thermal deformation of the shutter, the second member does not move in the longitudinal direction. It can be smoothly slid in the guide hole of the guide member.

この発明によれば、シャッタに長手方向の熱変形を生じた場合に、可動シャフトがシャッタに対して相対的に移動して複数のシャフトの間隔が維持されるため、ガイド孔内を摺動する複数のシャフトを介してシャッタを円滑に昇降させることができる。   According to the present invention, when the longitudinal thermal deformation of the shutter occurs, the movable shaft moves relative to the shutter and the interval between the plurality of shafts is maintained. The shutter can be raised and lowered smoothly through the plurality of shafts.

図1は、この発明の実施形態であるウェハ用真空加熱装置10の外観図である。図2は、ウェハ用真空加熱装置10の要部の側面断面図である。ウェハ用真空加熱装置10は、一例として半導体ウェハを真空状態で1000℃程度に加熱するアニール処理等の真空加熱処理に用いられ、処理部1、支持部材2、シャッタ3、2本のシャフト4,5、ガイド部材6及び駆動機構7を備えている。   FIG. 1 is an external view of a wafer vacuum heating apparatus 10 according to an embodiment of the present invention. FIG. 2 is a side sectional view of a main part of the wafer vacuum heating apparatus 10. The wafer vacuum heating apparatus 10 is used, for example, for vacuum heating processing such as annealing for heating a semiconductor wafer to about 1000 ° C. in a vacuum state, and includes a processing section 1, a support member 2, a shutter 3, two shafts 4, and the like. 5, a guide member 6 and a drive mechanism 7 are provided.

処理部1は、薄型の筐体であり、前面にスリット状の開口部11を備えている。開口部11は、長手方向(矢印X方向)を水平にして配置されている。処理部1の内部には、図示しないロボットアームを介して半導体ウェハが水平状態にして開口部11から挿入される。処理部1は、外部に図示しない加熱手段を備えている。処理部1の内部は、図示しない真空ポンプにより、排気管12を経由して真空状態に排気される。   The processing unit 1 is a thin casing and includes a slit-shaped opening 11 on the front surface. The opening 11 is arranged with the longitudinal direction (arrow X direction) horizontal. A semiconductor wafer is inserted into the processing unit 1 from the opening 11 in a horizontal state via a robot arm (not shown). The processing unit 1 includes a heating unit (not shown) outside. The inside of the processing unit 1 is evacuated to a vacuum state via an exhaust pipe 12 by a vacuum pump (not shown).

支持部材2は、処理部1の前面に配置されている。支持部材2には、凹部21が形成されている。凹部21内には、シャッタ3が収納されている。支持部材2は、固定ネジ22を介して前面に取り付けられるカバー部材8とともに、シャッタ3を開口部11の長手方向に直交する方向である垂直方向(矢印Z方向)に沿って往復移動自在に支持する。   The support member 2 is disposed on the front surface of the processing unit 1. A recess 21 is formed in the support member 2. The shutter 3 is accommodated in the recess 21. The support member 2 supports the shutter 3 in a reciprocating manner along a vertical direction (arrow Z direction) that is a direction orthogonal to the longitudinal direction of the opening 11 together with a cover member 8 attached to the front surface via a fixing screw 22. To do.

シャッタ3は、一例としてアルミニウム合金を素材として形成されており、凹部21内で矢印Z方向に沿って往復移動する。シャッタ3は、下限位置で開口部11を開放し、上限位置で開口部11を気密状態で閉鎖する。   The shutter 3 is made of an aluminum alloy as an example, and reciprocates along the arrow Z direction in the recess 21. The shutter 3 opens the opening 11 at the lower limit position and closes the opening 11 in an airtight state at the upper limit position.

シャフト4,5は、軸方向を矢印Z方向に平行にして、矢印X方向に沿って配置されている。シャフト4,5の上端部は、シャッタ3の底面における矢印X方向の両端部に取り付けられている。シャフト4,5の下端部は、連結バー71に固定されている。   The shafts 4 and 5 are arranged along the arrow X direction with the axial direction parallel to the arrow Z direction. The upper end portions of the shafts 4 and 5 are attached to both end portions in the arrow X direction on the bottom surface of the shutter 3. The lower ends of the shafts 4 and 5 are fixed to the connecting bar 71.

ガイド部材6は、支持部材2の下方に配置されている。ガイド部材6には、ガイド孔61,62が形成されている。ガイド孔61,62には、それぞれシャフト4,5が矢印Z方向に摺動自在に貫通している。   The guide member 6 is disposed below the support member 2. Guide holes 61 and 62 are formed in the guide member 6. The shafts 4 and 5 penetrate the guide holes 61 and 62 slidably in the direction of arrow Z, respectively.

なお、支持部材2には、貫通孔24,25が形成されている。貫通孔24,25には、それぞれシャフト4,5が矢印Z方向に摺動自在に貫通している。   The support member 2 is formed with through holes 24 and 25. The shafts 4 and 5 penetrate the through holes 24 and 25 slidably in the arrow Z direction, respectively.

シャフト4,5は、例えば、ステンレスを素材として円柱形状に形成されており、ガイド孔61,62及び貫通孔24,25も円形断面に形成されている。   The shafts 4 and 5 are formed in a cylindrical shape using, for example, stainless steel, and the guide holes 61 and 62 and the through holes 24 and 25 are also formed in a circular cross section.

駆動機構7は、一例として空圧シリンダであり、圧空の流入出に応じて内部のピストンが矢印Z方向に沿って昇降する。ピストンの昇降動作は、連結部材72に伝達される。連結部材72には、連結バー71が固定されている。駆動機構7は、ピストンの昇降動作を連結部材72、連結バー71及びシャフト4,5を介してシャッタ3に矢印Z方向の移動力として供給する。   The drive mechanism 7 is a pneumatic cylinder as an example, and an internal piston moves up and down along the arrow Z direction in response to the inflow and outflow of compressed air. The raising / lowering motion of the piston is transmitted to the connecting member 72. A connecting bar 71 is fixed to the connecting member 72. The drive mechanism 7 supplies the piston ascending / descending operation to the shutter 3 as a moving force in the arrow Z direction via the connecting member 72, the connecting bar 71 and the shafts 4 and 5.

図3は、シャフト5の上端部の組立図である。シャフト5は、軸方向である矢印Z方向について第1部材51及び第2部材52との2分割に構成されている。シャフト5は、例えば、
第1部材51には、基部511、嵌入部512、係合片513が同軸上に一体に形成されている。基部511は、偏平円柱体の周面を互いに平行な2平面511A,511Bで面取りして形成されている。嵌入部512は、円柱形状を呈し、連結部514を介して基部511の上方に位置している。係合片513は、偏平円柱形状を呈し、連結部515を介して基部511の下方に位置している。嵌入部512及び係合片513は、基部511よりも小径にされている。
FIG. 3 is an assembly view of the upper end portion of the shaft 5. The shaft 5 is configured to be divided into two parts, that is, a first member 51 and a second member 52 in an arrow Z direction that is an axial direction. The shaft 5 is, for example,
In the first member 51, a base 511, a fitting portion 512, and an engagement piece 513 are integrally formed on the same axis. The base 511 is formed by chamfering the circumferential surface of the flat cylindrical body with two parallel planes 511A and 511B. The fitting portion 512 has a cylindrical shape and is located above the base portion 511 through the connecting portion 514. The engagement piece 513 has a flat cylindrical shape and is located below the base portion 511 via the connecting portion 515. The fitting portion 512 and the engagement piece 513 are smaller in diameter than the base portion 511.

第2部材52は、基部511の外径よりも大径の円柱形状を呈している。第2部材52の上端部には、係合溝521及び開放溝522が形成されている。係合溝521の幅は、係合片513の外径に略等しくされている。係合溝521の高さは、係合片513の高さよりも長くされている。開放溝522は、第2部材52の上端面から係合溝521に連通している。開放溝522の幅は、連結部515の外径に略等しくされている。開放溝522の高さは、連結部515の高さに略等しくされている。   The second member 52 has a cylindrical shape with a diameter larger than the outer diameter of the base 511. An engagement groove 521 and an opening groove 522 are formed at the upper end portion of the second member 52. The width of the engagement groove 521 is substantially equal to the outer diameter of the engagement piece 513. The height of the engagement groove 521 is longer than the height of the engagement piece 513. The open groove 522 communicates with the engagement groove 521 from the upper end surface of the second member 52. The width of the open groove 522 is substantially equal to the outer diameter of the connecting portion 515. The height of the open groove 522 is substantially equal to the height of the connecting portion 515.

開放溝522の長手方向を矢印X方向に平行にし、連結部515の矢印Y及びZ方向の位置を開放溝522の位置に一致させ、第1部材51を第2部材52に対して相対的に矢印X方向に近接させていくと、係合片513が係合溝521に嵌入し、連結部515が開放溝522に嵌入する。これによって、第1部材51と第2部材52とがシャフト5として一体にされ、第1部材51は、第2部材52に対して矢印Y方向及び矢印Z方向の相対的な移動を規制された状態で、矢印X方向に相対的に移動自在にされる。   The longitudinal direction of the open groove 522 is made parallel to the arrow X direction, the positions of the connecting portion 515 in the arrows Y and Z directions are made coincident with the position of the open groove 522, and the first member 51 is relative to the second member 52. When approaching in the direction of the arrow X, the engaging piece 513 is fitted into the engaging groove 521 and the connecting portion 515 is fitted into the open groove 522. Accordingly, the first member 51 and the second member 52 are integrated as the shaft 5, and the first member 51 is restricted from relative movement in the arrow Y direction and the arrow Z direction with respect to the second member 52. In the state, it is relatively movable in the arrow X direction.

第1部材51及び第2部材52は、図3に示す形状に限るものではなく、第1部材51を第2部材52に対して矢印Y方向及び矢印Z方向の相対的な移動を規制した状態で矢印X方向に相対的に移動自在にできることを条件に、種々の形状とする
図4は、ウェハ用真空加熱装置10の要部の正面断面図であり、シャッタ3に対するシャフト4,5の取付状態を示している。シャッタ3の矢印X方向の両端部には、底面に開放した穴部31,32が形成されている。穴部31,32は、それぞれ下方の大径部31A,32Aと上方の小径部31B,32Bとで構成されている。大径部31A,32Aは、基部511の外径よりも僅かに小さい内径にされており、図3に示した2平面511A,511Bと同じ幅の2平面が形成されており、基部511の高さより短くされている。小径部31B,32Bは、嵌入部512の外径よりも僅かに小さい内径にされており、嵌入部512の高さよりも長くされている。
The first member 51 and the second member 52 are not limited to the shapes shown in FIG. 3, but the first member 51 is restricted from relative movement in the arrow Y direction and the arrow Z direction with respect to the second member 52. FIG. 4 is a front sectional view of the main part of the vacuum heating apparatus 10 for wafers, with the shafts 4 and 5 being attached to the shutter 3. Indicates the state. At both ends of the shutter 3 in the direction of the arrow X, holes 31 and 32 opened to the bottom surface are formed. The holes 31 and 32 are configured by lower large diameter portions 31A and 32A and upper small diameter portions 31B and 32B, respectively. The large diameter portions 31A and 32A have an inner diameter slightly smaller than the outer diameter of the base portion 511, and two flat surfaces having the same width as the two flat surfaces 511A and 511B shown in FIG. Shorter than that. The small diameter portions 31 </ b> B and 32 </ b> B have an inner diameter slightly smaller than the outer diameter of the insertion portion 512, and are longer than the height of the insertion portion 512.

シャフト4の上端部には、嵌入部41、段部42及び廻り止め部43が同軸上に形成されている。嵌入部41及び段部42は、それぞれシャフト5の嵌入部512及び連結部514と同一の外径及び高さにされている。廻り止め部43は、シャフト5の基部511と同一の外径にされており、図3に示した2平面511A,511Bと同一幅の2平面が形成されている。   An insertion part 41, a step part 42, and a rotation prevention part 43 are coaxially formed at the upper end part of the shaft 4. The fitting portion 41 and the stepped portion 42 have the same outer diameter and height as the fitting portion 512 and the connecting portion 514 of the shaft 5, respectively. The anti-rotation portion 43 has the same outer diameter as the base portion 511 of the shaft 5, and two planes having the same width as the two planes 511A and 511B shown in FIG. 3 are formed.

シャフト4の上端部は、シャッタ3の穴部31に下方から圧入される。シャフト4において、嵌入部41の外周面が小径部31Bの内周面に圧接し、廻り止め部43の上部の外周面が大径部31Aの内周面に圧接する。これによって、シャフト4の上端部は、シャッタ3に固定される。   The upper end of the shaft 4 is press-fitted into the hole 31 of the shutter 3 from below. In the shaft 4, the outer peripheral surface of the fitting portion 41 is in pressure contact with the inner peripheral surface of the small diameter portion 31B, and the outer peripheral surface of the upper portion of the detent portion 43 is in pressure contact with the inner peripheral surface of the large diameter portion 31A. As a result, the upper end portion of the shaft 4 is fixed to the shutter 3.

シャフト5の第1部材の上端部は、シャッタ3の穴部32に下方から圧入される。第1部材51において、嵌入部512の外周面が小径部32Bの内周面に圧接し、係合片513の上部の外周面が大径部32Aの内周面に圧接する。これによって、第1部材51は、シャッタ3固定される。   The upper end portion of the first member of the shaft 5 is press-fitted into the hole portion 32 of the shutter 3 from below. In the first member 51, the outer peripheral surface of the fitting portion 512 is in pressure contact with the inner peripheral surface of the small diameter portion 32B, and the upper outer peripheral surface of the engagement piece 513 is in pressure contact with the inner peripheral surface of the large diameter portion 32A. Thereby, the first member 51 is fixed to the shutter 3.

処理部1における加熱処理時には、温度上昇によってシャッタ3が長手方向である矢印X方向に膨張し、矢印X方向におけるシャッタ3に固定されたシャフト4と第1部材51との間隔が伸びる。このとき、第1部材51は、第2部材52の上端部に対して矢印X1方向に摺動し、矢印X方向におけるシャフト4と第2部材52との間隔は変化しない。このため、シャッタ3に熱変形を生じた場合でも、シャフト4及び第2部材に変形を生じることがなく、ガイド孔61,62及び貫通孔24,25に対するシャフト4及び第2部材の摺動性が変化することがなく、シャッタ3を円滑に昇降させることができる。   During the heat treatment in the processing unit 1, the shutter 3 expands in the arrow X direction, which is the longitudinal direction, due to a temperature rise, and the interval between the shaft 4 fixed to the shutter 3 and the first member 51 in the arrow X direction increases. At this time, the first member 51 slides in the arrow X1 direction with respect to the upper end portion of the second member 52, and the interval between the shaft 4 and the second member 52 in the arrow X direction does not change. Therefore, even when the shutter 3 is thermally deformed, the shaft 4 and the second member are not deformed, and the sliding property of the shaft 4 and the second member with respect to the guide holes 61 and 62 and the through holes 24 and 25 is prevented. The shutter 3 can be raised and lowered smoothly without changing.

シャッタ3は、第1部材51とともに第2部材52に対して矢印X方向に変位自在にされているが、シャフト4に対しては変位しないため、矢印X方向における開口部11に対するシャッタ3の位置が変位することはない。   The shutter 3 is displaceable in the arrow X direction with respect to the second member 52 together with the first member 51, but is not displaced with respect to the shaft 4, so the position of the shutter 3 with respect to the opening 11 in the arrow X direction. Will not be displaced.

なお、小径部31B,32Bを雌ねじ穴とし、嵌入部41,512の周面に雄ねじを形成し、シャッタ3に対してシャフト4及び第1部材51を螺合させてもよい。   The small diameter portions 31B and 32B may be formed as female screw holes, male screws may be formed on the peripheral surfaces of the fitting portions 41 and 512, and the shaft 4 and the first member 51 may be screwed to the shutter 3.

また、第1部材51の下端部に係合溝を形成し、第2部材52の上端部に係合片を形成してもよい。   Further, an engagement groove may be formed at the lower end portion of the first member 51 and an engagement piece may be formed at the upper end portion of the second member 52.

この実施形態では、複数のシャフトを2本のシャフト4,5で構成したが、3本以上のシャフトで複数のシャフトを構成してもよい。この場合には、最も外側に位置する一方のシャフトを除く複数のシャフトをシャフト5と同様の構成とすればよい。   In this embodiment, the plurality of shafts are constituted by the two shafts 4 and 5, but the plurality of shafts may be constituted by three or more shafts. In this case, a plurality of shafts except for one shaft located on the outermost side may be configured similarly to the shaft 5.

上述の実施形態の説明は、すべての点で例示であって、制限的なものではないと考えられるべきである。本発明の範囲は、上述の実施形態ではなく、特許請求の範囲によって示される。さらに、本発明の範囲には、特許請求の範囲と均等の意味および範囲内でのすべての変更が含まれることが意図される。   The description of the above-described embodiment is an example in all respects and should be considered as not restrictive. The scope of the present invention is shown not by the above embodiments but by the claims. Furthermore, the scope of the present invention is intended to include all modifications within the meaning and scope equivalent to the scope of the claims.

この発明の実施形態であるウェハ用真空加熱装置の外観図である。It is an external view of the vacuum heating apparatus for wafers which is embodiment of this invention. 同ウェハ用真空加熱装置の要部の側面断面図である。It is side surface sectional drawing of the principal part of the vacuum heating apparatus for wafers. 一方のシャフトの上端部の組立図である。It is an assembly drawing of the upper end part of one shaft. ウェハ用真空加熱装置の要部の正面断面図であり、シャッタに対するシャフトの取付状態を示す図である。It is front sectional drawing of the principal part of the vacuum heating apparatus for wafers, and is a figure which shows the attachment state of the shaft with respect to a shutter.

符号の説明Explanation of symbols

1−処理部
3−シャッタ
4,5−シャフト
6−支持部
7−駆動機構
10−ウェハ用真空加熱装置
11−開口部
51−第1部材
52−第2部材
61,62−ガイド孔
513−係合片
521−係合溝
1-Processing Unit 3-Shutter 4,5-Shaft 6-Supporting Unit 7-Drive Mechanism 10-Vacuum Heating Device for Wafer 11-Opening 51-First Member 52-Second Member 61, 62-Guide Hole 513- Joint 521-engaging groove

Claims (3)

スリット状の開口部を有する処理部であって前記開口部から内部に挿入されたウェハを真空状態で加熱する処理部と、
前記開口部の長手方向に直交する方向に沿って往復移動することにより前記開口部を開閉するシャッタと、
それぞれの軸方向を前記長手方向に直交させて配置され、前記シャッタにおける前記長手方向に沿う複数の位置に前記軸方向の一方の端部を取り付けた複数のシャフトと、
前記複数のシャフトのそれぞれが前記軸方向に沿って摺動自在に貫通する複数のガイド孔が形成されたガイド部材と、
前記複数のシャフトに前記軸方向の移動力を供給する駆動機構と、
を備え、前記複数のシャフトのうち前記長手方向の最も外側の一方に位置するシャフトが、その一端部を前記長手方向に沿う所定範囲内で前記シャッタに対して移動自在にした可動シャフトであるウェハ用真空加熱装置。
A processing unit having a slit-shaped opening, and heating the wafer inserted into the inside through the opening in a vacuum state;
A shutter that opens and closes the opening by reciprocating along a direction orthogonal to the longitudinal direction of the opening;
A plurality of shafts arranged with their respective axial directions orthogonal to the longitudinal direction and having one end portion in the axial direction attached to a plurality of positions along the longitudinal direction of the shutter;
A guide member formed with a plurality of guide holes through which each of the plurality of shafts slidably penetrates along the axial direction;
A drive mechanism for supplying the axial movement force to the plurality of shafts;
And a wafer located on the outermost side in the longitudinal direction among the plurality of shafts is a movable shaft whose one end is movable with respect to the shutter within a predetermined range along the longitudinal direction. Vacuum heating equipment.
前記複数のシャフトが、前記長手方向における前記シャッタの両端部に配置された2本のシャフトである請求項1に記載のウェハ用真空加熱装置。   The wafer vacuum heating apparatus according to claim 1, wherein the plurality of shafts are two shafts arranged at both ends of the shutter in the longitudinal direction. 前記可動シャフトは、一方の端部側で前記軸方向に沿う第1部材と第2部材とに分割され、前記第1部材は前記軸方向の一端側の露出部を前記シャッタから露出させて前記シャッタに固定され、前記露出部と前記第2部材の前記軸方向における前記第1部材側の連結部とのそれぞれに、前記長手方向の係合溝と前記係合溝に前記長手方向に摺動自在に係合する係合片との何れかを形成した請求項1又は2に記載のウェハ用真空加熱装置。   The movable shaft is divided into a first member and a second member along the axial direction on one end side, and the first member exposes an exposed portion on one end side in the axial direction from the shutter. Fixed to the shutter, and slides in the longitudinal direction into the longitudinal engaging groove and the engaging groove in each of the exposed portion and the connecting portion on the first member side in the axial direction of the second member. The wafer vacuum heating device according to claim 1, wherein any one of the engagement pieces that are freely engaged is formed.
JP2007321472A 2007-12-13 2007-12-13 Wafer vacuum heating system Active JP5279253B2 (en)

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003515950A (en) * 1999-11-30 2003-05-07 ウエファーマスターズ, インコーポレイテッド Single wafer furnace with resistance heating

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003515950A (en) * 1999-11-30 2003-05-07 ウエファーマスターズ, インコーポレイテッド Single wafer furnace with resistance heating

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