JP2009136935A - Polishing pad - Google Patents

Polishing pad Download PDF

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Publication number
JP2009136935A
JP2009136935A JP2007313198A JP2007313198A JP2009136935A JP 2009136935 A JP2009136935 A JP 2009136935A JP 2007313198 A JP2007313198 A JP 2007313198A JP 2007313198 A JP2007313198 A JP 2007313198A JP 2009136935 A JP2009136935 A JP 2009136935A
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JP
Japan
Prior art keywords
polishing
polishing pad
circumference part
flatness
suede
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Pending
Application number
JP2007313198A
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Japanese (ja)
Inventor
聡 田中
Satoshi Tanaka
Shinji Nakamura
真二 中村
Kazuhiko Toyoda
和彦 豊田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chiyoda Corp
Hamai Co Ltd
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Chiyoda Corp
Hamai Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Chiyoda Corp, Hamai Co Ltd filed Critical Chiyoda Corp
Priority to JP2007313198A priority Critical patent/JP2009136935A/en
Publication of JP2009136935A publication Critical patent/JP2009136935A/en
Pending legal-status Critical Current

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Abstract

<P>PROBLEM TO BE SOLVED: To solve a problem wherein a circumferential velocity difference between an inner circumference part and the outer circumference part of a carrier causes an accuracy difference in the surface roughness, parallelism and flatness in a single work in a conventionally used polishing pad whose diameter of openings on the surface is same and whose carrier of a planetary gear type polishing device executes circular movement of autorotation and revolution. <P>SOLUTION: The polishing pad is formed into a doughnut-like shape and changes the opening diameters so as to reduce the dispersion of the surface roughness of the polishing surfaces of the outer circumference part and the inner circumference part and uniformize the accuracy of the parallelism and the flatness, thereby improving the manufacturing efficiency. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

本発明は、シリコン、ガリュウム砒素等の半導体や、ガラス、金属等の種々の基板の鏡面研磨加工を行う研磨装置に使用される研磨パッドに関する。   The present invention relates to a polishing pad used in a polishing apparatus that performs mirror polishing of various substrates such as semiconductors such as silicon and gallium arsenide, glass, and metal.

従来よりガラス板、シリコンウエハ等を研磨する遊星歯車式平面研磨装置によれば、上プレート、下プレート、キャリヤ、太陽歯車及び内歯車を備える。上プレート及び下プレート加工面には、研磨基材としては、不織布の片面に湿式凝固法にて微多孔構造のウレタン樹脂層を形成したスウェードタイプの研磨布を両面粘着テープを介して貼り付け使用する。   Conventionally, a planetary gear type plane polishing apparatus for polishing a glass plate, a silicon wafer or the like includes an upper plate, a lower plate, a carrier, a sun gear, and an internal gear. Uses a suede-type abrasive cloth with a microporous urethane resin layer formed on one side of a nonwoven fabric by wet coagulation on the processed surface of the upper and lower plates with a double-sided adhesive tape. To do.

また研磨パッドの性能改善の為に研磨布、又は研磨パッドの研磨作用面を再研磨して表面状態を改質することや、表面に機械的加工により溝をつけるとか、長気孔を多数有するパッドすることが行われている。
特開平11−77518 特開平11−285963 特開2000−42901
Also, to improve the performance of the polishing pad, the polishing cloth or the polishing surface of the polishing pad is re-polished to improve the surface condition, the surface is grooved by mechanical processing, or a pad with many long pores. To be done.
JP-A-11-77518 JP-A-11-285963 JP2000-42901

研磨対象物をバッチ式で研磨する遊星歯車式平面研磨装置の場合、キャリヤに装着して数十枚を同時研磨加工している。研磨面の繊細化、平行・平坦度等の1キャリヤのバッチ内での精度の均一性が近年求められているが、従来のパッドでの加工後のワークは、キャリヤ外周部と内周部でのワークの面粗度や平行・平面度の精度差が出てしまう。   In the case of a planetary gear type plane polishing apparatus that polishes an object to be polished in batch mode, it is mounted on a carrier and several tens of sheets are simultaneously polished. The uniformity of accuracy within a batch of one carrier such as fineness of polishing surface, parallelism / flatness, etc. has been demanded in recent years. There will be a difference in accuracy between the surface roughness and parallel / flatness of the workpiece.

本発明は、ワーク研磨加工後のより高精度化の要求に対応し、その改良と生産工程の短縮化を目的とした研磨パッドを提供するものである。   The present invention provides a polishing pad that meets the demand for higher accuracy after workpiece polishing and aims to improve the accuracy and shorten the production process.

上記の課題を解決するために本発明は、研磨プレートに貼り付けて用いられるスエード様研磨パッドで、ドーナツ状に開口径を変化させて形成されている研磨パッドで、ドーナツ状の帯が2〜5本形成させ、ドーナツ状の帯の開口径が1本飛びに0.1〜10倍に変化させ形成させた研磨パッドを提供する。   In order to solve the above problems, the present invention is a suede-like polishing pad that is used by being attached to a polishing plate, and is a polishing pad that is formed by changing the opening diameter in a donut shape. Provided is a polishing pad formed by changing the opening diameter of five donut-shaped bands to 0.1 to 10 times.

研磨パッドは、片面に湿式凝固法にて微多孔構造のウレタン樹脂層を形成したスウェードタイプの研磨布とする。その研磨布は、湿式凝固法にて生成させた微多孔質構造が表面から内部にかけてとっくり型に形成されており、その表面からサンディングペーパーで研削して開口径を出現させている。   The polishing pad is a suede type polishing cloth in which a urethane resin layer having a microporous structure is formed on one side by a wet coagulation method. In the polishing cloth, a microporous structure generated by a wet coagulation method is formed in a rough shape from the surface to the inside, and the opening diameter appears by grinding with sanding paper from the surface.

その研削量を変化させることにより、開口径も変化させられる。研削量を多くすれば開口径は大きくなる。この原理により、ドーナツ状に開口径を変化させて形成し、ドーナツ状の帯が2〜5本形成させる。そのドーナツ状の帯の隣同士の開口径が1.5〜10倍もしくは1/10〜1/1.5倍に変化させた研磨パッドが対象となる。   By changing the grinding amount, the opening diameter can also be changed. If the grinding amount is increased, the opening diameter is increased. Based on this principle, it is formed in a donut shape by changing the opening diameter, and 2 to 5 donut-shaped bands are formed. The polishing pad in which the opening diameters adjacent to the doughnut-shaped band are changed to 1.5 to 10 times or 1/10 to 1 / 1.5 times is an object.

本発明に使用されるスウェードタイプ研磨布に用いられる不織布はポリエステル繊維等のウエブに合成ゴム、ポリウレタン等の樹脂を含浸させた公知のものが利用できる。スウェード層はポリエステル系ポリウレタン、ポリエーテル系ポリウレタン、ポリカーボ系ポリウレタン等を用いて公知の湿式製法にて製造できる。ウレタン層に顔料等種々の添加剤を混合できる。   As the nonwoven fabric used for the suede type polishing cloth used in the present invention, a known nonwoven fabric in which a web such as polyester fiber is impregnated with a resin such as synthetic rubber or polyurethane can be used. The suede layer can be produced by a known wet manufacturing method using polyester polyurethane, polyether polyurethane, polycarbonate or the like. Various additives such as pigments can be mixed in the urethane layer.

更にスウェードタイプの研磨布は、通常は不織布の裏面に両面テープを貼り付け研磨機に装着して使用される。   Furthermore, a suede type polishing cloth is usually used by attaching a double-sided tape to the back of a non-woven fabric and attaching it to a polishing machine.

ポリウレタン樹脂を30%含浸させた、厚さ1.00mm のポリエステル繊維不織布上にポリエステルポリウレタン樹脂(固形分30%)100部、ジメチルホルムアミド(DMF)50部、黒顔料(顔料分8%)30部、凝固促進剤1.5部、で調合された溶液を、11100g/mの塗布量にてコーティングし、10%DMF水溶液凝固層に進入させ
凝固、洗浄、乾燥させてとっくり型の厚み700μmの発泡構造を持ったスウェード原布が得られる。
Polyester polyurethane resin (solid content 30%) 100 parts, dimethylformamide (DMF) 50 parts, black pigment (pigment content 8%) 30 parts on 1.00 mm thick polyester fiber nonwoven fabric impregnated with 30% polyurethane resin The solution prepared with 1.5 parts of a coagulation accelerator was coated at an application amount of 11100 g / m 2 , entered into a 10% DMF aqueous solution coagulation layer, coagulated, washed, and dried. A suede fabric with a foamed structure is obtained.

通常はこの段階で表面からサンディングペーパーで研削してスウェード層の表面に目的の開口径の穴を開けるが、本発明では前述の原布を1300mm角に裁断して、125μmのポリエステルフィルムを500mm径の円盤と、内径1000mm、外径1250mmのドーナツ状盤にトムソンで抜き、それらを1300mmにカットした原布裏面不織布に中心を合わせて接着剤で貼り付け、更に心材に188μmポリエステルフィルムを使用してアクリル系両面テープを不織布裏面に重ねて貼り付けた。その後研磨機にて#120のペーパーを使用して185μmスウェード表面より研削した。得られたスウェードタイプ研磨布は内側より開口径80、30、80μmであった。更に1200mmφにトムソンで抜き、一枚ものの研磨パッドが得られた。
開口径の測定方法は、マイクロスコープを利用して一定倍率により10μm刻みで20〜100μmの9段階の標準見本写真をあらかじめ作成し、測定資料を同倍率で写真資料を作成し標準見本と照らし合わせて測定する。
また得られたパッドは、穴あけ、溝切り加工等を通常通り実施できる。
Usually, at this stage, the surface is ground with sanding paper to make a hole with the desired opening diameter on the surface of the suede layer. In the present invention, the above-mentioned raw cloth is cut into 1300 mm square, and a 125 μm polyester film is cut into a 500 mm diameter. And a doughnut-shaped disk with an inner diameter of 1000 mm and an outer diameter of 1250 mm with Thomson, and center them on a non-woven fabric on the back of the raw cloth cut to 1300 mm, and paste it with an adhesive. Acrylic double-sided tape was applied on the back of the nonwoven fabric. Then, it was ground from a 185 μm suede surface using # 120 paper by a polishing machine. The obtained suede type polishing cloth had opening diameters of 80, 30, and 80 μm from the inside. Further, it was extracted with 1200 mmφ with Thomson, and a single polishing pad was obtained.
To measure the aperture diameter, use a microscope to create standard sample photographs in 9 steps from 20 to 100 μm in increments of 10 μm at a constant magnification, and create measurement materials at the same magnification and compare them with the standard sample. To measure.
Further, the obtained pad can be subjected to drilling, grooving and the like as usual.

また、上記スウェード原布をあらかじめ開口径30、80μmに研削し、ドーナツ状に別々にトムソンで抜き組み合わせ、裏面を両面テープを貼り付けて作成することも出切る。   It is also possible to grind the suede cloth in advance to an opening diameter of 30 and 80 μm, and to cut it out separately in a donut shape with Thomson and attach the double-sided tape on the back side.

本発明の研磨パッドを遊星歯車式平面研磨装置に装着して、2.5インチのガラスディスクの仕上げ研磨を1バッチ20枚で10バッチ実施した。結果として、面粗度や平行・平面度のバラツキが少なく、再加工率が本発明の研磨パッドを使用していない装置と比較して20パーセント減少し、工程短縮化が達成できた。   The polishing pad of the present invention was attached to a planetary gear type flat polishing apparatus, and final polishing of 2.5 inch glass disks was performed 10 batches by 20 batches. As a result, there was little variation in surface roughness, parallelism and flatness, the rework rate was reduced by 20% compared to the apparatus not using the polishing pad of the present invention, and the process was shortened.

本発明の研磨パットの厚み700μmで、とっくり形スエード層断面である。The polishing pad of the present invention has a thickness of 700 μm and a cross section of a suede layer. 本発明の実施の形態の一例を示し、研磨パッドを研磨プレートに貼り付けワークとキャリアーとの状態真上から見た説明図であるIt is explanatory drawing which showed an example of embodiment of this invention and stuck the polishing pad on the polishing plate, and was seen from the state of a workpiece | work and a carrier right above. 本発明の研磨パッドを研磨プレートに貼り付けた断面図である。It is sectional drawing which affixed the polishing pad of this invention on the polishing plate.

符号の説明Explanation of symbols

10 研磨プレート
11 ワーク
12 キャリヤ
13 研磨パッド
13A 開口径80μm
13B 開口径30μm
10 Polishing plate 11 Workpiece 12 Carrier 13 Polishing pad 13A Opening diameter 80 μm
13B Opening diameter 30μm

Claims (3)

加工物を研磨加工する研磨パッドであって、
研磨装置の研磨プレートに貼り付けて用いられるスエード様研磨パッドで、ドーナツ状に開口径を変化させて形成されている研磨パッド。
A polishing pad for polishing a workpiece,
A suede-like polishing pad that is used by being affixed to a polishing plate of a polishing apparatus, and is formed by changing the opening diameter in a donut shape.
ドーナツ状帯の隣同士の開口径が1.5〜10倍もしくは1/10〜1/1.5倍に変化させ形成させた請求項1記載の研磨パッド 2. The polishing pad according to claim 1, wherein the opening diameter between adjacent donut-shaped bands is changed to 1.5 to 10 times or 1/10 to 1 / 1.5 times. ドーナツ状の帯が2〜5本形成させた請求項1記載の研磨パッド。 The polishing pad according to claim 1, wherein 2 to 5 donut-shaped bands are formed.
JP2007313198A 2007-12-04 2007-12-04 Polishing pad Pending JP2009136935A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007313198A JP2009136935A (en) 2007-12-04 2007-12-04 Polishing pad

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JP2007313198A JP2009136935A (en) 2007-12-04 2007-12-04 Polishing pad

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JP2009136935A true JP2009136935A (en) 2009-06-25

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011212779A (en) * 2010-03-31 2011-10-27 Fujibo Holdings Inc Polishing pad and method for manufacturing the same
JP2011212759A (en) * 2010-03-31 2011-10-27 Fujibo Holdings Inc Polishing pad and method for manufacturing the same
CN104924196A (en) * 2014-03-20 2015-09-23 六晶金属科技(苏州)有限公司 Method for grinding metal substrate for LED chip scale packaging
CN106737128A (en) * 2016-11-23 2017-05-31 东莞市中镓半导体科技有限公司 A kind of single-sided polishing system in Two sides milling and polishing equipment
CN106863025A (en) * 2017-03-28 2017-06-20 江苏吉星新材料有限公司 A kind of 2 inch, 4 inch Sapphire Substrate defect on back side Repair gene methods
CN116021359A (en) * 2023-03-30 2023-04-28 苏州晨晖智能设备有限公司 Silicon wafer fine grinding device capable of automatically adjusting polished workpiece

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011212779A (en) * 2010-03-31 2011-10-27 Fujibo Holdings Inc Polishing pad and method for manufacturing the same
JP2011212759A (en) * 2010-03-31 2011-10-27 Fujibo Holdings Inc Polishing pad and method for manufacturing the same
CN104924196A (en) * 2014-03-20 2015-09-23 六晶金属科技(苏州)有限公司 Method for grinding metal substrate for LED chip scale packaging
CN106737128A (en) * 2016-11-23 2017-05-31 东莞市中镓半导体科技有限公司 A kind of single-sided polishing system in Two sides milling and polishing equipment
CN106863025A (en) * 2017-03-28 2017-06-20 江苏吉星新材料有限公司 A kind of 2 inch, 4 inch Sapphire Substrate defect on back side Repair gene methods
CN116021359A (en) * 2023-03-30 2023-04-28 苏州晨晖智能设备有限公司 Silicon wafer fine grinding device capable of automatically adjusting polished workpiece
CN116021359B (en) * 2023-03-30 2023-05-30 苏州晨晖智能设备有限公司 Silicon wafer fine grinding device capable of automatically adjusting polished workpiece

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