JP2009122356A - 位相差顕微鏡 - Google Patents

位相差顕微鏡 Download PDF

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Publication number
JP2009122356A
JP2009122356A JP2007295641A JP2007295641A JP2009122356A JP 2009122356 A JP2009122356 A JP 2009122356A JP 2007295641 A JP2007295641 A JP 2007295641A JP 2007295641 A JP2007295641 A JP 2007295641A JP 2009122356 A JP2009122356 A JP 2009122356A
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JP
Japan
Prior art keywords
phase difference
ring
phase
stage
observation
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JP2007295641A
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English (en)
Japanese (ja)
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JP2009122356A5 (enExample
Inventor
Ichiro Sase
一郎 佐瀬
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Nikon Corp
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Nikon Corp
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Priority to JP2007295641A priority Critical patent/JP2009122356A/ja
Publication of JP2009122356A publication Critical patent/JP2009122356A/ja
Publication of JP2009122356A5 publication Critical patent/JP2009122356A5/ja
Pending legal-status Critical Current

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JP2007295641A 2007-11-14 2007-11-14 位相差顕微鏡 Pending JP2009122356A (ja)

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JP2007295641A JP2009122356A (ja) 2007-11-14 2007-11-14 位相差顕微鏡

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JP2007295641A JP2009122356A (ja) 2007-11-14 2007-11-14 位相差顕微鏡

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JP2009122356A true JP2009122356A (ja) 2009-06-04
JP2009122356A5 JP2009122356A5 (enExample) 2012-04-12

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Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012013888A (ja) * 2010-06-30 2012-01-19 Nikon Corp 顕微鏡、培養観察装置
JP2013145318A (ja) * 2012-01-13 2013-07-25 Sony Corp 測定装置、プログラム及び測定方法
CN103529542A (zh) * 2013-10-24 2014-01-22 广州粤显光学仪器有限责任公司 偏振光调制相衬显微镜
WO2014091661A1 (ja) * 2012-12-14 2014-06-19 ソニー株式会社 位相差顕微鏡、位相差顕微鏡の制御装置及び位相差顕微鏡の制御方法
JP2015152647A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2015152649A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2015152648A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2016071117A (ja) * 2014-09-30 2016-05-09 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置および撮像方法
WO2017009383A3 (de) * 2015-07-14 2017-04-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V. Verfahren zur phasenkontrastmikroskopie, optikeinheit sowie phasenkontrastmikroskop
JP2017161385A (ja) * 2016-03-10 2017-09-14 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置における撮像配置決定方法および撮像装置
JP2019148828A (ja) * 2019-05-17 2019-09-05 株式会社ニコン 位相差顕微鏡及びプログラム
US10466462B2 (en) 2015-06-30 2019-11-05 Fujifilm Corporation Phase-contrast microscope and imagine method
US10649192B2 (en) 2015-06-30 2020-05-12 Fujifilm Corporation Phase-contrast microscope and imaging method
CN111164487A (zh) * 2017-09-28 2020-05-15 株式会社片冈制作所 相位差观察装置及细胞处理装置
EP3677945A4 (en) * 2017-09-28 2021-06-02 Kataoka Corporation PHASE DIFFERENCE MONITORING DEVICE AND CELL TREATMENT DEVICE

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005004088A (ja) * 2003-06-13 2005-01-06 Nikon Corp 位相差顕微鏡
JP2006038977A (ja) * 2004-07-23 2006-02-09 Nikon Corp 光学顕微鏡システムおよびこれを用いた試料動画像生成方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005004088A (ja) * 2003-06-13 2005-01-06 Nikon Corp 位相差顕微鏡
JP2006038977A (ja) * 2004-07-23 2006-02-09 Nikon Corp 光学顕微鏡システムおよびこれを用いた試料動画像生成方法

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012013888A (ja) * 2010-06-30 2012-01-19 Nikon Corp 顕微鏡、培養観察装置
JP2013145318A (ja) * 2012-01-13 2013-07-25 Sony Corp 測定装置、プログラム及び測定方法
JPWO2014091661A1 (ja) * 2012-12-14 2017-01-05 ソニー株式会社 位相差顕微鏡、位相差顕微鏡の制御装置及び位相差顕微鏡の制御方法
WO2014091661A1 (ja) * 2012-12-14 2014-06-19 ソニー株式会社 位相差顕微鏡、位相差顕微鏡の制御装置及び位相差顕微鏡の制御方法
US20150309296A1 (en) * 2012-12-14 2015-10-29 Sony Corporation Phase contrast microscope, control apparatus for phase contrast microscope, and control method for phase contrast microscope
CN103529542A (zh) * 2013-10-24 2014-01-22 广州粤显光学仪器有限责任公司 偏振光调制相衬显微镜
JP2015152647A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2015152649A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2015152648A (ja) * 2014-02-12 2015-08-24 株式会社ニコン 位相差顕微鏡
JP2016071117A (ja) * 2014-09-30 2016-05-09 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置および撮像方法
US10466462B2 (en) 2015-06-30 2019-11-05 Fujifilm Corporation Phase-contrast microscope and imagine method
US10649192B2 (en) 2015-06-30 2020-05-12 Fujifilm Corporation Phase-contrast microscope and imaging method
WO2017009383A3 (de) * 2015-07-14 2017-04-06 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V. Verfahren zur phasenkontrastmikroskopie, optikeinheit sowie phasenkontrastmikroskop
JP2017161385A (ja) * 2016-03-10 2017-09-14 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置における撮像配置決定方法および撮像装置
WO2017154253A1 (ja) * 2016-03-10 2017-09-14 株式会社Ｓｃｒｅｅｎホールディングス 撮像装置における撮像配置決定方法および撮像装置
CN111164487A (zh) * 2017-09-28 2020-05-15 株式会社片冈制作所 相位差观察装置及细胞处理装置
EP3677945A4 (en) * 2017-09-28 2021-06-02 Kataoka Corporation PHASE DIFFERENCE MONITORING DEVICE AND CELL TREATMENT DEVICE
CN111164487B (zh) * 2017-09-28 2022-04-15 株式会社片冈制作所 相位差观察装置及细胞处理装置
JP2019148828A (ja) * 2019-05-17 2019-09-05 株式会社ニコン 位相差顕微鏡及びプログラム

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