JP2008541081A5 - - Google Patents

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Publication number
JP2008541081A5
JP2008541081A5 JP2008510628A JP2008510628A JP2008541081A5 JP 2008541081 A5 JP2008541081 A5 JP 2008541081A5 JP 2008510628 A JP2008510628 A JP 2008510628A JP 2008510628 A JP2008510628 A JP 2008510628A JP 2008541081 A5 JP2008541081 A5 JP 2008541081A5
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JP
Japan
Prior art keywords
processor
needle
axis
probe according
measurement probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008510628A
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English (en)
Japanese (ja)
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JP2008541081A (ja
JP5283501B2 (ja
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Publication date
Priority claimed from GBGB0509394.3A external-priority patent/GB0509394D0/en
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Publication of JP2008541081A publication Critical patent/JP2008541081A/ja
Publication of JP2008541081A5 publication Critical patent/JP2008541081A5/ja
Application granted granted Critical
Publication of JP5283501B2 publication Critical patent/JP5283501B2/ja
Anticipated expiration legal-status Critical
Active legal-status Critical Current

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JP2008510628A 2005-05-10 2006-05-08 寸法測定用プローブ Active JP5283501B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0509394.3 2005-05-10
GBGB0509394.3A GB0509394D0 (en) 2005-05-10 2005-05-10 Dimensional measurement probe
PCT/GB2006/001654 WO2006120403A1 (en) 2005-05-10 2006-05-08 Dimensional measurement probe

Publications (3)

Publication Number Publication Date
JP2008541081A JP2008541081A (ja) 2008-11-20
JP2008541081A5 true JP2008541081A5 (https=) 2009-06-25
JP5283501B2 JP5283501B2 (ja) 2013-09-04

Family

ID=34685277

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008510628A Active JP5283501B2 (ja) 2005-05-10 2006-05-08 寸法測定用プローブ

Country Status (6)

Country Link
US (2) US7792654B2 (https=)
EP (1) EP1880163B1 (https=)
JP (1) JP5283501B2 (https=)
CN (1) CN101171493B (https=)
GB (1) GB0509394D0 (https=)
WO (1) WO2006120403A1 (https=)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0512138D0 (en) 2005-06-15 2005-07-20 Renishaw Plc Method of determining measurement probe orientation
GB0608998D0 (en) * 2006-05-08 2006-06-14 Renishaw Plc Contact sensing probe
WO2008058164A2 (en) 2006-11-06 2008-05-15 Quarq Technology, Inc. Crankset based bicycle power measurement
US8006574B2 (en) * 2007-11-06 2011-08-30 Sram, Llc Crankset based bicycle power measurement
GB0804467D0 (en) 2008-03-11 2008-04-16 Renishaw Plc Touch trigger measurement probe
US8191407B2 (en) * 2008-05-13 2012-06-05 Seagate Technology Llc Folded beam suspension for probe
IT1402715B1 (it) * 2010-10-29 2013-09-18 Marposs Spa Sonda di tastaggio
JP6010046B2 (ja) 2011-01-19 2016-10-19 レニショウ パブリック リミテッド カンパニーＲｅｎｉｓｈａｗ Ｐｕｂｌｉｃ Ｌｉｍｉｔｅｄ Ｃｏｍｐａｎｙ 工作機械装置用のアナログ測定用プローブ
GB201316329D0 (en) * 2013-09-13 2013-10-30 Renishaw Plc A Method of Using a scanning probe
JP6727306B2 (ja) 2015-12-22 2020-07-22 株式会社ミツトヨ Ｃｍｍタッチプローブのためのセンサ信号オフセット補正システム
US10279864B2 (en) 2016-04-12 2019-05-07 Sram, Llc Bicycle power meter
US10184849B2 (en) 2016-04-12 2019-01-22 Sram, Llc Bicycle power meter
US9784628B1 (en) 2016-04-12 2017-10-10 Sram, Llc Bicycle power meter
WO2017182875A1 (en) 2016-04-21 2017-10-26 Mitutoyo Corporation Coordinate measurement probe body
US10101141B2 (en) 2016-12-07 2018-10-16 Mitutoyo Corporation Trigger counter for measurement device with count values stored in flash memory
US10145666B2 (en) * 2016-12-19 2018-12-04 Mitutoyo Corporation Touch probe for CMM including digital signal communication
GB201700879D0 (en) 2017-01-18 2017-03-01 Renishaw Plc Machine tool apparatus
US9835433B1 (en) 2017-05-09 2017-12-05 Tesa Sa Touch trigger probe
CN107131985B (zh) * 2017-06-15 2023-10-31 中国水利水电科学研究院 轮辐式分级压力检测装置
DE102018114899B4 (de) 2017-06-20 2022-03-31 Nuton GmbH Verfahren zur Ermittlung der Geometrie oder relativen Position eines in das für die Aufnahme von Bearbeitungswerkzeugen vorgesehene Wechselspannsystem einer Werkzeugmaschine eingespannten Tastkörpers sowie entsprechend eingerichtete Werkzeugmaschine
EP3460384A1 (en) * 2017-09-26 2019-03-27 Renishaw PLC Measurement probe
RU182539U1 (ru) * 2018-05-04 2018-08-22 Федеральное государственное бюджетное образовательное учреждение высшего образования "Волгоградский государственный технический университет" (ВолгГТУ) Виброконтактное измерительное устройство
CN111174743B (zh) * 2019-12-31 2021-07-06 中国科学院长春光学精密机械与物理研究所 一种装配间隔面的检测装置及方法
US11644299B2 (en) * 2020-12-31 2023-05-09 Mitutoyo Corporation Inductive position sensor signal gain control for coordinate measuring machine probe
EP4148372A1 (en) 2021-09-09 2023-03-15 Renishaw PLC Measurement probe
US12188765B2 (en) 2022-09-07 2025-01-07 Mitutoyo Corporation Adjustable update rate for measuring probe
US12287194B2 (en) 2022-11-29 2025-04-29 Mitutoyo Corporation Motion mechanism for measuring probe
US12496504B2 (en) 2022-12-12 2025-12-16 Sram, Llc Bicycle trainer torque measurement device
US12488448B2 (en) 2023-07-20 2025-12-02 Mitutoyo Corporation Machine vision system with objective lens and collision protection

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8409091D0 (en) * 1984-04-09 1984-05-16 Renishaw Plc Probe for measuring workpieces
GB8610087D0 (en) * 1986-04-24 1986-05-29 Renishaw Plc Probe
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
DE69201985T2 (de) * 1991-02-25 1995-08-24 Renishaw Metrology Ltd Kontaktprobe.
JPH05506103A (ja) * 1991-02-25 1993-09-02 レニショウ　メタロジィ　リミテッド 接触プローブ
JP3996734B2 (ja) * 2000-11-20 2007-10-24 株式会社日立メディコ 核磁気共鳴を用いた検査装置
AU2002953540A0 (en) * 2002-12-24 2003-01-16 The University Of Queensland Correction of non-linear gradients effects on magnetic resonance imaging
GB0506158D0 (en) 2005-03-24 2005-05-04 Renishaw Plc Measurement probe

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