Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
  • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
  • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
  • G01B7/012—Contact-making feeler heads therefor

Definitions

• the present invention relates to a probe, for measuring the dimensions of objects, of the type used in conjunction with a machine which has coordinate positioning such as a coordinate measurement machine, machine tool, robotic device, or the like.
• one type of dimensional measurement probe produces a trigger signal when a contact stylus touches an object, the trigger signal causing a recording of the coordinates of the coordinate positioning machine to which the probe is attached.
• Sensors in the probe detect minute loadings on the stylus as the probe moves closer to the object in order to detect contact between the stylus and the object.
• the contact stylus is usually an elongate stem with an enlarged end so that it can reach features of the object to be dimensionally measured.
• the stem of the stylus is not completely stiff because it is relatively slender so as to reach as many features of the object as possible. Therefore, the stylus stem will bend slightly when subjected to side loading resulting from object contact perpendicular or oblique to the axis stem, but it will not bend significantly when subjected to loading caused by contact in a direction substantially along the axis of the stem. Bending of the stylus support structure occurs also. Again the bending is greater when the stylus is loaded from the side when compared to its bending resulting from loads along the axis of the stylus. The result of this bending causes a trigger signal which is dependent on the relative positions of the object surface and the axis of the stylus stem. In other words an object may appear to be a different size depending on the inclination of the stylus stem relative to the object's surface, caused predominantly by stylus bending and to a lesser extent by bending of the stylus support structure.
• One way to overcome this problem is to calibrate the probe so that for example correction factors are applied to the coordinate values when the probe is caused to trigger due to a side loading and different correction factors are applied when the probe is triggered by an "on-axis" contact.
• Such a calibration requires time and a calibration artefact. It is not always possible to apply a correction factor particularly if it is not known in which direction the contact force is being applied to the stylus.
• the stylus can be arranged such that its bending due to side loading is the same as the displacement along the axis of the stylus stem, e.g. a resilient member positioned along the stem to imitate the side deflection of the stylus stem.
• This mechanical solution causes problems e.g. vibration of the stylus and relative manufacturing complexity.
• a new approach has been provided by the inventors : a measurement probe for dimensional measurement of an object by means of contact of the object in at least two different approach directions, comprising: a stylus having an object contact area and having a stem extending substantially along an axis; a stylus contact determination device having a plurality of sensor elements each having an output for detecting contact of the object by the object contacting area of the stylus; and a processor for processing the output of the sensor elements, wherein the processor processes an output of at least two of the sensor elements to provide an object contact trigger signal caused by a predefined displacement of the stylus object contact area, which displacement is substantially the same in each of said approach directions.
• the contact trigger signal has issued as a result of object contact similar to that shown in Fig 2 or 3 and in either event the trigger signal will issue only when the stylus contact area is displaced in its triggering direction by an amount (z in Fig 2 or x in Fig 3) which is equal, despite some of that displacement (d) being caused by stylus stem bending. So, the position of the stylus when a trigger signal is issued is not dependent on the direction in which contact is made, but instead will issue when the stylus tip or object contact area has been displaced in any direction by a predetermined amount which is the same in all directions of displacement.
• the outputs are combined at the processor.
• the outputs from the sensor elements are combined at the processor according to an algorithm or equation.
• the algorithm or equation is
• the outputs from the sensors are processed at the processor so as to be compared with predetermined data.
• the probe includes a probe body and preferably the processor is disposed within the probe body.
• Figs Ia and Ib are schematic diagrams showing a measurement probe according to the invention, Fig Ib being a section on the line Ib-Ib in Fig Ia;
• Figs 2 and 3 show the measurement probe of Fig 1 in use
• Figs 4 and 5 are views corresponding to Figs Ia and Ib, but showing a practical example of a measurement probe
• Fig 6 is a schematic circuit diagram of a processor of the probe.
• a measurement probe 10 which has a body 12 attached to the spindle of a machine tool 14.
• the probe has a stylus 20 having a stylus tip 24 for contacting an object, in this case a workpiece 50 (Figs 2 and 3) , and an elongate stem 22 extending along axis 40.
• the stem 22 is connected to the body 12 by means of a strain sensing sensor 30.
• the sensor 30 is shown in plan in Fig Ib.
• Three fairly rigid spokes 32 each have a strain gauge 34 attached thereto for sensing strain in each spoke, e.g. when contact is made between the workpiece 50 and stylus tip 24.
• a processor 16 is connected to receive the outputs of each strain gauge.
• the probe 10 In use the probe 10 is moved relative to the workpiece 50 in directions X, Y and Z. Various contacts between the stylus tip 24 and the workpiece 50 are made in order to determine the size of the workpiece 50.
• strain is exerted on the sensors 34.
• the outputs of the strain gauges 34 are in the form of resistance change, and are processed by the processor 16 in the manner discussed below and shown in Fig 6, to produce a trigger output signal.
• the trigger signal issued from the processor 16 can be used to record the machine tool's position in order to determine the size of the workpiece 50.
• Fig 2 shows the probe of Figs Ia and Ib and workpiece 50.
• the stylus 20 has been displaced longitudinally by an amount z before a trigger signal is issued by processor 16.
• a force will be required to impart strain into the strain gauges 34 and thus cause the trigger signal.
• Fig 3 shows also the probe of Figs Ia and Ib and workpiece 50.
• the stylus 20 has been deflected laterally by distance x in order to produce a trigger signal.
• the trigger signal is produced when z is approximately equal to x. This is achieved by combining the outputs from the three strain gauges in the processor 16, to form a gauge output G as follows :
• G - ⁇ M J 2 + M 2 2 + AR 3 2 + ⁇ (AR 1 AR 2 + AR 2 AR 3 + AR 3 AR 1 ) ⁇
• ⁇ is a normalisation/scaling factor
• ARi 7 -AR 2 and ⁇ R 3 refer to the change in resistance of the three strain gauges 34
• ⁇ is a further factor dependent on the strain characteristics of the structure of the sensor 30 and the stylus 20 strain characteristics.
• each of the gauges may be decomposed into a component arising purely from the component of the contact force acting along the axis 40, and a component arising purely from the component of the contact force acting perpendicular to the axis.
• These components of the gauge output may then be combined and manipulated to give different sensitivities in X and Y directions compared with the sensitivity in the Z direction.
• the result of this manipulation is that the object detection caused by contact in the Z direction (as shown in Fig 2) can be desensitised so that more contact force is required to produce a trigger signal than the force required to produce a trigger signal when the contact is of the type shown in Fig 3.
• the distance z and x can be made equal or substantially or approximately equal, despite the x deflection having a component (d) resulting from bending of the stylus stem 22.
• the same but relative effect also occurs for all intermediate directions between x and z. This makes the contact signal trigger output independent of the direction of contact. A predefined movement of the stylus tip in any direction relative to the stylus thus produces a trigger signal output.
• the processor 16 preferably comprises a combination of analogue circuitry. This is configured in a known manner with a module 16A which calculates G in real time in accordance with the above equation. It also comprises a module 16B which is configured to produce the trigger output when the value of G exceeds a predetermined threshold value.
• This circuitry of the processor 16 may be implemented as an application- specific integrated circuit (ASIC) .
• the processor 16 can be implemented in a digital form, with a suitably programmed digital arithmetic unit.
• the outputs of the strain gauges can be converted to digital signals using analogue-to-digital converters.
• the processor 16 can include program modules corresponding to the modules 16A, 16B. The equation presented above can be maintained in non-volatile memory in the processor 16, which can then constantly monitor and process the strain gauge outputs.
• the processor 16 can compare the gauge outputs with a data table, in real time.
• a trigger signal output will be produced if the comparison indicates that the outputs of the strain gauges are indicating a triggered condition.
• this can be achieved by using for example an analogue to digital converter for each strain gauge, the outputs of which form an address bus connected to the data table memory.
• An output from the memory of "0" (no trigger) or "1" (trigger) can be used.
• ⁇ and ⁇ are normally held constant during a given measurement. However, small variations may be applied to them, e.g. to offer lower vibration sensitivity, or used to detect the probing direction (Z versus X, Y) . Changes in stylus length can be accommodated by changing the value of ⁇ or if a data table is used, having different tables for different styli.
• the data for the table can be pre-programmed or "taught" by exercising the stylus and teaching the probe to trigger at certain deflections . Gaps in data can then be infilled using a mesh algorithm.
• the processor 16 may be located away from the probe e.g. in an interface between the probe and the machine to which it is attached.
• the sensor 30 is shown having strain gauges extending radially of axis Z.
• the sensor need not use strain gauges and the sensing elements need not extend radially.
• the sensing elements could be displacement sensors like LVDTs, linear encoders or capacitance sensors. Their arrangement could be axial or any position which allows sensing of stylus contact.
• Figs 4 and 5 The mechanical arrangement of a practical probe is shown in Figs 4 and 5, by way of example. It will be appreciated that other arrangements are possible.
• the view of the probe in Fig 4 is a part- section in the sectional plane denoted 4-4 in Fig 5. This plane is not completely flat but includes two planes at 120° to each other.
• a dimensional measurement probe 110 is shown which is attachable to a machine 115 via a boss 112.
• the machine is typically one which can determine the coordinates of the probe e.g. in xy and z planes.
• the probe has a stylus 114 including a tip 116 for contact with a workpiece or other artefact 150 to be measured.
• the probe is moved by the machine relative to the artefact 150 and contact of the stylus tip with the artefact 150 is sensed by the mechanism within the probe 110.
• the probe produces a trigger signal which is sent to the machine in order to determine the probe's coordinates. In this way the coordinates of the surface of the artefact can be obtained.
• the probe 110 includes a main body 118, a circuit board 120, a spring cage 122, a compression spring 124, upper member 126 of stylus 114 and a strain sensing element 130.
• the circuit board 120 contains the processor 16 discussed above in connection with Figs 1-3 and Fig 6. Other arrangements are of course possible, e.g. a flexible circuit board may be wrapped cylindrically around the mechanical components of the probe.
• force is exerted on the stylus tip in the x,y or z directions or combinations of these directions .
• the force causes flexing of the radially extending arms 132 of the sensor element 130 relative to the body 118 to which the sensor element is fixed at central portion 137.
• Excessive force on the stylus in the x or y directions, or pulling the stylus in the z direction away from the probe body will result in closing of the gap 128 between the sensor element 130 and the body 118.
• excessive strain on the sensor element 130 cannot take place.
• Further force on the stylus causes the compression of spring 124 resulting in the disconnection between the stylus upper member or stylus holder 126 and the sensor element 130 against the force of the compression spring 124.
• the contact between this upper member 126 and the sensor element 130 is in the form of a kinematic location having a total of six points of contact.
• the kinematic location is formed from three balls 131 on the sensor, each one nesting between a pair of rollers 127 on the member 126.
• Fig 5 shows the sensor element 130 in more detail.
• the element 130 is produced as one piece, e.g. of machined metal.
• Each of the three balls 131 affixed to the surface of the element 130 has in use force exerted on them.
• the force exerted on the balls is altered.
• This in turn causes strain to be induced in radial arms 132.
• a semiconductor strain gauge 133 is secured to each of the arms 132.
• Each strain gauge provides a change in output if the strain in the arm is altered.
• stylus contact with article 150 can be detected.

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• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Length Measuring Devices With Unspecified Measuring Means (AREA)
• Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
• A Measuring Device Byusing Mechanical Method (AREA)

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• 2005
  • 2005-05-10 GB GBGB0509394.3A patent/GB0509394D0/en not_active Ceased
• 2006
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  • 2006-05-08 EP EP06743878.8A patent/EP1880163B1/en active Active
  • 2006-05-08 CN CN200680014933XA patent/CN101171493B/zh active Active
  • 2006-05-08 WO PCT/GB2006/001654 patent/WO2006120403A1/en not_active Ceased
  • 2006-05-08 US US11/919,000 patent/US7792654B2/en active Active
• 2010
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