JP2008516246A5 - - Google Patents

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Publication number
JP2008516246A5
JP2008516246A5 JP2007535974A JP2007535974A JP2008516246A5 JP 2008516246 A5 JP2008516246 A5 JP 2008516246A5 JP 2007535974 A JP2007535974 A JP 2007535974A JP 2007535974 A JP2007535974 A JP 2007535974A JP 2008516246 A5 JP2008516246 A5 JP 2008516246A5
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JP
Japan
Prior art keywords
distance
value
absolute distance
measuring device
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2007535974A
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English (en)
Japanese (ja)
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JP4995089B2 (ja
JP2008516246A (ja
Filing date
Publication date
Priority claimed from EP04405638A external-priority patent/EP1647838B1/de
Application filed filed Critical
Publication of JP2008516246A publication Critical patent/JP2008516246A/ja
Publication of JP2008516246A5 publication Critical patent/JP2008516246A5/ja
Application granted granted Critical
Publication of JP4995089B2 publication Critical patent/JP4995089B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2007535974A 2004-10-13 2005-09-29 絶対距離値を測定する方法及び測定装置 Expired - Fee Related JP4995089B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP04405638.0 2004-10-13
EP04405638A EP1647838B1 (de) 2004-10-13 2004-10-13 Verfahren und Messgerät zur Messung eines Absolutdistanzwertes
PCT/CH2005/000560 WO2006039820A1 (de) 2004-10-13 2005-09-29 Verfahren und messgerät zur messung eines absolutdistanzwertes

Publications (3)

Publication Number Publication Date
JP2008516246A JP2008516246A (ja) 2008-05-15
JP2008516246A5 true JP2008516246A5 (enExample) 2011-10-06
JP4995089B2 JP4995089B2 (ja) 2012-08-08

Family

ID=34932315

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007535974A Expired - Fee Related JP4995089B2 (ja) 2004-10-13 2005-09-29 絶対距離値を測定する方法及び測定装置

Country Status (9)

Country Link
US (1) US7609387B2 (enExample)
EP (1) EP1647838B1 (enExample)
JP (1) JP4995089B2 (enExample)
CN (1) CN100549726C (enExample)
AT (1) ATE466298T1 (enExample)
AU (1) AU2005294044B2 (enExample)
CA (1) CA2584347C (enExample)
DE (1) DE502004011107D1 (enExample)
WO (1) WO2006039820A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007309677A (ja) * 2006-05-16 2007-11-29 Mitsutoyo Corp 追尾式レーザ干渉計の絶対距離推定方法及び追尾式レーザ干渉計
US8767215B2 (en) * 2007-06-18 2014-07-01 Leddartech Inc. Method for detecting objects with light
CN101952741B (zh) * 2008-02-19 2013-06-19 莱卡地球系统公开股份有限公司 光电距离测量仪
CN102803990B (zh) 2009-06-23 2014-08-06 莱卡地球系统公开股份有限公司 跟踪方法和具有激光跟踪器的测量系统
EP2653908A1 (en) 2012-04-16 2013-10-23 Leica Geosystems AG Electro-optic modulator and electro-optic distance-measuring device
EP2653884A1 (en) * 2012-04-16 2013-10-23 Leica Geosystems AG Electro-optic distance-measuring device
EP2662702A1 (de) * 2012-05-07 2013-11-13 Leica Geosystems AG Lasertracker mit Interferometer und Absolutdistanzmesseinheit sowie Kalibrierverfahren für einen Lasertracker
CN103499338A (zh) * 2013-05-14 2014-01-08 罗江临 一种保证激光测距仪量程和提高测量精度的方法
KR102144541B1 (ko) * 2014-05-08 2020-08-18 주식회사 히타치엘지 데이터 스토리지 코리아 2방향 거리 검출 장치
JPWO2017038659A1 (ja) * 2015-09-01 2018-06-14 国立大学法人 東京大学 運動検出装置及びそれを用いた三次元形状測定装置
TWI595252B (zh) * 2016-05-10 2017-08-11 財團法人工業技術研究院 測距裝置及其測距方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4606638A (en) * 1983-11-03 1986-08-19 Zygo Corporation Distance measuring interferometer and method of use
US4714339B2 (en) * 1986-02-28 2000-05-23 Us Commerce Three and five axis laser tracking systems
JPH0430484Y2 (enExample) * 1986-09-11 1992-07-23
CH674675A5 (enExample) * 1987-10-23 1990-06-29 Kern & Co Ag
DE4314488C2 (de) * 1993-05-03 1997-11-20 Heidenhain Gmbh Dr Johannes Interferometrisches Meßverfahren für Absolutmessungen sowie dafür geeignete Laserinterferometeranordnung
DE19542490C1 (de) * 1995-11-15 1997-06-05 Leica Ag Elektro-optisches Meßgerät für absolute Distanzen
JPH09264960A (ja) 1996-03-28 1997-10-07 Koden Electron Co Ltd 光学式速度計及び距離計
EP1171752B1 (de) * 1999-04-19 2005-07-06 Leica Geosystems AG Indirekte positionsbestimmung mit hilfe eines trackers
DE60238612D1 (de) * 2001-04-10 2011-01-27 Faro Tech Inc Chopper-stabilisiertes messgerät für absolute distanzen
EP1172637B1 (en) 2001-04-12 2003-01-15 Agilent Technologies, Inc. (a Delaware corporation) Device for calibrating a wavelength measuring unit
US7285793B2 (en) * 2005-07-15 2007-10-23 Verisurf Software, Inc. Coordinate tracking system, apparatus and method of use

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