JP2008505364A5 - - Google Patents
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- JP2008505364A5 JP2008505364A5 JP2007519490A JP2007519490A JP2008505364A5 JP 2008505364 A5 JP2008505364 A5 JP 2008505364A5 JP 2007519490 A JP2007519490 A JP 2007519490A JP 2007519490 A JP2007519490 A JP 2007519490A JP 2008505364 A5 JP2008505364 A5 JP 2008505364A5
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- 238000000034 method Methods 0.000 claims 16
- 238000003491 array Methods 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 3
- 230000035945 sensitivity Effects 0.000 claims 2
- 230000003247 decreasing effect Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/882,959 | 2004-07-01 | ||
| US10/882,959 US7529421B2 (en) | 2004-07-01 | 2004-07-01 | Optical proximity correction in raster scan printing based on corner matching templates |
| PCT/US2005/023590 WO2006007570A1 (en) | 2004-07-01 | 2005-07-01 | Optical proximity correction in raster scan printing based on corner matching templates |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008505364A JP2008505364A (ja) | 2008-02-21 |
| JP2008505364A5 true JP2008505364A5 (enExample) | 2008-08-14 |
| JP4753942B2 JP4753942B2 (ja) | 2011-08-24 |
Family
ID=35276133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007519490A Expired - Fee Related JP4753942B2 (ja) | 2004-07-01 | 2005-07-01 | 角適合テンプレートに基づくラスタ走査型印刷における光学近接効果補正 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7529421B2 (enExample) |
| EP (1) | EP1766571A1 (enExample) |
| JP (1) | JP4753942B2 (enExample) |
| WO (1) | WO2006007570A1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030233630A1 (en) * | 2001-12-14 | 2003-12-18 | Torbjorn Sandstrom | Methods and systems for process control of corner feature embellishment |
| US7340713B2 (en) * | 2004-09-29 | 2008-03-04 | Synopsys, Inc. | Method and apparatus for determining a proximity correction using a visible area model |
| KR101407913B1 (ko) * | 2005-09-26 | 2014-06-17 | 마이크로닉 마이데이터 아베 | 설계 데이터의 다중 형태에 기반한 패턴 발생 방법 및시스템 |
| US8064682B2 (en) * | 2007-06-29 | 2011-11-22 | Intel Corporation | Defect analysis |
| JP4525722B2 (ja) * | 2007-09-20 | 2010-08-18 | 株式会社デンソー | 気象情報表示装置、プログラム |
| WO2010063827A1 (en) * | 2008-12-05 | 2010-06-10 | Micronic Laser Systems Ab | Gradient assisted image resampling in micro-lithographic printing |
| JP5438848B2 (ja) * | 2010-02-23 | 2014-03-12 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及びデバイス製造方法 |
| US8539395B2 (en) | 2010-03-05 | 2013-09-17 | Micronic Laser Systems Ab | Method and apparatus for merging multiple geometrical pixel images and generating a single modulator pixel image |
| US11195213B2 (en) * | 2010-09-01 | 2021-12-07 | Apixio, Inc. | Method of optimizing patient-related outcomes |
| CN102135725B (zh) * | 2011-03-20 | 2012-07-04 | 北京理工大学 | Pbopc优化掩膜图形的分割矩形总数的获取方法 |
| CN103208111B (zh) * | 2012-01-17 | 2015-10-07 | 富士通株式会社 | 用于修正图像角点的方法和装置以及图像处理设备 |
| US9047658B2 (en) * | 2013-11-05 | 2015-06-02 | United Microelectronics Corp. | Method of optical proximity correction |
| CN105549920B (zh) * | 2015-12-10 | 2018-04-03 | 河北远东通信系统工程有限公司 | 一种基于Flex的客户端大幅地图打印方法 |
| CN108073043A (zh) * | 2016-11-07 | 2018-05-25 | 俞庆平 | 一种直写式丝网制版系统的光均匀性补偿方法 |
| EP3461116B1 (en) * | 2017-09-23 | 2024-04-17 | Heidelberg Polska Sp. z o.o. | A method and system for am screening and protecting printouts |
| KR102688569B1 (ko) | 2018-12-13 | 2024-07-25 | 삼성전자주식회사 | 마스크 레이아웃 설계 방법, opc 방법, 및 그 opc 방법을 이용한 마스크 제조방법 |
| US10614340B1 (en) * | 2019-09-23 | 2020-04-07 | Mujin, Inc. | Method and computing system for object identification |
| CN111681284A (zh) * | 2020-06-09 | 2020-09-18 | 商汤集团有限公司 | 一种角点检测方法、装置、电子设备及存储介质 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5553170A (en) | 1987-07-09 | 1996-09-03 | Ezel, Inc. | High speed image processing system having a preparation portion and a converting portion generating a processed image based on the preparation portion |
| US5329614A (en) | 1991-02-07 | 1994-07-12 | Unisys Corporation | Method and apparatus for enlarging gray scale images |
| US5363119A (en) | 1991-05-01 | 1994-11-08 | Atari Games Corporation | Scaling processor for raster images |
| KR100310279B1 (ko) | 1992-11-02 | 2001-12-17 | 게스레이 마크 | 패턴발생장치용라스터라이저 |
| EP0663645A3 (en) | 1994-01-13 | 1996-07-03 | Eastman Kodak Co | Bitmap registration through gradient descent. |
| US6023530A (en) | 1995-11-13 | 2000-02-08 | Applied Intelligent Systems, Inc. | Vector correlation system for automatically locating patterns in an image |
| US5751852A (en) | 1996-04-29 | 1998-05-12 | Xerox Corporation | Image structure map data structure for spatially indexing an imgage |
| US6038348A (en) | 1996-07-24 | 2000-03-14 | Oak Technology, Inc. | Pixel image enhancement system and method |
| DE19636949A1 (de) | 1996-09-11 | 1998-03-12 | Siemens Ag | Verfahren zur Detektion von Kanten in einem Bildsignal |
| US5847959A (en) * | 1997-01-28 | 1998-12-08 | Etec Systems, Inc. | Method and apparatus for run-time correction of proximity effects in pattern generation |
| US6400838B2 (en) * | 1997-07-29 | 2002-06-04 | Kabushiki Kaisha Toshiba | Pattern inspection equipment, pattern inspection method, and storage medium storing pattern inspection program |
| US6061476A (en) | 1997-11-24 | 2000-05-09 | Cognex Corporation | Method and apparatus using image subtraction and dynamic thresholding |
| JP3120767B2 (ja) * | 1998-01-16 | 2000-12-25 | 日本電気株式会社 | 外観検査装置、外観検査方法及び外観検査プログラムを記録した記録媒体 |
| US6556702B1 (en) * | 1999-01-06 | 2003-04-29 | Applied Materials, Inc. | Method and apparatus that determines charged particle beam shape codes |
| US6259106B1 (en) * | 1999-01-06 | 2001-07-10 | Etec Systems, Inc. | Apparatus and method for controlling a beam shape |
| US6262429B1 (en) * | 1999-01-06 | 2001-07-17 | Etec Systems, Inc. | Raster shaped beam, electron beam exposure strategy using a two dimensional multipixel flash field |
| US6467076B1 (en) * | 1999-04-30 | 2002-10-15 | Nicolas Bailey Cobb | Method and apparatus for submicron IC design |
| US6678414B1 (en) * | 2000-02-17 | 2004-01-13 | Xerox Corporation | Loose-gray-scale template matching |
| US7034963B2 (en) * | 2001-07-11 | 2006-04-25 | Applied Materials, Inc. | Method for adjusting edges of grayscale pixel-map images |
| US7302111B2 (en) * | 2001-09-12 | 2007-11-27 | Micronic Laser Systems A.B. | Graphics engine for high precision lithography |
| SE0104238D0 (sv) * | 2001-12-14 | 2001-12-14 | Micronic Laser Systems Ab | Method and apparatus for patterning a workpiece |
| US20030233630A1 (en) | 2001-12-14 | 2003-12-18 | Torbjorn Sandstrom | Methods and systems for process control of corner feature embellishment |
| US7167185B1 (en) * | 2002-03-22 | 2007-01-23 | Kla- Tencor Technologies Corporation | Visualization of photomask databases |
| US7043089B2 (en) * | 2003-02-27 | 2006-05-09 | Hewlett-Packard Development Company, L.P. | Overflow error diffusion |
| US7407252B2 (en) * | 2004-07-01 | 2008-08-05 | Applied Materials, Inc. | Area based optical proximity correction in raster scan printing |
-
2004
- 2004-07-01 US US10/882,959 patent/US7529421B2/en not_active Expired - Fee Related
-
2005
- 2005-07-01 EP EP05769261A patent/EP1766571A1/en not_active Withdrawn
- 2005-07-01 WO PCT/US2005/023590 patent/WO2006007570A1/en not_active Ceased
- 2005-07-01 JP JP2007519490A patent/JP4753942B2/ja not_active Expired - Fee Related
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