JP2008292475A5 - - Google Patents

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Publication number
JP2008292475A5
JP2008292475A5 JP2008117205A JP2008117205A JP2008292475A5 JP 2008292475 A5 JP2008292475 A5 JP 2008292475A5 JP 2008117205 A JP2008117205 A JP 2008117205A JP 2008117205 A JP2008117205 A JP 2008117205A JP 2008292475 A5 JP2008292475 A5 JP 2008292475A5
Authority
JP
Japan
Prior art keywords
measurement system
position measurement
pld
fpga
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2008117205A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008292475A (ja
JP5128360B2 (ja
Filing date
Publication date
Priority claimed from US11/753,508 external-priority patent/US7489409B2/en
Priority claimed from US11/778,813 external-priority patent/US7869662B2/en
Application filed filed Critical
Publication of JP2008292475A publication Critical patent/JP2008292475A/ja
Publication of JP2008292475A5 publication Critical patent/JP2008292475A5/ja
Application granted granted Critical
Publication of JP5128360B2 publication Critical patent/JP5128360B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2008117205A 2007-05-24 2008-04-28 ターゲットパターンを使用して絶対位置を感知する位置測定システムおよび位置測定方法 Expired - Fee Related JP5128360B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US11/753,508 US7489409B2 (en) 2005-04-22 2007-05-24 System for sensing an absolute position in two dimensions using a target pattern
US11/753,508 2007-05-24
US11/778,813 US7869662B2 (en) 2005-04-22 2007-07-17 System architecture for sensing an absolute position using a target pattern
US11/778,813 2007-07-17

Publications (3)

Publication Number Publication Date
JP2008292475A JP2008292475A (ja) 2008-12-04
JP2008292475A5 true JP2008292475A5 (enExample) 2011-06-23
JP5128360B2 JP5128360B2 (ja) 2013-01-23

Family

ID=40072098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008117205A Expired - Fee Related JP5128360B2 (ja) 2007-05-24 2008-04-28 ターゲットパターンを使用して絶対位置を感知する位置測定システムおよび位置測定方法

Country Status (3)

Country Link
US (1) US7869662B2 (enExample)
JP (1) JP5128360B2 (enExample)
DE (1) DE102008026865A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2254091B1 (en) * 2009-05-19 2020-03-25 Veoneer Sweden AB Vision system and method for a motor vehicle
JP6239881B2 (ja) * 2013-07-10 2017-11-29 浜松ホトニクス株式会社 画像取得装置及び画像取得方法
US11061338B2 (en) * 2014-04-17 2021-07-13 Nikon Corporation High-resolution position encoder with image sensor and encoded target pattern
EP3064902B1 (de) * 2015-03-06 2017-11-01 Hexagon Technology Center GmbH System zur bestimmung von positionen
DE102016220573A1 (de) * 2016-10-20 2018-04-26 Robert Bosch Gmbh Verfahren und Vorrichtung zum Bestimmen einer Position und/oder Orientierung eines frei schwebenden Elements
CN110132327B (zh) * 2019-06-05 2021-09-17 知恒科技(天津)有限公司 一种光电编码器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4096477B2 (ja) * 1999-07-23 2008-06-04 松下電工株式会社 画像処理システムおよびその構成方法
US7249094B2 (en) * 2001-02-26 2007-07-24 Paypal, Inc. System and method for depicting on-line transactions
US7065258B2 (en) * 2001-05-21 2006-06-20 Mitutoyo Corporation Systems and methods for reducing accumulated systematic errors in image correlation displacement sensing systems
US7409092B2 (en) * 2002-06-20 2008-08-05 Hrl Laboratories, Llc Method and apparatus for the surveillance of objects in images
GB0220228D0 (en) * 2002-09-02 2002-10-09 Univ Heriot Watt Absolute phase measuring sensor
EP1683174B1 (en) * 2003-08-18 2013-10-23 Gentex Corporation Optical elements related manufacturing methods and assemblies incorporating optical elements
CN100450147C (zh) * 2004-02-18 2009-01-07 松下电器产业株式会社 图像修正方法和图像修正装置
US7230727B2 (en) 2005-04-22 2007-06-12 Agilent Technologies, Inc. System for sensing an absolute position in two dimensions using a target pattern
US7275474B2 (en) * 2005-05-31 2007-10-02 Parker-Hannifincorporation Optical position sensing and method

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