JP2008235539A - Semiconductor device and manufacturing method of semiconductor device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To improve the reliability of a semiconductor device having an electrode pad used for both of wiring and a probe pin by eliminating imperfect contact between the electrode pad and a rewiring layer arranged from the electrode pad even when electric characteristic inspection through the probe pin is carried out. <P>SOLUTION: In the semiconductor device equipped with the rewiring layer 31 conducted to the electrode pad 12 arranged on a semiconductor substrate, a protruded object 12a, produced on the surface of the electrode pad 12 because of contact by the probe pin, is covered by an organic insulating film 21 and the rewiring layer 31, conducted to the electrode pad 12, is arranged while covering the protruded object 12a as it is. According to this arrangement, erosion on the surface of the electrode pad 12, which is generated because of the protruded object 12a generated by the contact with the probe pin, is suppressed whereby poor conduction between the electrode pad 12 and the rewiring layer 31 formed thereon can be prevented. As a result, reliability as the semiconductor device is improved. <P>COPYRIGHT: (C)2009,JPO&INPIT

Description

  The present invention relates to a semiconductor device and a method for manufacturing the semiconductor device, and more particularly to a semiconductor device having a rewiring layer on an electrode pad and a method for manufacturing the semiconductor device.

  When conducting an electrical characteristic inspection of an IC (Integrated Circuit) chip formed in a semiconductor wafer process in a wafer state, an electrode pad for inspection is formed on a semiconductor device to be measured, and a probe is formed on the electrode pad. In general, inspection is performed by bringing a probe pin into contact with each other.

  In particular, recently, a semiconductor device has been disclosed in which such an electrode pad is divided into an electrode pad for a probe pin and an electrode pad for rewiring that conducts to an external connection terminal (for example, a patent) Reference 1). A basic structure of such a semiconductor device is shown in FIG.

FIG. 13 is a schematic cross-sectional view of an essential part for explaining the basic structure of a semiconductor device provided with divided electrode pads.
The semiconductor device shown in this figure is a semiconductor device in a wafer state before being separated into pieces by dicing, and a semiconductor substrate 100 (semiconductor wafer) and elements such as transistors and capacitors formed on the semiconductor substrate 100 (Not shown) or an electronic circuit layer 110 connected to these elements.

  In the upper layer of the electronic circuit layer 110, an electrode pad 120 for a probe pin and an electrode pad 121 for forming a rewiring layer (lead wiring) that conducts to an external connection terminal are formed so as to be divided. Each electrode pad 120, 121 is electrically connected to the electronic circuit layer 110. Further, a part of the electronic circuit layer 110 and the electrode pads 120 and 121 are covered with a passivation film 200.

According to such a semiconductor device, when an electrical characteristic inspection using a probe pin is performed, the inspection is performed by bringing the probe pin into contact with only the electrode pad 120, so that the wiring electrode pad 121 is damaged by the probe pin. There is no. As a result, even if a rewiring layer that conducts from the electrode pad 121 to the external connection terminal is formed, contact failure between the electrode pad 121 and the external connection terminal does not occur.
Japanese Patent No. 3468188

  However, due to the demand for reducing the size of the IC chip, the terminal pitch of the external connection terminals tends to become narrower, and the electrode pins 120 for the probe pins and the electrode pads 121 for the wiring are not divided, and they are separated. There is a demand for a compact semiconductor device shared on the same electrode pad.

  FIG. 14 shows the structure of such a semiconductor device. FIG. 14 is a schematic cross-sectional view of an essential part for explaining the configuration of a semiconductor device provided with electrode pads. FIG. 14A is a structural diagram of the semiconductor device before contact with the probe pin, and FIG. FIG.

  As shown in FIG. 1A, in this semiconductor device, the electrode pad 122 that shares the electrode pad for wiring and the electrode pad for probe pin is formed on the electronic circuit layer 110 without being divided. ing.

  However, in the structure of such a semiconductor device, when the electrode pad 122 is made of a soft metal such as aluminum (Al), the electrode pad 122 is scraped by the probe pin 123. The state is shown in FIG. When such lint-like projections 122a (projection-like foreign matter shown in the drawing) are generated on the electrode pad 122, the presence of the projections 122a may cause a defect in rewiring formation.

For example, FIG. 15 shows a state in which a plating film is formed on the electrode pad 122 while the protrusion 122a is present.
FIG. 15 is a schematic cross-sectional view of an essential part of a semiconductor device in which a rewiring layer is formed on an electrode pad after contact with a probe pin.

  As described above, in this figure, after forming the insulating film 210 for disposing the rewiring layer on the passivation film 200, the seed layer 300 for the plating film is formed on the electrode pad 122, and A state in which the rewiring layer 310 is formed on the seed layer 300 by plating is shown.

  As can be seen from this figure, the coverage (coverage) when the seed layer 300 is formed is reduced by the presence of the protrusion 122a, and the rewiring layer 310 is formed by plating as it is. That is, the rewiring layer 310 is formed by plating while the lower part of the protrusion 122a is not sufficiently covered with the seed layer 300.

  By the way, in plating, in order to obtain a high-quality plating film, it is generally grown at a slow growth rate, but such a seed layer 300 with poor coverage is the base of the rewiring layer 310. In such a case, the frequency that the plating chemical solution wraps around the exposed portion increases, and a phenomenon occurs in which the surface of the electrode pad 122 corrodes from that portion. For example, the part surrounded by the arrow A represents the corroded part.

  If such a corroded portion exists in the electrode pad 122, even if an external electrode terminal is formed on the rewiring layer 310, a poor conduction between the electrode pad 122 and the rewiring layer 310 occurs, and the reliability as a semiconductor device is improved. There was a problem of lowering.

  The present invention has been made in view of the above points, and has electrode pads used for both wiring and probe pins. It is an object of the present invention to provide a semiconductor device and a method for manufacturing the semiconductor device that can eliminate poor contact with a rewiring layer disposed from an electrode pad.

  In order to solve the above problems, the present invention provides a semiconductor device 1 that can be realized with the configuration illustrated in FIG. A semiconductor device 1 illustrated in FIG. 1 is a semiconductor device 1 including a wiring layer (rewiring layer 31) that is electrically connected to an electrode pad 12 disposed on a semiconductor substrate, and the surface of the electrode pad 12 by contact with a probe pin. An insulating film (organic insulating film 21) that covers at least a part of the protrusion 12a formed on the wiring layer, and a wiring layer (rewiring layer 31) formed on the insulating film and on the electrode pad 12 and conducting to the electrode pad 12 And.

  Further, the present invention provides a semiconductor device 2 that can be realized by the configuration illustrated in FIG. The semiconductor device 2 illustrated in FIG. 6 is a semiconductor device 2 including a wiring layer (rewiring layer 31) that is electrically connected to an electrode pad 12 disposed on a semiconductor substrate, and the surface of the electrode pad 12 by contact with a probe pin. And a wiring layer (rewiring layer 31) formed on the sputtering film and electrically connected to the electrode pad 12. It is characterized by.

  According to such semiconductor devices 1 and 2, the protrusion 12 a generated on the surface of the electrode pad 12 by the contact with the probe pin is covered with the insulating film (organic insulating film 21) or the sputtering film (seed layer 30, metal film 33). Then, a wiring layer (rewiring layer 31) that is electrically connected to the electrode pad 12 is disposed with the protrusion 12a covered.

  In order to solve the above problems, the present invention provides a method for manufacturing a semiconductor device including a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate, wherein the surface of the electrode pad is contacted by a probe pin. A step of covering at least a part of the protrusions formed on the substrate with an insulating film, and a step of forming the wiring layer electrically connected to the electrode pad on the insulating film and the electrode pad. A method of manufacturing a semiconductor device is provided.

  According to the present invention, there is also provided a method of manufacturing a semiconductor device including a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate, wherein a projection generated on the surface of the electrode pad is covered by contact with a probe pin. Thus, there is provided a method for manufacturing a semiconductor device, comprising: a step of forming a sputtering film; and a step of forming the wiring layer on the sputtering film.

  According to such a method for manufacturing a semiconductor device, the projection generated on the surface of the electrode pad is covered with the insulating film or the sputtering film by the contact with the probe pin, and the wiring layer that is electrically connected to the electrode pad is disposed.

  According to the present invention, in a semiconductor device having a wiring layer that conducts to an electrode pad disposed on a semiconductor substrate and a method for manufacturing the same, a projection generated on the electrode pad surface by contact with a probe pin is covered with an insulating film or a sputtering film. Then, a wiring layer that conducts to the electrode pad is disposed with the projections covered.

  Thereby, the corrosion of the electrode pad surface caused by the protrusion generated by the contact of the probe pin is suppressed, and the conduction failure between the electrode pad and the wiring layer formed thereon can be prevented. As a result, the reliability as a semiconductor device is improved.

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
<First Embodiment>
First, the form of the semiconductor device according to the first embodiment of the present invention will be described.

1A and 1B are diagrams illustrating a configuration of a semiconductor device according to a first embodiment. FIG. 1A is a schematic cross-sectional view of a main part, and FIG. 1B is an enlarged view.
The semiconductor device 1 shown in this figure shows, as an example, the main part of the semiconductor device in a wafer state before being cut by dicing. Further, the semiconductor device 1 in this figure shows a state in which an electrical characteristic inspection by a probe pin is performed in a wafer shape.

  In the semiconductor device 1, a so-called wafer process is applied to one main surface of a semiconductor substrate (semiconductor wafer) 10 such as Si (silicon) or GaAs (gallium arsenide), so that active elements such as transistors, capacitors, etc. Passive elements are provided (not shown), and an electronic circuit layer 11 connected to these elements is formed thereon.

  A plurality of electrode pads 12 and 13 electrically connected to the electronic circuit layer 11 are further disposed on the electronic circuit layer 11. However, as for the electrode pad 12, a rewiring electrode pad and a probe pin electrode pad are shared. The electrode pads 12 and 13 are made of a soft metal whose main component is aluminum or copper (Cu), and the electrode pad 12 has protrusions 12a generated in a lint-like shape by contact with a probe pin. is doing. A passivation film 20 such as silicon nitride (SiN) is formed on the electronic circuit layer 11 to protect the semiconductor device 1.

  On the passivation film 20 and the electrode pad 12, an organic insulating film 21 is formed so as to cover the protrusions 12 a generated on the electrode pad 12. The material of the organic insulating film 21 is an insulating resin, and is made of, for example, an epoxy resin or a polyimide resin. An opening 22 that penetrates to the surface of the electrode pad 12 is provided in the organic insulating film 21. However, the opening 22 is formed so as to remove the position of the protrusion 12a. The surface of the electrode pad 12 is exposed at the bottom of the opening 22.

  Further, a seed layer 30 is formed on the organic insulating film 21, the inner wall of the opening 22, and the electrode pad 12 whose surface is exposed, and a redistribution layer for conducting to the external connection terminal on the seed layer 30. 31 is formed. The rewiring layer 31 is mainly composed of copper.

  The semiconductor device 1 is sealed with a sealing layer 40 so as to expose a part of the rewiring layer 31. The material of the sealing layer 40 is, for example, an epoxy resin. Further, a bump electrode (projecting electrode) 50 as an external connection terminal is disposed on the rewiring layer 31 whose surface is exposed from the sealing layer 40. The bump electrode 50 is made of, for example, gold (Au), copper, an alloy thereof, solder, or the like.

  Next, the manufacturing method of such a semiconductor device 1 will be described with reference to FIGS. 2 to 5 from the coating step of the organic insulating film 21 before curing. In the following drawings, the same members as those in FIG. 1 are denoted by the same reference numerals, and detailed descriptions of the members already described are omitted.

2A and 2B are diagrams for explaining the organic insulating film application step, where FIG. 2A is a schematic cross-sectional view of an essential part and FIG. 2B is an enlarged view.
This figure shows a state in which a paste-like organic insulating film 21a is applied to a wafer-like semiconductor device after electrical characteristic inspection using probe pins has been performed.

  As shown in the drawing, an element and an electronic circuit layer 11 are formed in advance on a semiconductor substrate 10, and an electrode pad 12 conducting to the electronic circuit layer 11 is formed on the electronic circuit layer 11. Then, a passivation film 20 is formed so as to cover a part of the electrode pad 12. In the electrode pad 12, a lint-like protrusion 12a generated by an electrical characteristic inspection using a probe pin is generated.

  On such a wafer-like semiconductor device, an organic insulating film 21a, which is a photosensitive resin, is applied by spin coating. Here, the material of the organic insulating film 21a is made of an epoxy resin or a polyimide resin, and is in a paste form before photocuring. Therefore, the organic insulating film 21a before photocuring has a sufficient viscosity to cover the periphery of the lint-like projection 12a. That is, if the organic insulating film 21a is applied onto the semiconductor device by spin coating, the lint-like projections 12a are completely covered with the organic insulating film 21a, and the organic insulating film is also formed on the passivation film 20 and the electrode pad 12. 21a is formed.

  3A and 3B are diagrams for explaining the organic insulating film patterning step, FIG. 3A is a schematic cross-sectional view of the relevant part, and FIG. 3B is an enlarged view. This figure shows a state where the organic insulating film 21a applied in the previous step is cured and patterned on the semiconductor device.

  The alignment of the exposure mask is performed on the organic insulating film 21a applied in the previous step, the organic insulating film 21a is cured by lithography, and the patterned organic insulating film 21 is formed on the semiconductor device.

  Here, an opening 22 penetrating to the surface of the electrode pad 12 is provided in the organic insulating film 21 by lithography. The opening 22 is formed in the organic insulating film 21 so that the protrusions 12a generated on the electrode pad 12 are not exposed from the organic insulating film 21 by the exposure and lithography described above. The film thickness of the organic insulating film 21 formed here is 2 to 20 μm.

  4A and 4B are diagrams for explaining a rewiring layer plating process, in which FIG. 4A is a schematic cross-sectional view of an essential part, and FIG. 4B is an enlarged view. In this figure, a state where the rewiring layer 31 is plated on the electrode pad 12 is shown.

A seed layer 30 of 50 to 500 nm is formed in advance on the surface of the electrode pad 12, the inner wall of the opening 22 and the surface of the organic insulating film 21 by sputtering.
Then, in order to form a rewiring layer, a resist is applied, and a rewiring layer 31 having a thickness of 3 to 50 μm is formed by electrolytic plating on the seed layer 30 exposed from the resist 32 patterned by lithography. To do.

  5A and 5B are diagrams for explaining the rewiring layer forming step. FIG. 5A is a schematic cross-sectional view of the main part, and FIG. 5B is an enlarged view. In this figure, a state in which the rewiring layer 31 is disposed on the electrode pad 12 is shown.

  In the previous step, the patterned resist 32 and unnecessary portion of the seed layer 30 located under the resist 32 are removed by ashing and etching, and the rewiring layer 31 is formed on the electrode pad 12.

  Thereafter, as in the semiconductor device 1 shown in FIG. 1, the sealing layer 40 is formed so as to expose a part of the rewiring layer 31. Then, the bump electrode 50 is formed on the rewiring layer 31 whose surface is exposed from the sealing layer 40, and the bump electrode 50 and the electrode pad 12 are electrically connected to complete the semiconductor device 1. Here, as a method of forming the bump electrode 50, a ball bonding method using a metal wire, a plating method, a printing method, a transfer method, or the like is used. Thereafter, dicing is performed to manufacture a semiconductor device separated from the wafer state into a predetermined chip size.

  As described above, in the semiconductor device 1 described in the first embodiment, the lint-like protrusions 12 a generated by the electrical characteristic inspection using the probe pins are covered with the organic insulating film 21.

  Then, the rewiring layer 31 is formed on the electrode pad 12 while maintaining the state where the protrusion 12 a is covered with the organic insulating film 21. Further, a bump electrode 50 as an external connection terminal is formed on the rewiring layer 31.

  The organic insulating film 21 covers the portion of the protrusion 12a having poor coverage with the insulating film, so that the surface of the electrode pad is not corroded. As a result, the contact between the electrode pad 12 and the bump electrode 50 is poor. As a result, a highly reliable semiconductor device is realized.

  Further, by providing the electrode pad 12 that is shared for the rewiring layer and the electrical characteristic inspection, the semiconductor device can be made compact, and the semiconductor device can be highly integrated and reduced in cost.

<Second Embodiment>
Next, a second embodiment of the present invention will be described. In the following drawings, the same reference numerals are given to the same members included in the semiconductor device 1 described in the first embodiment, and the detailed description of the members already described is omitted.

6A and 6B are diagrams illustrating the configuration of the semiconductor device according to the second embodiment. FIG. 6A is a schematic cross-sectional view of a main part, and FIG. 6B is an enlarged view.
As an example, the semiconductor device 2 shown in this figure shows a main part of the semiconductor device in a wafer state before being cut by dicing. In addition, the semiconductor device 2 in this figure shows a state in which electrical characteristics are inspected by probe pins in the wafer state.

  In the semiconductor device 2, a so-called wafer process is applied to one main surface of the semiconductor substrate 10, and an active element such as a transistor and a passive element such as a capacitor are arranged (not shown). An electronic circuit layer 11 connected to these elements is formed.

  A plurality of electrode pads 12 and 13 electrically connected to the electronic circuit layer 11 are further disposed on the electronic circuit layer 11. However, as for the electrode pad 12, a rewiring electrode pad and a probe pin electrode pad are shared. And the protrusion 12a produced | generated in the waste thread shape by the contact by a probe pin is produced | generated by the electrode pad 12. FIG. A passivation film 20 is formed on the electronic circuit layer 11 to protect the semiconductor device 2. Further, an organic insulating film 21 is formed so as to cover the passivation film 20 and a part of the electrode pad 12. In the second embodiment, the metal film 33 and the seed layer 30 are formed so as to cover the protrusion 12a generated on the electrode pad 12. Here, the metal film 33 is made of a metal whose main component is at least one of titanium (Ti) or copper. The film thickness of the metal film 33 is 10 to 500 nm.

The seed layer 30 is a metal layer composed of the same components as the rewiring layer 31. The film thickness of the seed layer 30 is 50 to 500 nm.
Further, a rewiring layer 31 is formed on the seed layer 30 to conduct to the external connection terminal. The rewiring layer 31 is made of a metal whose main component is copper.

  The semiconductor device 2 is sealed with a sealing layer 40 so as to expose a part of the rewiring layer 31. Furthermore, a bump electrode 50 as an external connection terminal is disposed on the rewiring layer 31 whose surface is exposed from the sealing layer 40. The bump electrode 50 is made of, for example, gold, copper, an alloy thereof, solder, or the like.

  Next, a method for manufacturing the semiconductor device 2 will be described from the step of forming the organic insulating film 21 with reference to FIGS. In addition, in the following drawings, the same code | symbol is attached | subjected to the member same as FIGS. 1-6, and the detail of the description is abbreviate | omitted about the member already demonstrated.

  7A and 7B are diagrams for explaining the organic insulating film patterning step. FIG. 7A is a schematic cross-sectional view of an essential part, and FIG. 7B is an enlarged view. This figure shows a state in which the organic insulating film 21 is patterned on the wafer-like semiconductor device after the electrical characteristic inspection by the probe pins is performed.

  As shown in the drawing, a passivation film 20 is formed in advance on the wafer-like semiconductor device so as to cover a part of the electrode pad 12, and the electrode pad 12 is generated by an electrical characteristic inspection using a probe pin. A lint-like protrusion 12a is generated.

  On such a wafer-like semiconductor device, a paste-like organic insulating film, which is a photosensitive resin, is applied by spin coating (not shown), and the paste-like organic insulating film is cured by lithography, and the organic insulating film Is patterned.

After patterning, as shown in this figure, an organic insulating film 21 is formed so as to cover the passivation film 20 and part of the electrode pad 12.
In the second embodiment, the protrusion 12 a is not covered with the organic insulating film 21, and in this step, it is exposed on the electrode pad 12.

  8A and 8B are diagrams for explaining a sputtered film forming process, FIG. 8A is a schematic cross-sectional view of a relevant part, and FIG. This figure shows a state in which the protrusion 12a is covered with a sputtered film.

A metal film 33 is formed on the electrode pad 12, the inner wall of the organic insulating film 21, and the surface thereof by sputtering.
Here, as for the sputtering condition of the metal film 33, the substrate temperature is set to 50 to 400 ° C. so that the migration on the surface of the electrode pad 12 is promoted and the projection 12a is sufficiently surrounded. Further, the metal film 33 is formed so as to have a thickness of 10 to 500 nm.

  Further, a seed layer 30 of a rewiring layer described later is formed on the metal film 33 by sputtering. Also for the seed layer 30, the substrate temperature is set to 50 to 400 ° C. so that the migration on the surface of the electrode pad 12 is promoted and the protrusion 12 a is sufficiently surrounded. Further, the seed layer 30 is formed so as to have a film thickness of 50 to 500 nm.

By forming these coating films by sputtering, the periphery of the protrusion 12 a is covered with the metal film 33 and the seed layer 30.
9A and 9B are diagrams for explaining a rewiring layer plating process, FIG. 9A is a schematic cross-sectional view of a relevant part, and FIG. 9B is an enlarged view. In this figure, a state where the rewiring layer 31 is plated on the electrode pad 12 is shown.

  In the previous step, after the seed layer 30 is formed, a resist 32 is applied for plating the rewiring layer, and the resist 32 is patterned. Then, a rewiring layer 31 having a thickness of 3 to 50 μm is formed on the seed layer 30 exposed from the resist 32 by electrolytic plating.

  10A and 10B are diagrams for explaining the rewiring layer forming step. FIG. 10A is a schematic cross-sectional view of the relevant part, and FIG. 10B is an enlarged view. In this figure, a state in which the rewiring layer 31 is disposed on the electrode pad 12 is shown.

  The resist 32 formed by patterning in the previous step, and unnecessary portions of the metal film 33 and the seed layer 30 remaining under the resist 32 are removed by ashing and etching, and a rewiring layer 31 that is electrically connected to the electrode pad 12 is provided.

  Thereafter, as in the semiconductor device 2 shown in FIG. 6, the sealing layer 40 is formed so as to expose a part of the rewiring layer 31. Further, the bump electrode 50 is formed on the rewiring layer 31 whose surface is exposed from the sealing layer 40, and the semiconductor device 2 is completed. Thereafter, dicing is performed to manufacture a semiconductor device separated from the wafer state into a predetermined chip size.

  As described above, in the semiconductor device 2, the lint-like protrusion 12 a generated by the electrical characteristic inspection using the probe pin is covered with the metal film 33 and the seed layer 30.

  Then, the rewiring layer 31 is formed on the electrode pad 12 by plating while maintaining the state in which the protrusion 12a is covered with the metal film 33 and the seed layer 30, and the rewiring layer 31 is connected to the rewiring layer 31 for external connection. A bump electrode 50 as a terminal is formed.

  In particular, in the second embodiment, the metal film 33 is formed around the protrusion 12 a and, at the same time, the seed layer 30 of the rewiring layer 31 is formed on the metal film 33. By forming the sputtered film, for example, when the material of the seed layer 30 is the same as the material of the wiring layer, the growth of plating is improved because of the same material, and plating is applied to a portion having poor coverage under the protrusion 12a. Generation | occurrence | production of the defect which a chemical | medical solution penetrates and causes the corrosion of an electrode pad can be suppressed. As a result, contact failure between the electrode pad 12 and the bump electrode 50 is reduced, and a highly reliable semiconductor device is realized.

  Further, by providing the electrode pad 12 that is shared for the rewiring layer and the electrical characteristic inspection, the semiconductor device can be made compact, and the semiconductor device can be highly integrated and reduced in cost.

<Third Embodiment>
Next, a third embodiment of the present invention will be described. The third embodiment is a combined example of the first and second embodiments described above. The configuration of the semiconductor device in this case will be described in detail. Note that, in the following drawings, the same members included in the semiconductor devices 1 and 2 described in the first and second embodiments are denoted by the same reference numerals, and the members already described are described in detail. Is omitted.

FIG. 11 is a schematic cross-sectional view of the relevant part for explaining a modification of the configuration of the semiconductor device.
The semiconductor device 3 is provided with active elements such as transistors and passive elements such as capacitors (not shown), and an electronic circuit layer 11 connected to these elements is formed thereon.

  A plurality of electrode pads 12 and 13 electrically connected to the electronic circuit layer 11 are disposed on the electronic circuit layer 11. However, as for the electrode pad 12, a rewiring electrode pad and a probe pin electrode pad are shared. As described above, the protrusions 12a generated in a lint-like shape are generated on the electrode pad 12 by contact with the probe pin. A passivation film 20 is formed on the electronic circuit layer 11 to protect the semiconductor device 3.

  An organic insulating film 21 is formed on the passivation film 20 and the electrode pad 12 so as to cover a part of the protrusion 12a. An opening 22 is provided in the organic insulating film 21. The organic insulating film 21 is formed by the manufacturing method described in the first embodiment.

  That is, the organic insulating film 21 is formed by spin coating on a wafer-like semiconductor device, and is an insulating resin film formed by patterning a photosensitive resin by exposure and development. Specifically, it is composed of an epoxy resin, a polyimide resin, or the like.

  Furthermore, a metal film 33 and a seed layer 30 are formed on the surface of the protrusion 12a, the surface of the electrode pad 12, and the surface of the organic insulating film 21 that are not covered with the organic insulating film 21 by sputtering. The metal film 33 and the seed layer 30 are formed by the manufacturing method described in the second embodiment.

  A rewiring layer 31 is formed on the seed layer 30 to be electrically connected to the external connection terminal. Further, the semiconductor device 3 is sealed by a sealing layer 40 so as to expose a part of the rewiring layer 31, and a bump electrode as an external connection terminal is formed on the rewiring layer 31 whose surface is exposed. 50 is arranged.

  As described above, in the semiconductor device 3, the lint-like protrusion 12 a generated by the electrical characteristic inspection using the probe pin is covered with the organic insulating film 21, the metal film 33, and the seed layer 30.

  A rewiring layer 31 is formed on the electrode pad 12 by plating while the protrusion 12a is covered with the organic insulating film 21, the metal film 33, and the seed layer 30, and the rewiring layer is further formed. A bump electrode 50 as an external connection terminal is formed on 31.

  In particular, since the seed layer 30 of the rewiring layer 31 is formed on the protrusion 12a, the coverage at the lower portion of the protrusion 12a is improved, and when the seed layer and the rewiring layer are made of the same material. The growth of the plating film is promoted, and the plating chemical solution can be prevented from flowing into the lower portion of the projection 12a of the plating chemical solution.

  Therefore, the corrosion of the surface of the electrode pad 12 generated when the rewiring layer 31 is formed is improved. A bump electrode 50 that is electrically connected to the electrode pad 12 is disposed in the semiconductor device 3. As a result, contact failure between the electrode pad 12 and the bump electrode 50 is reduced, and a highly reliable semiconductor device is realized.

  Further, by providing the electrode pad 12 that is shared for the rewiring layer and the electrical characteristic inspection, the semiconductor device can be made compact, and the semiconductor device can be highly integrated and reduced in cost.

<Fourth embodiment>
Next, a fourth embodiment of the present invention will be described. The fourth embodiment is a modification of the first to third embodiments described above. In the following drawings, the same reference numerals are given to the same members included in the semiconductor devices 1, 2, and 3 described in the first to third embodiments, and the members already described are described in the description. Details are omitted.

FIG. 12 is a schematic cross-sectional view of the relevant part for explaining a modification of the configuration of the semiconductor device.
A so-called wafer process is applied to the semiconductor device 4 so that an active element such as a transistor and a passive element such as a capacitor are disposed (not shown), and an electronic circuit layer 11 connected to these elements is provided on the upper layer. Is formed.

  A plurality of electrode pads 12 and 13 electrically connected to the electronic circuit layer 11 are disposed on the electronic circuit layer 11. However, the electrode pad 12 shares an electrode pad for rewiring and an electrode pad for probe pins. And the protrusion 12a produced | generated in the waste thread shape by the contact by a probe pin is produced | generated by the electrode pad 12. FIG. A passivation film 20 is formed on the electronic circuit layer 11 to protect the semiconductor device 4.

  An organic insulating film 21 is formed on the passivation film 20 and the electrode pad 12 so as to cover the protrusion 12a. An opening 22 that penetrates to the surface of the electrode pad 12 is provided in the organic insulating film 21 so as to remove the position of the protrusion 12 a, and the surface of the electrode pad 12 is exposed at the bottom of the opening 22.

  Further, a seed layer 30 is formed on the organic insulating film 21, the inner wall of the opening 22, and the exposed electrode pad 12, and a rewiring layer 31 is formed on the seed layer 30 to be electrically connected to an external connection terminal. Has been. The rewiring layer 31 is made of a metal whose main component is copper.

The semiconductor device 4 is sealed with a sealing layer 41 so as to expose a part of the rewiring layer 31.
However, in this embodiment, the sealing layer 41 is formed higher than, for example, the sealing layer 40 described in the first to third embodiments, and the hole formed in the sealing layer 41 has a cylindrical shape. A columnar electrode 60 (post-shaped electrode) is formed. The columnar electrode 60 is formed by printing or plating. The columnar electrode 60 is made of, for example, copper.

  A bump electrode 51 as an external connection terminal is formed on the columnar electrode 60. The bump electrode 51 is made of, for example, gold, copper, an alloy thereof, solder, or the like.

  In such a semiconductor device 4, since the protrusion 12 a is covered with the organic insulating film 21, the corrosion of the surface of the electrode pad 12 generated when the rewiring layer 31 is formed is improved. A bump electrode 51 that is electrically connected to the electrode pad 12 is disposed in the semiconductor device 4. Further, the arrangement of the columnar electrode 60 can relieve or absorb the stress generated during mounting by the columnar electrode 60 and the sealing layer 41 around the columnar electrode 60. As a result, contact failure between the electrode pad 12 and the bump electrode 51 is reduced, and a highly reliable semiconductor device is realized.

  Further, by providing the electrode pad 12 that is shared for the rewiring layer and the electrical characteristic inspection, the semiconductor device can be made compact, and the semiconductor device can be highly integrated and reduced in cost.

  In this figure, the covering state of the protrusions 12a is illustrated by way of example in which the protrusions 12a are covered by the organic insulating film 21 corresponding to the first embodiment. Naturally, this embodiment can also be applied to the semiconductor devices 2 and 3 corresponding to the second and third embodiments.

(Appendix 1) A semiconductor device including a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate,
An insulating film that covers at least a part of the protrusion generated on the surface of the electrode pad by contact with the probe pin;
The wiring layer formed on the insulating film and on the electrode pad and conducting to the electrode pad;
A semiconductor device comprising:

(Appendix 2) A semiconductor device including a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate,
A sputtering film for covering the protrusions generated on the surface of the electrode pad by contact with a probe pin;
The wiring layer formed on the sputtering film and conducting to the electrode pad;
A semiconductor device comprising:

  (Supplementary note 3) The semiconductor device according to supplementary note 1, wherein a part of the protrusion is covered with the insulating film, and a part of the protrusion that is not covered with the insulating film is covered with a sputtering film. .

(Supplementary note 4) The semiconductor device according to Supplementary note 1 or 3, wherein the insulating film is an organic insulating film.
(Additional remark 5) The said sputtering film is comprised by the film which laminated | stacked the seed layer which makes the material of the said wiring layer the main component on the metal film which makes at least one of titanium (Ti) or chromium (Cr) the main component. The semiconductor device according to attachment 2, wherein the semiconductor device is formed.

(Additional remark 6) The columnar electrode is formed on the said wiring layer, The semiconductor device as described in any one of additional remark 1 thru | or 3 characterized by the above-mentioned.
(Appendix 7) A semiconductor device including a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate,
A semiconductor device comprising a plurality of metal films between a projection formed on a surface of the electrode pad by contact with a probe pin, an external terminal, and a wiring layer connecting the electrode pad.

(Supplementary note 8) The semiconductor device according to supplementary note 7, wherein the metal film covering the protrusion and the seed layer formed between the metal film and the wiring layer are made of different materials.
(Supplementary note 9) The semiconductor device according to supplementary note 7, wherein the seed layer formed between the metal film and the wiring layer is made of the same material as that of the wiring layer.

(Additional remark 10) It is a manufacturing method of the semiconductor device provided with the wiring layer connected to the electrode pad arrange | positioned at the semiconductor substrate,
A step of covering at least a part of the protrusion generated on the surface of the electrode pad with an insulating film by contact with a probe pin; and
Forming the wiring layer electrically connected to the electrode pad on the insulating film and the electrode pad;
A method for manufacturing a semiconductor device, comprising:

(Additional remark 11) It is a manufacturing method of the semiconductor device provided with the wiring layer electrically connected to the electrode pad arrange | positioned at the semiconductor substrate,
Forming a sputtering film so as to cover the projections generated on the surface of the electrode pad by contact with a probe pin; and
Forming the wiring layer on the sputtering film;
A method for manufacturing a semiconductor device, comprising:

  (Additional remark 12) When covering a part of said protrusion with the said insulating film, the said protrusion which is not coat | covered with the said insulating film is coat | covered with a sputtering film, The semiconductor device of Additional remark 10 characterized by the above-mentioned. Production method.

(Additional remark 13) In the process of forming the said sputtering film, the process of forming a 1st sputtering film so that the projection produced | generated on the surface of the said electrode pad may be coat | covered by the contact by a probe pin,
Forming a second sputtering film on the first sputtering film;
The method for manufacturing a semiconductor device according to appendix 11, wherein:

(Additional remark 14) The said insulating film is an organic insulating film, The manufacturing method of the semiconductor device of Additional remark 10 or 12 characterized by the above-mentioned.
(Supplementary note 15) The method of manufacturing a semiconductor device according to supplementary note 13, wherein the first sputtering film is a metal film containing at least one of titanium (Ti) and chromium (Cr) as a main component.

  (Additional remark 16) The said 2nd sputtering film is a seed layer of the said wiring layer which uses the material of the said wiring layer as a main component, The manufacturing method of the semiconductor device of Additional remark 13 characterized by the above-mentioned.

1A and 1B are diagrams illustrating a configuration of a semiconductor device according to a first embodiment, FIG. 1A is a schematic cross-sectional view of a main part, and FIG. 1B is an enlarged view. It is a figure explaining an organic insulating film application | coating process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining an organic insulating film patterning process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining a rewiring layer plating process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining a rewiring layer formation process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining the structure of the semiconductor device in 2nd Embodiment, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining an organic insulating film patterning process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining a sputter | spatter film formation process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining a rewiring layer plating process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a figure explaining a rewiring layer formation process, (A) is a principal part cross-sectional schematic diagram, (B) is an enlarged view. It is a principal part cross-sectional schematic diagram explaining the modification of a structure of a semiconductor device. It is a principal part cross-sectional schematic diagram explaining the modification of a structure of a semiconductor device. It is a principal part cross-sectional schematic diagram explaining the basic composition of the semiconductor device provided with the split-type electrode pad. FIG. 2 is a schematic cross-sectional view of a main part for explaining the configuration of a semiconductor device provided with electrode pads, (A) is a structural diagram of the semiconductor device before contacting the probe pin, and (B) is a structure of the semiconductor device after contacting the probe pin. FIG. It is a principal part cross-sectional schematic diagram of the semiconductor device which formed the rewiring layer on the electrode pad after a probe pin contact.

Explanation of symbols

1, 2, 3, 4 Semiconductor device 10 Semiconductor substrate 11 Electronic circuit layer 12, 13 Electrode pad 12a Protrusion 20 Passivation film 21, 21a Organic insulating film 22 Opening 30 Seed layer 31 Redistribution layer 32 Resist 33 Metal film 40 , 41 Sealing layer 50, 51 Bump electrode 60 Columnar electrode

Claims (5)

A semiconductor device comprising a wiring layer that conducts to an electrode pad disposed on a semiconductor substrate,
An insulating film that covers at least a part of the protrusion generated on the surface of the electrode pad by contact with the probe pin;
The wiring layer formed on the insulating film and on the electrode pad and conducting to the electrode pad;
A semiconductor device comprising: A semiconductor device comprising a wiring layer that conducts to an electrode pad disposed on a semiconductor substrate,
A sputtering film for covering the protrusions generated on the surface of the electrode pad by contact with a probe pin;
The wiring layer formed on the sputtering film and conducting to the electrode pad;
A semiconductor device comprising:   2. The semiconductor device according to claim 1, wherein a part of the protrusion is covered with the insulating film, and a part of the protrusion that is not covered with the insulating film is covered with a sputtering film. A method of manufacturing a semiconductor device comprising a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate,
A step of covering at least a part of the protrusion generated on the surface of the electrode pad with an insulating film by contact with a probe pin; and
Forming a wiring layer electrically connected to the electrode pad on the insulating film and the electrode pad;
A method for manufacturing a semiconductor device, comprising: A method of manufacturing a semiconductor device comprising a wiring layer that is electrically connected to an electrode pad disposed on a semiconductor substrate,
Forming a sputtering film so as to cover the projections generated on the surface of the electrode pad by contact with a probe pin; and
Forming the wiring layer on the sputtering film;
A method for manufacturing a semiconductor device, comprising:

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