JP2008211144A - Semiconductor device producing method and semiconductor device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a novel structure for obtaining a low-voltage operation and low power consumption of an integrated circuit, and to provide a semiconductor device producing method. <P>SOLUTION: The semiconductor device has: an island-like semiconductor layer 130 provided between a pair of impurity regions 120 and including a channel formation region 108; a first insulating layer 110 provided on the impurity regions 120; a second insulating layer 112 provided on the channel formation region 108 and the first insulating layer 110; and a conductive layer 114 superimposing on the impurity regions 120 via the first insulating layer 110 and the second insulating layer 112, and superimposing on the channel formation region 108 via the second insulating layer 112. The channel formation region 108 has a film thickness thinner than the film thickness of the impurity formation region 120. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention relates to a semiconductor device and a manufacturing method thereof.

  In recent years, research on forming a thin film transistor over a substrate having an insulating surface has been actively conducted. Since thin film transistors have excellent characteristics, various functional circuits can be manufactured. For example, an integrated circuit such as a CPU (Central Processing Unit) can be manufactured.

  An integrated circuit such as a CPU has been used for various electronic devices such as a portable terminal and a computer. However, as the functionality of the electronic device increases, there is a problem that the power supply life is shortened. In order to suppress a decrease in power supply life, low voltage operation and low power consumption of an integrated circuit such as a CPU are required.

  As a method for reducing power consumption, there is a method for reducing the operating voltage of a circuit. In order to lower the operating voltage of the circuit, it is effective to lower the threshold voltage of the thin film transistor used in the circuit. In order to lower the threshold value of the thin film transistor, it is effective to improve the subthreshold characteristic of the thin film transistor. As a method for improving the subthreshold characteristics, there are a method for reducing the silicon film thickness of the thin film transistor and a method for reducing the thickness of the gate insulating layer.

For example, Patent Document 1 describes that after an island-shaped non-single-crystal silicon layer is formed, the channel region is selectively etched using a resist layer to selectively reduce the silicon thickness of the channel region. Has been.
JP 61-48975

  However, in the method of reducing the silicon film thickness of the channel region by selectively etching the channel region, it is necessary to selectively etch the channel region by forming a resist layer by a photolithography process. In this case, high precision is required for mask alignment, and it becomes very difficult to form a resist layer that opens only the channel region. When the position of the mask is shifted, a part of the source region or the drain region other than the channel region is thinned.

  On the other hand, in order to prevent a decrease in on-current, it is desirable to reduce the resistance of the source region and the drain region as much as possible. The source region and the drain region are formed by accelerating and injecting an impurity element imparting one conductivity type into the semiconductor layer with an electric field. However, if a part of the source region and the drain region is thinned as compared with other regions as a result of the process of thinning the channel region, the concentration control of the impurity element to be added is not successful and sufficient. Low resistance cannot be achieved. For example, in the source region or the drain region, when an impurity element is added so as to reduce the resistance of a portion that is not thinned, the resistance of the thinned portion is increased. On the other hand, if the impurity element is added so as to reduce the resistance of the thinned portion, the resistance of the portion not thinned cannot be sufficiently reduced.

  In view of the above problems, it is an object of the present invention to provide a semiconductor device having a novel structure and a method for manufacturing the semiconductor device for realizing low voltage operation and low power consumption while suppressing a decrease in on-state current. To do.

  The structure of the semiconductor device of the present invention includes an island-shaped semiconductor layer including a channel formation region provided between a pair of impurity regions, a first insulating layer provided over the impurity region, a channel formation region, and a first A second insulating layer provided over the first insulating layer, a conductive layer overlapping with the impurity region through the first insulating layer and the second insulating layer, and overlapping with the channel formation region through the second insulating layer And the channel formation region is thinner than the impurity formation region.

  In addition, a structure of the semiconductor device of the present invention includes an island-shaped semiconductor layer including a channel formation region provided between a pair of impurity regions and a silicide region provided in contact with part of the impurity region, and over the impurity region. A first insulating layer provided on the first insulating layer, a second insulating layer provided on the channel formation region and the first insulating layer, and an impurity region overlapping with the first insulating layer and the second insulating layer. And a conductive layer which overlaps with the channel formation region with the second insulating layer interposed therebetween, and the thickness of the channel formation region is smaller than that of the impurity formation region.

  In the above structure, the thickness of the channel formation region is preferably 0.5 nm to 100 m.

  In the above structure, the thickness of the second insulating layer functioning as the gate insulating layer of the thin film transistor is preferably greater than or equal to 1 nm and less than or equal to 20 nm. The first insulating layer is preferably thicker than the second insulating layer.

  Further, in one manufacturing method of the present invention, an island-shaped semiconductor layer is formed, an impurity element is added to the semiconductor layer, and the first concentration region and the first concentration region are sequentially added to the semiconductor layer from the surface side. A second concentration region having a low impurity concentration is formed, a first insulating layer is formed on the semiconductor layer, the first insulating layer is selectively etched to locally expose the semiconductor layer, and the semiconductor layer is exposed. By etching the first concentration region of the formed region, a channel formation region including the second concentration region exposed locally and an impurity region including the remaining first concentration region and second concentration region are formed, A second insulating layer is formed over the channel formation region and the first insulating layer, and a conductive layer overlapping with part of the channel formation region and the impurity region is interposed through the first insulating layer and the second insulating layer. It is characterized by forming.

  Further, in one manufacturing method of the present invention, an island-shaped semiconductor layer is formed, an impurity element is added to the semiconductor layer, and the first concentration region and the first concentration region are sequentially added to the semiconductor layer from the surface side. A second concentration region having a low impurity concentration is formed, a first insulating layer is formed on the semiconductor layer, the first insulating layer is selectively etched to locally expose the semiconductor layer, and the semiconductor layer is exposed. By etching the first concentration region of the formed region, a channel formation region including the second concentration region exposed locally and an impurity region including the remaining first concentration region and second concentration region are formed, A second insulating layer is formed over the channel formation region and the first insulating layer, and a conductive layer which overlaps with the channel formation region and part of the impurity region is formed through the first insulating layer and the second insulating layer. The first insulating layer and the conductive layer as a mask A part of the impurity region is exposed by etching the insulating layer 2, at least a metal layer is formed on the exposed impurity region, and heat treatment is performed, so that a part of the region where the impurity region and the metal layer are in contact with each other Is silicided to form a silicide region in part of the impurity region.

  In the above manufacturing method, the semiconductor layer is formed with a thickness of 10 nm to 200 nm and then etched to reduce the thickness, and the channel formation region has a thickness of 0.5 nm to 100 nm, preferably 5 nm to 50 nm. It may be formed.

  In the above manufacturing method, the thickness of the second insulating layer functioning as the gate insulating layer of the thin film transistor is preferably greater than or equal to 1 nm and less than or equal to 20 nm. The first insulating layer is preferably thicker than the second insulating layer.

  By applying the present invention to locally thin the channel formation region, it is possible to improve the subthreshold characteristic and reduce the threshold voltage while suppressing a decrease in on-current. As a result, low voltage operation is possible, and low power consumption can be realized.

  Embodiments of the present invention will be described below with reference to the drawings. However, the present invention is not limited to the following description, and various modifications can be made without departing from the spirit of the present invention. Is not to be done. In the structure of the present invention described below, the same reference numerals may be used in common in different drawings.

(Embodiment 1)
FIG. 1 is a top view and a cross-sectional view for explaining a main configuration of a semiconductor device according to the present invention. 1 particularly shows a structure of a thin film transistor. FIG. 1A is a top view, FIG. 1B is a cross-sectional view taken along a dashed line OP in FIG. 1A, and FIG. Sectional drawing between the wavy lines Q-R in (A) is shown. Note that FIG. 1A partially omits a thin film or the like.

  A thin film transistor 140 illustrated in FIG. 1 is provided over a substrate 100 having an insulating surface. The thin film transistor 140 includes a semiconductor layer 130 in which the channel formation region 108 and the impurity region 120 are formed, an insulating layer 110 provided over the impurity region 120 in the semiconductor layer 130, and the channel formation region 108 and the insulating layer 110 in the semiconductor layer 130. The insulating layer 112 is provided over the conductive layer 114 which overlaps with the channel formation region 108 and the impurity region 120 with the insulating layer 112 interposed therebetween.

  As the substrate 100, an SOI (Silicon on Insulator) substrate, a glass substrate, a quartz substrate, a sapphire substrate, a ceramic substrate, a metal substrate with an insulating layer formed on the surface, or the like can be used.

  A semiconductor layer 130 is formed on the substrate 100. An insulating layer 102 and an insulating layer 103 that function as a base insulating layer may be provided between the substrate 100 and the semiconductor layer 130. The base insulating layer prevents impurities such as alkali metals from diffusing from the substrate 100 to the semiconductor layer 130 and is contaminated, and may be provided as a blocking layer as appropriate. In the case where the surface of the substrate 100 is uneven, the base insulating layer can be provided as a planarizing layer.

  The insulating layers 102 and 103 are formed using silicon oxide (SiOx), silicon nitride (SiNx), silicon oxynitride (SiOxNy), silicon nitride oxide (SiNxOy), or the like. In this embodiment mode, the base insulating layer is a stacked layer of the insulating layers 102 and 103, but a single layer structure or a stacked structure of three or more layers may be used. For example, in the case of using a two-layer structure as in this embodiment, a silicon nitride oxide film can be formed as the first layer and a silicon oxynitride layer can be formed as the second layer. Alternatively, a silicon nitride layer may be formed as the first layer and a silicon oxide layer may be formed as the second layer.

  The semiconductor layer 130 is formed in an island shape. The semiconductor layer 130 is preferably formed using a single crystal semiconductor or a polycrystalline semiconductor, and can be formed using various semiconductor materials such as silicon, germanium, and silicon germanium. When an SOI substrate is applied, the semiconductor layer on the buried insulating layer can be applied as it is.

  The semiconductor layer 130 includes a channel formation region 108 and a pair of impurity regions 120. Part or all of the impurity region 120 functions as a source region or a drain region. An impurity element imparting one conductivity type is added to the impurity region 120. Further, an impurity element imparting one conductivity type for controlling the threshold voltage of the transistor may be added to the channel formation region 108. The channel formation region 108 is formed in the semiconductor layer 130 in a region overlapping with the conductive layer 114 only through the insulating layer 112, and is located between the pair of impurity regions 120.

  The channel formation region 108 is thinner than the impurity region 120. The thickness of the channel formation region 108 may be 0.5 nm to 100 nm, preferably 5 nm to 50 nm. By making the channel formation region 108 thinner, leakage current between the source region and the drain region in the subthreshold region of the thin film transistor can be suppressed.

  Further, the impurity region 120 has regions having different impurity concentrations. Specifically, it has a first concentration region 105 formed on the surface side of the impurity region 120 and a second concentration region 106 formed on the lower side of the impurity region 120. The first concentration region 105 formed on the surface side of the impurity region 120 has a higher impurity concentration than the second concentration region 106 formed on the lower side of the impurity region 120. The first concentration region 105 and the second concentration region 106 are not uniform in concentration, and it is difficult to form a clear boundary. Here, the boundary between the first concentration region 105 and the second concentration region 106 is indicated by a dotted line.

  Further, a low concentration impurity region functioning as an LDD (Lightly Doped Drain) region may be formed in the semiconductor layer 130. The low concentration impurity region can be formed between the channel formation region and the impurity region functioning as a source region or a drain region. The LDD region has a lower impurity concentration than the peak concentration of the impurity region 120 functioning as a source region or a drain region.

  The insulating layer 110 is formed in contact with the impurity region 120. It can also be said that the insulating layer 110 is formed over the semiconductor layer 130 so as to have an opening in a region overlapping with the channel formation region 108. The thickness of the insulating layer 110 is 5 nm to 300 nm, preferably 10 nm to 200 nm.

  An insulating layer 112 is formed in contact with the channel formation region 108 and the insulating layer 110. The insulating layer 112 functions as a gate insulating layer of the thin film transistor 140. The insulating layer 112 functioning as a gate insulating layer is preferably formed to have a uniform thickness in order to prevent a short circuit between the conductive layer 114 and the semiconductor layer 130, generation of leakage current, electrostatic breakdown, and the like.

In addition, when the insulating layer 110 is thicker than the insulating layer 112, the capacitance formed by the impurity region 120 and the conductive layer 114 through the insulating layer 110 can be reduced. In addition, when the insulating layer 110 has a thickness of 10 nm or more, the impurity region 120 can be prevented from disappearing due to overetching when the conductive layer 114 is processed by dry etching.

  Next, a method for manufacturing the thin film transistor illustrated in FIG. 1 is specifically described with reference to FIGS.

  First, the semiconductor layer 104 is formed over the substrate 100 with the insulating layers 102 and 103 functioning as a base insulating layer (see FIG. 2A).

  As the substrate 100, a substrate having an insulating surface such as a glass substrate or a quartz substrate is used. The insulating layers 102 and 103 are formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, or silicon nitride oxide by a CVD method or a sputtering method. The insulating layers 102 and 103 function as blocking layers that prevent alkali metal or the like from diffusing from the substrate 100 to the semiconductor layer 104 and contaminating the semiconductor layer 104. Further, when the surface of the substrate 100 is uneven, the substrate 100 can function as a planarization layer. Note that the insulating layers 102 and 103 are not necessarily formed if impurity diffusion from the substrate 100 or unevenness on the surface of the substrate 100 is not a problem. Although the base insulating layer has a two-layer structure here, it may have a single-layer structure or a three-layer structure or more.

  The semiconductor layer 104 is preferably formed using a material containing silicon as a main component by a CVD method or a sputtering method. Specifically, it can be formed using silicon, silicon germanium, or the like. Alternatively, germanium may be used. For example, the semiconductor layer 104 is an island-shaped semiconductor layer in which an amorphous semiconductor layer is formed using a material containing silicon as a main component, and the amorphous semiconductor layer is crystallized and then selectively etched. Can be formed. When crystallizing an amorphous semiconductor layer, a laser crystallization method, a thermal crystallization method using an RTA or furnace annealing furnace, a thermal crystallization method using a metal element that promotes crystallization, or a combination of these methods Etc. The semiconductor layer 104 is formed with a thickness of 10 nm to 150 nm, preferably 30 nm to 100 nm. Note that the semiconductor layer may be formed thick in advance and then thinned by etching the thick semiconductor layer.

Next, an impurity element imparting one conductivity type is added to the semiconductor layer 104, so that the first concentration region 105 and the second concentration region 106 are formed (see FIG. 2B). The first concentration region 105 is formed so that the impurity concentration is higher than that of the second concentration region 106. Specifically, the concentration of the impurity element contained in the first concentration region 105 is in the range of 1 × 10 ¹⁹ atoms / cm ^{3 to} 5 × 10 ²¹ atoms / cm ³ , and the impurity element contained in the second concentration region 106 The concentration is preferably 1 × 10 ¹⁹ atoms / cm ³ or less. As an impurity element imparting one conductivity type, an element imparting p-type such as boron (B), aluminum (Al), or gallium (Ga), or n-type such as phosphorus (P) or arsenic (As) is imparted. Elements can be used.

  The addition of the impurity element imparting one conductivity type to the semiconductor layer 104 can be performed by a doping method. As a doping method, an ion doping method or an ion implantation method can be used. For example, impurity regions having different concentrations can be formed on the surface side and the lower side of the semiconductor layer 104 by adding an impurity element with a low acceleration voltage using a doping method. In the present embodiment, the first concentration region 105 is formed on the surface side of the semiconductor layer 104, and the second concentration region 106 having a lower concentration than the first concentration region is formed on the lower side of the semiconductor layer 104. As a condition of the acceleration voltage at the time of doping with the impurity element, 1 keV or more and 50 keV or less, preferably 1 keV or more and 10 keV or less may be selected. By appropriately selecting the acceleration voltage, it is possible to control the film thickness, concentration, and the like of each of the first concentration region 105 and the second concentration region 106 formed in the semiconductor layer 104.

  Note that the impurity element imparting one conductivity type may be added to the semiconductor layer 104 before the island-shaped semiconductor layer is formed.

  Next, an insulating layer 110 (hereinafter also referred to as a first insulating layer 110) is formed over the first concentration region 105 (see FIG. 2C). The first insulating layer 110 is formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, silicon nitride oxide, or aluminum nitride by a CVD method, a sputtering method, or a coating method. The first insulating layer 110 is formed with a thickness of 20 nm to 300 nm, preferably 50 nm to 200 nm.

  Next, the first insulating layer 110 is selectively removed, so that part of the first concentration region 105 is locally exposed (see FIG. 3A). The first insulating layer 110 may be removed by a wet etching method or a dry etching method.

  Next, using the first insulating layer 110 as a mask, the exposed first concentration region 105 is selectively removed to form the semiconductor layer 130 exposing the second concentration region 106 (see FIG. 3B). ). At this time, a part of the surface of the second concentration region 106 may be removed. In the semiconductor layer 130, a region where the second concentration region 106 is exposed by removing the first concentration region 105 becomes a channel formation region 108 of the thin film transistor 140 shown in FIG. That is, a part of the second concentration region 106 forms the channel formation region 108. Note that an impurity element imparting one conductivity type for controlling the threshold voltage of the transistor may be added to the second concentration region 106 in which the channel formation region 108 is formed in a later step.

  Further, the first concentration region 105 remains so as to sandwich the channel formation region 108. In the semiconductor layer 130, the remaining first concentration region 105 and the second concentration region 106 below the first concentration region 105 form the impurity region 120 of the thin film transistor 140 shown in FIG. The impurity region 120 is a region in which a part or the whole functions as a source region or a drain region.

The removal of the first concentration region 105 is performed using a wet etching method or a dry etching method. At this time, regardless of which etching method is used, the etching process is performed for a preset time. In the case of using a dry etching method, it is preferable to use conditions so that a reaction product is not formed on the surface of the channel formation region 108. For example, dry etching may be performed using Cl ₂ gas as a dry etching gas. When dry etching is performed using CHF ₃ gas or the like, a reaction product is formed on the surface of the channel formation region 108. In this case, a clean surface is obtained by further removing the surface of the channel formation region 108. Can be formed. Hereinafter, the clean surface in the present specification refers to a surface having no contaminated layer containing a reaction product or the like, or an amorphous altered layer.

  Note that the thickness of the channel formation region 108 is 0.5 nm to 100 nm, preferably 5 nm to 50 nm.

  Next, an insulating layer 112 (hereinafter also referred to as a second insulating layer 112) is formed over the first insulating layer 110 and the channel formation region 108 (see FIG. 3C). The second insulating layer 112 is formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, silicon nitride oxide, or aluminum nitride by a CVD method or a sputtering method. The second insulating layer 112 is formed with a single layer structure or a stacked layer structure using one or more of these materials. The second insulating layer 112 is formed with a thickness of 1 nm to 50 nm, preferably 1 nm to 20 nm, more preferably 1 nm to 10 nm. In this embodiment, a silicon oxynitride layer is formed with a thickness of 5 nm as the second insulating layer 112.

  Alternatively, the second insulating layer 112 may be formed only on the channel formation region 108 by using solid phase oxidation or solid phase nitridation by plasma treatment. For example, the second insulating layer 112 can be formed by oxidizing or nitriding the channel formation region 108 by plasma treatment.

The solid-phase oxidation treatment or solid-phase nitridation treatment by plasma treatment is excited at a high frequency such as a microwave (typically 2.45 GHz) and has an electron density of 1 × 10 ¹¹ cm ⁻³ or more and 1 × 10 ¹³ cm ^−3. In the following, it is preferable to use plasma having an electron temperature of 0.5 eV to 1.5 eV. By using the above conditions, a dense insulating layer can be formed and a practical reaction rate can be obtained at a temperature of 500 ° C. or lower in solid-phase oxidation treatment or solid-phase nitridation treatment.

In the case where the surface of the channel formation region 108 is oxidized by plasma treatment, an atmosphere containing oxygen (for example, oxygen (O ₂ ), ozone (O ₃ ), nitrous oxide (N ₂ O), or nitric oxide (NO ) Or nitrogen dioxide (NO ₂ ) and a noble gas (including at least one of helium (He), neon (Ne), argon (Ar), krypton (Kr), xenon (Xe)), or An atmosphere containing oxygen (O ₂ ), ozone (O ₃ ), nitrous oxide (N ₂ O), nitrogen monoxide (NO) or nitrogen dioxide (NO ₂ ), hydrogen (H ₂ ), and a rare gas. Below). In the case where the surface of the channel formation region 108 is nitrided by plasma treatment, it contains at least one of nitrogen (N ₂ ) and a rare gas (He, Ne, Ar, Kr, Xe) under an atmosphere containing nitrogen. ), An atmosphere containing nitrogen, hydrogen, and a rare gas, or an atmosphere containing NH ₃ and a rare gas). For example, Ar is preferably used as the rare gas. A gas in which Ar and Kr are mixed may be used.

  Here, FIG. 11 shows a configuration example of a plasma processing apparatus 1080 for performing plasma processing. The plasma processing apparatus 1080 includes a support 1088, a gas supply unit 1084 for supplying gas, an exhaust port 1086 connected to a vacuum pump for exhausting gas, an antenna 1098, a dielectric plate 1082, and a plasma generating unit. A high frequency supply unit 1092 for inputting a high frequency is included. The object to be processed 1010 is held by a support base 1088. In addition, the temperature of the object to be processed 1010 can be controlled by providing the support base 1088 with the temperature controller 1090. The object to be processed 1010 is a base for plasma treatment. In this embodiment mode, the insulating layers 102 and 103 and the island-shaped semiconductor layer 104 are sequentially stacked over the substrate 100 so that the channel formation region 108 is exposed. Equivalent to.

  Hereinafter, a specific example in which an insulating layer is formed on the surface of the semiconductor layer using the plasma processing apparatus 1080 shown in FIG. 11 will be described. Note that plasma treatment includes, in its category, oxidation treatment, nitridation treatment, oxynitridation treatment, hydrogenation treatment, and surface modification treatment for a substrate, a semiconductor layer, an insulating layer, and a conductive layer. In these processes, a gas supplied from the gas supply unit 1084 may be selected according to the purpose.

  First, the processing chamber of the plasma processing apparatus 1080 shown in FIG. 11 is evacuated. Then, a gas containing a rare gas, oxygen, or nitrogen is supplied from the gas supply unit 1084. The object to be processed 1010 is heated at room temperature or in the range of 100 ° C. to 550 ° C. by the temperature control unit 1090. An interval between the object to be processed 1010 and the dielectric plate 1082 (hereinafter also referred to as an electrode interval) is about 20 mm to 200 mm (preferably 20 nm to 60 mm).

  Next, a high frequency is input from the high frequency supply unit 1092 to the antenna 1098. Here, a microwave (frequency: 2.45 GHz) is input as a high frequency. Then, a microwave is input from the antenna 1098 through the dielectric plate 1082 into the processing chamber, thereby generating plasma 1094. The plasma 1094 generates oxygen radicals (which may include OH radicals) or nitrogen radicals (when NH radicals are included). Is also generated. At this time, the plasma 1094 is generated by the supplied gas.

When the plasma 1094 is generated by inputting microwaves, plasma with a low electron temperature (3 eV or less, preferably 1.5 eV or less) and a high electron density (1 × 10 ¹¹ cm ⁻³ or more) can be generated. Specifically, it is preferable to generate plasma having an electron temperature of 0.5 eV to 1.5 eV and an electron density of 1 × 10 ¹¹ cm ^{−3 to} 1 × 10 ¹³ cm. Note that in this specification, plasma having a low electron temperature and a high electron density generated by input of microwaves is also referred to as high-density plasma. In addition, performing plasma processing using high-density plasma is also referred to as high-density plasma processing.

  The surface of the semiconductor layer formed on the object to be processed 1010 is oxidized or nitrided by oxygen radicals (which may include OH radicals) or nitrogen radicals (which may also include NH radicals) generated by the plasma 1094 to be insulated. A layer is formed. At this time, when a rare gas such as argon is mixed with the supplied gas, oxygen radicals or nitrogen radicals can be efficiently generated by the excited species of the rare gas. Note that. In the case where a rare gas is used as the supply gas, the formed insulating layer may contain a rare gas. In this method, active radicals excited by plasma can be effectively used to perform oxidation and nitridation by solid phase reaction at a low temperature of 500 ° C. or lower.

  An example of a suitable second insulating layer 112 formed by high-density plasma treatment using the apparatus shown in FIG. 11 is 0.5 nm or more on one surface of the channel formation region 108 by plasma treatment under an atmosphere containing oxygen. A silicon oxide layer is formed with a thickness of 20 nm or less, and then a nitrogen plasma treatment layer is formed by treating the surface of the silicon oxide layer with nitriding plasma in an atmosphere containing nitrogen. Specifically, first, a silicon oxide layer is formed with a thickness of 0.5 nm to 20 nm on one surface of the channel formation region 108 by plasma treatment in an atmosphere containing oxygen. Subsequently, a plasma treatment is performed in an atmosphere containing nitrogen to provide a nitrogen plasma treatment layer having a high nitrogen concentration on or near the surface of the silicon oxide layer. Note that the vicinity of the surface means a depth in a range of approximately 0.5 nm to 1.5 nm from the surface of the silicon oxide layer. For example, by performing plasma treatment in an atmosphere containing nitrogen, a structure in which nitrogen is contained at a ratio of 20 atomic% to 50 atomic% in a depth of approximately 1 nm in the vertical direction from the surface of the silicon oxide layer is obtained. In addition, the surface of the insulating layer 110 can be oxidized or nitrided by high-density plasma treatment.

  For example, by forming the channel formation region 108 and oxidizing the surface of the channel formation region by plasma treatment, a dense oxide layer without distortion at the interface can be formed. Further, the oxide layer can be further densified by nitriding the oxide layer by plasma treatment to form a nitride layer by replacing oxygen in the surface layer portion with nitrogen. Thereby, an insulating layer having a high withstand voltage can be formed.

  By using the solid phase oxidation treatment or solid phase nitridation treatment by the plasma treatment as described above, a thermal oxide film formed in the range of 950 ° C. to 1050 ° C., even if a glass substrate having a heat resistant temperature of 700 ° C. or less is used. An equivalent insulating layer can be obtained. That is, a highly reliable insulating layer that functions as a gate insulating layer of a semiconductor element, particularly, a thin film transistor or a nonvolatile memory element can be formed.

  Next, the conductive layer 114 is formed so as to overlap with part of the channel formation region 108 and the impurity region 120 with the second insulating layer 112 interposed therebetween (see FIG. 4). The conductive layer 114 is formed using a metal element such as tantalum (Ta), tungsten (W), titanium (Ti), molybdenum (Mo), chromium (Cr), aluminum (Al), copper (Cu), or niobium (Nb), Alternatively, an alloy material or a compound material containing the metal element can be used. Alternatively, a semiconductor material typified by polycrystalline silicon to which an impurity element imparting one conductivity type such as phosphorus is added can be used. The conductive layer 114 can be processed into a desired shape by selective etching after being formed over the entire surface using these materials by a CVD method or a sputtering method. Further, the conductive layer 114 may have a single-layer structure or a stacked structure. The conductive layer 114 is formed with a thickness of 10 nm to 1000 nm, preferably a thickness of 100 nm to 800 nm, more preferably 200 nm to 500 nm.

  Note that it is preferable to activate the impurity element by performing heat treatment after the conductive layer 114 is formed. The heat treatment can be performed using laser beam irradiation, an RTA, or a furnace annealing furnace. Specifically, the heat treatment is performed in a temperature range of 400 ° C. to 700 ° C., preferably 500 ° C. to 550 ° C. The heat treatment is preferably performed in a nitrogen atmosphere. For example, activation can be performed by heating at 550 ° C. for 4 hours. Further, the heat treatment may be performed after the impurity element is added or may be performed in any step before the formation of the conductive layer 114.

  Through the above, a thin film transistor 140 to which the present invention is applied can be formed. Note that the structure of the thin film transistor (TFT) described in this embodiment mode is just an example, and the present invention is not limited to the illustrated structure. For example, a multi-gate structure having a semiconductor layer including at least two or more channel formation regions connected in series and at least two or more gate electrode layers that apply an electric field to each channel formation region is used. Also good.

  Further, although an example in which a single conductive layer is formed as a gate electrode is described in this embodiment mode, the present invention is not particularly limited. The side surface of the gate electrode may be tapered, or the gate electrode may have a stacked structure of two or more conductive layers.

  Hereinafter, it is shown by logical calculation that the on-characteristic of the thin film transistor is improved by making the semiconductor device have a structure based on this embodiment mode. For the calculation, TCAD software Sentaurus manufactured by synopsys was used. 12A, 12B, and 12C are cross-sectional views illustrating the structure of the thin film transistor used in the theoretical calculation. The cross-sectional view corresponds to FIG.

  FIG. 12A illustrates a semiconductor device based on this embodiment, in which a thin film transistor 1200 is formed over a substrate 1201. The thin film transistor 1200 includes a channel formation region 1202, an impurity region 1208 positioned so as to sandwich the channel formation region 1202, an insulating layer 1204 in contact with the impurity region 1208, and an insulating layer in contact with the channel formation region 1202 and the insulating layer 1204. 1205 and a conductive layer 1206 positioned over the channel formation region 1202 with the insulating layer 1205 interposed therebetween. Note that the conductive layer 1206 is also located over the impurity region 1208 with the insulating layer 1204 and the insulating layer 1205 provided therebetween. Further, the impurity region 1208 has regions with different impurity concentrations. Specifically, it has a first concentration region 1203 formed on the surface side of the impurity region 1208 and a second concentration region 1207 formed on the lower side of the impurity region 1208. Since the first concentration region 1203 and the second concentration region 1207 are not uniform in density and it is difficult to distinguish a clear boundary, the boundary between the first concentration region 1203 and the second concentration region 1207 is indicated by a dotted line for convenience. . The channel formation region 1202 is 5 nm thick, the impurity region 1208 is 100 nm thick, and the channel formation region 1202 is thinner than the impurity region 1208. The impurity region 1208 is added with phosphorus as an impurity element at an acceleration voltage of 10 kV and has a concentration distribution in the depth direction. The insulating layer 1204 has a thickness of 10 nm, and the insulating layer 1205 has a thickness of 5 nm. The insulating layer 1205 functions as a gate insulating layer of the thin film transistor 1200. A conductive layer 1206 is provided over the channel formation region 1202 with an insulating layer 1205 interposed therebetween. The conductive layer 1206 partially overlaps with the impurity region 1208, and the overlapping width D2 of the conductive layer 1206 and the impurity region 1208 is 0.5 μm. The width D1 of the channel formation region 1202 corresponds to the gate length of the thin film transistor 1200. Hereinafter, the thin film transistor 1200 illustrated in FIG.

  In the semiconductor device illustrated in FIG. 12B, a thin film transistor 1210 is formed over a substrate 1211. The thin film transistor 1210 includes a channel formation region 1212, an impurity region 1213 located so as to sandwich the channel formation region 1212, an insulating layer 1214 in contact with the impurity region 1213, and an insulating layer in contact with the channel formation region 1212 and the insulating layer 1214. 1215 and a conductive layer 1216 positioned over the channel formation region 1212 with the insulating layer 1215 interposed therebetween. Note that the conductive layer 1216 is also located over the impurity region 1213 with the insulating layer 1214 and the insulating layer 1215 interposed therebetween. The channel formation region 1212 has a thickness of 10 nm, the impurity region 1213 has a thickness of 10 nm, and the channel formation region 1212 and the impurity region 1213 have substantially the same film thickness and are both as thin as about 10 nm. The insulating layer 1214 has a thickness of 10 nm, and the insulating layer 1215 has a thickness of 5 nm. The insulating layer 1215 functions as a gate insulating layer of the thin film transistor 1210. A conductive layer 1216 is provided over the channel formation region 1212 with an insulating layer 1215 interposed therebetween. The conductive layer 1216 partially overlaps with the impurity region 1213, and the overlapping width D2 of the conductive layer 1216 and the impurity region 1213 is 0.5 μm. The width D1 of the channel formation region 1212 corresponds to the gate length of the thin film transistor 1210. Hereinafter, the thin film transistor 1210 illustrated in FIG.

  In the semiconductor device illustrated in FIG. 12C, a thin film transistor 1220 is formed over a substrate 1221. The thin film transistor 1220 includes a channel formation region 1222, an impurity region 1228 located so as to sandwich the channel formation region 1222, an insulating layer 1224 in contact with the impurity region 1228, and an insulating layer in contact with the channel formation region 1222 and the insulating layer 1224. 1225 and a conductive layer 1226 located over the channel formation region 1222 with the insulating layer 1225 interposed therebetween. Note that the conductive layer 1226 is also located over the impurity region 1228 with the insulating layer 1224 and the insulating layer 1225 interposed therebetween. Further, the impurity region 1228 includes regions having different impurity concentrations. Specifically, it has a first concentration region 1223 formed on the surface side of impurity region 1228 and a second concentration region 1227 formed on the lower side of impurity region 1228. Since the first concentration region 1223 and the second concentration region 1227 are not uniform in concentration and it is difficult to distinguish a clear boundary, for convenience, the boundary between the first concentration region 1223 and the second concentration region 1227 is a dotted line. Show. The channel formation region 1222 has a thickness of 100 nm, the impurity region 1228 has a thickness of 100 nm, and the channel formation region 1222 and the impurity region 1228 have substantially the same thickness, both of which are as thick as about 100 nm. The impurity region 1228 is doped with phosphorus as an impurity element at an acceleration voltage of 10 kV and has a concentration distribution in the depth direction. The insulating layer 1224 has a thickness of 10 nm, and the insulating layer 1225 has a thickness of 5 nm. The insulating layer 1225 functions as a gate insulating layer of the thin film transistor 1220. A conductive layer 1226 is provided over the channel formation region 1222 with an insulating layer 1225 interposed therebetween. The conductive layer 1226 partially overlaps with the impurity region 1228, and the overlapping width D2 of the conductive layer 1226 and the impurity region 1228 is 0.5 μm. The width D1 of the channel formation region 1222 corresponds to the gate length of the thin film transistor 1220. Hereinafter, the thin film transistor 1220 illustrated in FIG.

  FIG. 13A shows subthreshold values obtained from drain current-gate voltage characteristics when the drain voltage is 1 V in the thin film transistors having the structures A to C shown in FIGS. 12A to 12C. . In the graph shown in FIG. 13A, the horizontal axis indicates the channel length (width of D1) (μm), and the vertical axis indicates the subthreshold value (mV / dec).

  FIG. 13B shows drain current values when the drain voltage is 1 V and the gate voltage is 3 V in the thin film transistors having the structures A to C shown in FIGS. In the graph shown in FIG. 13B, the horizontal axis indicates the channel length (width of D1) (μm), and the vertical axis indicates the drain current value (A).

  From the graphs of FIGS. 13A and 13B, it can be seen that the structure A has a larger on-state current value (indicating a drain current when the transistor is on) than the structure B. Further, it can be seen that the structure A has a smaller subthreshold value than the structure C. It can be seen that the subthreshold values of the structures A and B are as small as the same, and the on-current values of the structures A and C are as large as the same. From the above results, as shown in this embodiment mode, by reducing the thickness of the channel formation region compared to the impurity region and reducing the thickness of the channel formation region to about 0.5 nm to 50 nm, It can be seen that a thin film transistor having a small subthreshold value and a large on-current value (drain current value) can be manufactured.

  As described above, the thin film transistor manufactured by applying the present invention can have a small subthreshold value and can suppress a decrease in on-state current. Accordingly, low voltage operation and low power consumption of the semiconductor device can be achieved.

  Note that this embodiment can be combined with any of the other embodiments described in this specification as appropriate.

(Embodiment 2)
In this embodiment, an example of manufacturing a semiconductor device by a manufacturing method different from that in Embodiment 1 will be described with reference to FIGS.

  FIG. 5 is a top view and a cross-sectional view for explaining the main configuration of the semiconductor device according to the present invention. 5A and 5B particularly illustrate a structure of a thin film transistor. FIG. 5A is a top view, FIG. 5B is a cross-sectional view taken along a dashed line OP in FIG. 5A, and FIG. Sectional drawing between the wavy lines Q-R in (A) is shown. In FIG. 5A, some thin films and the like are omitted.

  A thin film transistor 540 illustrated in FIG. 5 is provided over a substrate 500 having an insulating surface. The thin film transistor 540 includes a semiconductor layer 530 in which a channel formation region 508, an impurity region 520, and a metal silicide region 507 are formed, an insulating layer 510 provided in a part of the impurity region 520 of the semiconductor layer 530, and the semiconductor layer 530. An insulating layer 512 provided over the channel formation region 508 and the insulating layer 510 and a conductive layer 514 that overlaps the channel formation region 508 and the impurity region 520 with the insulating layer 512 interposed therebetween.

  As the substrate 500, an SOI substrate, a glass substrate, a quartz substrate, a sapphire substrate, a ceramic substrate, a metal substrate with an insulating layer formed on the surface, or the like can be used.

  A semiconductor layer 530 is formed over the substrate 500. An insulating layer 502 and an insulating layer 503 that function as a base insulating layer may be provided between the substrate 500 and the semiconductor layer 530. The base insulating layer prevents impurities such as alkali metal from diffusing from the substrate 500 to the semiconductor layer 530 to be contaminated, and may be appropriately provided as a blocking layer. In the case where the surface of the substrate 500 is uneven, the base insulating layer can be provided as a planarizing layer.

  The insulating layers 502 and 503 are formed using silicon oxide (SiOx), silicon nitride (SiNx), silicon oxynitride (SiOxNy), silicon nitride oxide (SiNxOy), or the like. In this embodiment mode, the base insulating layer is a stacked layer of insulating layers 502 and 503, but a single layer structure or a stacked structure of three or more layers may be used. For example, in the case of using a two-layer structure as in this embodiment, a silicon nitride oxide film can be formed as the first layer and a silicon oxynitride layer can be formed as the second layer. Alternatively, a silicon nitride layer may be formed as the first layer and a silicon oxide layer may be formed as the second layer.

  The semiconductor layer 530 is formed in an island shape. The semiconductor layer 530 is preferably formed using a single crystal semiconductor or a polycrystalline semiconductor, and can be formed using various semiconductor materials such as silicon, germanium, and silicon germanium. When an SOI substrate is applied, the semiconductor layer on the buried insulating layer can be applied as it is.

  The semiconductor layer 530 includes a channel formation region 508 and a pair of impurity regions 520. Part or all of the impurity region 520 functions as a source region or a drain region. An impurity element imparting one conductivity type is added to the impurity region 520. Further, part of the impurity region 520 has a metal silicide region 507. Further, an impurity element imparting one conductivity type for controlling the threshold voltage of the transistor may be added to the channel formation region 508. The channel formation region 508 is formed in a region overlapping with the conductive layer 514 with only the insulating layer 512 interposed therebetween, and is located between the pair of impurity regions 520.

  The channel formation region 508 is thinner than the impurity region 520. The channel formation region 508 may be formed to have a thickness of 0.5 nm to 100 nm, preferably 5 nm to 50 nm. By thinning the channel formation region 508, leakage current between the source region and the drain region in the subthreshold region of the thin film transistor can be suppressed.

  Impurity region 520 has regions with different impurity concentrations. Specifically, the first concentration region 505 formed on the surface side of the impurity region 520 and the second concentration region 506 formed on the lower side of the impurity region 520 are provided. The impurity region 520 has a higher impurity concentration than the second concentration region 506 in which the first concentration region 505 formed on the surface side is formed on the lower side. Note that the first concentration region 505 and the second concentration region 506 are indicated by dotted lines because the concentration is not uniform and a clear boundary is difficult to be formed. Further, the impurity region 520 has a metal silicide region 507 in part.

  Further, a low concentration impurity region functioning as an LDD (Lightly Doped Drain) region may be formed in the semiconductor layer 530. The low concentration impurity region can be formed between the channel formation region and the impurity region functioning as a source region or a drain region. The low concentration impurity region has a lower impurity concentration than the peak concentration of the impurity region 520 functioning as a source region or a drain region.

  An insulating layer 510 is formed in contact with part of the impurity region 520. The thickness of the insulating layer 510 is 5 nm to 300 nm, preferably 10 nm to 200 nm. By increasing the thickness of the insulating layer 510, the capacitance formed by the impurity region 520 and the conductive layer 514 can be reduced. In addition, when the insulating layer 510 has a thickness of 10 nm or more, the impurity region 520 can be prevented from being lost due to overetching when the conductive layer 514 is processed by dry etching.

  Note that the insulating layer 510 is formed in contact with the first concentration region 505 of the impurity region 520. In the impurity region 520, a metal silicide region 507 is formed on the surface of a region where the insulating layer 510 is not formed in contact.

  An insulating layer 512 is formed over the channel formation region 508 and the insulating layer 510. The insulating layer 512 functions as a gate insulating layer of the thin film transistor 540. The insulating layer 512 functioning as a gate insulating layer is preferably formed with a uniform thickness in order to prevent a short circuit between the conductive layer 514 and the semiconductor layer 530, generation of leakage current, and electrostatic breakdown.

  Next, a method for manufacturing the thin film transistor illustrated in FIG. 5 is specifically described with reference to FIGS.

  An island-shaped semiconductor layer is formed over the substrate 500 with insulating layers 502 and 503 interposed therebetween. An impurity element imparting one conductivity type is added to the semiconductor layer to form a first concentration region 505 on the surface side of the semiconductor layer and a second concentration region 506 on the lower side of the semiconductor layer. The first concentration region 505 has a higher impurity concentration than the second concentration region 506. Next, after an insulating layer 510 is formed so as to cover the island-shaped semiconductor layer, the insulating layer 510 is selectively removed to expose a part of the first concentration region 505 formed in the semiconductor layer. Next, the exposed first concentration region 505 is selectively removed using the insulating layer 510 as a mask to form a semiconductor layer 530 in which the second concentration region 506 is exposed. In the semiconductor layer 530, a region where the second concentration region 506 is exposed becomes a channel formation region 508, and the remaining first concentration region 505 and the second concentration region 506 below the first concentration region 505 form an impurity region 520. Next, after an insulating layer 512 is formed over the channel formation region 508 and the insulating layer 510, a conductive layer 514 is formed so as to overlap with part of the channel formation region 508 and the impurity region 520 with the insulating layer 512 interposed therebetween ( (See FIG. 6A). Up to the manufacturing process of the conductive layer 514, the substrate 100, the insulating layers 102 and 103, the semiconductor layer 130, the first concentration region 105, the second concentration region 106, the insulating layer 110, the channel formation region 108, and the impurity which are described in Embodiment Mode 1 The description is omitted because it is similar to the region 120, the insulating layer 112, and the conductive layer 114.

  After the conductive layer 514 having a desired shape is formed, the insulating layer 510 and the insulating layer 512 are selectively removed using the conductive layer 514 as a mask to expose part of the impurity region 520 (see FIG. 6B). . The insulating layer 510 and the insulating layer 512 may be removed by a wet etching method or a dry etching method. Note that the insulating layer 510 remains in a region where the conductive layer 514 and the impurity region 520 overlap with each other.

  Next, a metal film is formed at least on the exposed surface of the impurity region 520. At this time, if a natural oxide film is formed on the exposed surface of the impurity region 520, the metal film is formed after removing the natural oxide film. The metal film uses a material that forms silicide by reacting with the semiconductor layer. As the metal film, for example, a nickel film, a titanium film, a cobalt film, a platinum film, or a film made of an alloy containing at least two of these elements can be used. In this embodiment mode, a nickel film is used as the metal film, and the nickel film is formed by sputtering at a room temperature in the range of a film formation power of 500 W to 1 kW.

  After the metal film is formed, a metal silicide region 507 is formed by heat treatment. Metal silicide region 507 is formed in part of impurity region 520. The metal silicide region 507 is formed in the impurity region 520 in a region that does not overlap with the conductive layer 514 with the insulating layer 510 and the insulating layer 512 interposed therebetween. Depending on the formation conditions of the metal silicide region 507, a part of the metal silicide region 507 may overlap the conductive layer 514 through the insulating layer 510 and the insulating layer 512. It will not be. In the present embodiment, the metal silicide region 507 is formed of nickel silicide. Note that RTA, furnace annealing, or the like can be used for the heat treatment.

After the formation of the metal silicide region 507, the unreacted metal film is removed. For example, when a nickel film is formed as a metal film, an unreacted solution is used using an etching solution in which hydrochloric acid (HCl): nitric acid (HNO ₃ ): pure water (H ₂ O) is mixed at a ratio of 3: 2: 1. Nickel can be removed. When the unreacted metal film is removed, in the impurity region 520, the metal silicide region 507 is formed only in the exposed and exposed region (see FIG. 6C).

  Note that it is preferable to activate the impurity element added to the impurity region 520 or the channel formation region 508 by performing heat treatment after the metal silicide region 507 is formed. The heat treatment can be performed using laser beam irradiation, an RTA, or a furnace annealing furnace. Specifically, the heat treatment is performed in a temperature range of 400 ° C. to 700 ° C., preferably 500 ° C. to 550 ° C. The heat treatment is preferably performed in a nitrogen atmosphere. For example, activation can be performed by heating at 550 ° C. for 4 hours. Further, the heat treatment may be performed after the impurity element is added or may be performed in any step before the formation of the conductive layer 514.

  Through the above, a thin film transistor 540 to which the present invention is applied can be formed. Note that the TFT structure described in this embodiment mode is an example, and the present invention is not limited to the illustrated structure. For example, a multi-gate structure having a semiconductor layer including at least two or more channel formation regions connected in series and at least two or more gate electrode layers that apply an electric field to each channel formation region is used. Also good.

  Further, although an example in which a single conductive layer is formed as a gate electrode is described in this embodiment mode, the present invention is not particularly limited. The side surface of the gate electrode may be tapered, or the gate electrode may have a stacked structure of two or more conductive layers.

  As described above, the thin film transistor manufactured by applying the present invention can have a small subthreshold value. Further, by forming a metal silicide layer in part of the source region and the drain region, a decrease in on-current can be further suppressed. Accordingly, low voltage operation and low power consumption of the semiconductor device can be achieved.

  Note that this embodiment can be combined with any of the other embodiments described in this specification as appropriate.

(Embodiment 3)
In this embodiment, an example in which a semiconductor device is manufactured by a manufacturing method different from that in Embodiments 1 and 2 is described with reference to FIGS.

  7A and 7B are a top view and a cross-sectional view for explaining the main configuration of the semiconductor device according to the present invention. 7A and 7B particularly illustrate a structure of a thin film transistor. FIG. 7A is a top view, FIG. 7B is a cross-sectional view taken along a dashed line OP in FIG. 7A, and FIG. Sectional drawing between the wavy lines Q-R in (A) is shown. Note that FIG. 7A partially omits a thin film or the like.

  A thin film transistor 740 illustrated in FIG. 7 is provided over a substrate 700 having an insulating surface. The thin film transistor 740 includes a semiconductor layer 730 in which a channel formation region 708, a low concentration impurity region 718, and a high concentration impurity region 716 are formed, an insulating layer 710 provided over the low concentration impurity region 718 of the semiconductor layer 730, and a semiconductor layer 730 includes a channel formation region 708, an insulating layer 712 provided over the insulating layer 710, and a conductive layer 714 that overlaps the channel formation region 708 and the low-concentration impurity region 718 with the insulating layer 712 interposed therebetween.

  As the substrate 700, an SOI substrate, a glass substrate, a quartz substrate, a sapphire substrate, a ceramic substrate, a metal substrate with an insulating layer formed on the surface, or the like can be used.

  A semiconductor layer 730 is formed over the substrate 700. An insulating layer 702 and an insulating layer 703 that function as a base insulating layer may be provided between the substrate 700 and the semiconductor layer 730. The base insulating layer prevents impurities such as alkali metal from diffusing from the substrate 700 to the semiconductor layer 730 to be contaminated, and may be provided as appropriate as a blocking layer. In the case where the surface of the substrate 700 is uneven, the base insulating layer can function as a planarization layer.

  The insulating layers 702 and 703 are formed using silicon oxide (SiOx), silicon nitride (SiNx), silicon oxynitride (SiOxNy), silicon nitride oxide (SiNxOy), or the like. In this embodiment mode, the base insulating layer is a stacked layer of insulating layers 702 and 703, but a single layer structure or a stacked structure of three or more layers may be used as a matter of course. For example, in the case of using a two-layer structure as in this embodiment, a silicon nitride oxide film can be formed as the first layer and a silicon oxynitride layer can be formed as the second layer. Alternatively, a silicon nitride layer may be formed as the first layer and a silicon oxide layer may be formed as the second layer.

  The semiconductor layer 730 is formed in an island shape. The semiconductor layer 730 is preferably formed using a single crystal semiconductor or a polycrystalline semiconductor, and can be formed using various semiconductor materials such as silicon, germanium, and silicon germanium. When an SOI substrate is applied, the semiconductor layer on the buried insulating layer can be applied as it is.

  The semiconductor layer 730 includes a channel formation region 708, a low concentration impurity region 718, and a high concentration impurity region 716. A part or all of the low concentration impurity region 718 functions as an LDD (Lightly Doped Drain) region. Part or all of the high concentration impurity region 716 functions as a source region or a drain region. The channel formation region 708 is located between the pair of high concentration impurity regions 716. The low concentration impurity region 718 is located between the channel formation region 708 and the high concentration impurity region 716. An impurity element imparting one conductivity type is added to the low-concentration impurity region 718 and the high-concentration impurity region 716, and the low-concentration impurity region 718 is formed to have a lower impurity element concentration than the high-concentration impurity region 716. Is done. Further, an impurity element imparting one conductivity type for controlling the threshold voltage of the transistor may be added to the channel formation region 708. The channel formation region 708 is formed in a region overlapping with the conductive layer 714 through only the insulating layer 712 and is located between the high concentration impurity regions 716.

  The channel formation region 708 is thinner than the high concentration impurity region 716. The thickness of the channel formation region 708 is 0.5 nm to 100 nm, preferably 5 nm to 50 nm. By thinning the channel formation region 708, leakage current between the source region and the drain region in the subthreshold region of the thin film transistor can be suppressed.

  The low concentration impurity region 718 has regions with different impurity concentrations. Specifically, a first concentration region 707 formed on the surface side of the low concentration impurity region 718 and a second concentration region 706 formed on the lower side of the low concentration impurity region 718 are provided. The first concentration region 707 has a higher impurity concentration than the second concentration region 706. Note that the first concentration region 707 and the second concentration region 706 are not uniform in concentration, and it is difficult to form a clear boundary. Here, the boundary between the first concentration region 707 and the second concentration region 706 is indicated by a dotted line.

  An insulating layer 710 is formed in contact with the low concentration impurity region 718. The thickness of the insulating layer 710 is 5 nm to 300 nm, preferably 10 nm to 200 nm. By increasing the thickness of the insulating layer 710, the capacitance formed by the low-concentration impurity regions 718 and the conductive layer 714 with the insulating layer 710 interposed therebetween can be reduced. In addition, when the insulating layer 710 has a thickness of 10 nm or more, disappearance of the low-concentration impurity region 718 due to overetching can be prevented when the conductive layer 714 is processed by dry etching.

  An insulating layer 712 is formed in contact with the channel formation region 708 and the insulating layer 710. The insulating layer 712 functions as a gate insulating layer of the thin film transistor 740. The gate insulating layer 712 is preferably formed uniformly in order to prevent a short circuit between the conductive layer 714 and the semiconductor layer 730, generation of leakage current, electrostatic breakdown, and the like.

  Next, a method for manufacturing the thin film transistor illustrated in FIG. 7 is specifically described with reference to FIGS.

  First, the semiconductor layer 704 is formed over the substrate 700 with insulating layers 702 and 703 functioning as base insulating layers (see FIG. 8A).

  As the substrate 700, a substrate having an insulating surface such as a glass substrate or a quartz substrate is used. The insulating layers 702 and 703 are formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, or silicon nitride oxide by a CVD method or a sputtering method. The insulating layers 702 and 703 function as blocking layers that prevent alkali metal or the like from diffusing from the substrate 700 to the semiconductor layer 704 and contaminating the semiconductor layer 704. In the case where the surface of the substrate 700 is uneven, the substrate 700 can function as a planarization layer. Note that the insulating layers 702 and 703 are not necessarily formed if impurity diffusion from the substrate 700 or unevenness on the surface of the substrate 700 is not a problem. Although the base insulating layer has a two-layer structure here, it may have a single-layer structure or a three-layer structure or more.

  The semiconductor layer 704 is preferably formed using a material containing silicon as its main component by a CVD method or a sputtering method. Specifically, it can be formed using silicon, silicon germanium, or the like. Alternatively, germanium may be used. For example, the semiconductor layer 704 is an island-shaped semiconductor layer in which an amorphous semiconductor layer is formed using a material containing silicon as a main component, and the amorphous semiconductor layer is crystallized and then selectively etched. Can be formed. When crystallizing an amorphous semiconductor layer, a laser crystallization method, a thermal crystallization method using an RTA or furnace annealing furnace, a thermal crystallization method using a metal element that promotes crystallization, or a combination of these methods Etc. The semiconductor layer 704 is formed with a thickness of 10 nm to 150 nm, preferably 30 nm to 100 nm. Note that the semiconductor layer may be formed thick in advance and then thinned by etching the thick semiconductor layer.

Next, an impurity element imparting one conductivity type is added to the semiconductor layer 704 to form a first concentration region 707 and a second concentration region 706 (see FIG. 8B). The concentration of the impurity element contained in the first concentration region 707 is in the range of 1 × 10 ¹⁶ atoms / cm ^{3 to} 1 × 10 ²⁰ atoms / cm ³ . The second concentration region 706 has a lower impurity concentration than the first concentration region 707, and preferably has a concentration close to that of an intrinsic semiconductor having a very low impurity concentration. As an impurity element imparting one conductivity type, an element imparting p-type such as boron (B), aluminum (Al), or gallium (Ga), or n-type such as phosphorus (P) or arsenic (As) is imparted. Elements can be used.

  The impurity element can be added to the semiconductor layer 704 by a doping method. As a doping method, an ion doping method or an ion implantation method can be used. By adding an impurity element with a low acceleration voltage using a doping method, the first concentration region 707 can be formed on the surface side of the semiconductor layer 704. As an acceleration voltage condition for doping, 1 keV or more and 50 ekV or less, preferably 1 keV or more and 10 keV or less may be selected.

  Note that the impurity element imparting one conductivity type to the semiconductor layer 704 may be added before the island-shaped semiconductor layer is formed.

  Next, an insulating layer 710 (hereinafter also referred to as a first insulating layer 710) is formed over the first concentration region 707 (see FIG. 8C). The first insulating layer 710 is formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, silicon nitride oxide, or aluminum nitride by a CVD method, a sputtering method, or a coating method. The first insulating layer 710 is formed with a thickness of 5 nm to 300 nm, preferably 10 nm to 200 nm.

  Next, the first insulating layer 710 is selectively removed to expose part of the first concentration region 707 (see FIG. 9A). The first insulating layer 710 may be removed by a wet etching method or a dry etching method.

  Next, using the first insulating layer 710 as a mask, the exposed first concentration region 707 is selectively removed to form a semiconductor layer 730 in which the second concentration region 706 is exposed. (See FIG. 9B). At that time, a part of the surface of the second concentration region 706 may be removed. In the semiconductor layer 730, the region where the second concentration region 706 is exposed by the removal of the first concentration region 707 becomes a channel formation region 708 of the thin film transistor 740 shown in FIG. The first concentration region 707 remains so as to sandwich the channel formation region 708.

The first concentration region 707 is removed by performing an etching process for a predetermined time using a wet etching method or a dry etching method. In the case of using a dry etching method, it is preferable to use conditions so that a reaction product is not formed on the surface of the channel formation region 708. For example, dry etching may be performed using Cl ₂ gas as a dry etching gas. When dry etching is performed using CHF ₃ gas or the like, a reaction product is formed on the surface of the channel formation region 708. In this case, by removing the surface of the channel formation region 708, a clean surface is formed. Can be formed.

  Note that the thickness of the channel formation region 708 is 0.5 nm to 100 nm, preferably 5 nm to 50 nm.

  Next, an insulating layer 712 (hereinafter also referred to as a second insulating layer 712) is formed over the first insulating layer 710 and the channel formation region 708 (see FIG. 8C). The second insulating layer 712 is formed using a material such as silicon oxide, silicon nitride, silicon oxynitride, silicon nitride oxide, or aluminum nitride by a CVD method or a sputtering method. The second insulating layer 712 is formed with a single-layer structure or a stacked structure using one or more of these materials. The second insulating layer 712 is formed with a thickness of 1 nm to 50 nm, preferably 1 nm to 20 nm, more preferably 1 nm to 10 nm. In this embodiment, a silicon oxynitride layer is formed with a thickness of 5 nm as the second insulating layer 712.

  Alternatively, the second insulating layer 712 may be formed only on the channel formation region 708 by using solid phase oxidation or solid phase nitridation by plasma treatment. For example, the channel formation region 708 can be oxidized or nitrided by plasma treatment to form the second insulating layer 712.

  Next, a conductive layer 714 is formed so as to overlap with part of the channel formation region 708 and the first concentration region 707 with the second insulating layer 712 interposed therebetween (see FIG. 10A). The conductive layer 714 includes a metal element such as tantalum (Ta), tungsten (W), titanium (Ti), molybdenum (Mo), chromium (Cr), aluminum (Al), copper (Cu), or niobium (Nb), Alternatively, an alloy material or a compound material containing the metal element can be used. Alternatively, a semiconductor material typified by polycrystalline silicon to which an impurity element imparting one conductivity type such as phosphorus is added can be used. The conductive layer 714 can be processed into a desired shape by selective etching after being formed over the entire surface using these materials by a CVD method or a sputtering method. Further, the conductive layer 714 may have a single-layer structure or a stacked structure. The conductive layer 714 is formed with a thickness of 10 nm to 1000 nm, preferably 100 nm to 800 nm, more preferably 200 nm to 500 nm.

Next, using the conductive layer 714 as a mask, the first insulating layer 710 and the second insulating layer 712 are selectively removed to expose part of the first concentration region 707 and the second concentration region 706 (FIG. 10 (B)). The etching of the first insulating layer 710 and the second insulating layer 712 may be removed by a wet etching method or a dry etching method. Note that the insulating layer 710 remains in a region where the conductive layer 714 and the first concentration region 707 overlap.

Next, using the conductive layer 714 as a mask, an impurity element imparting the same conductivity type as the first concentration region 707 is selectively added to the semiconductor layer 730 to form a high concentration impurity region 716 (FIG. 10). (See (C)). Specifically, the high-concentration impurity region 716 is formed in a region that does not overlap with the conductive layer 714 in the first concentration region 707 remaining so as to sandwich the channel formation region 708 and the second concentration region 706 therebelow. The concentration of the impurity element contained in the high-concentration impurity region 716 is in the range of 1 × 10 ¹⁹ atoms / cm ^{3 to} 5 × 10 ²¹ atoms / cm ³ . As an impurity element imparting one conductivity type, an element imparting p-type such as boron (B), aluminum (Al), or gallium (Ga), or n-type such as phosphorus (P) or arsenic (As) is imparted. Elements can be used. The addition of the impurity element can be performed by a doping method. As a doping method, an ion doping method or an ion implantation method can be used.

  Further, the first concentration region 707 and the second concentration region 706 remaining in the region overlapping with the conductive layer 714 with the insulating layer 710 and the insulating layer 712 form a low concentration impurity region 718. The low concentration impurity region 718 is formed so as to be sandwiched between the channel formation region 708 and the high concentration impurity region 716.

  Note that the impurity element for forming the high-concentration impurity region 716 may be added without removing the first insulating layer 710 and the second insulating layer 712.

  In addition, it is preferable to activate the impurity element by performing heat treatment after the impurity element is added. The heat treatment can be performed using laser beam irradiation, an RTA, or a furnace annealing furnace. Specifically, the heat treatment is performed in a temperature range of 400 ° C. to 700 ° C., preferably 500 ° C. to 550 ° C. The heat treatment is preferably performed in a nitrogen atmosphere. For example, activation can be performed by heating at 550 ° C. for 4 hours.

  As described above, the thin film transistor manufactured by applying the present invention can have a small subthreshold value and can suppress a decrease in on-state current. In addition, since the drain electric field strength can be suppressed by forming the LDD region, the reliability can be improved. Accordingly, low voltage operation and low power consumption of the semiconductor device can be achieved.

  Note that this embodiment can be combined with any of the other embodiments described in this specification as appropriate.

(Embodiment 4)
The semiconductor device according to the present invention can be applied to an integrated circuit such as a CPU (Central Processing Unit). In this embodiment, an example of a CPU to which the semiconductor device described in any of Embodiments 1 to 3 is applied is described below with reference to drawings.

  19 includes an arithmetic circuit (ALU) 3601, an arithmetic circuit control circuit unit (ALU Controller) 3602, an instruction analysis unit 3603, and an interrupt control unit (Interrupt Controller). 3604, Timing Controller 3605, Register 3606, Register Controller 3607, Bus Interface (Bus I / F) 3608, Rewritable ROM 3609, ROM Interface (ROM I / F) 3620 It has mainly. The ROM 3609 and the ROM interface 3620 may be provided in separate chips. Various circuits included in the CPU 3660 can be formed using the thin film transistor described in any of Embodiments 1 to 3, a CMOS circuit in which the thin film transistor is combined, an nMOS circuit, a pMOS circuit, or the like.

  Note that the CPU 3660 illustrated in FIG. 19 is merely an example in which the configuration is simplified, and an actual CPU has various configurations depending on the application. Therefore, the configuration of the CPU to which the present invention is applied is not limited to that shown in FIG.

  An instruction input to the CPU 3660 via the bus interface 3608 is input to the instruction analysis unit 3603 and decoded, and then is input to the arithmetic circuit control circuit unit 3602, the interrupt control unit 3604, the register control unit 3607, and the timing control unit 3605. Entered.

  The arithmetic circuit control circuit portion 3602, the interrupt control portion 3604, the register control portion 3607, and the timing control portion 3605 perform various controls based on the decoded instruction. Specifically, the arithmetic circuit control circuit portion 3602 generates a signal for controlling driving of the arithmetic circuit 3601. The interrupt control unit 3604 determines and processes an interrupt request from an external input / output device or a peripheral circuit from the priority or mask state during execution of the program of the CPU 3660. The register control unit 3607 generates an address of the register 3606, and reads and writes the register 3606 according to the state of the CPU.

  In addition, the timing control unit 3605 generates a signal for controlling the driving timing of the arithmetic circuit 3601, the arithmetic circuit control circuit unit 3602, the instruction analysis unit 3603, the interrupt control unit 3604, and the register control unit 3607. For example, the timing control unit 3605 includes an internal clock generation unit that generates an internal clock signal CLK2 (3622) based on the reference clock signal CLK1 (3621), and supplies the clock signal CLK2 to the various circuits.

  FIG. 14 shows a display device in which a pixel portion, a CPU, and other circuits are formed over the same substrate, a so-called system-on-panel. Over a substrate 3700, a pixel portion 3701, a scan line driver circuit 3702 for selecting a pixel included in the pixel portion 3701, and a signal line driver circuit 3703 for supplying a video signal to the selected pixel are provided. A CPU 3704 and other circuits such as a control circuit 3705 are connected to each other by wiring drawn from the scan line driver circuit 3702 and the signal line driver circuit 3703. The control circuit includes an interface. Then, a connection portion with an FPC terminal is provided at an end portion of the substrate, and exchange with an external signal is performed.

  As other circuits, a video signal processing circuit, a power supply circuit, a gradation power supply circuit, a video RAM, a memory (DRAM, SRAM, PROM) and the like can be provided in addition to the control circuit 3705. These circuits may be formed by an IC chip and mounted on a substrate. Further, the scan line driver circuit 3702 and the signal line driver circuit 3703 are not necessarily formed over the same substrate. For example, only the scan line driver circuit 3702 is formed over the same substrate, and the signal line driver circuit 3703 is formed using an IC chip. May be implemented.

  Note that although an example in which the semiconductor device according to the present invention is applied to a CPU has been described in this embodiment, the present invention is not particularly limited. For example, the semiconductor device according to the present invention can be applied to a pixel portion, a driver circuit portion, and the like of a display device including an organic light emitting element, an inorganic light emitting element, a liquid crystal display element, or the like. In addition, by applying the present invention, a digital camera, an audio playback device such as a car audio, a notebook personal computer, a game device, a portable information terminal (mobile phone, portable game machine, etc.), a home game machine, etc. It is also possible to manufacture an image reproducing device provided with a recording medium.

  In the semiconductor device to which the present invention is applied, the subthreshold value can be reduced and a decrease in on-state current can be suppressed. Therefore, the operating characteristics can be improved, and the circuit drive speed can be increased, the voltage operation can be reduced, and the power consumption can be reduced.

  In addition, when a transistor having a metal silicide region as described in Embodiment Mode 2 is applied, contact resistance (contact resistance between a conductive layer and a semiconductor layer) can be reduced, so that signal delay or the like can be prevented. Therefore, circuit driving at higher speed is possible.

(Embodiment 5)
In this embodiment, an example of usage of the semiconductor device described in the above embodiment is described. Specifically, application examples of a semiconductor device capable of inputting and outputting data without contact will be described below with reference to the drawings. A semiconductor device that can input and output data without contact is also referred to as an RFID tag, an ID tag, an IC tag, an IC chip, an RF tag, a wireless tag, an electronic tag, or a wireless chip, depending on the application.

  An example of a top structure of the semiconductor device described in this embodiment will be described with reference to FIG. A semiconductor device 2180 illustrated in FIG. 15 includes a thin film integrated circuit 2131 provided with a plurality of elements such as thin film transistors included in a memory portion and a logic portion, and a conductive layer 2132 functioning as an antenna. The conductive layer 2132 functioning as an antenna is electrically connected to the thin film integrated circuit 2131. The thin film transistor according to the present invention described in any of Embodiments 1 to 3 can be applied to the thin film integrated circuit 2131.

  FIGS. 15B and 15C are schematic views of the cross section of FIG. The conductive layer 2132 functioning as an antenna may be provided above the elements included in the memory portion and the logic portion. For example, the insulating layer 2130 is provided above the thin film integrated circuit 2131 including the thin film transistor described in the above embodiment mode. A conductive layer 2132 which functions as an antenna can be provided through (see FIG. 15B). In addition, after the conductive layer 2132 functioning as an antenna is provided over the substrate 2133, the substrate 2133 and the thin film integrated circuit 2131 can be attached to each other so that the conductive layer 2132 is positioned therebetween (FIG. 15). (See (C)). In FIG. 15C, a conductive layer 2136 provided over the insulating layer 2130 and a conductive layer 2132 functioning as an antenna are electrically connected to each other through conductive particles 2134 contained in a resin 2135 having adhesiveness. An example is shown.

  Note that although an example in which the conductive layer 2132 functioning as an antenna is provided in a coil shape and an electromagnetic induction method or an electromagnetic coupling method is applied is described in this embodiment mode, the semiconductor device of the present invention is not limited thereto, and a microwave method is used. It is also possible to apply. In the case of a microwave method, the shape of the conductive layer 2132 functioning as an antenna may be determined as appropriate depending on the wavelength of the electromagnetic wave used.

  For example, when a microwave method (for example, UHF band (860 MHz to 960 MHz band), 2.45 GHz band, or the like) is used as a signal transmission method in the semiconductor device 2180, the wavelength of an electromagnetic wave used for signal transmission is set to The shape such as the length of the conductive layer functioning as an antenna may be appropriately set in consideration. For example, the conductive layer functioning as an antenna has a linear shape (for example, a dipole antenna (see FIG. 17A)), a flat shape (for example, a patch antenna (see FIG. 17B)), or a ribbon shape (see FIG. 17). (See (C) and (D))). In addition, the shape of the conductive layer 2132 functioning as an antenna is not limited to a linear shape, and a curved shape, a meandering shape, or a combination thereof may be provided in consideration of the wavelength of electromagnetic waves.

  The conductive layer 2132 functioning as an antenna is formed using a conductive material by a CVD method, a sputtering method, a printing method such as screen printing or gravure printing, a droplet discharge method, a dispenser method, a plating method, or the like. Conductive materials are aluminum (Al), titanium (Ti), silver (Ag), copper (Cu), gold (Au), platinum (Pt) nickel (Ni), palladium (Pd), tantalum (Ta), molybdenum A metal element such as (Mo) or an alloy material or compound material containing the metal element is used to form a single layer structure or a stacked structure.

  For example, when the conductive layer 2132 that functions as an antenna is formed using a screen printing method, a conductive paste in which conductive particles having a particle size of several nanometers to several tens of micrometers are dissolved or dispersed in an organic resin is selected. Can be provided by printing. The conductive particles include silver (Ag), gold (Au), copper (Cu), nickel (Ni), platinum (Pt), palladium (Pd), tantalum (Ta), molybdenum (Mo) and titanium (Ti). Any one or more metal particles, silver halide fine particles, or dispersible nanoparticles can be used. In addition, as the organic resin contained in the conductive paste, one or more selected from organic resins that function as a binder, a solvent, a dispersant, and a coating material of metal particles can be used. Typically, an organic resin such as an epoxy resin or a silicon resin can be given. In forming the conductive layer, it is preferable to fire after extruding the conductive paste. For example, in the case where fine particles containing silver as a main component (for example, fine particles having a particle diameter of 1 nm to 100 nm) are used as a conductive paste material, the conductive layer is cured by baking at a temperature range of 150 ° C. to 300 ° C. Can be formed. Further, fine particles mainly composed of solder or lead-free solder may be used. In this case, it is preferable to use fine particles having a particle diameter of 20 μm or less. Solder and lead-free solder have the advantage of low cost.

  A semiconductor device to which the present invention is applied can achieve low power consumption. Therefore, it is effective in the case of a small semiconductor device capable of inputting / outputting data without contact as shown in this embodiment mode. Further, it is possible to increase the distance between communication devices when inputting / outputting data without contact.

  Next, an operation example of the semiconductor device according to the present embodiment will be described.

  The semiconductor device 2180 has a function of communicating data without contact, and controls the high-frequency circuit 81, the power supply circuit 82, the reset circuit 83, the clock generation circuit 84, the data demodulation circuit 85, the data modulation circuit 86, and other circuits. A control circuit 87, a memory circuit 88, and an antenna 89 are provided (see FIG. 18A). The high frequency circuit 81 is a circuit that receives a signal from the antenna 89 and outputs the signal received from the data modulation circuit 86 from the antenna 89. The power supply circuit 82 is a circuit that generates a power supply potential from the received signal. The reset circuit 83 is a circuit that generates a reset signal. The clock generation circuit 84 is a circuit that generates various clock signals based on the reception signal input from the antenna 89. The data demodulation circuit 85 is a circuit that demodulates the received signal and outputs it to the control circuit 87. The data modulation circuit 86 is a circuit that modulates a signal received from the control circuit 87. Further, as the control circuit 87, for example, a code extraction circuit 91, a code determination circuit 92, a CRC determination circuit 93, and an output unit circuit 94 are provided. The code extraction circuit 91 is a circuit that extracts a plurality of codes included in an instruction sent to the control circuit 87, and the code determination circuit 92 compares the extracted code with a code corresponding to a reference. The CRC determination circuit 93 is a circuit that detects the presence or absence of a transmission error or the like based on the determined code. In FIG. 18A, in addition to the control circuit 87, a high frequency circuit 81 and a power supply circuit 82 which are analog circuits are included.

  Next, an example of operation of the above-described semiconductor device will be described. First, a radio signal is received by the antenna 89. The radio signal is sent to the power supply circuit 82 via the high frequency circuit 81, and a high power supply potential (hereinafter referred to as VDD) is generated. VDD is supplied to each circuit included in the semiconductor device 2180. In addition, the signal sent to the data demodulating circuit 85 via the high frequency circuit 81 is demodulated (hereinafter referred to as a demodulated signal). Further, the signal and the demodulated signal that have passed through the reset circuit 83 and the clock generation circuit 84 via the high frequency circuit 81 are sent to the control circuit 87. The signal sent to the control circuit 87 is analyzed by the code extraction circuit 91, the code determination circuit 92, the CRC determination circuit 93, and the like. Then, information on the semiconductor device stored in the memory circuit 88 is output in accordance with the analyzed signal. The output semiconductor device information is encoded through the output unit circuit 94. Further, the encoded information of the semiconductor device 2180 passes through the data modulation circuit 86 and is transmitted on the radio signal by the antenna 89. Note that a plurality of circuits included in the semiconductor device 2180 have a common low power supply potential (hereinafter referred to as VSS), and VSS can be GND.

  In this manner, a signal is transmitted from the communication unit (for example, a reader / writer or a unit having a function of either a reader or a writer) to the semiconductor device 2180, and the signal transmitted from the semiconductor device 2180 is received by the reader / writer. As a result, the data of the semiconductor device can be read.

  In addition, the semiconductor device 2180 may be a type in which the power supply voltage is supplied to each circuit by an electromagnetic wave without mounting the power source (battery), or each circuit is mounted by the electromagnetic wave and the power source (battery). It is good also as a type which supplies a power supply voltage to.

  Next, an example of a usage pattern of a semiconductor device capable of inputting and outputting data without contact will be described. A communication means 3200 is provided on a side surface of the portable terminal including the display portion 3210, and a semiconductor device 3230 is provided on a side surface of the article 3220 (see FIG. 18B). Note that the communication unit 3200 has a function of reading a signal and a function of transmitting a signal, such as a reader / writer, or a function of reading a signal or a function of transmitting a signal. When the communication means 3200 is placed over the semiconductor device 3230 included in the product 3220, information about the product such as the product raw material, the place of origin, the inspection result for each production process, the history of the distribution process, and the like, and the product description are displayed on the display unit 3210. The Further, when the product 3260 is conveyed by the belt conveyor, the product 3260 can be inspected using the communication unit 3240 and the semiconductor device 3250 provided in the product 3260 (see FIG. 18C). As the semiconductor device 3230 and the semiconductor device 3250, the above-described semiconductor device 2180 can be used. As described above, by utilizing the semiconductor device according to the present invention in the system, information can be easily acquired, and high functionality and high added value are realized. In addition, since the semiconductor device according to the present invention can achieve low power consumption, the semiconductor device provided in the product can be downsized. Further, it is possible to increase the distance between communication devices when inputting / outputting data without contact.

  In addition to the above, the semiconductor device according to the present invention has a wide range of uses, and is applicable to any product that can be used for production and management by clarifying information such as the history of objects in a non-contact manner. can do. For example, banknotes, coins, securities, certificate documents, bearer bonds, packaging containers, books, recording media, personal belongings, vehicles, foods, clothing, health supplies, daily necessities, medicines, etc. It can be provided and used in an electronic device or the like. These examples will be described with reference to FIG.

  Banknotes and coins are money that circulates in the market, and include those that are used in the same way as money in a specific area (cash vouchers), commemorative coins, and the like. Securities refer to checks, securities, promissory notes, and the like (see FIG. 16A). The certificate refers to a driver's license, a resident card, etc. (see FIG. 16B). Bearer bonds refer to stamps, gift tickets, various gift certificates, and the like (see FIG. 16C). Packaging containers refer to wrapping paper for lunch boxes, plastic bottles, and the like (see FIG. 16D). Books refer to books, books, and the like (see FIG. 16E). The recording media refer to DVD software, video tapes, and the like (see FIG. 16F). The vehicles refer to vehicles such as bicycles, ships, and the like (see FIG. 16G). Personal belongings refer to bags, glasses, and the like (FIG. 16H). Foods refer to food products, beverages, and the like. Clothing refers to clothing, footwear, and the like. Health supplies refer to medical equipment, health equipment, and the like. Livingware refers to furniture, lighting equipment, and the like. Chemicals refer to pharmaceuticals, agricultural chemicals, and the like. Electronic devices refer to liquid crystal display devices, EL display devices, television devices (television receivers, flat-screen television receivers), cellular phones, and the like.

  Forgery can be prevented by providing the semiconductor device 2180 for bills, coins, securities, certificates, bearer bonds, and the like. In addition, by providing the semiconductor device 2180 for personal items such as packaging containers, books, recording media, personal items, foods, daily necessities, electronic devices, etc., the efficiency of inspection systems and rental store systems will be improved. Can do. Forgery or theft can be prevented by providing the semiconductor device 2180 for vehicles, health supplies, medicines, and the like. Moreover, if it is chemicals, the mistake of taking a medicine can be prevented. As a method for providing the semiconductor device 2180, the semiconductor device 2180 is attached to the surface of an article or embedded in an article. For example, a book may be embedded in paper, and a package made of an organic resin may be embedded in an organic resin.

  In this way, by providing semiconductor devices in packaging containers, recording media, personal items, foods, clothing, daily necessities, electronic devices, etc., it is possible to improve the efficiency of inspection systems and rental store systems. it can. Further, forgery or theft can be prevented by providing a semiconductor device in the vehicles. Moreover, by embedding it in creatures such as animals, it is possible to easily identify individual creatures. For example, by embedding or attaching a semiconductor device equipped with a sensor to a living creature such as livestock, it is possible to easily manage the health state such as the current body temperature as well as the year of birth, gender or type.

  Note that this embodiment can be freely combined with the above embodiment.

FIG. 9 illustrates an example of a main structure of a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. FIG. 9 illustrates an example of a main structure of a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. FIG. 9 illustrates an example of a main structure of a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. 8A and 8B illustrate an example of a method for manufacturing a semiconductor device according to the present invention. The figure which shows the example of a structure of a plasma processing apparatus. FIG. 6 illustrates an example of a structure of a semiconductor device according to the present invention. FIG. 10 shows characteristics of a semiconductor device according to the invention. 1 is a perspective view illustrating an example of a semiconductor device according to the present invention. 4A and 4B are a top view and a cross-sectional view illustrating an example of a semiconductor device according to the invention. FIG. 13 shows an example of usage of a semiconductor device according to the invention. 4A and 4B illustrate an antenna which can be used in a semiconductor device according to the invention. 1A and 1B are a block diagram illustrating an example of a semiconductor device according to the invention and a diagram illustrating an example of a usage pattern. 1 is a block diagram illustrating an example of a semiconductor device according to the present invention.

Explanation of symbols

81 High-frequency circuit 82 Power supply circuit 83 Reset circuit 84 Clock generation circuit 85 Data demodulation circuit 86 Data modulation circuit 87 Control circuit 88 Memory circuit 89 Antenna 91 Code extraction circuit 92 Code determination circuit 93 CRC determination circuit 94 Output unit circuit 100 Substrate 102 Insulating layer 103 Insulating layer 104 Semiconductor layer 105 First concentration region 106 Second concentration region 108 Channel formation region 110 Insulating layer 112 Insulating layer 114 Conductive layer 120 Impurity region 130 Semiconductor layer 140 Thin film transistor 500 Substrate 502 Insulating layer 503 Insulating layer 505 First concentration region 506 Second concentration region 507 Metal silicide region 508 Channel formation region 510 Insulating layer 512 Insulating layer 514 Conductive layer 520 Impurity region 530 Semiconductor layer 540 Thin film transistor 700 Substrate 702 Insulating layer 703 Insulating 704 Semiconductor layer 706 Second concentration region 707 First concentration region 708 Channel formation region 710 Insulating layer 712 Insulating layer 714 Conductive layer 716 High concentration impurity region 718 Low concentration impurity region 730 Semiconductor layer 740 Thin film transistor 1010 Object 1080 Plasma processing apparatus 1082 Dielectric plate 1084 Gas supply unit 1086 Exhaust port 1088 Support base 1090 Temperature control unit 1092 High frequency supply unit 1094 Plasma 1098 Antenna 1200 Thin film transistor 1201 Substrate 1202 Channel formation region 1203 First concentration region 1204 Insulating layer 1205 Insulating layer 1206 Conductive layer 1207 Second Concentration region 1208 Impurity region 1210 Thin film transistor 1211 Substrate 1212 Channel formation region 1213 Impurity region 1214 Insulating layer 1215 Insulating layer 1216 Conductive layer 220 Thin film transistor 1221 Substrate 1222 Channel formation region 1223 First concentration region 1224 Insulating layer 1225 Insulating layer 1226 Conductive layer 1227 Second concentration region 1228 Impurity region 2130 Insulating layer 2131 Thin film integrated circuit 2132 Conductive layer 2133 Substrate 2134 Conductive particle 2135 Resin 2136 Conductive Layer 2180 Semiconductor device 3200 Communication unit 3210 Display unit 3220 Product 3230 Semiconductor device 3240 Communication unit 3250 Semiconductor device 3260 Product 3600 Substrate 3601 Operation circuit 3602 Control circuit unit 3603 for operation circuit Instruction analysis unit 3604 Control unit 3605 Timing control unit 3606 Register 3607 Register Control unit 3608 Bus interface 3609 ROM
3620 ROM interface 3660 CPU
3700 Substrate 3701 Pixel portion 3702 Scan line driver circuit 3703 Signal line driver circuit 3704 CPU
3705 Control circuit

Claims (11)

An island-shaped semiconductor layer including a channel formation region provided between a pair of impurity regions;
A first insulating layer provided on the impurity region of the semiconductor layer;
A second insulating layer provided on the channel formation region and the first insulating layer;
A conductive layer overlapping the impurity region via the first insulating layer and the second insulating layer and overlapping the channel formation region via the second insulating layer;
Have
2. The semiconductor device according to claim 1, wherein the channel formation region is thinner than the impurity region. An island-shaped semiconductor layer including a channel formation region provided between a pair of impurity regions, and a silicide region provided in contact with part of the impurity regions;
A first insulating layer provided on the impurity region of the semiconductor layer;
A second insulating layer provided on the channel formation region and the first insulating layer;
A conductive layer overlapping the impurity formation region via the first insulating layer and the second insulating layer and overlapping the channel formation region via the second insulating layer;
Have
2. The semiconductor device according to claim 1, wherein the channel formation region is thinner than the impurity region. In claim 2,
The semiconductor device is characterized in that the silicide region is a region including any of nickel silicide, titanium silicide, cobalt silicide, or platinum silicide. In any one of Claim 1 thru | or 3,
The semiconductor device is characterized in that the channel formation region has a thickness of 0.5 nm to 100 nm. In any one of Claims 1 thru | or 4,
The semiconductor device is characterized in that the thickness of the second insulating layer is 1 nm to 20 nm. In any one of Claims 1 thru | or 5,
In the semiconductor layer, an impurity element imparting the same conductivity type as the impurity region is added between the channel formation region and the impurity region, and the impurity element is added at a lower concentration than the impurity region. A semiconductor device comprising a low concentration impurity region. Forming an island-like semiconductor layer,
An impurity element is added to the semiconductor layer, and a first concentration region and a second concentration region having an impurity concentration lower than that of the first concentration region are formed in the semiconductor layer sequentially from the surface side,
Forming a first insulating layer on the semiconductor layer;
Selectively etching the first insulating layer to locally expose the semiconductor layer;
A channel forming region including the second concentration region exposed locally by etching the first concentration region in the region where the semiconductor layer is exposed, and the remaining first concentration region and second concentration region Forming an impurity region containing
Forming a second insulating layer on the channel formation region and the first insulating layer;
A method for manufacturing a semiconductor device, wherein a conductive layer which overlaps with part of the channel formation region and the impurity region is formed with the first insulating layer and the second insulating layer interposed therebetween. Forming an island-like semiconductor layer,
An impurity element is added to the semiconductor layer, and a first concentration region and a second concentration region having an impurity concentration lower than that of the first concentration region are formed in the semiconductor layer sequentially from the surface side,
Forming a first insulating layer on the semiconductor layer;
Selectively etching the first insulating layer to locally expose the semiconductor layer;
A channel forming region including the second concentration region exposed locally by etching the first concentration region in the region where the semiconductor layer is exposed, and the remaining first concentration region and second concentration region Forming an impurity region containing
Forming a second insulating layer on the channel formation region and the first insulating layer;
Forming a conductive layer overlapping with part of the channel formation region and the impurity region via the first insulating layer and the second insulating layer;
Using the conductive layer as a mask, the first insulating layer and the second insulating layer are etched to expose a part of the impurity region,
Forming a metal layer on at least the exposed impurity region;
A method for manufacturing a semiconductor device, characterized in that by performing heat treatment, a part of a region where the impurity region and the metal layer are in contact with each other is silicided to form a silicide region in a part of the impurity region. In claim 8,
The metal layer is formed using a metal element selected from nickel (Ni), titanium (Ti), cobalt (Co), or platinum (Pt), or an alloy material containing the metal element. Device fabrication method. In any one of Claims 7 to 9,
The method for manufacturing a semiconductor device is characterized in that the second insulating layer is formed with a thickness of 1 nm to 20 nm. In any one of Claims 7 to 10,
The method for manufacturing a semiconductor device, wherein the first concentration region formed in the semiconductor layer includes an impurity element at a concentration of 1 × 10 ^{16 to} 1 × 10 ²² atoms / cm ³ .

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