JP2008112804A - Wafer cassette - Google Patents

Wafer cassette Download PDF

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JP2008112804A
JP2008112804A JP2006293939A JP2006293939A JP2008112804A JP 2008112804 A JP2008112804 A JP 2008112804A JP 2006293939 A JP2006293939 A JP 2006293939A JP 2006293939 A JP2006293939 A JP 2006293939A JP 2008112804 A JP2008112804 A JP 2008112804A
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semiconductor wafer
pair
wafer
side plates
cassette
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JP4832252B2 (en
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Satoshi Odajima
智 小田嶋
Noriyoshi Hosono
則義 細野
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Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
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Shin Etsu Polymer Co Ltd
Shin Etsu Chemical Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a wafer cassette for enabling automatic transfer or the like by controlling fluctuation among a plurality of semiconductor wafers. <P>SOLUTION: A wafer cassette 1 is soaked into liquid under the condition that a semiconductor wafer W accommodated through an input/output aperture 8 is set in the upright state by providing a pair of side plates 2 opposed with each other, bridging a bottom plate 5 and a ceiling plate 6 between the upper and lower end portions of the pair of side plates 2 to form a pair of openings, with the opening at the front surface serving as the input/output aperture 8 for the semiconductor wafer W, and also with the opening at the rear surface serving as a delivery opening 9. This wafer cassette is provided with a plurality of teeth 3 formed in a certain arrangement to the pair of side plates 2 to support both sides of the circumferential edge of the semiconductor wafer W and a holding groove 10 for holding the lower end of the circumferential edge of the semiconductor wafer W in the upright state. Moreover, a linear line passing the point where the pair of opposite teeth 3 and the semiconductor wafer W in the upright state are in the contact state is positioned at the lower location than the center of semiconductor wafer W and each holding groove 10 is formed in an asymmetrical cross-sectionally near V shape so that the lower end part of the circumferential edge of semiconductor wafer W in the upright state is in contact with a sloping surface having a large sloping angle. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、収納した半導体ウェーハを縦に起立させた状態で液体中に浸漬されるウェーハカセットに関するものである。   The present invention relates to a wafer cassette that is immersed in a liquid in a state where a stored semiconductor wafer is vertically erected.

薄く丸くスライスされた半導体ウェーハは、エッジの面取り工程から両面研磨工程、洗浄工程が終了するまでの間、水槽のウェット確保液等からなる液体に浸漬されるが、この際、ウェーハカセットに複数枚が収納された状態で浸漬される。この種のウェーハカセットは、図示しないが、相対向する一対の側板と、この一対の側板の前端部間に架設された正面板と、一対の側板の後端部間に架設された背面板とを備え、開口した上部が半導体ウェーハ用の出し入れ口とされるとともに、開口した狭い下部が液体用の流通口とされており、複数枚の半導体ウェーハを起立させた状態で横一列に整列収納し、液体中に浸漬される(特許文献1参照)。   The thinly sliced semiconductor wafer is immersed in a liquid consisting of a wet securing solution in the water tank until the end of the edge chamfering process, the double-side polishing process, and the cleaning process is completed. Is immersed in a stored state. Although not shown, this type of wafer cassette includes a pair of opposing side plates, a front plate laid between the front end portions of the pair of side plates, and a back plate laid between the rear end portions of the pair of side plates, The open upper part is used as an inlet / outlet port for semiconductor wafers, and the narrow open lower part is used as a liquid outlet port, and a plurality of semiconductor wafers are placed in a horizontal row in a standing state. And immersed in a liquid (see Patent Document 1).

一対の側板は、上方から下方に向かうに従い内方向に徐々に狭まる断面略く字形にそれぞれ屈曲形成され、内面には半導体ウェーハの周縁部両側を接触支持する複数のティースが前後方向に所定のピッチで並設されており、各ティースが半導体ウェーハの周縁部側方に沿う形に屈曲形成されている。また、出し入れ口は半導体ウェーハの出し入れが可能な大きさに形成され、流通口は半導体ウェーハの出し入れが不可能な大きさに形成されている。
特開2005‐64530号公報
Each of the pair of side plates is bent and formed in a substantially rectangular shape that gradually narrows inward as it goes from the top to the bottom, and a plurality of teeth that contact and support both sides of the periphery of the semiconductor wafer are formed on the inner surface at a predetermined pitch in the front-rear direction. The teeth are bent and formed along the side of the periphery of the semiconductor wafer. The loading / unloading port is formed in a size that allows the semiconductor wafer to be loaded and unloaded, and the distribution port is formed in a size that the semiconductor wafer cannot be loaded / unloaded.
JP 2005-64530 A

従来におけるウェーハカセットは、以上のように構成され、一対の側板の内面に複数のティースが所定のピッチで単に並設されるに止まるので、複数枚の半導体ウェーハを起立させて整列収納すると、半導体ウェーハが整列方向に傾くことにより、複数枚の半導体ウェーハにおける上部間の間隔が大きくばらつき、浸漬後の自動搬送を困難にするという問題がある。   The conventional wafer cassette is configured as described above, and a plurality of teeth are simply arranged in parallel at a predetermined pitch on the inner surfaces of a pair of side plates. When the wafers are inclined in the alignment direction, there is a problem in that the intervals between the upper portions of the plurality of semiconductor wafers vary greatly, making it difficult to perform automatic conveyance after immersion.

本発明は上記に鑑みなされたもので、複数枚の半導体ウェーハ間のばらつきを抑制し、自動搬送等の搬送を可能にするウェーハカセットを提供することを目的としている。   The present invention has been made in view of the above, and an object of the present invention is to provide a wafer cassette that suppresses variations among a plurality of semiconductor wafers and enables conveyance such as automatic conveyance.

本発明においては上記課題を解決するため、半導体ウェーハを収納可能な間隔を空けて一対の側板を対向させ、この一対の側板の両端部間に第一、第二の対向板をそれぞれ架設して相対する一対の開口を形成し、この一対の開口のうち一方の開口を半導体ウェーハの出し入れが可能な出し入れ口とするとともに、他方の開口を半導体ウェーハの出し入れが不可能な大きさに形成して液体用の流通口とし、出し入れ口から収納した複数枚の半導体ウェーハを起立させた状態で液体中に浸されるものであって、
一対の側板にそれぞれ形成され、半導体ウェーハの周縁部両側を支持する複数のティースと、起立した半導体ウェーハの周縁部下端を保持する保持溝とを含み、複数のティースと起立した半導体ウェーハとの接触点を通る直線を半導体ウェーハの中心よりも下方に位置させ、保持溝を非対称の断面略V字形に形成してその傾斜角の大きい傾斜面に起立した半導体ウェーハの周縁部下端を接触させるようにしたことを特徴としている。
In the present invention, in order to solve the above-described problem, a pair of side plates are opposed to each other with a space capable of accommodating a semiconductor wafer, and first and second opposing plates are respectively installed between both ends of the pair of side plates. A pair of opposed openings are formed, and one of the pair of openings is used as a loading / unloading opening that allows a semiconductor wafer to be taken in and out, and the other opening is formed to a size that prevents the semiconductor wafer from being taken in and out. As a circulation port for the liquid, it is immersed in the liquid in a state where a plurality of semiconductor wafers stored from the inlet / outlet are upright,
Each of the pair of side plates includes a plurality of teeth that support both sides of the peripheral edge of the semiconductor wafer, and a holding groove that holds a lower end of the peripheral edge of the semiconductor wafer, and the plurality of teeth contact the rising semiconductor wafer. A straight line passing through the point is positioned below the center of the semiconductor wafer, and the holding groove is formed in a substantially V-shaped asymmetric cross section so that the lower end of the peripheral edge of the semiconductor wafer standing on the inclined surface having a large inclination angle is brought into contact It is characterized by that.

なお、一対の側板の下端部間に第一の対向板を架設して底板とし、一対の側板の上端部間に第二の対向板を架設して天板とし、正面を出し入れ口とするとともに、背面を流通口とすることができる。   A first counter plate is installed between the lower ends of the pair of side plates as a bottom plate, a second counter plate is installed between the upper ends of the pair of side plates as a top plate, and the front is used as the entrance / exit. The back can be used as a distribution port.

また、一対の側板をそれぞれ断面略く字形に形成し、この一対の側板の前端部間に第一の対向板を架設して正面板とし、一対の側板の後端部間に第二の対向板を架設して背面板とし、開口した上部を出し入れ口とするとともに、開口した下部を流通口とし、複数のティースの下部間を保持溝とすることもできる。
また、第一、第二の対向板の間に、他方の開口を分割する規制板を架設することにより流通口を形成し、規制板の内面に複数の保持溝を並べて形成することができる。
Further, each of the pair of side plates is formed in a substantially rectangular shape in cross section, and a first counter plate is installed between the front end portions of the pair of side plates as a front plate, and a second counter plate is disposed between the rear end portions of the pair of side plates. A plate can be installed to form a back plate, the opened upper part can be used as a loading / unloading port, the opened lower part can be used as a circulation port, and a holding groove can be formed between the lower parts of the plurality of teeth.
In addition, a restricting plate that divides the other opening may be installed between the first and second opposing plates to form a circulation port, and a plurality of holding grooves may be formed side by side on the inner surface of the restricting plate.

ここで、特許請求の範囲における半導体ウェーハには、少なくとも口径150mmタイプ、200mmタイプ、300mmタイプ、450mmタイプ等が含まれる。この半導体ウェーハは、起立する際、垂直に起立するものでも良いが、僅かな傾斜角度、例えば1°〜5°の傾斜角度で傾斜しながら起立するものでも良い。また、液体には、少なくともウェット確保液や洗浄液等が含まれる。規制板は単数複数を特に問うものではない。   Here, the semiconductor wafer in the claims includes at least 150 mm type, 200 mm type, 300 mm type, 450 mm type and the like. This semiconductor wafer may stand upright when standing, but may stand up while tilting at a slight tilt angle, for example, 1 ° to 5 °. Further, the liquid includes at least a wet ensuring liquid, a cleaning liquid, and the like. There is no particular limitation on the number of restriction plates.

複数のティースと保持溝とは、複数のティースに保持される半導体ウェーハの厚さ方向の中心部が保持溝の谷部を通る鉛直線よりも傾斜角度の小さい傾斜面側にずれる関係であることが好ましい。さらに、ウェーハカセットは、透明、半透明、不透明を特に問うものではなく、又液体に浸される際、横に倒されるタイプでも良いし、そうでなくても良い。   The plurality of teeth and the holding groove are in a relationship in which the central portion in the thickness direction of the semiconductor wafer held by the plurality of teeth is shifted to the inclined surface side having a smaller inclination angle than the vertical line passing through the valley portion of the holding groove. Is preferred. Further, the wafer cassette is not particularly required to be transparent, translucent, or opaque, and may be of a type that is tilted sideways when immersed in a liquid, or not.

本発明によれば、液体中に半導体ウェーハを浸たす場合には、複数枚の半導体ウェーハの姿勢を横一列として各半導体ウェーハを縦に起立させ、液体中にウェーハカセットを沈めれば、ウェーハカセットの出し入れ口や流通口から液体が流入し、液体に各半導体ウェーハを浸たすことができる。
この際、起立した半導体ウェーハは、整列方向に揺れて傾くことがあるが、最終的に非対称で断面略V字形の保持溝の険しい傾斜面ではなく、緩やかな傾斜面に下端部が接触して保持されるので、ウェーハカセットの静置により略縦に支持されることとなる。
According to the present invention, when a semiconductor wafer is immersed in a liquid, each semiconductor wafer is erected vertically with the orientation of a plurality of semiconductor wafers in a horizontal row, and the wafer cassette is submerged in the liquid. The liquid flows in from the inlet / outlet of the cassette and the distribution port, and each semiconductor wafer can be immersed in the liquid.
At this time, the standing semiconductor wafer may be tilted by swinging in the alignment direction, but the lower end portion is not in contact with the gently inclined surface but the asymmetrically inclined surface having a substantially V-shaped holding groove. Since the wafer cassette is held, the wafer cassette is supported substantially vertically by the stationary wafer cassette.

本発明によれば、一対の側板にそれぞれ形成され、半導体ウェーハの周縁部両側を支持する複数のティースと、起立した半導体ウェーハの周縁部下端を保持する保持溝とを含み、複数のティースと起立した半導体ウェーハとの接触点を通る直線を半導体ウェーハの中心よりも下方に位置させ、保持溝を非対称の断面略V字形に形成してその傾斜角の大きい傾斜面に起立した半導体ウェーハの周縁部下端を接触させるので、複数枚の半導体ウェーハ間のばらつきを抑制し、自動搬送等の搬送を可能にするウェーハカセットを提供することができるという効果がある。   According to the present invention, a plurality of teeth formed on a pair of side plates and supporting both sides of the peripheral edge of the semiconductor wafer, and a holding groove for holding the lower end of the peripheral edge of the upstanding semiconductor wafer are provided. The semiconductor wafer has a straight line passing through the contact point with the semiconductor wafer positioned below the center of the semiconductor wafer, and the holding groove is formed in a substantially V-shaped asymmetric cross section so that the peripheral edge of the semiconductor wafer stands on the inclined surface having a large inclination angle. Since the lower ends are brought into contact with each other, there is an effect that it is possible to provide a wafer cassette that suppresses variations among a plurality of semiconductor wafers and enables transfer such as automatic transfer.

また、第一、第二の対向板の間に、他方の開口を分割する規制板を架設することにより流通口を形成すれば、規制板により半導体ウェーハの脱落を招くことなく、取り出し用の突き出し治具の進入を許容することができ、半導体製造の自動化に資することができる。   In addition, if a distribution port is formed by laying a regulating plate that divides the other opening between the first and second opposing plates, the ejecting jig for taking out without causing the semiconductor wafer to fall off by the regulating plate Can be allowed to enter, contributing to automation of semiconductor manufacturing.

以下、図面を参照して本発明の好ましい実施の形態を説明すると、本実施形態におけるウェーハカセット1は、図1ないし図10に示すように、複数枚(例えば13枚、25枚、26枚)の半導体ウェーハWを整列収納可能な間隔を空けて対向する左右一対の側板2と、この一対の側板2の下端部間に架設される底板5と、一対の側板2の上端部間に架設される天板6とを備えて前後方向に相対する一対の開口を形成し、この一対の開口のうち正面の開口を半導体ウェーハWの出し入れが可能な出し入れ口8とするとともに、背面の開口を液体用の流通口9とし、水槽の液体中に浸漬される際、横に倒されて正面の出し入れ口8を上方に向け、収納した複数枚の半導体ウェーハWを起立させるようにしている。   Hereinafter, a preferred embodiment of the present invention will be described with reference to the drawings. As shown in FIGS. 1 to 10, a plurality of wafer cassettes 1 (for example, 13, 25, 26) are used in this embodiment. A pair of left and right side plates 2 facing each other with an interval capable of aligning and storing the semiconductor wafers W, a bottom plate 5 installed between the lower ends of the pair of side plates 2, and an upper end of the pair of side plates 2. A pair of openings facing each other in the front-rear direction is formed, and the front opening of the pair of openings is used as a loading / unloading opening 8 through which the semiconductor wafer W can be loaded and unloaded, and the back opening is a liquid. When it is immersed in the liquid in the water tank, it is tilted sideways and the front loading / unloading port 8 is directed upward so that a plurality of stored semiconductor wafers W are erected.

半導体ウェーハWは、図1、図7ないし図9に示すように、例えば薄く丸くスライスされた口径200mmや300mmのタイプからなり、周縁部のエッジが丸く面取りされており、エッジの面取り工程から両面研磨工程、及び洗浄工程が終了するまでの間、水槽に貯えられた液体、例えばウェット確保液に浸漬される。   As shown in FIG. 1 and FIG. 7 to FIG. 9, the semiconductor wafer W is of, for example, a 200 mm or 300 mm diameter sliced thinly and rounded, and the peripheral edge is rounded and chamfered. Until the polishing step and the cleaning step are completed, the substrate is immersed in a liquid stored in the water tank, for example, a wet securing liquid.

一対の側板2は、図1、図2、図6に示すように、その内面に半導体ウェーハWの周縁部両側を略水平に点接触で支持する左右一対のティース3が配設され、この左右一対のティース3が側板2の上下方向に所定のピッチで並設されており、各側板2が断面略円弧形に形成される。各側板2における複数のティース3は、その間が底面の傾斜した整列溝4に形成され、各ティース3が細長い先細りの断面略三角形に形成される。   As shown in FIGS. 1, 2, and 6, the pair of side plates 2 is provided with a pair of left and right teeth 3 that support both sides of the periphery of the semiconductor wafer W in a substantially horizontal point contact manner. A pair of teeth 3 are arranged in parallel in the vertical direction of the side plate 2 at a predetermined pitch, and each side plate 2 is formed in a substantially circular arc shape in cross section. A plurality of teeth 3 in each side plate 2 are formed in an alignment groove 4 having an inclined bottom surface between them, and each tooth 3 is formed in a substantially triangular shape having an elongated and tapered shape.

相対する一対のティース3と起立した半導体ウェーハWとの接触点を通る直線SLは、図7に示すように半導体ウェーハWの中心Wcよりも下方に位置し、起立した半導体ウェーハWの周縁部下端がその厚さ方向、言い換えれば、複数枚の半導体ウェーハWの整列方向にスライドしたり、揺動するのを容易化する。   A straight line SL passing through the contact point between the pair of teeth 3 and the standing semiconductor wafer W is located below the center Wc of the semiconductor wafer W as shown in FIG. However, it is easy to slide or swing in the thickness direction, in other words, the alignment direction of the plurality of semiconductor wafers W.

底板5と天板6との間には図1、図2、図5、図6に示すように、背面の開口を周方向に分割する細長い一対の規制板7が並べて縦に架設され、この一対の規制板7の架設により、半導体ウェーハWの出し入れが不可能な流通口9が複数形成されており、この複数の流通口9が水槽の液体をウェーハカセット1の内外に流通させたり、半導体ウェーハW取り出し用の突き出し治具の進入を許容するよう機能する。   Between the bottom plate 5 and the top plate 6, as shown in FIGS. 1, 2, 5, and 6, a pair of elongate regulating plates 7 that divide the opening on the back surface in the circumferential direction are arranged side by side and are installed vertically. A plurality of flow ports 9 through which the semiconductor wafer W cannot be taken in and out are formed by installing the pair of regulating plates 7. The plurality of flow ports 9 allow the liquid in the water tank to flow inside and outside the wafer cassette 1, It functions to allow the protrusion jig for taking out the wafer W to enter.

各規制板7は、断面略円弧形の縦長に形成され、内面の上下方向には、一対のティース3に位置的に対応する複数の保持溝10が並べて形成されており、各保持溝10が半導体ウェーハWの周縁部奥側、言い換えれば、起立した半導体ウェーハWの周縁部下端を嵌合保持するよう機能する。   Each regulating plate 7 is formed in a vertically long shape having a substantially arc-shaped cross section, and a plurality of holding grooves 10 corresponding to the pair of teeth 3 are formed side by side in the vertical direction of the inner surface. Functions to fit and hold the lower end of the peripheral edge of the semiconductor wafer W, in other words, the lower end of the peripheral edge of the semiconductor wafer W standing up.

保持溝10は、図8や図9に示すように、単なる断面略U字形や略V字形ではなく、一対の傾斜面10a・10bが非対称の断面略V字形、換言すれば、傾斜した断面略L字形に形成されており、傾斜角が大きく緩やかな傾斜面10aに、僅かな傾斜角度で傾斜しながら起立した半導体ウェーハWの周縁部下端が点接触する。   As shown in FIG. 8 and FIG. 9, the holding groove 10 is not a simple U-shaped section or a substantially V-shaped section, but a pair of inclined surfaces 10 a and 10 b are asymmetrical sectional V-shapes. The lower end of the peripheral edge of the semiconductor wafer W that stands up while tilting at a slight tilt angle makes point contact with the inclined surface 10a that is formed in an L shape and has a large tilt angle.

複数の保持溝10は一対のティース3に位置的に対応するが、これら一対のティース3と複数の保持溝10は、図8に示すように、ウェーハカセット1が水平に置かれた際、一対のティース3により保持される半導体ウェーハWの厚さ方向の中心部CLが保持溝10の下方の谷部10cを通る鉛直線PLよりも僅かに傾斜角が小さく急峻な傾斜面10b側にずれるような位置関係を形成する。   The plurality of holding grooves 10 correspond in position to the pair of teeth 3, but the pair of teeth 3 and the plurality of holding grooves 10 are paired when the wafer cassette 1 is placed horizontally as shown in FIG. 8. The center portion CL in the thickness direction of the semiconductor wafer W held by the teeth 3 is slightly smaller in inclination angle than the vertical line PL passing through the trough portion 10c below the holding groove 10 and is shifted toward the steep inclined surface 10b side. A good positional relationship.

底板5と天板6とは、半導体ウェーハWよりも一回り大きい肉厚の略円板形に形成され、底板5には複数の位置決め具11が平面略Y字を描くよう一体形成されており、この複数の位置決め具11の凹んだV溝が半導体製造用の加工装置の位置決めピンに上方からそれぞれ嵌入支持されることにより、加工装置上にウェーハカセット1が位置決め固定される(図1、図4参照)。   The bottom plate 5 and the top plate 6 are formed in a substantially disc shape having a thickness slightly larger than the semiconductor wafer W, and a plurality of positioning tools 11 are integrally formed on the bottom plate 5 so as to draw a substantially Y-shaped plane. The recessed V-grooves of the plurality of positioning tools 11 are fitted and supported from above on the positioning pins of the processing apparatus for manufacturing semiconductors, whereby the wafer cassette 1 is positioned and fixed on the processing apparatus (FIGS. 1 and 2). 4).

上記において、ウェーハカセット1に半導体ウェーハWを収納する場合には、図1のウェーハカセット1の出し入れ口8に半導体ウェーハWを搬送ロボットにより挿入して左右一対のティース3に略水平に支持させ、各保持溝10に半導体ウェーハWの周縁部奥側(半導体ウェーハWが起立した場合の周縁部下端)を嵌合保持させれば、ウェーハカセット1に半導体ウェーハWを収納することができる。そして、この作業を繰り返すことにより、ウェーハカセット1に複数枚の半導体ウェーハWを縦一列に整列収納することができる。   In the above, when the semiconductor wafer W is stored in the wafer cassette 1, the semiconductor wafer W is inserted into the loading / unloading port 8 of the wafer cassette 1 of FIG. The semiconductor wafer W can be stored in the wafer cassette 1 by fitting and holding the rear side of the periphery of the semiconductor wafer W (the lower end of the periphery when the semiconductor wafer W stands up) in each holding groove 10. By repeating this operation, a plurality of semiconductor wafers W can be aligned and stored in the wafer cassette 1 in a vertical row.

また、水槽の液体中に半導体ウェーハWを図10に示すように浸漬する場合には、図1や図2のウェーハカセット1を横に寝かせて正面の出し入れ口8を上方に向け、縦一列に整列収納した複数枚の半導体ウェーハWの姿勢を横一列に変更して各半導体ウェーハWを縦に起立させ、水槽にウェーハカセット1を搬送して沈めれば、ウェーハカセット1の出し入れ口8や各流通口9から液体が流入し、液体に各半導体ウェーハWを浸漬することができる。   When the semiconductor wafer W is immersed in the liquid in the water tank as shown in FIG. 10, the wafer cassette 1 shown in FIG. If the postures of a plurality of aligned semiconductor wafers W are changed to a horizontal row, each semiconductor wafer W is raised vertically, and the wafer cassette 1 is transported and submerged in a water tank. A liquid flows in from the circulation port 9, and each semiconductor wafer W can be immersed in the liquid.

係るウェーハカセット1の搬送や沈降の際、起立した半導体ウェーハWは、振動や液体の液流で整列方向に揺れて大きく傾くことがあるが、ウェーハカセット1の静置に伴い縦に支持されることとなる。この点について説明すると、一対のティース3とこれら3に対応する複数の保持溝10の位置関係は、ウェーハカセット1が水平に置かれた際、一対のティース3により保持される半導体ウェーハWの厚さ方向の中心部CLが各保持溝10の谷部10cを通る鉛直線PLよりも急峻な傾斜面10b側にずれる関係となる。   When the wafer cassette 1 is transported or settled, the standing semiconductor wafer W may be greatly tilted by shaking in the alignment direction due to vibration or liquid flow, but is supported vertically as the wafer cassette 1 is left standing. It will be. Explaining this point, the positional relationship between the pair of teeth 3 and the plurality of holding grooves 10 corresponding to these three is the thickness of the semiconductor wafer W held by the pair of teeth 3 when the wafer cassette 1 is placed horizontally. The center portion CL in the vertical direction is shifted to the inclined surface 10b side steeper than the vertical line PL passing through the valley portion 10c of each holding groove 10.

係る関係により、整列方向に傾いた半導体ウェーハWは、保持溝10の急峻な傾斜面10bからなだらかな傾斜面10aに下端部が自然にずれて(図8の矢印参照)点接触し、円滑に位置決めガイドされることになるので、ウェーハカセット1の静置に伴い縦に支持される。   Due to such a relationship, the semiconductor wafer W inclined in the alignment direction has its lower end naturally deviated from the steep inclined surface 10b of the holding groove 10 to the gentle inclined surface 10a (see the arrow in FIG. 8), and is in point contact and smoothly. Since the positioning is guided, the wafer cassette 1 is supported vertically as the wafer cassette 1 is left stationary.

上記構成によれば、保持溝10の傾斜面10aが位置決め機能を発揮するので、複数枚の半導体ウェーハWの上部間の間隔が大きくばらついたり、隣接する半導体ウェーハWの上部同士が接触することがない。したがって、半導体ウェーハWの縦置き時におけるピッチ精度を大幅に向上させることができ、浸漬後の自動搬送が実に容易となる。また、各側板2における複数のティース3の間が単なるU字形の溝ではなく、底面の傾斜した整列溝4に形成されるので、側板2の厚さ方向に傾いた底面を利用して複数枚の半導体ウェーハWを整然と整列させることができる。   According to the above configuration, since the inclined surface 10a of the holding groove 10 exhibits a positioning function, the interval between the upper portions of the plurality of semiconductor wafers W may vary greatly, or the upper portions of adjacent semiconductor wafers W may contact each other. Absent. Therefore, it is possible to greatly improve the pitch accuracy when the semiconductor wafer W is vertically placed, and automatic conveyance after immersion is actually facilitated. Further, since the space between the plurality of teeth 3 in each side plate 2 is not a simple U-shaped groove, but is formed in an alignment groove 4 having an inclined bottom surface, a plurality of sheets are utilized by using the bottom surface inclined in the thickness direction of the side plate 2. The semiconductor wafers W can be aligned in an orderly manner.

さらに、ウェーハカセット1を縦横に使用可能な構造に構成し、しかも、底板5に複数の位置決め具11を配設するので、ウェーハカセット1の汎用性を高めたり、加工装置にウェーハカセット1を簡易に位置決め固定することができる。   Furthermore, since the wafer cassette 1 is configured in a structure that can be used vertically and horizontally and a plurality of positioning tools 11 are disposed on the bottom plate 5, the versatility of the wafer cassette 1 can be improved, and the wafer cassette 1 can be simplified in a processing apparatus. Can be positioned and fixed.

なお、上記実施形態ではPBT等の成形材料を使用してウェーハカセット1を射出成形したが、何らこれに限定されるものではなく、例えば組み立て式でも良い。また、ウェーハカセット1にRFIDシステムのRFタグを装着して半導体ウェーハWの自動識別に資するようにしても良い。   In the above-described embodiment, the wafer cassette 1 is injection-molded using a molding material such as PBT. However, the present invention is not limited to this, and may be an assembly type, for example. Further, an RFID tag of the RFID system may be attached to the wafer cassette 1 to contribute to automatic identification of the semiconductor wafer W.

また、左右一対のティース3に半導体ウェーハWの周縁部両側を点接触で支持させても良いが、起立した半導体ウェーハWの周縁部下端を容易にスライドさせることができるのであれば、半導体ウェーハWの周縁部両側を線接触で支持させても良い。また、ウェーハカセット1の底板5と天板6との間に一対の規制板7を並べて架設したが、何らこれに限定されるものではなく、必要に応じて規制板7を増減することも可能である。例えば、規制板7を1本とすることも可能である。   Further, both sides of the peripheral portion of the semiconductor wafer W may be supported by point contact between the pair of left and right teeth 3, but if the lower end of the peripheral portion of the standing semiconductor wafer W can be easily slid, the semiconductor wafer W You may support the peripheral part both sides by line contact. In addition, although a pair of restriction plates 7 are arranged side by side between the bottom plate 5 and the top plate 6 of the wafer cassette 1, the invention is not limited to this, and the restriction plates 7 can be increased or decreased as necessary. It is. For example, it is possible to use one restriction plate 7.

さらに、上記実施形態では前後の開口したウェーハカセット1を示したが、必ずしもこれに限定されるものではなく、上下の開口したウェーハカセット1でも良い。この場合には、相対向する左右一対の側板2と、この一対の側板2の前端部間に架設された正面板と、一対の側板2の後端部間に架設された背面板とを備え、開口した上部を半導体ウェーハW用の出し入れ口8とし、一対の側板2を、上方から下方に向かうに従い内方向に徐々に狭まる断面略く字形にそれぞれ屈曲形成してその下部を半導体ウェーハWの下部側に位置させるとともに、各側板2の内面に半導体ウェーハWの周縁部両側に沿いながら接触支持する複数のティース3を前後方向に所定のピッチで並設し、この複数のティース3の下部間を非対称の断面略V字形の保持溝10とすることができる。   Further, in the above embodiment, the front and rear opened wafer cassettes 1 are shown, but the present invention is not necessarily limited to this, and upper and lower opened wafer cassettes 1 may be used. In this case, a pair of left and right side plates 2 facing each other, a front plate constructed between the front end portions of the pair of side plates 2, and a back plate constructed between the rear end portions of the pair of side plates 2 are provided. The upper part of the opening is used as a loading / unloading port 8 for the semiconductor wafer W, and the pair of side plates 2 are bent in a substantially rectangular shape that gradually narrows inwardly from the upper side to the lower side. A plurality of teeth 3 that are positioned on the lower side and are in contact with and supported on the inner surface of each side plate 2 along both sides of the peripheral edge of the semiconductor wafer W are arranged in parallel at a predetermined pitch in the front-rear direction, and between the lower portions of the plurality of teeth 3 Can be a holding groove 10 having an asymmetric cross-section and a substantially V-shaped cross section.

本発明に係るウェーハカセットの実施形態を模式的に示す斜視説明図である。It is a perspective explanatory view showing typically an embodiment of a wafer cassette concerning the present invention. 本発明に係るウェーハカセットの実施形態を模式的に示す正面説明図である。It is front explanatory drawing which shows typically embodiment of the wafer cassette which concerns on this invention. 本発明に係るウェーハカセットの実施形態を模式的に示す平面説明図である。It is a plane explanatory view showing typically an embodiment of a wafer cassette concerning the present invention. 本発明に係るウェーハカセットの実施形態を模式的に示す底面説明図である。It is bottom explanatory drawing which shows typically embodiment of the wafer cassette which concerns on this invention. 本発明に係るウェーハカセットの実施形態を模式的に示す背面説明図である。It is back explanatory drawing which shows typically embodiment of the wafer cassette which concerns on this invention. 本発明に係るウェーハカセットの実施形態を模式的に示す断面説明図である。It is a section explanatory view showing typically an embodiment of a wafer cassette concerning the present invention. 本発明に係るウェーハカセットの実施形態における起立した半導体ウェーハの収納状態を模式的に示す説明図である。It is explanatory drawing which shows typically the accommodation state of the standing semiconductor wafer in embodiment of the wafer cassette which concerns on this invention. 本発明に係るウェーハカセットの実施形態におけるティース、保持溝、及び起立した半導体ウェーハとの関係を模式的に示す説明図である。It is explanatory drawing which shows typically the relationship between the teeth in the embodiment of the wafer cassette which concerns on this invention, a holding groove, and the standing semiconductor wafer. 本発明に係るウェーハカセットの実施形態における保持溝と起立した半導体ウェーハとの関係を模式的に示す説明図である。It is explanatory drawing which shows typically the relationship between the holding groove | channel and the standing semiconductor wafer in embodiment of the wafer cassette which concerns on this invention. 本発明に係るウェーハカセットの実施形態における起立した複数枚の半導体ウェーハの整列収納状態を模式的に示す説明図である。It is explanatory drawing which shows typically the alignment accommodation state of the several semiconductor wafer which stood up in embodiment of the wafer cassette which concerns on this invention.

符号の説明Explanation of symbols

1 ウェーハカセット
2 側板
3 ティース
4 整列溝
5 底板
6 天板
7 規制板
8 出し入れ口
9 流通口
10 保持溝
10a 傾斜面
10b 傾斜面
10c 谷部
11 位置決め具
CL 半導体ウェーハの厚さ方向の中心部
PL 保持溝の谷部を通る鉛直線
SL 直線
W 半導体ウェーハ
Wc 半導体ウェーハの中心
DESCRIPTION OF SYMBOLS 1 Wafer cassette 2 Side plate 3 Teeth 4 Alignment groove 5 Bottom plate 6 Top plate 7 Restriction plate 8 Inlet / outlet 9 Distribution port 10 Holding groove 10a Inclined surface 10b Inclined surface 10c Valley 11 Positioning tool CL Center part PL of semiconductor wafer thickness direction Vertical line SL passing through trough of holding groove Straight line W Semiconductor wafer Wc Center of semiconductor wafer

Claims (3)

半導体ウェーハを収納可能な間隔を空けて一対の側板を対向させ、この一対の側板の両端部間に第一、第二の対向板をそれぞれ架設して相対する一対の開口を形成し、この一対の開口のうち一方の開口を半導体ウェーハの出し入れが可能な出し入れ口とするとともに、他方の開口を半導体ウェーハの出し入れが不可能な大きさに形成して液体用の流通口とし、出し入れ口から収納した複数枚の半導体ウェーハを起立させた状態で液体中に浸されるウェーハカセットであって、
一対の側板にそれぞれ形成され、半導体ウェーハの周縁部両側を支持する複数のティースと、起立した半導体ウェーハの周縁部下端を保持する保持溝とを含み、複数のティースと起立した半導体ウェーハとの接触点を通る直線を半導体ウェーハの中心よりも下方に位置させ、保持溝を非対称の断面略V字形に形成してその傾斜角の大きい傾斜面に起立した半導体ウェーハの周縁部下端を接触させるようにしたことを特徴とするウェーハカセット。
A pair of side plates are opposed to each other with an interval capable of accommodating a semiconductor wafer, and first and second opposing plates are respectively installed between both ends of the pair of side plates to form a pair of opposed openings. One of the openings is used as a loading / unloading port where a semiconductor wafer can be taken in and out, and the other opening is formed into a size that prevents the semiconductor wafer from being taken in and out to serve as a liquid circulation port, and is stored from the loading / unloading port. A wafer cassette immersed in a liquid in a state where a plurality of semiconductor wafers are erected,
Each of the pair of side plates includes a plurality of teeth that support both sides of the peripheral edge of the semiconductor wafer and a holding groove that holds a lower end of the peripheral edge of the semiconductor wafer, and the contact between the plurality of teeth and the semiconductor wafer rising A straight line passing through the point is positioned below the center of the semiconductor wafer, and the holding groove is formed in a substantially V-shaped asymmetric cross section so that the lower end of the peripheral edge of the semiconductor wafer standing on the inclined surface having a large inclination angle is brought into contact A wafer cassette characterized by that.
一対の側板の下端部間に第一の対向板を架設して底板とし、一対の側板の上端部間に第二の対向板を架設して天板とし、正面を出し入れ口とするとともに、背面を流通口とした請求項1記載のウェーハカセット。   A first counter plate is installed between the lower ends of the pair of side plates as a bottom plate, a second counter plate is installed between the upper ends of the pair of side plates as a top plate, and the front is used as the entrance and exit. The wafer cassette according to claim 1, wherein the outlet is a distribution port. 第一、第二の対向板の間に、他方の開口を分割する規制板を架設することにより流通口を形成し、規制板の内面に複数の保持溝を並べて形成した請求項1又は2記載のウェーハカセット。   The wafer according to claim 1 or 2, wherein a flow opening is formed by laying a restriction plate that divides the other opening between the first and second opposing plates, and a plurality of holding grooves are arranged on the inner surface of the restriction plate. cassette.
JP2006293939A 2006-10-30 2006-10-30 Wafer cassette Expired - Fee Related JP4832252B2 (en)

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CN111243998A (en) * 2020-03-13 2020-06-05 北京市塑料研究所 Silicon wafer loader for preventing silicon wafers from being adhered
JP2020111424A (en) * 2019-01-10 2020-07-27 トヨタ紡織株式会社 Transferring device for workpieces
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JP2002029006A (en) * 2000-07-14 2002-01-29 Nippon Futsuso Kogyo Kk Laminated structure, support fixture, tank, stirring container, and method for manufacturing laminated structure
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CN107742615A (en) * 2017-11-16 2018-02-27 无锡麟力科技有限公司 Integrated antenna package intellectuality tool structure
CN107742615B (en) * 2017-11-16 2024-03-29 无锡麟力科技有限公司 Intelligent tool structure for integrated circuit packaging
JP2020111424A (en) * 2019-01-10 2020-07-27 トヨタ紡織株式会社 Transferring device for workpieces
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