JP2008089521A5 - - Google Patents

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Publication number
JP2008089521A5
JP2008089521A5 JP2006273442A JP2006273442A JP2008089521A5 JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5 JP 2006273442 A JP2006273442 A JP 2006273442A JP 2006273442 A JP2006273442 A JP 2006273442A JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5
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JP
Japan
Prior art keywords
sample
light
light signal
analyzing
faint
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JP2006273442A
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English (en)
Japanese (ja)
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JP5424528B2 (ja
JP2008089521A (ja
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Priority to JP2006273442A priority Critical patent/JP5424528B2/ja
Priority claimed from JP2006273442A external-priority patent/JP5424528B2/ja
Publication of JP2008089521A publication Critical patent/JP2008089521A/ja
Publication of JP2008089521A5 publication Critical patent/JP2008089521A5/ja
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Publication of JP5424528B2 publication Critical patent/JP5424528B2/ja
Expired - Fee Related legal-status Critical Current
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JP2006273442A 2006-10-04 2006-10-04 微弱光サンプルの解析方法および装置 Expired - Fee Related JP5424528B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006273442A JP5424528B2 (ja) 2006-10-04 2006-10-04 微弱光サンプルの解析方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006273442A JP5424528B2 (ja) 2006-10-04 2006-10-04 微弱光サンプルの解析方法および装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2013143976A Division JP5726956B2 (ja) 2013-07-09 2013-07-09 微弱光サンプルの解析方法および装置

Publications (3)

Publication Number Publication Date
JP2008089521A JP2008089521A (ja) 2008-04-17
JP2008089521A5 true JP2008089521A5 (fr) 2009-11-26
JP5424528B2 JP5424528B2 (ja) 2014-02-26

Family

ID=39373824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006273442A Expired - Fee Related JP5424528B2 (ja) 2006-10-04 2006-10-04 微弱光サンプルの解析方法および装置

Country Status (1)

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JP (1) JP5424528B2 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5302063B2 (ja) * 2009-03-24 2013-10-02 オリンパス株式会社 微弱光および高強度光の画像を撮像可能な顕微鏡撮像装置
JP5466976B2 (ja) * 2010-03-19 2014-04-09 オリンパス株式会社 顕微鏡システム、観察画像の表示方法、プログラム
JP5684020B2 (ja) * 2011-03-24 2015-03-11 オリンパス株式会社 正立型イメージング装置
JP6253225B2 (ja) * 2012-09-18 2017-12-27 オリンパス株式会社 顕微鏡システムおよび顕微鏡観察方法
WO2016117089A1 (fr) 2015-01-22 2016-07-28 オリンパス株式会社 Procédé de production d'image tridimensionnelle émettant de la lumière et système d'imagerie
WO2016189628A1 (fr) * 2015-05-25 2016-12-01 オリンパス株式会社 Procédé de mesure de luminescence

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9014570D0 (en) * 1990-06-29 1990-08-22 Dixon Arthur E Method for transmitted-light and reflected-light imaging
JP2000089124A (ja) * 1998-09-14 2000-03-31 Nikon Corp 複合顕微鏡
JP2000180728A (ja) * 1998-12-10 2000-06-30 Japan Science & Technology Corp 二方位蛍光測光多光子励起レ―ザ顕微鏡
JP3902939B2 (ja) * 2001-10-26 2007-04-11 株式会社日立ハイテクノロジーズ 標本中の微小領域測定装置及び方法
JP4603283B2 (ja) * 2004-04-14 2010-12-22 オリンパス株式会社 システム顕微鏡
EP1816503B1 (fr) * 2004-11-26 2017-11-08 Olympus Corporation Procédé d'imagerie d'échantillon luminescent
CN102156346B (zh) * 2005-02-21 2012-07-18 奥林巴斯株式会社 微弱光标本摄像单元及微弱光标本摄像装置

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