JP2008089521A5 - - Google Patents

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JP2008089521A5
JP2008089521A5 JP2006273442A JP2006273442A JP2008089521A5 JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5 JP 2006273442 A JP2006273442 A JP 2006273442A JP 2006273442 A JP2006273442 A JP 2006273442A JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5
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Japan
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sample
light
light signal
analyzing
faint
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JP2006273442A
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Japanese (ja)
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JP5424528B2 (en
JP2008089521A (en
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Priority claimed from JP2006273442A external-priority patent/JP5424528B2/en
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Publication of JP2008089521A5 publication Critical patent/JP2008089521A5/ja
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Claims (6)

微弱光を発生し且つ複数の測定部位を有する厚みのある生きたサンプルに対して測定部位ごとに異なる位置から微弱光シグナルを取得する工程と、
取得した複数の測定部位ごとの画像情報に基づいてサンプルの微弱光による解析を行う工程とを有し、
前記微弱光シグナルの取得は、複数の測定部位のそれぞれについて複数回繰り返すとともに、
前記解析工程は、取得された複数回の微弱光シグナルに基づいて前記サンプルの所望の測定部位に関する時系列な解析結果を得ることを特徴とする微弱光サンプルの解析方法。 Acquiring a weak light signal from a different position for each measurement site with respect to a thick live sample that generates weak light and has a plurality of measurement sites;
A step of analyzing the sample by weak light based on the acquired image information for each of the plurality of measurement sites ,
The acquisition of the weak light signal is repeated multiple times for each of a plurality of measurement sites,
The method for analyzing a faint light sample, wherein the analyzing step obtains a time-series analysis result relating to a desired measurement site of the sample based on a plurality of times the faint light signal acquired . 厚みのある立体的なサンプルの複数の測定部位に対し異なる角度から微弱光シグナルを取得することを特徴とする請求項１に記載の微弱光サンプルの解析方法。 2. The method for analyzing a faint light sample according to claim 1, wherein the faint light signal is acquired from different angles with respect to a plurality of measurement sites of a thick three-dimensional sample . 厚みのある透明度が低いサンプルの局所的な複数の測定部位と該測定部位を含む広範囲な測定部位のそれぞれに対応する位置から微弱光シグナルを取得することを特徴とする請求項１に記載の微弱光サンプルの解析方法。 2. The feeble light signal according to claim 1, wherein a faint light signal is acquired from a position corresponding to each of a plurality of local measurement sites and a wide range of measurement sites including the measurement site of a sample having a low thickness and transparency. Analysis method for optical samples. 前記生きたサンプルは、胚または組織である請求項１から３のいずれかに記載の微弱光サンプルの解析方法。 The method for analyzing a faint light sample according to claim 1, wherein the living sample is an embryo or a tissue. 前記解析方法を実行する装置であって、前記サンプルから微弱光シグナルを取得するために異なる位置に配置された複数の対物レンズと、An apparatus for performing the analysis method, wherein a plurality of objective lenses arranged at different positions to acquire a weak light signal from the sample;
前記対物レンズからの光を結像する結像レンズと、An imaging lens for imaging light from the objective lens;
前記結像レンズからの光シグナルを受光する光検出手段と、A light detecting means for receiving a light signal from the imaging lens;
前記光検出手段からの光シグナルに基づいて解析を行なう解析手段とを備えることを特徴とする微弱光サンプルの解析装置。An analysis device for weak light samples, comprising: analysis means for performing analysis based on a light signal from the light detection means. 光学条件が、開口数（NA）／投影倍率（β）の２乗で表される光学条件が０．０１以上である請求項５に記載の微弱光サンプルの解析装置。6. The apparatus for analyzing a faint light sample according to claim 5, wherein the optical condition is an optical condition expressed by the square of numerical aperture (NA) / projection magnification (β) of 0.01 or more.
JP2006273442A 2006-10-04 2006-10-04 Method and apparatus for analyzing faint light sample Expired - Fee Related JP5424528B2 (en)

Priority Applications (1)

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JP2006273442A JP5424528B2 (en) 2006-10-04 2006-10-04 Method and apparatus for analyzing faint light sample

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JP2006273442A JP5424528B2 (en) 2006-10-04 2006-10-04 Method and apparatus for analyzing faint light sample

Related Child Applications (1)

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JP2013143976A Division JP5726956B2 (en) 2013-07-09 2013-07-09 Method and apparatus for analyzing faint light sample

Publications (3)

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JP2008089521A JP2008089521A (en) 2008-04-17
JP2008089521A5 true JP2008089521A5 (en) 2009-11-26
JP5424528B2 JP5424528B2 (en) 2014-02-26

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5302063B2 (en) * 2009-03-24 2013-10-02 オリンパス株式会社 Microscope imaging device capable of taking images of weak light and high intensity light
JP5466976B2 (en) * 2010-03-19 2014-04-09 オリンパス株式会社 Microscope system, observation image display method, program
JP5684020B2 (en) * 2011-03-24 2015-03-11 オリンパス株式会社 Upright imaging device
JP6253225B2 (en) * 2012-09-18 2017-12-27 オリンパス株式会社 Microscope system and microscope observation method
WO2016117089A1 (en) 2015-01-22 2016-07-28 オリンパス株式会社 Method for generating three-dimensional light-emitting image, and imaging system
JPWO2016189628A1 (en) * 2015-05-25 2018-03-08 オリンパス株式会社 Luminescence measurement method

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9014570D0 (en) * 1990-06-29 1990-08-22 Dixon Arthur E Method for transmitted-light and reflected-light imaging
JP2000089124A (en) * 1998-09-14 2000-03-31 Nikon Corp Compound microscope
JP2000180728A (en) * 1998-12-10 2000-06-30 Japan Science & Technology Corp Double oriented fluorescent photometric multiple photon exciting laser microscope
JP3902939B2 (en) * 2001-10-26 2007-04-11 株式会社日立ハイテクノロジーズ Apparatus and method for measuring minute area in specimen
JP4603283B2 (en) * 2004-04-14 2010-12-22 オリンパス株式会社 System microscope
CN102156345A (en) * 2004-11-26 2011-08-17 奥林巴斯株式会社 Luminescent sample imaging method, luminescent cell imaging method and objective lens
CN102156346B (en) * 2005-02-21 2012-07-18 奥林巴斯株式会社 Weak-light specimen imaging unit and weak-light specimen imaging device

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