JP2008089521A5 - - Google Patents
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- JP2008089521A5 JP2008089521A5 JP2006273442A JP2006273442A JP2008089521A5 JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5 JP 2006273442 A JP2006273442 A JP 2006273442A JP 2006273442 A JP2006273442 A JP 2006273442A JP 2008089521 A5 JP2008089521 A5 JP 2008089521A5
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- JP
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- Prior art keywords
- sample
- light
- light signal
- analyzing
- faint
- Prior art date
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Claims (6)
取得した複数の測定部位ごとの画像情報に基づいてサンプルの微弱光による解析を行う工程とを有し、
前記微弱光シグナルの取得は、複数の測定部位のそれぞれについて複数回繰り返すとともに、
前記解析工程は、取得された複数回の微弱光シグナルに基づいて前記サンプルの所望の測定部位に関する時系列な解析結果を得ることを特徴とする微弱光サンプルの解析方法。 Acquiring a weak light signal from a different position for each measurement site with respect to a thick live sample that generates weak light and has a plurality of measurement sites;
A step of analyzing the sample by weak light based on the acquired image information for each of the plurality of measurement sites ,
The acquisition of the weak light signal is repeated multiple times for each of a plurality of measurement sites,
The method for analyzing a faint light sample, wherein the analyzing step obtains a time-series analysis result relating to a desired measurement site of the sample based on a plurality of times the faint light signal acquired .
前記対物レンズからの光を結像する結像レンズと、An imaging lens for imaging light from the objective lens;
前記結像レンズからの光シグナルを受光する光検出手段と、A light detecting means for receiving a light signal from the imaging lens;
前記光検出手段からの光シグナルに基づいて解析を行なう解析手段とを備えることを特徴とする微弱光サンプルの解析装置。An analysis device for weak light samples, comprising: analysis means for performing analysis based on a light signal from the light detection means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006273442A JP5424528B2 (en) | 2006-10-04 | 2006-10-04 | Method and apparatus for analyzing faint light sample |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006273442A JP5424528B2 (en) | 2006-10-04 | 2006-10-04 | Method and apparatus for analyzing faint light sample |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013143976A Division JP5726956B2 (en) | 2013-07-09 | 2013-07-09 | Method and apparatus for analyzing faint light sample |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2008089521A JP2008089521A (en) | 2008-04-17 |
JP2008089521A5 true JP2008089521A5 (en) | 2009-11-26 |
JP5424528B2 JP5424528B2 (en) | 2014-02-26 |
Family
ID=39373824
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006273442A Expired - Fee Related JP5424528B2 (en) | 2006-10-04 | 2006-10-04 | Method and apparatus for analyzing faint light sample |
Country Status (1)
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JP (1) | JP5424528B2 (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5302063B2 (en) * | 2009-03-24 | 2013-10-02 | オリンパス株式会社 | Microscope imaging device capable of taking images of weak light and high intensity light |
JP5466976B2 (en) * | 2010-03-19 | 2014-04-09 | オリンパス株式会社 | Microscope system, observation image display method, program |
JP5684020B2 (en) * | 2011-03-24 | 2015-03-11 | オリンパス株式会社 | Upright imaging device |
JP6253225B2 (en) * | 2012-09-18 | 2017-12-27 | オリンパス株式会社 | Microscope system and microscope observation method |
WO2016117089A1 (en) | 2015-01-22 | 2016-07-28 | オリンパス株式会社 | Method for generating three-dimensional light-emitting image, and imaging system |
JPWO2016189628A1 (en) * | 2015-05-25 | 2018-03-08 | オリンパス株式会社 | Luminescence measurement method |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9014570D0 (en) * | 1990-06-29 | 1990-08-22 | Dixon Arthur E | Method for transmitted-light and reflected-light imaging |
JP2000089124A (en) * | 1998-09-14 | 2000-03-31 | Nikon Corp | Compound microscope |
JP2000180728A (en) * | 1998-12-10 | 2000-06-30 | Japan Science & Technology Corp | Double oriented fluorescent photometric multiple photon exciting laser microscope |
JP3902939B2 (en) * | 2001-10-26 | 2007-04-11 | 株式会社日立ハイテクノロジーズ | Apparatus and method for measuring minute area in specimen |
JP4603283B2 (en) * | 2004-04-14 | 2010-12-22 | オリンパス株式会社 | System microscope |
CN102156345A (en) * | 2004-11-26 | 2011-08-17 | 奥林巴斯株式会社 | Luminescent sample imaging method, luminescent cell imaging method and objective lens |
CN102156346B (en) * | 2005-02-21 | 2012-07-18 | 奥林巴斯株式会社 | Weak-light specimen imaging unit and weak-light specimen imaging device |
-
2006
- 2006-10-04 JP JP2006273442A patent/JP5424528B2/en not_active Expired - Fee Related
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