JP2008078361A - 半導体集積回路装置 - Google Patents
半導体集積回路装置 Download PDFInfo
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- JP2008078361A JP2008078361A JP2006255424A JP2006255424A JP2008078361A JP 2008078361 A JP2008078361 A JP 2008078361A JP 2006255424 A JP2006255424 A JP 2006255424A JP 2006255424 A JP2006255424 A JP 2006255424A JP 2008078361 A JP2008078361 A JP 2008078361A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 33
- 239000000758 substrate Substances 0.000 description 18
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 4
- 229920005591 polysilicon Polymers 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 3
- 230000005669 field effect Effects 0.000 description 3
- 238000002955 isolation Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/58—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
- H01L23/585—Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries comprising conductive layers or plates or strips or rods or rings
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/0611—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region
- H01L27/0617—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type
- H01L27/0629—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration integrated circuits having a two-dimensional layout of components without a common active region comprising components of the field-effect type in combination with diodes, or resistors, or capacitors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/0684—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions characterised by the shape, relative sizes or dispositions of the semiconductor regions or junctions between the regions
- H01L29/0692—Surface layout
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/8611—Planar PN junction diodes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
【構成】一方の導電型を有する主領域に形成されている少なくとも1つMOSトランジスタと、前記主領域に接しつつ前記MOSトランジスタの周りに形成され、前記一方の導電型を有するガードリング領域と、を含む半導体集積回路装置であり、前記主領域に接しつつ前記ガードリング領域に対向して形成され、他方の導電型を有するアノード領域と、前記ガードリング領域の少なくとも1部からなるカソード領域とを含み、前記アノード領域と前記主領域と前記カソード領域とがダイオードを形成する。
【選択図】図1
Description
<第1の実施例>
図2は、本発明の第1の実施例を示し、半導体集積回路装置を上方から見た平面図を示している。半導体集積回路装置10は、いわゆるLSI(Large Scale Integrated Circuit)を構成し、多様な機能を実現するためにPMOSトランジスタやNMOSトランジスタの如き多数の半導体素子がP型基板20上に形成されていて、特に、図示される1つの出力トランジスタとしてPMOSトランジスタ70がP型基板20上でNウェル30を介して形成されている。PMOSトランジスタ70は、出力端子を介して外部と電気的に接続されることが想定され、ESD保護対策が必要となる。
<第2の実施例>
図5は、本発明の第2の実施例を示し、半導体集積回路装置を上方から見た平面図を示している。半導体集積回路装置10は、第1の実施例と同様に、1つの出力トランジスタとしてPMOSトランジスタ70がP型基板20上でNウェル30を介して形成されている。PMOSトランジスタ70は、出力端子を介して外部と電気的に接続されることが想定され、ESD保護対策が必要となる。
20 P型基板
21 P型基板ガードリング
30 Nウェル
40 N型ガードリング
41、42 N型高濃度領域
50 アノード領域
51 P型高濃度領域
60、61 保護ダイオード
70 PMOSトランジスタ
71 ポリシリコン領域
72、73 P型高濃度領域
74 ドリフト領域
80 NMOSトランジスタ
L 対向長
Claims (4)
- 一方の導電型を有する主領域に形成されている少なくとも1つMOSトランジスタと、前記主領域に接しつつ前記MOSトランジスタの周りに形成され、前記一方の導電型を有するガードリング領域と、を含む半導体集積回路装置であって、
前記主領域に接しつつ前記ガードリング領域に対向して形成され、他方の導電型を有するアノード領域と、
前記ガードリング領域の少なくとも1部からなるカソード領域と、を含み、
前記アノード領域と前記主領域と前記カソード領域とがダイオードを形成することを特徴とする半導体集積回路装置。 - 前記アノード領域は、前記MOSトランジスタと前記ガードリング領域との間に形成されることを特徴とする請求項1記載の半導体集積回路装置。
- 前記アノード領域は、前記MOSトランジスタのドレイン領域に電気的に接続されることを特徴とする請求項1記載の半導体集積回路装置。
- 前記アノード領域は、前記MOSトランジスタのドレイン領域に接して形成されていることを特徴とする請求項1記載の半導体集積回路装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006255424A JP2008078361A (ja) | 2006-09-21 | 2006-09-21 | 半導体集積回路装置 |
US11/781,326 US20080073721A1 (en) | 2006-09-21 | 2007-07-23 | Semiconductor integrated circuit device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006255424A JP2008078361A (ja) | 2006-09-21 | 2006-09-21 | 半導体集積回路装置 |
Publications (1)
Publication Number | Publication Date |
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JP2008078361A true JP2008078361A (ja) | 2008-04-03 |
Family
ID=39224024
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2006255424A Pending JP2008078361A (ja) | 2006-09-21 | 2006-09-21 | 半導体集積回路装置 |
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Country | Link |
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US (1) | US20080073721A1 (ja) |
JP (1) | JP2008078361A (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010182945A (ja) * | 2009-02-06 | 2010-08-19 | Oki Semiconductor Co Ltd | 半導体装置 |
CN108447861A (zh) * | 2017-01-25 | 2018-08-24 | 瑞萨电子株式会社 | 半导体器件 |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8537514B2 (en) | 2007-08-08 | 2013-09-17 | Sofics Bvba | Diode chain with guard-band |
US8164869B2 (en) * | 2007-08-08 | 2012-04-24 | Sofics Bvba | Diode chain with a guard-band |
US8344416B2 (en) | 2009-05-15 | 2013-01-01 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrated circuits using guard rings for ESD, systems, and methods for forming the integrated circuits |
US9209098B2 (en) * | 2011-05-19 | 2015-12-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | HVMOS reliability evaluation using bulk resistances as indices |
US9177924B2 (en) * | 2013-12-18 | 2015-11-03 | Taiwan Semiconductor Manufacturing Company Limited | Vertical nanowire transistor for input/output structure |
CN111313393B (zh) * | 2016-05-03 | 2022-07-12 | 联咏科技股份有限公司 | 具有静电放电保护功能的输出电路 |
US10637235B2 (en) * | 2016-05-03 | 2020-04-28 | Novatek Microelectronics Corp. | Output circuit with ESD protection |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5838050A (en) * | 1996-06-19 | 1998-11-17 | Winbond Electronics Corp. | Hexagon CMOS device |
KR100307554B1 (ko) * | 1998-06-30 | 2001-11-15 | 박종섭 | Esd 소자를 구비하는 반도체장치 |
US6777721B1 (en) * | 2002-11-14 | 2004-08-17 | Altera Corporation | SCR device for ESD protection |
-
2006
- 2006-09-21 JP JP2006255424A patent/JP2008078361A/ja active Pending
-
2007
- 2007-07-23 US US11/781,326 patent/US20080073721A1/en not_active Abandoned
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010182945A (ja) * | 2009-02-06 | 2010-08-19 | Oki Semiconductor Co Ltd | 半導体装置 |
CN108447861A (zh) * | 2017-01-25 | 2018-08-24 | 瑞萨电子株式会社 | 半导体器件 |
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US20080073721A1 (en) | 2008-03-27 |
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