JP2008070290A - Apparatus for measuring light distribution characteristics - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a space-saving apparatus with a mechanism for rotating a light emission source sample to be measured by 360 degrees and capable of measuring three-dimensional light distribution characteristics by moving an optical receiver with respect to a Z-axis in one direction only by ±90 degrees. <P>SOLUTION: The apparatus includes a sample base 11; a sample base part 10; a rotating stage 30 for rotating the sample base part 10; a horizontal substrate 100 for mounting the rotating stage; a raised plate part 40 vertically raised over the horizontal substrate and provided with a rotatable bearing part; a rotating plate 50 capable of rotating by 180 degrees with the rotatable bearing part of the raised plate part as a fulcrum; the optical receiver 60 fastened to the surface of the rotating plate on the side of a measuring position point and capable of receiving axial rays from the measuring position point at a prescribed distance in a radial direction and measuring their intensity; and an imaging camera 70 for imaging the periphery of the light emission source sample. The optical receiver measures luminous intensity in spherical coordinates (a Z-axis direction δ>0) at the prescribed distance in a radial direction from the measuring position point of a light emission source and in a circumferential direction (θ) by rotating the rotating plate and the rotating stage. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

  The present invention sets a light emitting source sample having various electrode terminal shapes to be measured as a predetermined measurement position point, sets the measurement position point as the center of a spherical coordinate system, and emits light at a predetermined radial distance from the coordinate center. The present invention relates to an apparatus for measuring a three-dimensional light distribution characteristic indicating a relationship between a light emission direction of a sample and its intensity.

  Conventionally, an apparatus for measuring the light distribution characteristics of a light emitting source has been required to measure the light distribution characteristics in a wide solid angle range, for example, a solid angle range of a hemispherical coordinate system, for the intensity of light emitted from the light source.

  When measuring the light distribution characteristics, it is necessary to increase the distance between the light source and the measuring light receiver so that the light source can be regarded as a point light source. That is, it is necessary to set in advance a predetermined radial distance from the measurement position point of the light source to the light receiver.

  Therefore, in order to measure the three-dimensional light distribution characteristic, conventionally, the light receiver has to be moved in two directions. For example, the front direction of the light emitting surface is the Z axis, and there are a circumferential (θ) direction that rotates the light receiver around the Z axis, and an axis (Z) direction that moves the light receiver in the direction of the Z axis.

  A light receiver must be installed around the light source at a predetermined distance from the point, and the light receiver must rotate 360 degrees around the light source to measure the light intensity. The light distribution characteristic measuring apparatus has a problem of requiring a large space.

  In order to solve these problems, a plurality of light receiving portions are disposed at positions facing different radiation angles in advance (light receiving positions separated by the predetermined radial distance) with respect to the Z axis in the front direction of the light emitting surface. The invention is disclosed in Patent Document 1.

  In this invention, the light receiver is moved only 360 degrees in the circumferential direction, but there is a problem that a large space is required as a three-dimensional light distribution characteristic measuring apparatus.

  Conventionally, it has been difficult to understand where the center of the light emitting point is. Therefore, the measurement accuracy of the light distribution characteristics centered on the light emitting point is not good. Further, when considering the light distribution measurement of the LED, it may be said that the light distribution characteristic centered on the light emitting surface or the light distribution characteristic centered on the resin head (lens surface top). Although it is necessary to measure the light distribution characteristic centered on the part required for the purpose, there is a problem that is difficult in the conventional apparatus. Furthermore, there is a problem that it is difficult to measure the light distribution by selecting a part of the light emitting point and selecting the light distribution characteristic of the light emitted from only the part, for example, only a part of the organic EL that emits light in a large area.

Japanese Patent Laying-Open No. 2005-172665 (2nd page, FIG. 6)

  The present invention has a mechanism for rotating a light-emitting source sample to be measured by 360 degrees, and can save three-dimensional light distribution characteristics by moving the light receiver only by ± 90 degrees in one direction with respect to the Z axis. It is a first object to provide

  It is a second object of the present invention to provide a sample gripping mechanism that can be easily exchanged and attached in accordance with the shape of the luminescent source sample and the terminal structure.

  It is a third object of the present invention to provide an electrode terminal connection mechanism for a sample stage that holds various light-emitting source samples, and to provide a configuration for easy mounting and connection.

In order to solve the above problems, the light distribution characteristic measuring apparatus of the present invention sets a light emitting source sample of various electrode terminal shapes to be measured at a predetermined measurement position point, and sets the measurement position point as the center of a spherical coordinate system, An apparatus for measuring a three-dimensional light distribution characteristic indicating a relationship between a radiation direction of a light-emitting source sample at a predetermined radial direction distance from the coordinate center and its intensity,
A detachable and replaceable sample stage that grips corresponding to the various electrode terminals of the luminescent source sample, and a sample stage unit that connects an end of a cable that supplies power to the sample; and
A three-dimensional adjustment mechanism that mounts the sample stage, moves in the vertical (Z-axis) direction, left-right (X-axis) direction, and front-back (Y-axis) direction, and fixes the measurement position within the movable range; ,
A rotary stage that mounts a three-dimensional adjustment mechanism on which the sample stage is placed and rotates the sample stage 360 degrees around the Z axis that passes through the center of the measurement position of the gripped sample;
A horizontal substrate on which the rotary stage is mounted horizontally;
Standing vertically on the horizontal substrate, and a standing plate portion provided with a rotary bearing portion having the perpendicular direction as an axis at a position intersecting with the perpendicular from the measurement position center;
A rotating plate capable of rotating at least 180 degrees with the rotary bearing portion of the standing plate portion as a fulcrum;
A light receiver that is fixed on the surface of the rotating plate on the measurement position point side, receives a radiation beam from the measurement position point at the predetermined radial distance, and can measure the intensity;
A camera device for imaging the periphery of the luminescent source sample,
The rotating plate is rotated, the camera device is horizontally oriented, the Z-axis direction is adjusted by the three-dimensional adjusting mechanism, the height position of the measurement position point is set, and then the rotating plate is rotated 90 degrees. Rotate and adjust the X and Y axis directions with the camera device in the vertical direction, set according to the measurement position point,
The light receiver in the spherical coordinates (Z-axis direction δ> 0) and the circumferential direction (θ) of the predetermined radial distance from the measurement position point of the light emitting source is rotated by rotating the rotating plate and the rotating stage, respectively. It is characterized by measuring with.

  The light source sample is a light emitting diode (LED) or an assembly thereof.

In addition, the light source sample is a light emitting diode (LED), and when the sample stage grips the LED,
(1) When the anode and cathode terminals of the LED are on both sides, the movable plate is sandwiched between the fixed plate connected to one of the input terminals and the movable plate connected to the other of the input terminals. Using a side contact type sample table that is connected by applying contact pressure to
(2) When the anode and cathode terminals of the LED are at both ends of the same side, electrodes are arranged opposite to the terminals at both ends, and each is connected by applying contact pressure to the movable electrode plate connected to the input terminal. Using a side view type sample stage,
(3) When the anode / cathode terminal of the LED is at both ends of the back surface, electrodes are arranged opposite to both ends, and they are exhausted from the suction piping connection port to the attracted electrode plate connected to the input terminal. Using an adsorption-type sample table that is connected by applying contact pressure,
(4) When the LED is bullet-shaped and the anode / cathode terminal is composed of lead wires, the lead wire connected to the input terminal is inserted into the two tunnel electrodes corresponding to both lead wires, and the LED A bullet-type LED sample stage is used, which is connected by contact pressure between each lead wire and the tunnel electrode by covering a hollow disk from above.

  The three-dimensional adjustment mechanism includes a Z-axis stage including a Z-axis direction adjustment micrometer and an XY stage including an X-direction adjustment micrometer and a Y-direction adjustment micrometer.

  The rotating stage further includes a stepping motor for rotating the stage on the horizontal substrate.

  The present invention has the following effects. That is, by arranging a rotation stage that can rotate 360 degrees on the sample stage side that holds the light source sample, the light receiver moves in one direction (with respect to the Z axis in the front direction of the light emitting surface of the light source sample). Since the three-dimensional light distribution characteristic measurement can be performed only by moving the radiation angle range of ± 90 degrees, it is possible to obtain a device having a space of 1/2 of the conventional one.

  In addition, since the sample stage mounted on the rotary stage has a mechanism that can be exchanged while holding the sample, the light distribution characteristics of each sample can be efficiently measured by replacing the light source sample. In particular, even when the arrangement and structure of the electrode terminals of the sample are different, since various sample stands corresponding to the sample can be provided, the replacement can be easily performed.

  In addition, when setting the light source sample (LED) on the sample stage corresponding to various electrode terminals, the connection between the electrode terminal (anode terminal, cathode terminal) and the input terminal of the sample stage is detachable, At the same time, it is possible to replace the three-dimensional adjustment mechanism on which the sample stage is mounted, so that the measurement work can be performed efficiently. That is, it does not require the trouble of connecting and removing the soldering electrodes as in the prior art.

  In addition, the measurement position point can be arbitrarily set before measurement by a three-dimensional adjustment mechanism on which a light source sample to be measured, particularly a sample stage for holding an LED, is mounted. When the light-emitting source sample (LED) is set on a sample stage corresponding to various electrode terminals, the measurement position point of the light emitter can be finely adjusted each time it is set. For this reason, light-emitting source samples (LEDs) having different shapes and electrode arrangements can be easily and efficiently measured.

  In addition, since an imaging camera is provided in parallel with the light receiver, it is possible to simultaneously acquire the light distribution characteristic measurement value data together with the image data of the light source sample (LED), so that the image data and the light distribution characteristic measurement data are obtained. Can be obtained.

  In addition, by providing an imaging camera, the image of the camera and the mark of the part that the detector is looking at are displayed simultaneously on the screen, and the mark is matched to the part to be measured, so that the measurement part can be accurately displayed. It is now possible to adjust the light distribution characteristics with high accuracy by knowing exactly where the light emission point is centered. For example, it is possible to measure light distribution characteristics centered on the light emitting surface, light distribution characteristics centered on the resin head (lens surface top), or light distribution characteristics centered on the part required by the purpose. .

  Furthermore, by exchanging the lens unit attached to the tip of the receiver (the direction facing the sample stage), it is possible to select a part of the light emission point and measure the light distribution characteristics of the light emitted from only that part. it can. For example, light distribution measurement can be performed by selecting only a part of the organic EL that shines in a large area.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 shows a perspective view of an embodiment of a light distribution characteristic measuring apparatus of the present invention, FIG. 2 (a) shows a front view thereof, and FIG. 1 (b) shows a side view thereof. Both are mounted on the horizontal substrate 100.

  In the figure, 1 is a light source sample, specifically a light emitting diode (LED). Reference numeral 10 denotes a sample stage, 11 denotes a sample stage (one-touch exchange type sample stage), and the sample stage 11 includes input terminals 11a and 11b for connecting cable ends for supplying power to the sample.

  Reference numeral 12 denotes a sample table one-touch receiving unit that can receive and fix the sample table 11 with one touch.

  Reference numeral 20 denotes a three-dimensional adjustment mechanism (XYZ stage), on which a sample table unit one-touch receiving unit 12 on which the sample table 11 is placed.

  The three-dimensional adjustment mechanism 20 includes a Z stage, an X stage, and a Y stage, and each stage can be moved in the Z axis direction and the XY axis direction by the micrometers 21a, 22a, and 23a.

  Reference numeral 30 denotes a rotation stage, on which the three-dimensional adjustment mechanism 20 is mounted and can be rotated 360 degrees around the Z axis. Accordingly, the sample stage 11 is also rotated 360 degrees.

  Reference numeral 30 a denotes a stepping motor that rotates the rotary stage 30. Reference numeral 40 denotes a plate-like standing plate portion standing on the horizontal substrate 100.

  As shown in the side view of FIG. 2B, the rotary bearing portion 40 a is provided on the standing plate portion 40.

  Reference numeral 50 denotes a rotating plate that rotates about the rotating shaft 50a. The rotation angle is rotated by an angle of ± 90 degrees or more with respect to the vertical direction with the vertical direction being 0 degrees. What can rotate about ± 110 degree | times is desirable.

  A light receiver 60 detects the light beam at the measurement position point with a line sensor with a spectroscope. Reference numeral 70 denotes an imaging camera, which is used for alignment of measurement position points of the light-emitting source sample 1 described later.

  The light receiver 60 and the imaging camera 70 are mounted on the rotating plate 50 and fixed.

  Next, the measurement position point will be described in detail below.

  A sample stage 11 on which a light emitting source sample 1 such as an LED is mounted is mounted on a rotary stage 30 via a three-dimensional adjustment mechanism 20 and is horizontally fixed on a horizontal substrate 100.

  With this structure, when the rotary stage 30 is rotated in the direction of 360 degrees θ with respect to the Z axis in the vertical direction, the X and Y stages X and Y are controlled by the X stage 22 and the Y stage 23 so that the light emission point to be measured of the light source sample 1 does not move. It is necessary to adjust the direction and move the light source sample 1 in the horizontal direction (see FIG. 3). The above is the alignment of the measurement position points in the X and Y directions.

  Further, with this structure, when the rotating plate 50 is rotated at least ± 110 degrees as described above and the imaging camera 70 is pointed toward the light source sample 1 in the horizontal direction, the light emission point to be measured of the light source sample 1 is exactly the horizontal position. The Z direction is adjusted by the Z stage 21 (see FIG. 4).

  The measurement position point in the XY plane coordinates of the light source sample 1 is determined by the movement in the horizontal plane direction by the X stage 22 and the Y stage 23, and the measurement position point in the Z axis coordinates is determined by the vertical adjustment by the Z stage 21.

  That is, the measurement position point can be set in advance before measurement by the three-dimensional adjustment mechanism 20 having three stages of XYZ.

  FIG. 3 is a view of the sample stage 10, the three-dimensional adjustment mechanism 20, and the rotary stage 30 on which the light emission source sample 1 is set from the upper surface of the imaging camera 70. The X stage and the Y stage are adjusted so that the light emitting point is aligned with the Z axis so that the center of the light emitting point is rotated even if the rotation axis (Z axis) of the rotary stage 30 is rotated in the direction of 360 degrees θ.

  FIG. 4 is a side view of the height of the sample stage 10 on which the light source sample 1 is set by the imaging camera 70.

The rotating plate 50 rotates with the rotating shaft 50a entering the rotating bearing portion 40a of the standing plate 40 as a fulcrum, and the imaging camera 70 faces in the horizontal direction. In this state, the height of the sample stage 10 is adjusted on the Z stage. By this adjustment, the height of the light emitting point from the horizontal substrate becomes the same as the height of the rotary bearing portion 40a, and it appears that the position of the light emitting point overlaps the center of the hole in the central portion of the rotary bearing portion 40a as shown in FIG. .

  When the position of the light emission point of the light source sample 1 is adjusted by the three-dimensional adjustment mechanism 20 shown in FIGS. 3 and 4 and set to the measurement position point, the perpendicular line from the light emission point to the rotating plate 50 is rotated. It passes through the center of the bearing portion 40a.

  5A shows the relationship between the rotating plate 50 and the imaging camera 70 and the light source sample 1 (LED) when the light source sample 1 (LED) is adjusted in the XY direction. The central axis of the imaging camera 70 coincides with a vertical rotation axis (Z axis) passing through the light source sample 1 (LED).

  FIG. 5B shows the relationship between the rotating plate 50 and the imaging camera 70 and the light source sample 1 (LED) when the light source sample 1 (LED) is adjusted in the Z direction. The central axis of the imaging camera 70 is a horizontal line and passes through the light emitting surface of the light source sample 1 (LED).

  Next, an operation in the case where the light source sample 1 is measured one after another in the sample stage 11 having a gripping structure corresponding to various electrode terminals of the light source sample 1 (LED) will be described.

  In addition, the specific structure of various electrode terminals, such as the light emission source sample 1 (LED), is mentioned later. In any case, the sample stage 11 is detachably attached to the sample stage part one-touch receiving part 12, and the light source sample 1 can be exchanged without soldering.

  When the set light source sample 1 is replaced with another light source sample 1 on the sample stage 11, even if the measurement position point of the light source sample 1 may be different due to a mechanical accuracy error, FIG. Move to the correct position by setting the measurement position point as shown in.

When the sample stage 11 is changed corresponding to the electrode structure (arrangement) of the light source sample 1 (LED) and the other sample stage 11 is exchanged with one touch, the measurement of the light source sample 1 (LED) is performed. Since the position points are naturally different, it is necessary to set the measurement position points as shown in FIG.

  Next, a measurement operation when the light emitting source sample 1 (LED) is set as a measurement position point will be described with reference to FIG.

In FIG. 6, the Z axis is the vertical direction passing through the measurement position point. The Z-axis is first matched with the light-receiving axis of the light receiver 60, and the intensity of the light is measured (in this case, naturally, even if the rotary stage 30 is rotated).

  Next, measurement is performed by rotating the light receiver 60 to a position away from the Z axis by an angle δ with the light emitting point of the light source sample 1 as the center of the spherical coordinate. The light intensity is measured by the light receiver 60 at every predetermined angle by rotating at least 90 degrees or more. At that time, the rotary stage 30 is rotated 360 degrees in the θ direction for each angle, and the light intensity is measured by the light receiver 60 for each predetermined angle θ.

The light intensity I is represented by a function based on coordinate parameters determined by (δ, θ) at a predetermined radial distance R from the center.
I = f (R, δ, θ)

  Based on FIGS. 7 to 10, a sample stage 11 having a mechanism for holding the light-emitting source sample 1 corresponding to various electrode terminals will be described.

  FIG. 7 shows a sample stage 11-1 (side contact type sample stage) of LED 1 in which the electrode terminals of the anode and the cathode are provided on both sides of the cube. 7A shows an LED 1 provided with an anode terminal 1a and a cathode terminal 1b on both side surfaces, and FIG. 7B is a perspective view of a sample stage 11-1 on which the LED 1 is set. c) shows an AA ′ cross-sectional view along the Z-axis of (b).

  In FIG. 7C, 11x is a fixed terminal plate, 11y is a movable terminal plate, 11c is a compression spring, and 11d is an open piston. When the open piston 11d is pushed in, the movable terminal plate 11y moves to the left, and the fixed terminal plate 11x and the movable terminal 11y are separated from the anode terminal 1a and cathode terminal 1b of the LED 1, and the LED 1 can be taken out.

  In a natural state in which the release piston 11d is released, the movable terminal plate 11y is automatically narrowed by the compression spring 11c, and contacts the electrode terminals 1a and 1b of the LED 1.

  Reference numerals 11a and 11b are input terminals connected to the power supply cable, and are connected to 11x and 11y, respectively. With this structure, work efficiency is improved because soldering is not required for the replacement measurement of the LED 1.

  FIG. 8 shows a sample stage 11-2 (side view type sample stage) of the LED 1 in which the anode terminal 1a and the cathode terminal 1b are provided on both sides of the same side surface, respectively. Fig.8 (a) shows LED1 which has a light emission part in the intermediate part of electrode terminal 1a, 1b.

  FIG. 8B is a perspective view of the sample stage 11-2 on which the LED 1 is set. Reference numerals 11y and 11z denote movable electrodes that are in contact with each other while simultaneously pressing the electrode terminals 1a and 1b of the LED 1 in a natural state. When replacing the LED 1, the release piston 11 d is pushed and released.

  FIG. 8C shows the input terminals 11a and 11b. These are respectively connected to the movable side terminal plates 11y and 11z. The sample stage 11-2 also has the same effect as the sample stage 11-1.

  FIG. 9 shows a back electrode type LED sample stage 11-3 (adsorption type sample stage) in which an electrode terminal is provided on the opposite side of the light emitting surface. (A) shows the structure of the LED 1.

  FIG. 9B is a perspective view of the sample stage 11-3. 11e is a suction hole of the suction pipe connection port. The back electrode type LED 1 is set near the upper center.

  9C and 9D are enlarged views near the upper center. FIG. 9C is a diagram before the LED is set, and FIG. 9D is a diagram showing when the LED is set. In (c), there are suction holes 11e at the center and electrode pads 11f and 11g at both ends.

  FIG. 9D shows a state where the LED 1 is set. The center of the back surface of the LED 1 is adsorbed by the adsorption hole 11e, and the electrode terminals 1a and 1b are contact-connected to the electrode pads 11f and 11g.

  The electrode pads 11f and 11g are connected to an input terminal inside the sample table 11-3 (adsorption type sample table) (not shown).

  FIG. 10 shows a sample stage 11-4 (a bullet type LED sample stage) in which the LED 1 is a bullet type.

  FIG. 10A shows the bullet-type LED 1. Reference numerals 1a and 1b denote electrode terminals.

  FIG.10 (b) is a perspective view of the sample stand 11-4 (bullet type LED sample stand) in which this LED1 was set. 11h is a pressure screw, and by rotating this, pressure is applied to both electrode terminals 1a, 1b of the bullet-type LED 1, and contact connection is made with the input terminal on the sample stage 11-4 (bullet-type LED sample stage) (illustrated). (Omitted).

It is a perspective view of one Example of the light distribution characteristic measuring apparatus of this invention. The light distribution characteristic measuring apparatus of this invention is shown, (a) is a front view, (b) is a side view. It is a figure which shows the state seen from the upper surface, when setting a measurement position point. It is a figure which shows the state seen from the side surface of the horizontal direction when setting one measurement point. (A) is a figure which shows the positional relationship at the time of XY direction adjustment of LED, (b) is a figure which shows the positional relationship at the time of Z direction adjustment of LED. It is a figure which shows the movement position of the light receiver at the time of measurement operation. It is a figure explaining the structure of a side contact type | mold sample stand, (a) is LED, (b) is a perspective view of a sample stand, (c) is AA 'sectional drawing of (b). It is a figure explaining the structure of a side view type sample stand, (a) is LED, (b) is a perspective view of a sample stand, (c) is sectional drawing which shows an input terminal. It is a figure explaining the structure of an adsorption | suction type sample stand, (a) is LED, (b) is a perspective view of a sample stand, (c) is an upper enlarged view, (d) is an upper enlarged view which mounts LED. . It is a figure explaining the structure of a bullet type LED sample stand, (a) is LED, (b) is a perspective view of a sample stand.

Explanation of symbols

1 Light source sample, LED
1a Anode terminal (electrode terminal)
1b Cathode terminal (electrode terminal)
10 Sample stand 11 Sample stand, one-touch exchangeable sample stand 11-1 Sample stand, side contact type sample stand (both side electrode type)
11-2 Sample stand, side view type sample stand (same side electrode type)
11-3 Sample stand, adsorption type sample stand (back electrode type)
11-4 Sample stand, bullet-type LED sample stand 11a Input terminal (power supply terminal)
11b Input terminal (power supply terminal)
11c Compression spring 11d Open piston 11e Suction hole (Suction piping connection port)
11f Electrode pad 11g Electrode pad 11x Fixed side terminal plate 11y Movable side terminal plate 11z Movable side terminal plate 12 Sample stage one-touch receiving unit 20 Three-dimensional adjustment mechanism (XYZ stage)
21 Z stage 21a Micrometer 22 X stage 22a Micrometer 23 Y stage 23a Micrometer 30 Rotating stage 30a Stepping motor 40 Standing plate portion 40a Rotating bearing portion 50 Rotating plate 50a Rotating shaft 60 Light receiver 70 Imaging camera (camera device)
100 Horizontal board 100a Leveling screw

Claims (5)

The light source sample of various electrode terminal shapes to be measured is set at a predetermined measurement position point, the measurement position point is set as the center of the spherical coordinate system, and the radiation direction of the light source sample at a predetermined radial distance from the coordinate center An apparatus for measuring a three-dimensional light distribution characteristic indicating the intensity relationship,
A detachable and replaceable sample stage that grips corresponding to the various electrode terminals of the luminescent source sample, and a sample stage unit that connects an end of a cable that supplies power to the sample; and
A three-dimensional adjustment mechanism that mounts the sample stage, moves in the vertical (Z-axis) direction, left-right (X-axis) direction, and front-back (Y-axis) direction, and fixes the measurement position within the movable range; ,
A rotary stage that mounts a three-dimensional adjustment mechanism on which the sample stage is placed and rotates the sample stage 360 degrees around the Z axis that passes through the center of the measurement position of the gripped sample;
A horizontal substrate on which the rotary stage is mounted horizontally;
Standing vertically on the horizontal substrate, and a standing plate portion provided with a rotary bearing portion having the perpendicular direction as an axis at a position intersecting with the perpendicular from the measurement position center;
A rotating plate capable of rotating at least 180 degrees with the rotary bearing portion of the standing plate portion as a fulcrum;
A light receiver that is fixed on the surface of the rotating plate on the measurement position point side, receives a radiation beam from the measurement position point at the predetermined radial distance, and can measure the intensity;
A camera device for imaging the periphery of the luminescent source sample,
The rotating plate is rotated, the camera device is horizontally oriented, the Z-axis direction is adjusted by the three-dimensional adjusting mechanism, the height position of the measurement position point is set, and then the rotating plate is rotated 90 degrees. Rotate and adjust the X and Y axis directions with the camera device in the vertical direction, set according to the measurement position point,
The light receiver in the spherical coordinates (Z-axis direction δ> 0) and the circumferential direction (θ) of the predetermined radial distance from the measurement position point of the light emitting source is rotated by rotating the rotating plate and the rotating stage, respectively. A light distribution characteristic measuring device characterized by measuring with   2. The light distribution characteristic measuring apparatus according to claim 1, wherein the light source sample is a light emitting diode (LED) or an assembly thereof. The light source sample is a light emitting diode (LED), and when the sample stage grips the LED,
(1) When the anode and cathode terminals of the LED are on both sides, the movable plate is sandwiched between the fixed plate connected to one of the input terminals and the movable plate connected to the other of the input terminals. Using a side contact type sample table that is connected by applying contact pressure to
(2) When the anode and cathode terminals of the LED are at both ends of the same side, electrodes are arranged opposite to the terminals at both ends, and each is connected by applying contact pressure to the movable electrode plate connected to the input terminal. Using a side view type sample stage,
(3) When the anode / cathode terminal of the LED is located at both ends of the back surface, electrodes are arranged opposite to both ends, and they are exhausted from the suction piping connection port to the attracted electrode plate connected to the input terminal. Using an adsorption-type sample table that is connected by applying contact pressure,
(4) When the LED is bullet-shaped and the anode / cathode terminal is composed of lead wires, the lead wire connected to the input terminal is inserted into the two tunnel electrodes corresponding to both lead wires, and the LED 2. The light distribution characteristic measuring apparatus according to claim 1, wherein a bullet-type sample stage is used which is connected by contact pressure between each lead wire and the tunnel electrode by covering a hollow disk from above.   The arrangement according to claim 1, wherein the three-dimensional adjustment mechanism includes a Z-axis stage including a Z-axis direction adjusting micrometer and an XY stage including an X-direction adjusting micrometer and a Y-direction adjusting micrometer. Optical property measuring device.   The light distribution characteristic measuring apparatus according to claim 1, wherein the rotating stage further includes a stepping motor for rotating the stage on the horizontal substrate.

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