JP2008058249A5 - - Google Patents

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Publication number
JP2008058249A5
JP2008058249A5 JP2006238287A JP2006238287A JP2008058249A5 JP 2008058249 A5 JP2008058249 A5 JP 2008058249A5 JP 2006238287 A JP2006238287 A JP 2006238287A JP 2006238287 A JP2006238287 A JP 2006238287A JP 2008058249 A5 JP2008058249 A5 JP 2008058249A5
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JP
Japan
Prior art keywords
observation
specimen
photometric
photometry
observation image
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JP2006238287A
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English (en)
Japanese (ja)
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JP4855185B2 (ja
JP2008058249A (ja
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Priority to JP2006238287A priority Critical patent/JP4855185B2/ja
Priority claimed from JP2006238287A external-priority patent/JP4855185B2/ja
Publication of JP2008058249A publication Critical patent/JP2008058249A/ja
Publication of JP2008058249A5 publication Critical patent/JP2008058249A5/ja
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Publication of JP4855185B2 publication Critical patent/JP4855185B2/ja
Expired - Fee Related legal-status Critical Current
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JP2006238287A 2006-09-01 2006-09-01 観察測光方法および観察測光装置 Expired - Fee Related JP4855185B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006238287A JP4855185B2 (ja) 2006-09-01 2006-09-01 観察測光方法および観察測光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006238287A JP4855185B2 (ja) 2006-09-01 2006-09-01 観察測光方法および観察測光装置

Publications (3)

Publication Number Publication Date
JP2008058249A JP2008058249A (ja) 2008-03-13
JP2008058249A5 true JP2008058249A5 (enExample) 2009-10-15
JP4855185B2 JP4855185B2 (ja) 2012-01-18

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JP2006238287A Expired - Fee Related JP4855185B2 (ja) 2006-09-01 2006-09-01 観察測光方法および観察測光装置

Country Status (1)

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JP (1) JP4855185B2 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5407015B2 (ja) * 2008-07-10 2014-02-05 国立大学法人徳島大学 画像処理装置、画像処理方法、コンピュータ実行可能な画像処理プログラム、及び顕微鏡システム
JP5365691B2 (ja) 2009-04-10 2013-12-11 株式会社ニコン 生体試料観察装置
JP5616611B2 (ja) * 2009-11-24 2014-10-29 オリンパス株式会社 微弱光標本撮像装置
JP2014062839A (ja) * 2012-09-21 2014-04-10 Hamamatsu Photonics Kk 発光検出装置
CN106257998B (zh) * 2013-12-23 2020-01-21 皇家飞利浦有限公司 用于检测颗粒的检测装置
WO2022029280A1 (en) * 2020-08-07 2022-02-10 Abberior Instruments Gmbh Method, apparatus and computer program for localizing an emitter in a sample

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002277746A (ja) * 2001-03-22 2002-09-25 Olympus Optical Co Ltd 走査型光学顕微鏡および該走査型光学顕微鏡の共焦点ピンホール調整方法
JP4834242B2 (ja) * 2001-05-30 2011-12-14 オリンパス株式会社 蛍光読み取り装置
JP3902939B2 (ja) * 2001-10-26 2007-04-11 株式会社日立ハイテクノロジーズ 標本中の微小領域測定装置及び方法
JP4217061B2 (ja) * 2002-12-12 2009-01-28 オリンパス株式会社 蛍光読み取り装置
JP4664599B2 (ja) * 2004-01-15 2011-04-06 オリンパス株式会社 顕微鏡装置

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