EP1801538A3 - Distance measuring method and distance measuring device - Google Patents

Distance measuring method and distance measuring device Download PDF

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Publication number
EP1801538A3
EP1801538A3 EP06256159A EP06256159A EP1801538A3 EP 1801538 A3 EP1801538 A3 EP 1801538A3 EP 06256159 A EP06256159 A EP 06256159A EP 06256159 A EP06256159 A EP 06256159A EP 1801538 A3 EP1801538 A3 EP 1801538A3
Authority
EP
European Patent Office
Prior art keywords
distance measuring
light
distance
measuring method
projecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP06256159A
Other languages
German (de)
French (fr)
Other versions
EP1801538A2 (en
EP1801538B1 (en
Inventor
Fumio; K. K. Topcon Ohtomo
Masahiro; K.K. Topcon Ohishi
Ikuo; K.K. Topcon Ishinabe
Kazuhiro ; K.K. Topcon Shida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Publication of EP1801538A2 publication Critical patent/EP1801538A2/en
Publication of EP1801538A3 publication Critical patent/EP1801538A3/en
Application granted granted Critical
Publication of EP1801538B1 publication Critical patent/EP1801538B1/en
Not-in-force legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

A distance measuring method for performing distance measurement by projecting a distance measuring light to an object to be measured and by receiving a reflected light, comprising: a step of projecting for scanning the distance measuring light which has at least one luminous flux with a predetermined spreading angle; a step of emitting the light by pulsed light emission at least two times during a period when the luminous flux traverses the object to be measured; a step of measuring a distance by receiving the reflected light at least two times; and a step of averaging the results of the distance measurement.
EP06256159A 2005-12-20 2006-12-01 Distance measuring method and distance measuring device Not-in-force EP1801538B1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005366265A JP4796834B2 (en) 2005-12-20 2005-12-20 Distance measuring method and distance measuring device

Publications (3)

Publication Number Publication Date
EP1801538A2 EP1801538A2 (en) 2007-06-27
EP1801538A3 true EP1801538A3 (en) 2007-08-15
EP1801538B1 EP1801538B1 (en) 2009-01-28

Family

ID=37948892

Family Applications (1)

Application Number Title Priority Date Filing Date
EP06256159A Not-in-force EP1801538B1 (en) 2005-12-20 2006-12-01 Distance measuring method and distance measuring device

Country Status (5)

Country Link
US (1) US7382443B2 (en)
EP (1) EP1801538B1 (en)
JP (1) JP4796834B2 (en)
CN (1) CN1987518B (en)
DE (1) DE602006005034D1 (en)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007283721A (en) * 2006-04-20 2007-11-01 Canon Inc Image-forming apparatus and method for forming image
JP5145013B2 (en) 2007-11-01 2013-02-13 株式会社トプコン Surveying instrument
JP5166087B2 (en) * 2008-03-21 2013-03-21 株式会社トプコン Surveying device and surveying system
JP2010091289A (en) * 2008-10-03 2010-04-22 Topcon Corp Light wave measuring device
JP5616025B2 (en) * 2009-01-22 2014-10-29 株式会社トプコン Lightwave distance measuring method and lightwave distance measuring apparatus
DE102010029091B4 (en) * 2009-05-21 2015-08-20 Koh Young Technology Inc. Form measuring device and method
CN102466479B (en) * 2010-11-16 2013-08-21 深圳泰山在线科技有限公司 System and method for measuring anti-jamming distance of moving object
JP6172534B2 (en) 2011-09-29 2017-08-02 アースロメダ、 インコーポレイテッド System used for precise prosthesis positioning in hip arthroplasty
EP2645125B1 (en) * 2012-03-27 2017-05-10 Sick AG Laser scanner and method for detecting objects in a surveillance area
CA2906152A1 (en) 2013-03-15 2014-09-18 Arthromeda, Inc. Systems and methods for providing alignment in total knee arthroplasty
JP6410258B2 (en) * 2015-03-02 2018-10-24 株式会社トプコン Light wave distance meter
DE102016107099A1 (en) * 2016-04-18 2017-10-19 Status Pro Maschinenmesstechnik Gmbh Rotary laser for determining the squareness of two machine parts
DE102016107100A1 (en) * 2016-04-18 2017-10-19 Status Pro Maschinenmesstechnik Gmbh Rotary laser for the measurement of machine tools
US9869754B1 (en) * 2017-03-22 2018-01-16 Luminar Technologies, Inc. Scan patterns for lidar systems
WO2018181250A1 (en) * 2017-03-30 2018-10-04 パナソニックＩｐマネジメント株式会社 Distance image generation device and distance image generation method
US11428790B2 (en) 2017-06-05 2022-08-30 Texas Instruments Incorporated Narrowband TIA and signaling for optical distance measurement systems
IT201700064070A1 (en) * 2017-06-09 2018-12-09 Dropsa Spa Device and method of sanitizing an environment
EP3502617B1 (en) 2017-12-21 2021-10-20 Leica Geosystems AG Measuring device with measuring beam homogenization
JP6709471B2 (en) * 2018-08-02 2020-06-17 クモノスコーポレーション株式会社 Three-dimensional laser light scanning device
CN112601979B (en) * 2018-09-03 2024-07-23 松下知识产权经营株式会社 Distance measuring device
US11024669B2 (en) * 2018-10-24 2021-06-01 Aeva, Inc. LIDAR system with fiber tip reimaging

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5552893A (en) * 1993-09-17 1996-09-03 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus
US5691725A (en) * 1995-09-08 1997-11-25 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus capable of measuring plural distance data for calculated angle ranges
US6710885B2 (en) * 2000-12-26 2004-03-23 Kabushiki Kaisha Topcon Measuring system
US6879384B2 (en) * 2001-12-19 2005-04-12 Riegl Laser Measurement Systems, Gmbh Process and apparatus for measuring an object space
EP1522870A1 (en) * 2003-10-06 2005-04-13 HIPP, Johann F. Distance measurement

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61132845A (en) * 1984-12-02 1986-06-20 Dainippon Screen Mfg Co Ltd Surface detect inspecting device
JP2580148B2 (en) 1987-03-05 1997-02-12 株式会社トプコン Optical mixer
CN1094515A (en) * 1993-02-24 1994-11-02 新典自动化股份有限公司 A kind of laser distance measurement method and device
JP3483303B2 (en) * 1994-06-21 2004-01-06 株式会社トプコン Rotary laser device
JPH10239433A (en) * 1997-02-24 1998-09-11 Omron Corp Distance measuring device
JPH11166974A (en) * 1997-12-05 1999-06-22 Aisin Seiki Co Ltd Range finder
CN1080874C (en) * 1998-02-23 2002-03-13 亚洲光学股份有限公司 Laser range finding method and device
JP4328917B2 (en) 1998-11-27 2009-09-09 株式会社トプコン Light wave distance meter
JP2004212058A (en) 2002-12-26 2004-07-29 Topcon Corp Working position measuring apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5552893A (en) * 1993-09-17 1996-09-03 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus
US5691725A (en) * 1995-09-08 1997-11-25 Mitsubishi Denki Kabushiki Kaisha Distance measuring apparatus capable of measuring plural distance data for calculated angle ranges
US6710885B2 (en) * 2000-12-26 2004-03-23 Kabushiki Kaisha Topcon Measuring system
US6879384B2 (en) * 2001-12-19 2005-04-12 Riegl Laser Measurement Systems, Gmbh Process and apparatus for measuring an object space
EP1522870A1 (en) * 2003-10-06 2005-04-13 HIPP, Johann F. Distance measurement

Also Published As

Publication number Publication date
EP1801538A2 (en) 2007-06-27
US20070146683A1 (en) 2007-06-28
JP4796834B2 (en) 2011-10-19
CN1987518A (en) 2007-06-27
EP1801538B1 (en) 2009-01-28
CN1987518B (en) 2012-03-21
DE602006005034D1 (en) 2009-03-19
JP2007170902A (en) 2007-07-05
US7382443B2 (en) 2008-06-03

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