JP2008016516A5 - - Google Patents
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- Publication number
- JP2008016516A5 JP2008016516A5 JP2006183851A JP2006183851A JP2008016516A5 JP 2008016516 A5 JP2008016516 A5 JP 2008016516A5 JP 2006183851 A JP2006183851 A JP 2006183851A JP 2006183851 A JP2006183851 A JP 2006183851A JP 2008016516 A5 JP2008016516 A5 JP 2008016516A5
- Authority
- JP
- Japan
- Prior art keywords
- phase difference
- exposure apparatus
- polarization component
- optical system
- adjustment unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003287 optical effect Effects 0.000 claims 10
- 230000010287 polarization Effects 0.000 claims 10
- 238000005286 illumination Methods 0.000 claims 9
- 239000000758 substrate Substances 0.000 claims 4
- 238000005259 measurement Methods 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 claims 2
- 239000013078 crystal Substances 0.000 claims 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006183851A JP2008016516A (ja) | 2006-07-03 | 2006-07-03 | 露光装置 |
| TW096123989A TW200815941A (en) | 2006-07-03 | 2007-07-02 | Exposure apparatus |
| US11/772,437 US7602474B2 (en) | 2006-07-03 | 2007-07-02 | Exposure apparatus |
| KR1020070066342A KR100847634B1 (ko) | 2006-07-03 | 2007-07-03 | 노광장치 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006183851A JP2008016516A (ja) | 2006-07-03 | 2006-07-03 | 露光装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008016516A JP2008016516A (ja) | 2008-01-24 |
| JP2008016516A5 true JP2008016516A5 (enExample) | 2009-08-20 |
Family
ID=39073278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006183851A Withdrawn JP2008016516A (ja) | 2006-07-03 | 2006-07-03 | 露光装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7602474B2 (enExample) |
| JP (1) | JP2008016516A (enExample) |
| KR (1) | KR100847634B1 (enExample) |
| TW (1) | TW200815941A (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8035803B2 (en) * | 2006-09-06 | 2011-10-11 | Carl Zeiss Smt Gmbh | Subsystem of an illumination system of a microlithographic projection exposure apparatus |
| TW200938957A (en) * | 2008-03-05 | 2009-09-16 | Nanya Technology Corp | Feedback system and feedback method for controlling power ratio of light source |
| JP5319766B2 (ja) * | 2008-06-20 | 2013-10-16 | カール・ツァイス・エスエムティー・ゲーエムベーハー | マイクロリソグラフィ投影露光装置の光学系及びマイクロリソグラフィ露光方法 |
| US8325417B1 (en) | 2008-09-23 | 2012-12-04 | The United States Of America As Represented By The Secretary Of The Navy | Apparatus and method for producing an annular far-field patterned beam(s) |
| JP2010097986A (ja) * | 2008-10-14 | 2010-04-30 | Nikon Corp | 投影光学系、露光装置、及びデバイス製造方法 |
| JP2012004465A (ja) | 2010-06-19 | 2012-01-05 | Nikon Corp | 照明光学系、露光装置、およびデバイス製造方法 |
| JP6084507B2 (ja) * | 2012-04-16 | 2017-02-22 | Hoya株式会社 | マスクブランク用基板の製造方法、マスクブランクの製造方法、転写用マスクの製造方法、及び半導体デバイスの製造方法 |
| US8957374B2 (en) * | 2012-09-28 | 2015-02-17 | Corning Incorporated | Systems and methods for measuring birefringence in glass and glass-ceramics |
| JP5839076B2 (ja) * | 2014-04-25 | 2016-01-06 | 株式会社ニコン | 照明光学系、露光装置、およびデバイス製造方法 |
| CN116909107B (zh) * | 2023-07-25 | 2024-03-01 | 上海图双精密装备有限公司 | 一种光刻设备照明用光源系统 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3803991A (en) * | 1972-05-22 | 1974-04-16 | H Leader | Method of inserting liners in bags |
| US5677757A (en) | 1994-03-29 | 1997-10-14 | Nikon Corporation | Projection exposure apparatus |
| JP2000277413A (ja) * | 1999-03-24 | 2000-10-06 | Canon Inc | 露光量制御方法、露光装置およびデバイス製造方法 |
| JP3710321B2 (ja) * | 1999-04-01 | 2005-10-26 | キヤノン株式会社 | 露光量制御方法、露光装置およびデバイス製造方法 |
| JP4521896B2 (ja) * | 1999-06-08 | 2010-08-11 | キヤノン株式会社 | 照明装置、投影露光装置及びデバイス製造方法 |
| KR100338932B1 (ko) * | 1999-10-28 | 2002-05-30 | 박종섭 | 웨이퍼 노광 장치 |
| JP4289755B2 (ja) | 2000-02-24 | 2009-07-01 | キヤノン株式会社 | 露光量制御方法、デバイス製造方法および露光装置 |
| JP4545874B2 (ja) * | 2000-04-03 | 2010-09-15 | キヤノン株式会社 | 照明光学系、および該照明光学系を備えた露光装置と該露光装置によるデバイスの製造方法 |
| JP2003133216A (ja) | 2001-10-26 | 2003-05-09 | Canon Inc | 露光方法及び露光装置 |
| JP2003297729A (ja) | 2002-04-03 | 2003-10-17 | Nikon Corp | 投影光学系、露光装置および露光方法 |
| TW200412617A (en) | 2002-12-03 | 2004-07-16 | Nikon Corp | Optical illumination device, method for adjusting optical illumination device, exposure device and exposure method |
| US7245353B2 (en) * | 2004-10-12 | 2007-07-17 | Asml Netherlands B.V. | Lithographic apparatus, device manufacturing method |
-
2006
- 2006-07-03 JP JP2006183851A patent/JP2008016516A/ja not_active Withdrawn
-
2007
- 2007-07-02 TW TW096123989A patent/TW200815941A/zh unknown
- 2007-07-02 US US11/772,437 patent/US7602474B2/en not_active Expired - Fee Related
- 2007-07-03 KR KR1020070066342A patent/KR100847634B1/ko not_active Expired - Fee Related
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