JP2008002925A - 電圧測定装置 - Google Patents
電圧測定装置 Download PDFInfo
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- JP2008002925A JP2008002925A JP2006172120A JP2006172120A JP2008002925A JP 2008002925 A JP2008002925 A JP 2008002925A JP 2006172120 A JP2006172120 A JP 2006172120A JP 2006172120 A JP2006172120 A JP 2006172120A JP 2008002925 A JP2008002925 A JP 2008002925A
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Abstract
【解決手段】測定対象体4の電圧V1を測定する電圧測定装置1であって、駆動信号S2の周波数f1の2倍の容量変調周波数f2で静電容量C1を変化させる可変容量回路19を有し、かつ電圧V1と参照電位Vrとの間の電位差(V1−Vr)に応じて振幅が変化すると共に容量変調周波数f2と同じ周波数の検出信号S3を出力するプローブユニット2と、検出信号S3と局部発振回路23で生成された局発信号S5とをミキシングした後フィルタリングして中間周波信号S7を生成する中間周波変換部FTと、中間周波信号S7を検波して検出信号S3の振幅成分を示す振幅信号S8を生成する検波回路26と、参照電位Vrを生成してプローブユニット2に印加すると共に振幅信号S8の振幅が減少するように参照電位Vrを変化させる電圧生成部3bとを備えている。
【選択図】図1
Description
2 プローブユニット(センサ部)
3 本体ユニット
3a 制御部
3b 電圧生成部
4 測定対象体
11 ケース
12 検出電極
14 駆動回路
15 電流検出器
19 可変容量回路
E11〜E14 第1電気的要素
E22,E23 第2電気的要素
E33,E34 第3電気的要素
Tr3 トランス
S3 検出信号
V1 測定対象体の電圧
Vr 参照電位
Claims (2)
- 測定対象体の電圧を測定可能に構成された電圧測定装置であって、
直流信号の通過を阻止しつつ印加電圧の絶対値の大きさに応じて容量が変化する電気的要素を含んで構成されて当該印加電圧の周波数に応じた容量変調周波数で静電容量を変化させる可変容量回路を有し、かつ前記測定対象体の前記電圧と参照電位との間の電位差に応じて振幅が変化すると共に前記容量変調周波数と同じ周波数の検出信号を出力するセンサ部と、
前記検出信号と局部発振回路で生成された局発信号とをミキシングした後にフィルタリングすることにより中間周波信号を生成する中間周波変換部と、
前記中間周波信号を検波して前記検出信号の振幅成分を示す振幅信号を生成する検波部と、
前記参照電位を生成して前記センサ部に印加すると共に前記振幅信号の振幅が減少するように当該参照電位を変化させる電圧生成部とを備えている電圧測定装置。 - 前記センサ部は、前記測定対象体に対向可能な検出電極と、当該検出電極に接続されてその静電容量を変化可能に構成された可変容量回路と、静電容量変化時において前記可変容量回路で発生する電流または前記可変容量回路の両端間電圧を前記検出信号として検出する検出回路とを備えている請求項1記載の電圧測定装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2006172120A JP5106798B2 (ja) | 2006-06-22 | 2006-06-22 | 電圧測定装置 |
Applications Claiming Priority (1)
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JP2006172120A JP5106798B2 (ja) | 2006-06-22 | 2006-06-22 | 電圧測定装置 |
Publications (2)
Publication Number | Publication Date |
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JP2008002925A true JP2008002925A (ja) | 2008-01-10 |
JP5106798B2 JP5106798B2 (ja) | 2012-12-26 |
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Application Number | Title | Priority Date | Filing Date |
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JP2006172120A Expired - Fee Related JP5106798B2 (ja) | 2006-06-22 | 2006-06-22 | 電圧測定装置 |
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JP (1) | JP5106798B2 (ja) |
Cited By (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009168696A (ja) * | 2008-01-18 | 2009-07-30 | Hioki Ee Corp | 電圧検出装置 |
JP2010286347A (ja) * | 2009-06-11 | 2010-12-24 | Hioki Ee Corp | 電圧検出装置 |
US10120021B1 (en) | 2017-06-16 | 2018-11-06 | Fluke Corporation | Thermal non-contact voltage and non-contact current devices |
US10119998B2 (en) | 2016-11-07 | 2018-11-06 | Fluke Corporation | Variable capacitance non-contact AC voltage measurement system |
US10139435B2 (en) | 2016-11-11 | 2018-11-27 | Fluke Corporation | Non-contact voltage measurement system using reference signal |
US10254375B2 (en) | 2016-11-11 | 2019-04-09 | Fluke Corporation | Proving unit for voltage measurement systems |
US10281503B2 (en) | 2016-11-11 | 2019-05-07 | Fluke Corporation | Non-contact voltage measurement system using multiple capacitors |
US10352967B2 (en) | 2016-11-11 | 2019-07-16 | Fluke Corporation | Non-contact electrical parameter measurement systems |
US10359494B2 (en) | 2016-11-11 | 2019-07-23 | Fluke Corporation | Proving unit for non-contact voltage measurement systems |
US10502807B2 (en) | 2017-09-05 | 2019-12-10 | Fluke Corporation | Calibration system for voltage measurement devices |
US10509063B2 (en) | 2017-11-28 | 2019-12-17 | Fluke Corporation | Electrical signal measurement device using reference signal |
US10539643B2 (en) | 2017-09-01 | 2020-01-21 | Fluke Corporation | Proving unit for use with electrical test tools |
US10551416B2 (en) | 2018-05-09 | 2020-02-04 | Fluke Corporation | Multi-sensor configuration for non-contact voltage measurement devices |
US10557875B2 (en) | 2018-05-09 | 2020-02-11 | Fluke Corporation | Multi-sensor scanner configuration for non-contact voltage measurement devices |
US10591515B2 (en) | 2016-11-11 | 2020-03-17 | Fluke Corporation | Non-contact current measurement system |
US10605832B2 (en) | 2016-11-11 | 2020-03-31 | Fluke Corporation | Sensor subsystems for non-contact voltage measurement devices |
US10677876B2 (en) | 2018-05-09 | 2020-06-09 | Fluke Corporation | Position dependent non-contact voltage and current measurement |
US10746767B2 (en) | 2018-05-09 | 2020-08-18 | Fluke Corporation | Adjustable length Rogowski coil measurement device with non-contact voltage measurement |
US10775409B2 (en) | 2018-05-09 | 2020-09-15 | Fluke Corporation | Clamp probe for non-contact electrical parameter measurement |
US10802072B2 (en) | 2018-05-11 | 2020-10-13 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
US10908188B2 (en) | 2018-05-11 | 2021-02-02 | Fluke Corporation | Flexible jaw probe for non-contact electrical parameter measurement |
CN117590096A (zh) * | 2023-11-10 | 2024-02-23 | 北京中科飞龙传感技术有限责任公司 | 一种静电传感器灵敏度补偿方法、装置、设备及存储介质 |
Citations (4)
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JPH01170209A (ja) * | 1987-11-27 | 1989-07-05 | Philips Gloeilampenfab:Nv | 帯域フィルタ回路配置 |
JP2001255342A (ja) * | 2000-03-08 | 2001-09-21 | Hitachi Ltd | 電圧センサ |
JP2002162429A (ja) * | 2000-11-24 | 2002-06-07 | Tdk Corp | 表面電位検出方法、表面電位検出装置及び表面電位センサ |
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2006
- 2006-06-22 JP JP2006172120A patent/JP5106798B2/ja not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS62103315U (ja) * | 1985-12-19 | 1987-07-01 | ||
JPH01170209A (ja) * | 1987-11-27 | 1989-07-05 | Philips Gloeilampenfab:Nv | 帯域フィルタ回路配置 |
JP2001255342A (ja) * | 2000-03-08 | 2001-09-21 | Hitachi Ltd | 電圧センサ |
JP2002162429A (ja) * | 2000-11-24 | 2002-06-07 | Tdk Corp | 表面電位検出方法、表面電位検出装置及び表面電位センサ |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009168696A (ja) * | 2008-01-18 | 2009-07-30 | Hioki Ee Corp | 電圧検出装置 |
JP2010286347A (ja) * | 2009-06-11 | 2010-12-24 | Hioki Ee Corp | 電圧検出装置 |
US10119998B2 (en) | 2016-11-07 | 2018-11-06 | Fluke Corporation | Variable capacitance non-contact AC voltage measurement system |
US10281503B2 (en) | 2016-11-11 | 2019-05-07 | Fluke Corporation | Non-contact voltage measurement system using multiple capacitors |
US10139435B2 (en) | 2016-11-11 | 2018-11-27 | Fluke Corporation | Non-contact voltage measurement system using reference signal |
US10254375B2 (en) | 2016-11-11 | 2019-04-09 | Fluke Corporation | Proving unit for voltage measurement systems |
US10605832B2 (en) | 2016-11-11 | 2020-03-31 | Fluke Corporation | Sensor subsystems for non-contact voltage measurement devices |
US10352967B2 (en) | 2016-11-11 | 2019-07-16 | Fluke Corporation | Non-contact electrical parameter measurement systems |
US10359494B2 (en) | 2016-11-11 | 2019-07-23 | Fluke Corporation | Proving unit for non-contact voltage measurement systems |
US11237192B2 (en) | 2016-11-11 | 2022-02-01 | Fluke Corporation | Non-contact current measurement system |
US10591515B2 (en) | 2016-11-11 | 2020-03-17 | Fluke Corporation | Non-contact current measurement system |
US10120021B1 (en) | 2017-06-16 | 2018-11-06 | Fluke Corporation | Thermal non-contact voltage and non-contact current devices |
US10539643B2 (en) | 2017-09-01 | 2020-01-21 | Fluke Corporation | Proving unit for use with electrical test tools |
US10502807B2 (en) | 2017-09-05 | 2019-12-10 | Fluke Corporation | Calibration system for voltage measurement devices |
US10509063B2 (en) | 2017-11-28 | 2019-12-17 | Fluke Corporation | Electrical signal measurement device using reference signal |
US10551416B2 (en) | 2018-05-09 | 2020-02-04 | Fluke Corporation | Multi-sensor configuration for non-contact voltage measurement devices |
US10677876B2 (en) | 2018-05-09 | 2020-06-09 | Fluke Corporation | Position dependent non-contact voltage and current measurement |
US10746767B2 (en) | 2018-05-09 | 2020-08-18 | Fluke Corporation | Adjustable length Rogowski coil measurement device with non-contact voltage measurement |
US10775409B2 (en) | 2018-05-09 | 2020-09-15 | Fluke Corporation | Clamp probe for non-contact electrical parameter measurement |
US10557875B2 (en) | 2018-05-09 | 2020-02-11 | Fluke Corporation | Multi-sensor scanner configuration for non-contact voltage measurement devices |
US10802072B2 (en) | 2018-05-11 | 2020-10-13 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
US10908188B2 (en) | 2018-05-11 | 2021-02-02 | Fluke Corporation | Flexible jaw probe for non-contact electrical parameter measurement |
US11209480B2 (en) | 2018-05-11 | 2021-12-28 | Fluke Corporation | Non-contact DC voltage measurement device with oscillating sensor |
CN117590096A (zh) * | 2023-11-10 | 2024-02-23 | 北京中科飞龙传感技术有限责任公司 | 一种静电传感器灵敏度补偿方法、装置、设备及存储介质 |
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