JP2007511278A5 - - Google Patents

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Publication number
JP2007511278A5
JP2007511278A5 JP2006539585A JP2006539585A JP2007511278A5 JP 2007511278 A5 JP2007511278 A5 JP 2007511278A5 JP 2006539585 A JP2006539585 A JP 2006539585A JP 2006539585 A JP2006539585 A JP 2006539585A JP 2007511278 A5 JP2007511278 A5 JP 2007511278A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2006539585A
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Japanese (ja)
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JP4668204B2 (ja
JP2007511278A (ja
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Publication date
Priority claimed from US10/971,937 external-priority patent/US20050105044A1/en
Priority claimed from US10/971,769 external-priority patent/US7425067B2/en
Application filed filed Critical
Priority claimed from PCT/US2004/036306 external-priority patent/WO2005048829A2/en
Publication of JP2007511278A publication Critical patent/JP2007511278A/ja
Publication of JP2007511278A5 publication Critical patent/JP2007511278A5/ja
Application granted granted Critical
Publication of JP4668204B2 publication Critical patent/JP4668204B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2006539585A 2003-11-14 2004-10-29 眼科用両眼波面測定システム Expired - Lifetime JP4668204B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US52029403P 2003-11-14 2003-11-14
US58112704P 2004-06-18 2004-06-18
US10/971,937 US20050105044A1 (en) 2003-11-14 2004-10-22 Lensometers and wavefront sensors and methods of measuring aberration
US10/971,769 US7425067B2 (en) 2003-11-14 2004-10-22 Ophthalmic diagnostic instrument
PCT/US2004/036306 WO2005048829A2 (en) 2003-11-14 2004-10-29 Ophthalmic binocular wafefront measurement system

Publications (3)

Publication Number Publication Date
JP2007511278A JP2007511278A (ja) 2007-05-10
JP2007511278A5 true JP2007511278A5 (enExample) 2008-12-18
JP4668204B2 JP4668204B2 (ja) 2011-04-13

Family

ID=34623984

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2006539585A Expired - Lifetime JP4668204B2 (ja) 2003-11-14 2004-10-29 眼科用両眼波面測定システム
JP2006539586A Expired - Fee Related JP4832310B2 (ja) 2003-11-14 2004-10-29 レンズメータ及び波面センサ及び収差測定方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2006539586A Expired - Fee Related JP4832310B2 (ja) 2003-11-14 2004-10-29 レンズメータ及び波面センサ及び収差測定方法

Country Status (5)

Country Link
EP (3) EP1690072A2 (enExample)
JP (2) JP4668204B2 (enExample)
KR (1) KR100992182B1 (enExample)
AU (1) AU2004291042B2 (enExample)
WO (2) WO2005048829A2 (enExample)

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US8506083B2 (en) 2011-06-06 2013-08-13 Clarity Medical Systems, Inc. Compact wavefront sensor module and its attachment to or integration with an ophthalmic instrument
FR2897426B1 (fr) * 2006-02-16 2012-07-27 Onera (Off Nat Aerospatiale) Procede d'analyse de surface d'onde par interferometrie multilaterale a difference de frequences
EP1999443B1 (en) 2006-03-14 2017-12-27 AMO Manufacturing USA, LLC Spatial frequency wavefront sensor system and method
JP2008246153A (ja) * 2007-03-30 2008-10-16 Topcon Corp 検眼装置及びその方法
JP5608892B2 (ja) * 2008-07-25 2014-10-22 東海光学株式会社 レンズ評価方法
JP5335922B2 (ja) * 2008-09-29 2013-11-06 サイファイ メドテック エッセ.エッレ.エッレ. カスタマイズされたバイオメトリック眼内レンズを設計および移植するためのシステムおよび方法
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JP5265425B2 (ja) * 2009-03-19 2013-08-14 オリンパス株式会社 干渉計による2次元位相デ−タのアンラップ方法および装置
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JP2010252994A (ja) * 2009-04-24 2010-11-11 Topcon Corp 眼科装置
JP2010286434A (ja) * 2009-06-15 2010-12-24 Brother Ind Ltd 動的面形状測定装置および動的面形状測定方法
JP5394902B2 (ja) * 2009-11-27 2014-01-22 株式会社トプコン 眼科装置
CN101947157B (zh) * 2009-12-18 2012-02-15 中国科学院光电技术研究所 人眼自适应光学视知觉学习训练仪
CN101947158B (zh) * 2009-12-18 2012-07-04 中国科学院光电技术研究所 双眼自适应光学视知觉学习训练仪
JP5641744B2 (ja) * 2010-02-10 2014-12-17 キヤノン株式会社 撮像装置及びその制御方法
KR101325988B1 (ko) 2010-10-29 2013-11-07 엘지디스플레이 주식회사 입체 디스플레이의 광학 측정 장치 및 방법
GB2484998B (en) * 2010-10-29 2014-08-20 Lg Display Co Ltd Optical measuring apparatus and measuring method of stereoscopic display device
EP2596745B1 (en) * 2011-10-07 2019-06-19 Popovic, Zoran Reference calibration for an adaptive optics system
EP2809220A4 (en) * 2012-02-03 2015-04-08 Digitalvision Llc REFRACTOMETER WITH A COMPARATIVE SEH CORRECTION SIMULATOR
FR2992843B1 (fr) * 2012-07-06 2016-05-06 Essilor Int Dispositif et procede de mesure de refraction oculaire objective et d'au moins un parametre geometrico-morphologique d'un individu
JP6000773B2 (ja) * 2012-09-13 2016-10-05 キヤノン株式会社 収差推定方法、プログラムおよび撮像装置
WO2014083392A1 (en) * 2012-11-28 2014-06-05 Perfect Vision Technology, Ltd. Methods and systems for automated measurement of the eyes and delivering of sunglasses and eyeglasses
CN105578947B (zh) * 2013-07-02 2018-10-26 麻省理工学院 确定眼处方的装置和方法
EP3242585A1 (en) * 2015-01-09 2017-11-15 Smart Vision Labs, Inc. Portable wavefront aberrometer with open field alignment channel
WO2016184571A2 (de) * 2015-05-20 2016-11-24 Carl Zeiss Smt Gmbh Messverfahren und messanordnung für ein abbildendes optisches system
JP6821361B2 (ja) * 2016-09-05 2021-01-27 キヤノン株式会社 計測装置、光学機器の製造方法および光学機器の製造装置
US10595724B2 (en) * 2017-08-04 2020-03-24 Ho Wa LAI Adaptor for an image capture device for fundus photography
FR3082274B1 (fr) 2018-06-06 2021-11-19 Gaztransport Et Technigaz Cuve etanche et thermiquement isolante
KR102082747B1 (ko) * 2019-01-23 2020-02-28 연세대학교 산학협력단 초점거리 조절이 가능한 led 어레이 기반 3차원 이미징 장치 및 방법
EP3914144A4 (en) * 2019-01-24 2022-11-02 6 Over 6 Vision Ltd APPARATUS, SYSTEM AND METHOD FOR DETERMINING ONE OR MORE PARAMETERS OF A REFRACTION ERROR OF AN EYE TESTED
KR102771619B1 (ko) 2019-03-11 2025-02-25 삼성전자주식회사 영상의 횡이동이 가능한 디스플레이 장치
JP6581325B1 (ja) * 2019-06-12 2019-09-25 株式会社アサヒビジョン レンズ光学特性測定装置、レンズ光学特性測定方法、プログラム、及び、記録媒体。
CN110274696B (zh) * 2019-06-26 2020-11-06 中国科学院长春光学精密机械与物理研究所 大视场主动光学望远镜的波前传感方法、装置、及系统
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CN117357056A (zh) * 2023-11-03 2024-01-09 瑞尔明康(浙江)医疗科技有限公司 人眼测量装置及人眼测量方法

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