JP2007335532A - Graphene intergrated circuit - Google Patents
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- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 title claims abstract description 105
- 229910021389 graphene Inorganic materials 0.000 title claims abstract description 97
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract description 43
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract description 39
- 239000000758 substrate Substances 0.000 claims abstract description 37
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 34
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 33
- 239000010703 silicon Substances 0.000 claims abstract description 33
- 238000004519 manufacturing process Methods 0.000 claims abstract description 11
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 238000002955 isolation Methods 0.000 claims abstract description 4
- 238000001312 dry etching Methods 0.000 claims description 3
- 230000005294 ferromagnetic effect Effects 0.000 claims description 2
- 230000010354 integration Effects 0.000 abstract description 5
- 239000004065 semiconductor Substances 0.000 abstract description 3
- 238000009413 insulation Methods 0.000 abstract 2
- 239000010408 film Substances 0.000 description 21
- 238000000034 method Methods 0.000 description 8
- 239000010410 layer Substances 0.000 description 6
- 229910052799 carbon Inorganic materials 0.000 description 5
- 239000010931 gold Substances 0.000 description 4
- 239000002041 carbon nanotube Substances 0.000 description 3
- 229910021393 carbon nanotube Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- FFBHFFJDDLITSX-UHFFFAOYSA-N benzyl N-[2-hydroxy-4-(3-oxomorpholin-4-yl)phenyl]carbamate Chemical compound OC1=C(NC(=O)OCC2=CC=CC=C2)C=CC(=C1)N1CCOCC1=O FFBHFFJDDLITSX-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 238000000137 annealing Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 150000001721 carbon Chemical group 0.000 description 1
- 125000004432 carbon atom Chemical group C* 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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Abstract
Description
本発明は、グラフェンを含む非線形素子を有するグラフェン集積回路に関する。 The present invention relates to a graphene integrated circuit having a nonlinear element including graphene.
CMOS集積回路は、エレクトロニクスの基盤技術であるが、その半導体の集積度の向上を、ムーアの法則に示されるように維持することが困難になりつつある。具体的には、増大を続ける消費電力に伴う発熱が抑えられない状態にまで達していることがある。さらに、微細化に伴うショートチャンネル効果などの問題を抑えることと、寄生抵抗を低減することが相容れないため、微細化が行き詰まっていることがある。そのため、新しい材料を含めて様々な方法でこれを解決する努力が続けられている。それにより、カーボンナノチューブトランジスタが開発されたが、カーボンナノチューブトランジスタを集積化することは、本質的に困難である。 The CMOS integrated circuit is a basic technology of electronics, but it is becoming difficult to maintain the improvement of the degree of integration of the semiconductor as shown by Moore's law. Specifically, there is a case where the heat generation accompanying the continuously increasing power consumption has reached a state where it cannot be suppressed. Furthermore, miniaturization may be stuck because it is incompatible with suppressing problems such as the short channel effect associated with miniaturization and reducing parasitic resistance. Therefore, efforts are being made to solve this in various ways, including new materials. Thereby, carbon nanotube transistors have been developed, but it is inherently difficult to integrate the carbon nanotube transistors.
一方、カーボンナノチューブトランジスタをある意味で、たとえばコンタクト抵抗などの点で凌駕するデバイスポテンシャルを有するグラフェントランジスタが考えられている。従って、グラフェントランジスタを任意の部位に集積化できる技術があれば、半導体の集積度の向上が期待できる。 On the other hand, a graphene transistor having a device potential that surpasses the carbon nanotube transistor in terms of contact resistance, for example, has been considered. Therefore, if there is a technology that can integrate the graphene transistor at an arbitrary position, an improvement in the integration degree of the semiconductor can be expected.
グラファイト(グラフェン超薄膜)を形成する技術としては、6H-シリコンカーバイドの(0001)シリコン面を熱処理することによって、シリコンを脱離させて超薄膜のエピタキシャルグラファイトを形成させることが報告されている(非特許文献1参照)。 As a technique for forming graphite (ultra-graphene ultra-thin film), it is reported that the (0001) silicon surface of 6H-silicon carbide is heat-treated to desorb silicon to form ultra-thin epitaxial graphite ( Non-patent document 1).
一方、微傾斜面を有するシリコンカーバイドを特定の方法でエッチング処理すると、クリアなステップ/テラス構造となることが報告されている(非特許文献2参照)。
本発明の目的は、グラフェンを含む非線形素子を集積化する技術を提供することである。 An object of the present invention is to provide a technique for integrating nonlinear elements including graphene.
本発明は、シリコンカーバイド基板の表面の所望の部位に、グラフェンを形成することができる手段を新たに見いだすことにより完成された。 The present invention has been completed by newly finding a means capable of forming graphene at a desired site on the surface of a silicon carbide substrate.
本発明の第一は以下に示すグラフェン集積回路に関する。
[1]シリコンカーバイド基板のシリコン面に形成されたグラフェンを含む非線形素子を有するグラフェン集積回路。
[2]前記シリコンカーバイドのポリタイプは、4Hまたは6Hである、[1]に記載のグラフェン集積回路。
[3]前記シリコン面は、4Hシリコンカーバイド(0001)のシリコン面、または6Hシリコンカーバイド(0001)のシリコン面である、[1]に記載のグラフェン集積回路。
[4]前記シリコンカーバイド基板のシリコン面は微傾斜面である、[1]に記載のグラフェン集積回路。
[5]複数の前記非線形素子を有する、[1]に記載のグラフェン集積回路。
[6]チップに集積された、[1]に記載のグラフェン集積回路。
The first of the present invention relates to the graphene integrated circuit described below.
[1] A graphene integrated circuit having a non-linear element including graphene formed on a silicon surface of a silicon carbide substrate.
[2] The graphene integrated circuit according to [1], wherein the polytype of the silicon carbide is 4H or 6H.
[3] The graphene integrated circuit according to [1], wherein the silicon surface is a silicon surface of 4H silicon carbide (0001) or a silicon surface of 6H silicon carbide (0001).
[4] The graphene integrated circuit according to [1], wherein the silicon surface of the silicon carbide substrate is a slightly inclined surface.
[5] The graphene integrated circuit according to [1], including a plurality of the nonlinear elements.
[6] The graphene integrated circuit according to [1], integrated on a chip.
本発明の第二は以下に示すグラフェン集積回路の製造方法に関する。
[7]シリコンカーバイド基板のシリコン面に形成されたグラフェンを含む非線形素子を有するグラフェン集積回路の製造方法であって、
絶縁膜で被覆されたシリコン面を有するシリコンカーバイド基板を準備するステップ;複数の所望の部位の前記絶縁膜を除去して、シリコン面を露出させるステップ;前記シリコンカーバイド基板を加熱することによって、前記露出部にグラフェンを形成するステップ;および前記グラフェンにオーミック電極を形成するステップを含む製造方法。
[8]シリコンカーバイド基板のシリコン面に形成されたグラフェンを含む非線形素子を有するグラフェン集積回路の製造方法であって、
シリコン面を有するシリコンカーバイド基板を加熱することによって、当該シリコン面にグラフェンを形成するステップ;前記グラフェンをドライエッチングによりアイソレーションするステップ;前記アイソレーションにより形成された溝に絶縁膜を形成するステップ;および前記グラフェンにオーミック電極を形成するステップを含む製造方法。
The second of the present invention relates to a method for manufacturing a graphene integrated circuit as described below.
[7] A method of manufacturing a graphene integrated circuit having a nonlinear element including graphene formed on a silicon surface of a silicon carbide substrate,
Providing a silicon carbide substrate having a silicon surface coated with an insulating film; removing the insulating film at a plurality of desired sites to expose the silicon surface; and heating the silicon carbide substrate to Forming a graphene on the exposed portion; and forming an ohmic electrode on the graphene.
[8] A method of manufacturing a graphene integrated circuit having a non-linear element including graphene formed on a silicon surface of a silicon carbide substrate,
Heating a silicon carbide substrate having a silicon surface to form graphene on the silicon surface; isolating the graphene by dry etching; forming an insulating film in a trench formed by the isolation; And a method of forming an ohmic electrode on the graphene.
本発明により、グラフェン非線形素子が集積化された回路が提供されるので、さらなるデバイスの集積度の向上が達せられる。 According to the present invention, since a circuit in which graphene nonlinear elements are integrated is provided, further improvement in device integration can be achieved.
1.本発明のグラフェン集積回路
本発明のグラフェン集積回路は、グラフェンを含む複数の非線形素子、およびこれらの非線形素子を接続する配線を有する。さらに抵抗やキャパシタなどの他の回路素子を有していてもよい。
1. Graphene Integrated Circuit of the Present Invention The graphene integrated circuit of the present invention has a plurality of nonlinear elements including graphene and wirings connecting these nonlinear elements. Furthermore, you may have other circuit elements, such as a resistor and a capacitor.
本発明の集積回路が有するグラフェンを含む非線形素子は、グラフェンをチャネル(伝導チャネル)とする素子であればよく、二端子素子であっても、三端子素子であっても、それ以上の多端子素子であってもかまわない。 The non-linear element including graphene included in the integrated circuit of the present invention may be an element having graphene as a channel (conduction channel). It may be an element.
非線形素子に含まれるグラフェンは、単原子層のカーボン結晶構造であってもよく、複数の原子層のカーボン結晶構造であってもよい。複数の原子層とは、例えば一桁数の原子層である。複数原子層のカーボン結晶構造は、一般にグラフェン多層膜(multi-layer graphene)またはグラフェン積層膜(stacked graphene)と称されることもある。 The graphene contained in the nonlinear element may have a carbon crystal structure with a monoatomic layer or a carbon crystal structure with a plurality of atomic layers. The plurality of atomic layers are, for example, single-digit atomic layers. The carbon crystal structure of a multi-atomic layer is sometimes called a graphene multilayer film (multi-layer graphene) or a graphene stacked film (stacked graphene).
非線形素子に含まれるグラフェンは、シリコンカーバイド基板の表面に形成されている。シリコンカーバイドのポリタイプは、4H-シリコンカーバイドまたは6H-シリコンカーバイドが好ましく、6H-シリコンカーバイドがより好ましい。平坦なグラフェンが形成されうるからである。さらにグラフェンが形成されたシリコンカーバイドの表面は、カーボン面でもよいがシリコン面の方がよいと考えられ、4H-シリコンカーバイドの(0001)シリコン面、または6H-シリコンカーバイドの(0001)シリコン面であることが好ましく、6H-シリコンカーバイドの(0001)シリコン面であることがより好ましい。熱力学的に安定したグラフェンが形成されうるからである。 The graphene contained in the nonlinear element is formed on the surface of the silicon carbide substrate. The silicon carbide polytype is preferably 4H-silicon carbide or 6H-silicon carbide, and more preferably 6H-silicon carbide. This is because flat graphene can be formed. Further, the surface of the silicon carbide on which graphene is formed may be a carbon surface, but a silicon surface is considered better. Preferably, it is a (0001) silicon surface of 6H-silicon carbide. This is because thermodynamically stable graphene can be formed.
非線形素子に含まれるグラフェンは、高温アニールにより表面処理されたシリコンカーバイド基板を、真空中で熱処理して表面層のシリコン原子を乖離させ、かつ炭素原子を遊離させることで形成される。 Graphene contained in the non-linear element is formed by heat-treating a silicon carbide substrate surface-treated by high-temperature annealing in vacuum to dissociate silicon atoms in the surface layer and liberate carbon atoms.
グラフェンが形成されるシリコンカーバイド基板は、ジャスト基板であっても傾斜基板であってもよい。シリコンカーバイド基板の傾斜面は、前処理することにより原子ステップがバンチングを起こし、ステップ/テラス構造を形成する。ここで「前処理」とは、例えばH2/HClガスエッチングであり、これらは前述の非特許文献2などを参照して行われる。ステップ/テラス構造を有する傾斜面に形成されたグラフェンは、ストライプ状に形成されうる。微傾斜基板の傾斜角度(オフ角度)に応じてストライプ幅を調整することができるので、所望のストライプ幅のグラフェンを形成することができる。
The silicon carbide substrate on which the graphene is formed may be a just substrate or an inclined substrate. By pre-treating the inclined surface of the silicon carbide substrate, atomic steps cause bunching, and a step / terrace structure is formed. Here, the “pretreatment” is, for example, H 2 / HCl gas etching, which is performed with reference to the
シリコンカーバイドの微傾斜基板の傾斜方向を調整することによって、微傾斜基板上に形成されるグラフェンの電気伝導特性を変化させることができる。つまり、グラフェンの電気伝導特性に方向依存性を発現させることがある。また、半導体性または金属性などのさまざまな特性を自在に付与することもできる。 By adjusting the tilt direction of the vicinal substrate of silicon carbide, it is possible to change the electric conduction characteristics of graphene formed on the vicinal substrate. In other words, direction dependency may be manifested in the electrical conductivity characteristics of graphene. Moreover, various characteristics such as semiconductivity or metallicity can be freely imparted.
本発明の集積回路は、所望の部位に非線形素子が形成されていることを特徴とするが、これはグラフェンをシリコンカーバイド基板の表面の所望の位置に形成することができるためである。グラフェンを所望の位置に形成する手段の例には、例えば以下の二通りの手段が挙げられる(プロセス1および2)。
The integrated circuit of the present invention is characterized in that a non-linear element is formed at a desired portion because graphene can be formed at a desired position on the surface of the silicon carbide substrate. Examples of means for forming graphene at a desired position include the following two means (
(プロセス1)
プロセス1のフローが図1に示される。シリコンカーバイド基板1(図1(a))の表面を、絶縁膜2で覆った後、グラフェンを形成させる露出部3−1を設け(図1(b))、そのシリコンカーバイド基板を熱処理して、グラフェン3を形成すればよい(図1(c))。グラフェン3を形成させる露出部3−1以外を絶縁膜2で覆うには、基板1の表面全体に絶縁膜2をデポジションにより形成して、形成された絶縁膜2の所望の部位をエッチングなどにより除去すればよい。絶縁膜2は、例えば、窒化シリコン、酸化シリコン、酸化アルミニウムからなる膜である。
(Process 1)
The flow of
(プロセス2)
プロセス2のフローが図2に示される。シリコンカーバイド基板1(図2(a))を熱処理して、基板表面全体にグラフェン3の膜を形成し(図2(b));所望の部位以外のグラフェン膜を、ドライエッチングにより除去して(アイソレーション);さらにエッチングされた部位には絶縁膜2を形成すればよい(図2(c))。絶縁膜2は、例えば、窒化シリコン、酸化シリコン、酸化アルミニウムからなる膜である。
(Process 2)
The flow of
所望の位置に形成されたグラフェン上には、オーミック電極4が形成されて非線形素子が形成される(図1(d)および図2(d))。オーミック電極4は、クロム、チタン、ニッケル、パラジウムなどの金属膜などの積層体であることが好ましく、それにより低抵抗化が実現される。形成されたオーミック電極は、ソース電極およびドレイン電極となる。 On the graphene formed at a desired position, an ohmic electrode 4 is formed to form a nonlinear element (FIGS. 1D and 2D). The ohmic electrode 4 is preferably a laminate of a metal film made of chromium, titanium, nickel, palladium or the like, thereby realizing low resistance. The formed ohmic electrode becomes a source electrode and a drain electrode.
非線形素子は、さらにゲート電極6が形成されることが好ましい(図1(e)および図2(e))。ゲート電極6は、例えばグラフェン上にゲート酸化膜5を介して形成されればよい。ゲート電極6は、例えばチタン/金(Ti/Au)、またはクロム/金 (Cr/Au)の積層体である。これにより、ゲート変調されるトランジスタが得られる。
It is preferable that the non-linear element further has a gate electrode 6 (FIGS. 1E and 2E). For example, the
非線形素子(好ましくはトランジスタ)には、適宜保護膜が形成されていてもよい。各非線形素子を金属配線7により接続して集積回路とすればよい(図3(f))。図3(f)には、2つのインバータが順列接続された構造が示される。本発明の集積回路はチップ上に形成され、集積回路が形成されたチップ全体を、ボンディングパッドを除いて覆うことにより、デバイスとしての安定化を図ることができる。 A protective film may be appropriately formed on the nonlinear element (preferably a transistor). What is necessary is just to connect each nonlinear element by the metal wiring 7, and to make an integrated circuit (FIG.3 (f)). FIG. 3F shows a structure in which two inverters are connected in a permutation. The integrated circuit of the present invention is formed on a chip, and the entire chip on which the integrated circuit is formed is covered except for bonding pads, so that stabilization as a device can be achieved.
本発明のグラフェン集積回路は、メモリ回路として用いられうる。すなわち、グラフェンを含むトランジスタは、炭素原子C12の同位元素であるC13を用いて、グラフェンからなるチャネル中の核スピンに、電子スピンの情報を転写することにより情報を保持することができる。 The graphene integrated circuit of the present invention can be used as a memory circuit. That is, a transistor including graphene can hold information by transferring information on electron spins to nuclear spins in a channel made of graphene using C13, which is an isotope of carbon atom C12.
また本発明のグラフェン集積回路は、各非線形素子のグラフェンに、複数(通常2つ)の強磁性電極を配置されることで、ラテラル型のMR素子(巨大磁気抵抗素子)を構成することもできる。 The graphene integrated circuit of the present invention can also be configured as a lateral MR element (giant magnetoresistive element) by arranging a plurality of (usually two) ferromagnetic electrodes on the graphene of each nonlinear element. .
6H-シリコンカーバイドの(0001)面(オフ角度:0°、ジャスト基板)に、グラフェンを形成し、三端子型の非線形素子(トランジスタ)を形成した。得られた非線形素子のソース−ドレイン電流と、ソース−ドレイン電圧との関係を図4に示した(ゲート電圧=0)。Y軸がドレイン電流の値を示し、X軸がソース-ドレイン電圧を示す。各曲線は、ゲート電圧を変化させた場合の電流−電圧曲線を示している。図4に示されるように、電圧と電流が比例していないことがわかる。
これらの非線形素子を配線で接続させれば、グラフェン集積回路が作製される。
Graphene was formed on the (0001) plane of 6H-silicon carbide (off angle: 0 °, just substrate) to form a three-terminal nonlinear element (transistor). FIG. 4 shows the relationship between the source-drain current of the obtained nonlinear element and the source-drain voltage (gate voltage = 0). The Y axis represents the drain current value, and the X axis represents the source-drain voltage. Each curve shows a current-voltage curve when the gate voltage is changed. As shown in FIG. 4, it can be seen that the voltage and current are not proportional.
If these nonlinear elements are connected by wiring, a graphene integrated circuit is manufactured.
本発明のグラフェン集積回路によりデバイスの集積度のさらなる向上が達成され、また新たなメモリが提供される。 The graphene integrated circuit of the present invention achieves further improvement in device integration and provides a new memory.
1:シリコンカーバイド基板
2:絶縁膜
3:グラフェン
3−1:グラフェンを形成するためのシリコン面の露出部
4:オーミック電極
5:ゲート酸化膜
6:ゲート電極
7:金属配線
1: Silicon carbide substrate 2: Insulating film 3: Graphene 3-1: Exposed portion of silicon surface for forming graphene 4: Ohmic electrode 5: Gate oxide film 6: Gate electrode 7: Metal wiring
Claims (9)
絶縁膜で被覆されたシリコン面を有するシリコンカーバイド基板を準備するステップ、
複数の所望の部位の前記絶縁膜を除去して、シリコン面を露出させるステップ、
前記シリコンカーバイド基板を加熱することによって、前記露出部にグラフェンを形成するステップ、および
前記グラフェンにオーミック電極を形成するステップを含む製造方法。 A method of manufacturing a graphene integrated circuit having a nonlinear element including graphene formed on a silicon surface of a silicon carbide substrate,
Providing a silicon carbide substrate having a silicon surface coated with an insulating film;
Removing the insulating film at a plurality of desired sites to expose the silicon surface;
A manufacturing method comprising: forming graphene on the exposed portion by heating the silicon carbide substrate; and forming an ohmic electrode on the graphene.
シリコン面を有するシリコンカーバイド基板を加熱することによって、当該シリコン面にグラフェンを形成するステップ、
前記グラフェンをドライエッチングによりアイソレーションするステップ、
前記アイソレーションにより形成された溝に絶縁膜を形成するステップ、および
前記グラフェンにオーミック電極を形成するステップを含む製造方法。 A method of manufacturing a graphene integrated circuit having a nonlinear element including graphene formed on a silicon surface of a silicon carbide substrate,
Forming graphene on the silicon surface by heating a silicon carbide substrate having the silicon surface;
Isolating the graphene by dry etching;
A manufacturing method comprising the steps of: forming an insulating film in the trench formed by the isolation; and forming an ohmic electrode on the graphene.
前記非線形素子のグラフェンに配置された複数の強磁性電極を含む、
ラテラル型の巨大磁気抵抗素子。 A graphene integrated circuit having a non-linear element including graphene formed on a silicon surface of a silicon carbide substrate, and a plurality of ferromagnetic electrodes disposed on the graphene of the non-linear element,
Lateral type giant magnetoresistive element.
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