JP2007314881A - Vapor deposition device for thin film formation - Google Patents
Vapor deposition device for thin film formation Download PDFInfo
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- 238000007740 vapor deposition Methods 0.000 title claims abstract description 70
- 239000010409 thin film Substances 0.000 title claims abstract description 20
- 230000015572 biosynthetic process Effects 0.000 title abstract description 4
- 239000000463 material Substances 0.000 claims abstract description 50
- 239000000758 substrate Substances 0.000 claims abstract description 25
- 238000001704 evaporation Methods 0.000 claims abstract description 19
- 230000008020 evaporation Effects 0.000 claims abstract description 16
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 230000008021 deposition Effects 0.000 claims description 11
- 229910052751 metal Inorganic materials 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 5
- 238000005507 spraying Methods 0.000 claims description 3
- 230000008602 contraction Effects 0.000 claims description 2
- 239000007921 spray Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 7
- 239000012808 vapor phase Substances 0.000 abstract description 2
- 238000002347 injection Methods 0.000 description 15
- 239000007924 injection Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 5
- 230000000903 blocking effect Effects 0.000 description 4
- 238000005137 deposition process Methods 0.000 description 2
- 238000010790 dilution Methods 0.000 description 2
- 239000012895 dilution Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000011368 organic material Substances 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
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- WMAXWOOEPJQXEB-UHFFFAOYSA-N 2-phenyl-5-(4-phenylphenyl)-1,3,4-oxadiazole Chemical compound C1=CC=CC=C1C1=NN=C(C=2C=CC(=CC=2)C=2C=CC=CC=2)O1 WMAXWOOEPJQXEB-UHFFFAOYSA-N 0.000 description 1
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- 101000837344 Homo sapiens T-cell leukemia translocation-altered gene protein Proteins 0.000 description 1
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- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/548—Controlling the composition
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
Abstract
Description
本発明は、薄膜形成用蒸着装置に関し、より詳しくは、蒸着材料の供給が不要な場合、それを遮断することによって、蒸着材料の使用効率を極大化することができる薄膜形成用蒸着装置に関する。 The present invention relates to a vapor deposition apparatus for forming a thin film, and more particularly to a vapor deposition apparatus for forming a thin film that can maximize the use efficiency of the vapor deposition material by blocking the supply of the vapor deposition material when it is unnecessary.
最近、情報通信技術の飛躍的な発展と市場の膨張によって、ディスプレイ素子として平板表示素子(フラット パネル ディスプレイ)が脚光を浴びている。このような平板表示素子としては、液晶表示素子、プラズマディスプレイ素子、有機発光素子などが代表的なものである。 Recently, flat display devices (flat panel displays) have been in the spotlight as display devices due to the dramatic development of information communication technology and the expansion of the market. Typical examples of such flat panel display elements include liquid crystal display elements, plasma display elements, and organic light emitting elements.
中でも、有機発光素子は、早い応答速度、従来の液晶表示素子より低い消費電力、軽量性、別途のバックライト装置の不要で超薄型で作られる点、高輝度などの特長から次世代ディスプレイ素子として脚光を浴びている。 Among them, organic light-emitting elements are next-generation display elements due to features such as high response speed, lower power consumption than conventional liquid crystal display elements, light weight, no need for a separate backlight device, and ultra-thinness. As the spotlight.
このような有機発光素子は、基板の上に、陽極膜、有機薄膜、陰極膜を順に成膜し、陽極と陰極との間に電圧をかけることによって、適宜なエネルギーの差が有機薄膜に形成され、自ら発光する原理である。即ち、注入される電子と正孔(hole)の再結合によって生じた励起エネルギーが光として発生するのである。この時、有機物質のドーパントの量によって、発生する光の波長が調節できるため、フルカラーの具現が可能である。 In such an organic light emitting device, an anode film, an organic thin film, and a cathode film are sequentially formed on a substrate, and an appropriate energy difference is formed in the organic thin film by applying a voltage between the anode and the cathode. It is a principle that emits light by itself. That is, excitation energy generated by recombination of injected electrons and holes is generated as light. At this time, since the wavelength of the generated light can be adjusted according to the amount of the dopant of the organic material, a full color can be realized.
有機発光素子の詳しい構造は、示していないが、基板上に、陽極、正孔(ホール)注入層、正孔転送層(hole transfer layer)、発光層、電子転送層(eletron transfer layer)、電子注入層、陰極が順に積層されて形成される。ここで、陽極としては、面抵抗が小さく、透過性が良いITO(Indium Tin Oxide)が主として使用される。そして、有機薄膜は、発光効率を高めるために、正孔注入層、正孔運送層、発光層、電子運送層、電子注入層の多層で構成され、発光層として使用される有機物質は、Alq3、TPD、PBD、m−MTDATA、TCTAなどである。また、陰極としては、LiF−Al金属膜が使用される。そして、有機薄膜は、空気中の水分と酸素に非常に弱いため、素子の寿命(life time)を増加させるためのキャップが封止される。 Although a detailed structure of the organic light emitting device is not shown, an anode, a hole injection layer, a hole transfer layer, a light emitting layer, an electron transfer layer, an electron are not shown on the substrate. An injection layer and a cathode are laminated in order. Here, as the anode, ITO (Indium Tin Oxide) having a small surface resistance and good permeability is mainly used. The organic thin film is composed of a multilayer of a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer in order to increase luminous efficiency. The organic material used as the light emitting layer is Alq. 3 , TPD, PBD, m-MTDATA, TCTA, and the like. In addition, a LiF—Al metal film is used as the cathode. Since the organic thin film is very sensitive to moisture and oxygen in the air, a cap for increasing the lifetime of the device is sealed.
従って、有機発光素子を製造するためには、多様な蒸着膜を形成しなければならないが、このような蒸着膜を形成するための従来の方法では、ポイント蒸着、ライン蒸着、有機気相蒸着(OVPD)、及びデジタル・スキャン・プロセッサー(DSP)などがある。 Accordingly, in order to manufacture an organic light emitting device, various deposition films must be formed. Conventional methods for forming such deposition films include point deposition, line deposition, and organic vapor deposition ( OVPD) and digital scan processor (DSP).
図1を参照して、従来のDSP方式による蒸着装置の構成を説明すると、蒸着材料を加熱して蒸発させる蒸発源120と、前記蒸発源120から蒸発された蒸着材料を移送する送り管130と、前記送り管130を通して供給された気相の蒸発材料を基板Sに向けて噴射する複数のノズルが備えられた噴射手段140とを含んでなる。
Referring to FIG. 1, the configuration of a conventional DSP vapor deposition apparatus will be described. An
前記のように構成された従来の蒸着装置100は、真空チャンバ内に基板Sをローディングし、ローディングされた基板とマスクMを整列して定位置に密着させた後、蒸発源120を加熱し、蒸着材料を基板Sに向けて噴射することによって、薄膜を形成する。
The conventional
一方、基板のローディング時、または基板とマスクの整列時などには、蒸着材料が噴射されてはならない。このため、従来では、回動可能なシャッター150を利用している。即ち、工程の準備時には、基板Sと噴射手段140との間にシャッター150を介在させることで、基板に蒸着材料が蒸着されることを防止し、工程時には、前記シャッター150を回動させて開放することで、基板に蒸着材料を蒸着する。
On the other hand, the vapor deposition material must not be sprayed when loading the substrate or aligning the substrate and the mask. For this reason, conventionally, a
ところが、有機発光素子の製造に利用される有機物などの蒸着材料の殆どは、非常に高価なものである。従って、シャッターによる方式は、噴射される蒸着材料を遮断して基板への蒸着を防ぐだけで、それを再活用することができないため、蒸着材料の無駄使いになるという問題点がある。 However, most of the vapor deposition materials such as organic substances used for manufacturing the organic light emitting device are very expensive. Therefore, the method using the shutter has a problem that the vapor deposition material is wasted because it cannot be reused simply by blocking the vapor deposition material to be sprayed to prevent vapor deposition on the substrate.
本発明は、上述した問題点を解決するために案出したものであって、本発明の目的は、蒸着材料の供給が不要な場合、これを遮断することによって、蒸着材料の使用効率を極大化することができる薄膜形成用蒸着装置を提供することにある。 The present invention has been devised in order to solve the above-described problems. The object of the present invention is to maximize the use efficiency of the vapor deposition material by blocking the supply of the vapor deposition material when it is unnecessary. An object of the present invention is to provide a vapor deposition apparatus for forming a thin film that can be converted into a thin film.
前記のような技術的課題を解決するために、本発明による薄膜形成用蒸着装置は、蒸着材料を加熱して蒸発させる蒸発源と、前記蒸発源から供給された気相の蒸着材料を移送する送り管と、前記送り管を開閉する開閉手段と、前記送り管に連結され、前記蒸着材料を基板に向けて噴射する噴射手段と、を含んでなる。 In order to solve the above technical problems, a thin film forming vapor deposition apparatus according to the present invention transfers an evaporation source that evaporates by heating the vapor deposition material, and a vapor deposition material supplied from the evaporation source. A feed pipe; opening and closing means for opening and closing the feed pipe; and injection means connected to the feed pipe and jetting the vapor deposition material toward the substrate.
前記開閉手段は、様々な形で製作されることができ、特に、空圧により伸縮可能なベローズと、前記ベローズの伸縮により前記送り管を開閉する金属口とを含んでなることが望ましい。 The opening / closing means can be manufactured in various forms, and in particular, preferably includes a bellows that can be expanded and contracted by pneumatic pressure and a metal port that opens and closes the feed pipe by expansion and contraction of the bellows.
また、前記送り管から分岐され、前記開閉手段により前記送り管の閉鎖時、蒸着材料を誘導するバイパスラインと、前記バイパスラインにより誘導される前記蒸着材料を貯蔵する貯蔵タンクがさらに備えられることがより望ましい。 Further, a bypass line branched from the feed pipe and guiding the vapor deposition material when the feed pipe is closed by the opening / closing means, and a storage tank for storing the vapor deposition material guided by the bypass line may be further provided. More desirable.
なお、前記開閉手段を加熱するヒーターがさらに備えられることが望ましい。 It is desirable that a heater for heating the opening / closing means is further provided.
また、前記噴射手段と基板との間には、回動可能なシャッターがさらに備えられても良い。 Further, a rotatable shutter may be further provided between the ejection unit and the substrate.
本発明によると、工程の進行によって、蒸着材料の供給を制御することができる。 According to the present invention, the supply of the vapor deposition material can be controlled by the progress of the process.
従って、蒸着材料の供給が不要な場合、これを遮断することによって、蒸着材料の使用効率を極大化することができる。 Therefore, when the supply of the vapor deposition material is unnecessary, the use efficiency of the vapor deposition material can be maximized by blocking this.
以下、添付した図面を参照して、本発明の構成及び作用を具体的に説明する。 Hereinafter, the configuration and operation of the present invention will be described in detail with reference to the accompanying drawings.
図2を参照すると、本発明による蒸着装置1は、蒸発源20、送り管30、噴射手段80、開閉手段40、50及びバイパスライン60を含んでなる。
Referring to FIG. 2, the
蒸発源20は、内部に金属または有機物などの蒸着材料を収容し加熱することによって、蒸着材料を蒸発させる要素である。
The
送り管30は、蒸発源20から蒸発された気相の蒸着材料を後述する噴射手段80に流入させる要素である。
The
噴射手段80は、送り管30から流入された前記気相の蒸着材料を基板Sに向けて噴射する複数の噴射ノズルを含んで構成される。前記基板Sは、メタルマスクMを整列して定位置に密着されている。また、噴射手段80と基板Sとの間には、シャッター90が備えられる。シャッター90は、回動可能に構成され、工程の準備時には、基板Sと噴射ヘッド80との間にシャッター90を介在させることで、基板Sに蒸着材料が蒸着されることを防止し、工程時には、シャッター90を回動させて開放することで、基板Sに蒸着材料を蒸着する。また、示していないが、噴射ヘッド80の温度を制御するための熱電対がさらに備えられる。
The
また、蒸着源20の上圧速度を制御するために、質量流量制御器(Mass Flow Controller、MFC)10が備えられるが、この時、希釈ガスが使用される。即ち、前記希釈ガスは、質量流量制御器10により供給量が制御され、供給ラインを通して注入される。
In addition, a mass flow controller (MFC) 10 is provided to control the upper pressure speed of the
特に、本発明による蒸着装置1は、送り管30を開閉する開閉手段40がさらに備えられている。開閉手段40により送り管30を開閉することによって、蒸発源20から蒸発された前記蒸着材料の噴射手段80への供給を制御することができる。
In particular, the
一方、開閉手段40によって送り管30が閉鎖される時、前記蒸着材料を誘導するバイパスライン60が、送り管30から分岐されて形成される。
On the other hand, when the
また、バイパスライン60上にも、開閉手段50がさらに備えられる。
An opening /
また、バイパスライン60を通して誘導される蒸着材料を貯蔵し再活用するために、貯蔵タンク70がさらに備えられている。
In addition, a
図3aを参照して、本発明による開閉手段40の構成を具体的に説明する。示しているように、開閉手段40は、空圧によって伸縮可能なベローズ41と、ベローズ41に連結され、送り管30を開閉する金属口42とを含んでなる。勿論、金属口42は、高温でも耐熱性を有する材質で形成される。
With reference to FIG. 3a, the structure of the opening / closing means 40 according to the present invention will be described in detail. As shown, the opening /
図3a乃至図3bを参照して、開閉手段40の作用を説明する。まず、図3aのように、蒸発源から蒸発された気相の蒸着材料が、送り管30を通して噴射手段に供給される。
The operation of the opening / closing means 40 will be described with reference to FIGS. 3a to 3b. First, as shown in FIG. 3 a, the vapor deposition material evaporated from the evaporation source is supplied to the injection means through the
次に、基板のローディングやマスクとの整列など、蒸着が行われない間には、図3bのように、ベローズ41に閉鎖用空圧を加えてベローズ41を伸ばし、その結果、ベローズ41に連結されている金属口42が、送り管30を閉鎖させる。この状態では、示していないが、噴射手段への供給が遮断された気相の蒸着材料は、バイパスラインに誘導され、貯蔵タンクに貯蔵される。
Next, while deposition is not performed such as substrate loading or alignment with the mask, the
逆に、蒸着工程を行うためには、ベローズ41に開放用空圧を加えてベローズ41を圧縮させ、その結果、図3aのように、金属口42が送り管30を開放させる。この時は、前記バイパスラインが閉鎖される。
On the contrary, in order to perform the vapor deposition step, the
以下、本発明による蒸着装置の作用を説明する。まず、真空チャンバ(示せず)の内部に基板Sをローディングし、マスクMを整列して定位置に密着させる。このような工程の準備中には、開閉手段40を用いて送り管30を閉鎖することによって、蒸着材料が噴射手段80に供給されることを遮断する。
Hereinafter, the operation of the vapor deposition apparatus according to the present invention will be described. First, the substrate S is loaded inside a vacuum chamber (not shown), and the mask M is aligned and brought into close contact with a fixed position. During the preparation of such a process, the
前記の準備段階が完了すると、シャッター90を回動させて開放し、開閉手段40を用いて送り管30を開放することによって、蒸着材料を噴射手段80に供給し、噴射手段80は、基板Sに向けて蒸着材料を噴射して蒸着する。
When the preparation step is completed, the
同様に、蒸着工程が完了する、または新しい蒸着工程を行うために準備する段階では、送り管30を閉鎖する。
Similarly, the
1 蒸着装置
10 質量流量制御器
20 蒸発源
30 送り管
40、50 バルブ
41 ベローズ
42 金属口
60 バイパスライン
70 貯蔵タンク
80 噴射ヘッド
90 シャッター
DESCRIPTION OF
Claims (6)
前記蒸発源から供給された気相の蒸着材料を移送する送り管と、
前記送り管を開閉する開閉手段と、
前記送り管に連結され、前記蒸着材料を基板に向けて噴射する噴射手段とを含んでなることを特徴とする薄膜形成用蒸着装置。 An evaporation source for heating and evaporating the vapor deposition material;
A feed pipe for transferring the vapor deposition material supplied from the evaporation source;
Opening and closing means for opening and closing the feed tube;
A vapor deposition apparatus for forming a thin film, characterized by comprising spraying means connected to the feed pipe and spraying the vapor deposition material toward the substrate.
空圧により伸縮可能なベローズと、
前記ベローズの伸縮により前記送り管を開閉する金属口とを含んでなることを特徴とする請求項1に記載の薄膜形成用蒸着装置。 The opening / closing means includes
Bellows that can be expanded and contracted by air pressure,
2. The vapor deposition apparatus for forming a thin film according to claim 1, further comprising a metal port that opens and closes the feed pipe by expansion and contraction of the bellows.
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KR1020060047241A KR100770653B1 (en) | 2006-05-25 | 2006-05-25 | Depositing apparatus forming thin film |
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Cited By (1)
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