JP2007278860A - 電気的接続装置 - Google Patents

電気的接続装置 Download PDF

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Publication number
JP2007278860A
JP2007278860A JP2006105930A JP2006105930A JP2007278860A JP 2007278860 A JP2007278860 A JP 2007278860A JP 2006105930 A JP2006105930 A JP 2006105930A JP 2006105930 A JP2006105930 A JP 2006105930A JP 2007278860 A JP2007278860 A JP 2007278860A
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JP
Japan
Prior art keywords
region
leaf spring
support substrate
block
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2006105930A
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English (en)
Japanese (ja)
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JP2007278860A5 (enExample
Inventor
Kazuto Hamada
和人 濱田
Takashi Akiba
孝志 秋庭
Satoshi Narita
聡 成田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2006105930A priority Critical patent/JP2007278860A/ja
Publication of JP2007278860A publication Critical patent/JP2007278860A/ja
Publication of JP2007278860A5 publication Critical patent/JP2007278860A5/ja
Pending legal-status Critical Current

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP2006105930A 2006-04-07 2006-04-07 電気的接続装置 Pending JP2007278860A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006105930A JP2007278860A (ja) 2006-04-07 2006-04-07 電気的接続装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006105930A JP2007278860A (ja) 2006-04-07 2006-04-07 電気的接続装置

Publications (2)

Publication Number Publication Date
JP2007278860A true JP2007278860A (ja) 2007-10-25
JP2007278860A5 JP2007278860A5 (enExample) 2009-04-30

Family

ID=38680448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006105930A Pending JP2007278860A (ja) 2006-04-07 2006-04-07 電気的接続装置

Country Status (1)

Country Link
JP (1) JP2007278860A (enExample)

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0547864A (ja) * 1991-08-12 1993-02-26 Advantest Corp プローブ
JPH06260541A (ja) * 1993-03-04 1994-09-16 Nippon Maikuronikusu:Kk 半導体チップソケット
JP2001007168A (ja) * 1999-06-23 2001-01-12 Matsushita Electric Ind Co Ltd 検査用基板
JP2002311049A (ja) * 2001-04-16 2002-10-23 Micronics Japan Co Ltd 電気的接続装置
JP2003139797A (ja) * 2001-08-22 2003-05-14 Mitsubishi Materials Corp コンタクトプローブ及びその製造方法
JP2005083863A (ja) * 2003-09-08 2005-03-31 Kobe Steel Ltd 電気的接続検査装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0547864A (ja) * 1991-08-12 1993-02-26 Advantest Corp プローブ
JPH06260541A (ja) * 1993-03-04 1994-09-16 Nippon Maikuronikusu:Kk 半導体チップソケット
JP2001007168A (ja) * 1999-06-23 2001-01-12 Matsushita Electric Ind Co Ltd 検査用基板
JP2002311049A (ja) * 2001-04-16 2002-10-23 Micronics Japan Co Ltd 電気的接続装置
JP2003139797A (ja) * 2001-08-22 2003-05-14 Mitsubishi Materials Corp コンタクトプローブ及びその製造方法
JP2005083863A (ja) * 2003-09-08 2005-03-31 Kobe Steel Ltd 電気的接続検査装置

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