JP2007248133A - Probe and measuring apparatus - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To prevent a malfunction and an insulation failure caused by the entry of a foreign body and deformation. <P>SOLUTION: The probe for measuring electric parameters 100 comprises an electrically conductive tubular outer terminal 110 and an electrically conductive columnar inner terminal 160 which is slidably arranged inside the outer terminal 110 with it insulated from the outer terminal 110 and of which the distal end part 163 protrudes from a distal end part 112 of the outer terminal 110 with it biased in the direction from the proximal end part to the distal end part 112 of the outer terminal 110 and with no external force is applied. The distal end part 163 of the inner terminal 160 includes an insulating bush 170 which is slidable with its outer periphery 171 being in contact with an inner periphery 114 of the outer terminal 110 along with the slide of the inner terminal 160. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a probe including an outer terminal and an inner terminal, and a measuring apparatus including the probe and configured to be able to measure an electrical parameter.

As this type of probe, a coaxial measurement probe unit (hereinafter also simply referred to as “probe”) disclosed by the applicant in Japanese Patent Application Laid-Open No. 7-104026 is known. This probe includes a cylindrical measurement probe (hereinafter also referred to as “tubular probe”) and a rod-shaped measurement probe (hereinafter also referred to as “bar probe”) slidably inserted therein. They are insulated from each other and configured as a single unit.
Japanese Patent Laid-Open No. 7-104026 (page 4, FIG. 4)

  However, the above probe has the following problems to be improved. That is, in this type of conventional probe including this probe, a gap is provided between the distal end portion of the cylindrical probe and the distal end portion of the rod-shaped probe in order to smoothly slide the rod-shaped probe. For this reason, there is a possibility that foreign matter enters the gap and the smooth sliding operation of the rod-shaped probe is hindered by the foreign matter. Further, for example, when a foreign object having conductivity such as a metal piece generated by the contact between the tip of the cylindrical probe and the rod-shaped probe and the measurement object at the time of measurement enters the gap, the cylindrical probe and the rod-shaped probe are There is a possibility that measurement may be difficult due to a short circuit. Further, in this type of probe, since a gap is provided between the tip of the cylindrical probe and the tip of the rod-like probe, each tip is in contact with the object to be measured (pressed) during measurement. When the probe is dragged in a state where the probe is dragged, the tip of the rod-shaped probe may be deformed and the smooth sliding operation may be hindered, or the tip of the rod-shaped probe may come into contact with the tip of the cylindrical probe. .

  The present invention has been made in view of such problems, and a main object of the present invention is to provide a probe that can prevent malfunctions and insulation defects caused by intrusion and deformation of foreign matter.

  In order to achieve the above object, the probe according to claim 1 is provided with a cylindrical outer terminal having conductivity, and is slidably disposed inside the outer terminal while being insulated from the outer terminal, and the outer terminal. A columnar inner terminal having conductivity, the tip of which protrudes from the tip of the outer terminal in a state where no external force is applied and biased from the base end of the terminal toward the tip. An electrical parameter measurement probe that is slid at the distal end portion of the inner terminal while the outer peripheral surface thereof is in contact with the inner peripheral surface of the outer terminal as the inner terminal slides. The bush which has property is arrange | positioned.

  The probe according to claim 2 is the probe according to claim 1, wherein the bush has a distal end surface located on the base end side of the outer terminal with respect to the most distal end portion of the inner terminal and the external force. In a state where no is added, at least a part of the tip surface projects from the tip of the outer terminal.

  The probe according to claim 3 is disposed on the outer peripheral side of the inner terminal so as to be slidable in a state of being insulated from the inner terminal and a columnar inner terminal having conductivity. Electrically provided with a cylindrical outer terminal having conductivity, the tip of which protrudes from the tip of the inner terminal when no external force is applied to the tip from the head side A probe for inspection, which has an insulating bush that is slid on the inner peripheral surface of the outer terminal while the inner peripheral surface is in contact with the outer peripheral surface of the inner terminal as the outer terminal slides. Is arranged.

  The probe according to claim 4 is the probe according to claim 3, wherein the bush has a distal end surface positioned on the proximal end side of the inner terminal with respect to the distal end portion of the outer terminal and the external force is applied. In a state where it is not added, the distal end surface is configured to be positioned closer to the most distal end portion side of the outer terminal than the distal end portion of the inner terminal.

  The probe according to claim 5 is provided with a cylindrical outer terminal having conductivity, and is slidably disposed inside the outer terminal while being insulated from the outer terminal, and at the base end of the outer terminal. An electrical parameter provided with a columnar inner terminal having conductivity, the tip of which protrudes from the tip of the outer terminal when no external force is applied to the tip from the head side In the measurement probe, the inner peripheral surface of the tip of the outer terminal is provided with an insulative bush that contacts the outer peripheral surface of the inner terminal when the inner terminal slides Has been.

  The probe according to claim 6 is the probe according to claim 5, wherein the bush has a distal end surface located on the base end side of the outer terminal with respect to the most distal end portion of the outer terminal. Has been.

  A measuring apparatus according to a seventh aspect includes the probe according to any one of the first to sixth aspects, and a measuring unit that measures an electrical parameter based on a signal input via the probe.

  According to the probe of Claim 1, the bush which has the insulation which is made to slide in the state which the outer peripheral surface contacted the inner peripheral surface of the outer side terminal with the slide of the inner side terminal was arrange | positioned in the front-end | tip part of the inner side terminal. Thus, even if a force is applied in the direction in which the inner terminal is bent during measurement, the outer peripheral surface of the bush comes into contact with the inner peripheral surface of the outer terminal, so that deformation of the inner terminal can be reliably prevented. . For this reason, it is possible to reliably prevent the malfunction of the probe and the insulation failure due to the deformation of the inner terminal. In addition, even if a foreign object such as a metal piece enters the space formed by the inner peripheral surface of the outer terminal and the front end surface of the bush, the bushing slides as the inner terminal slides toward the front end side of the outer terminal. The foreign matter can be pushed out of the probe. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the entry of foreign matter.

  Further, according to the probe of claim 2, at least a part of the distal end surface is located in a state where the distal end surface is positioned on the proximal end portion side of the outer terminal than the most distal end portion of the inner terminal and no external force is applied. By configuring the bush so as to protrude from the distal end portion of the outer terminal, the contact portion formed at the distal end portion of the inner terminal can be reliably brought into contact with the measurement target body, and the probe is separated from the measurement target body. When this is done, the foreign matter that has entered the space formed by the inner peripheral surface of the outer terminal and the tip end surface of the bush can be reliably pushed out of the probe.

  According to the probe of the third aspect, the insulating bush that is slid in a state where the inner peripheral surface thereof is in contact with the outer peripheral surface of the inner terminal as the outer terminal slides is provided on the inner peripheral surface of the outer terminal. Even if a force is applied in the direction in which the inner terminal is bent during measurement, the outer peripheral surface of the inner terminal contacts the inner peripheral surface of the bush disposed on the inner peripheral surface of the outer terminal. Therefore, deformation of the inner terminal can be reliably prevented. For this reason, it is possible to reliably prevent the malfunction of the probe and the insulation failure due to the deformation of the inner terminal. Even if a foreign object such as a metal piece enters the space formed by the inner peripheral surface of the bush and the tip of the inner terminal, the foreign object can be pushed out of the probe by the tip of the inner terminal. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the entry of foreign matter.

  Further, according to the probe of claim 4, the distal end surface is located on the proximal end side of the inner terminal with respect to the most distal end portion of the outer terminal, and the distal end surface is the distal end portion of the inner terminal when no external force is applied. By configuring the bushing so that it is located closer to the most distal portion side of the outer terminal, the contact part formed at the tip of the outer terminal can be reliably brought into contact with the measurement object and the probe is measured. When pressed against the object, foreign matter that has entered the space formed by the inner peripheral surface of the bush and the tip of the inner terminal can be reliably pushed out of the probe.

  According to the probe of claim 5, the bush having an insulating property that the outer peripheral surface of the inner terminal contacts the inner peripheral surface when the inner terminal slides is disposed on the inner peripheral surface of the tip portion of the outer terminal. Therefore, even if a force is applied in the direction in which the inner terminal is bent during measurement, the outer peripheral surface of the tip of the inner terminal contacts the inner peripheral surface of the bush, so that deformation of the inner terminal can be reliably prevented. it can. For this reason, it is possible to reliably prevent the malfunction of the probe and the insulation failure due to the deformation of the inner terminal. Even if a foreign object such as a metal piece enters the space formed by the inner peripheral surface of the bush and the tip of the inner terminal, the foreign object is removed from the probe by sliding the inner terminal toward the tip of the probe. Can be extruded. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the entry of foreign matter.

  The probe according to claim 6 is formed at the distal end portion of the outer terminal by configuring the bush so that the distal end surface thereof is located closer to the proximal end portion side of the outer terminal than the most distal end portion of the outer terminal. The contacted part can be reliably brought into contact with the measurement object.

  Moreover, according to the measuring apparatus of Claim 7, it can prevent reliably the situation where measurement becomes difficult due to the malfunction of a probe by providing said probe.

  The best mode of the probe and measuring apparatus according to the present invention will be described below with reference to the accompanying drawings.

  First, configurations of the probe 100 and the battery tester 1 will be described with reference to the drawings.

  A battery tester 1 shown in FIG. 1 is an example of a measuring apparatus according to the present invention, and is configured to be able to measure a resistance value of an internal resistance of the battery 200 (an example of an electrical parameter in the present invention) by a four-terminal method. Yes. Specifically, the battery tester 1 includes a power supply unit 2, a probe unit 3 (see FIG. 2), a voltage detection unit 4, a RAM 5, an operation unit 6, a display unit 7, and a CPU 8. The power supply unit 2 is configured to be able to generate an alternating current Im for measurement. In this case, the alternating current Im generated by the power supply unit 2 is output to the pair of electrodes 201 and 201 in the battery 200 via the probe 100 of the probe unit 3 shown in FIG.

  The probe unit 3 includes main body portions 31, 31, cables 32, 32..., Connectors 33, 33, and a probe 100. The main body portion 31 is configured to include an attachment portion to which the probe 100 can be attached, and is connected to the connector 33 via the cable 32. The connector 33 is configured to be insertable into an insertion port provided on the front panel of the battery tester 1, and in a state of being inserted into the insertion port, the power supply unit 2, the voltage detection unit 4, and the main body unit via the cable 32. The probe 100 attached to 31 is connected.

  The probe 100 is an example of the probe according to the present invention, and is formed in a rod shape as a whole as shown in FIG. In this case, as shown in FIG. 2, the probe 100 is attached to the main body 31 with the proximal end 101 side inserted into the attachment portion of the main body 31 and the distal end 102 side exposed. As shown in FIG. 4, the probe 100 includes an outer terminal 110, insulating pipes 120 and 130, a support pipe 140, a spring 150, an inner terminal 160 and a bush 170.

  As shown in FIGS. 3 and 4, the outer terminal 110 is formed in a cylindrical shape (an example of a cylindrical shape in the present invention) from a conductive material such as metal. In this case, the outer terminal 110 is connected to the power supply unit 2 via the cable 32 and the connector 33 in a state where the probe 100 is attached to the main body unit 31. The insulating pipe 120 is formed in a cylindrical shape from an insulating material such as resin, and is inserted into the base end 111 side of the outer terminal 110. A contact portion 113 having a sharp tip is formed on the tip surface of the tip portion 112 of the outer terminal 110. The insulating pipe 130 is formed in a cylindrical shape from an insulating material such as resin, and is inserted into the outer terminal 110.

  As shown in FIG. 4, the support pipe 140 is formed into a bottomed cylindrical shape using a conductive material such as metal, and a portion excluding the base end portion 141 is accommodated in the outer terminal 110. Further, the support pipe 140 is fixed so as to be insulated from the outer terminal 110 by being disposed so as to pass through the central portions of the insulating pipes 120 and 130 inserted into the outer terminal 110. . In this case, the support pipe 140 is connected to the voltage detection unit 4 via the cable 32 and the connector 33 while being attached to the main body unit 31. The spring 150 is disposed on the bottom side (the right side in the figure) inside the support pipe 140.

  The inner terminal 160 is formed of a conductive material such as metal in a columnar shape (an example of a columnar shape in the present invention) in which the distal end portion 163 is larger in diameter than the base end portion 161 and the central portion 162. Further, a contact portion 164 having a sharp tip is formed on the tip surface of the tip portion 163 of the inner terminal 160. The inner terminal 160 is slidably supported by the support pipe 140 by inserting the base end portion 161 and the central portion 162 into the support pipe 140 (that is, slidably disposed inside the outer terminal 110). At the same time, it is electrically connected to the support pipe 140. Further, the inner terminal 160 is urged from the base end 111 side to the front end 112 side of the outer terminal 110 by a spring 150 disposed inside the support pipe 140. In this case, as shown in FIGS. 3 and 4, the inner terminal 160 is configured such that a part (at least the contact part 164) of the tip part 163 is a tip part 112 (contact part 113) of the outer terminal 110 when no external force is applied. The length is defined so as to protrude from (). With the above configuration, the inner terminal 160 is slidably disposed inside the outer terminal 110 while being insulated from the outer terminal 110 by the insulating pipes 120 and 130 and a bush 170 described later.

  As shown in FIG. 5, the bush 170 is formed in a cylindrical shape as a whole by an insulating material such as resin, and is fixed to the tip portion 163 of the inner terminal 160. Further, the outer diameter of the bush 170 is slidable with the outer peripheral surface 171 in contact with the inner peripheral surface 114 of the outer terminal 110 as the inner terminal 160 slides. The inner diameter is slightly smaller than the inner diameter. Further, as shown in the figure, the bush 170 has a distal end surface 172 in a state where the distal end surface 172 is positioned on the proximal end portion 161 side with respect to the most distal end portion of the inner terminal 160 and no external force is applied to the inner terminal 160. The length is defined so that at least a part of 172 protrudes from the front end portion 112 (contact portion 113) of the outer terminal 110. Note that the length of the inner terminal 160 can be defined so that the entire distal end surface 172 protrudes from the distal end portion 112 (contact portion 113) of the outer terminal 110 when no external force is applied.

  The voltage detection unit 4 is configured to include, for example, an A / D conversion circuit (not shown), and the electrode 201 generated when an alternating current Im is supplied between the electrodes 201 and 201 of the battery 200 according to the control of the CPU 8. The voltage value V of the voltage between 201 is detected, and voltage data Dv indicating the voltage value V is output. The RAM 5 stores (stores) the resistance value R (measured value of the parameter in the present invention) of the battery 200 under the control of the CPU 8. As shown in FIG. 2, the operation unit 6 includes various switches such as a power switch 61 and a start switch 62, and is disposed on the front panel of the battery tester 1 to handle each switch operation. The operation signal So to be output is output to the CPU 8.

  The display unit 7 is composed of, for example, an LCD panel, and is disposed on the front panel of the battery tester 1 and displays a measured value (resistance value R) according to the control of the CPU 8 as shown in FIG. The CPU 8 constitutes a measurement unit according to the present invention together with the voltage detection unit 4, and calculates (measures) the resistance value R of the battery 200 based on the voltage data Dv output from the voltage detection unit 4. Further, the CPU 8 stores the calculated resistance value R in the RAM 5 and causes the display unit 7 to display the resistance value R.

  Next, a method for measuring the resistance value R of the battery 200 using the battery tester 1 will be described with reference to the drawings.

  First, the power switch 61 of the operation unit 6 is operated. At this time, the CPU 8 initializes the RAM 5 and erases each data stored in the RAM 5. Next, the start switch 62 is operated. At this time, the operation unit 6 outputs an operation signal So corresponding to the start switch 62, and the CPU 8 executes resistance value measurement processing according to the operation signal So. In this resistance value measurement process, the CPU 8 controls the power supply unit 2 to generate an alternating current Im. Subsequently, the body portions 31 and 31 of the probe unit 3 to which the probe 100 is attached are pressed against the electrodes 201 and 201 of the battery 200.

  At this time, as shown in FIG. 5, the contact portion 164 formed at the distal end portion 163 of the inner terminal 160 in the probe 100 contacts the electrode 201, and then the inner terminal 160 is pressed by the main body portion 31. And is slid toward the base end 101 side (in the direction of the arrow shown in the figure) against the urging force of the spring 150. In addition, as the inner terminal 160 slides, the bush 170 disposed at the distal end portion 163 of the inner terminal 160 is slid with the outer peripheral surface 171 in contact with the inner peripheral surface 114 of the outer terminal 110 (sliding). Move). For this reason, even if the probe 100 is dragged in a direction orthogonal to the pressing direction while the contact portion 164 of the inner terminal 160 is in contact with the electrode 201, a force is applied in a direction in which the inner terminal 160 is bent. The outer peripheral surface 171 of the bush 170 abuts on the inner peripheral surface 114 of the outer terminal 110, so that deformation of the inner terminal 160 is prevented. As a result, the smooth sliding of the inner terminal 160 is maintained, and the tip 163 of the inner terminal 160 contacts the inner peripheral surface 114 of the outer terminal 110 (short circuit between the inner terminal 160 and the outer terminal 110 (insulation failure). )) Is prevented.

  Next, as shown in FIG. 6, the tip portion 112 of the outer terminal 110 approaches the electrode 201 by sliding the inner terminal 160, and then the contact portion 113 formed on the tip portion 112 contacts the electrode 201. As a result, the alternating current Im from the power supply unit 2 is supplied between the electrodes 201 and 201 of the battery 200 via the outer terminal 110 of the probe 100 of the probe unit 3. Next, the voltage detector 4 detects the voltage value V of the voltage generated between the electrodes 201 and 201 by the supply of the alternating current Im, and outputs voltage data Dv indicating the voltage value V. Subsequently, the CPU 8 calculates the resistance value R of the battery 200 based on the voltage data Dv. Subsequently, the CPU 8 stores the calculated resistance value R in the RAM 5 and controls the display unit 7 to display the resistance value R.

  Next, the pressing of the main body 31 against the electrode 201 is released, and the measurement is finished. At this time, as shown in FIG. 7, the contact portion 113 of the outer terminal 110 is separated from the 201 in a state where the contact portion 164 of the inner terminal 160 is in contact with the electrode 201 by the urging force of the spring 150. That is, the inner terminal 160 is relatively slid toward the distal end portion 102 side of the probe 100 (the distal end portion 112 side of the outer terminal 110). Further, the bush 170 disposed at the distal end portion 163 of the inner terminal 160 is slid toward the distal end portion 102 side of the probe 100 as the inner terminal 160 slides.

  Here, as shown in FIG. 7, for example, when the probe 100 is pressed against the electrode 201, the foreign matter M such as a metal piece generated by scraping off the electrode 201 by the contact portions 113 and 164 is caused by the inner periphery of the outer terminal 110. Even if it enters the space formed by the surface 114 and the tip portion 163 (contact portion 164) of the inner terminal 160, it is pushed out of the probe 100 by the movement of the bush 170 toward the tip portion 102 side. For this reason, it is possible to prevent a situation in which the smooth sliding operation of the inner terminal 160 is hindered by the invading foreign matter M, or the outer terminal 110 and the inner terminal 160 are short-circuited, making measurement difficult.

  As described above, according to the probe 100, the bush 170 is disposed at the distal end portion 163 of the inner terminal 160, so that even if a force is applied in the direction in which the inner terminal 160 is bent at the time of measurement, the bush 170. Since the outer peripheral surface 171 contacts the inner peripheral surface 114 of the outer terminal 110, the inner terminal 160 can be reliably prevented from being deformed. For this reason, it is possible to reliably prevent malfunctions and insulation defects of the probe 100 due to the deformation of the inner terminal 160. Further, even if a foreign matter M such as a metal piece enters the space formed by the inner peripheral surface 114 of the outer terminal 110 and the distal end surface 172 of the bush 170, the inner terminal 160 slides toward the distal end portion 102 side. The foreign matter M can be pushed out of the probe 100 by sliding the bush 170. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the intrusion of the foreign matter M. Therefore, according to the battery tester 1 provided with the probe 100, it is possible to reliably prevent a situation in which measurement is difficult due to the malfunction of the probe 100.

  Further, according to the probe 100, the bush 170 is configured such that the distal end surface 172 is positioned closer to the proximal end portion 111 side of the outer terminal 110 than the most distal end portion of the contact portion 164 in the inner terminal 160. The contact portion 164 formed at the front end portion 163 of 160 can be reliably brought into contact with the measurement object. Furthermore, the probe 100 is separated from the measurement object by configuring the bush 170 so that a part of the tip surface 172 protrudes from the valley of the contact portion 113 in the outer terminal 110 in a state where no external force is applied. Sometimes, the foreign matter M that has entered the space formed by the inner peripheral surface 114 of the outer terminal 110 and the distal end surface 172 of the bush 170 can be reliably pushed out of the probe 100. Therefore, according to the battery tester 1 provided with the probe 100, it is possible to more reliably prevent a situation in which measurement is difficult due to the malfunction of the probe 100.

  Next, a probe 300 as another example of the probe according to the present invention will be described. In addition, the overlapping description is abbreviate | omitted about the same structure and function as the probe 100. As shown in FIG. 8, the probe 300 is formed in a rod shape as a whole, and can be attached to the main body 31 with the proximal end 301 side inserted into the mounting portion of the main body 31 and the distal end 302 side exposed. It is configured. As shown in FIG. 9, the probe 300 includes a main body 310, an insulating pipe 320, an inner terminal 330, a spring 340, an outer terminal 350, and a bush 360.

  As shown in FIGS. 8 and 9, the main body 310 is formed in a cylindrical shape from a conductive material such as metal. The insulating pipe 320 is formed in a cylindrical shape from an insulating material such as resin, and is inserted into the base end portion 311 side of the main body portion 310. The inner terminal 330 is made of a conductive material such as metal, and has a distal end portion 333 having a larger diameter than the base end portion 331 and the central portion 332 in a cylindrical shape. Further, a contact portion 334 having a sharp tip is formed on the tip surface of the tip portion 333 in the inner terminal 330. The inner terminal 330 is fixed in an insulated state with respect to the main body 310 by being disposed so as to pass through the central portion of the insulating pipe 320 inserted into the main body 310. In this case, the inner terminal 330 is connected to the voltage detection unit 4 via the cable 32 and the connector 33 while being attached to the main body 31 of the probe unit 3.

  The spring 340 is disposed slightly closer to the distal end portion 312 than the central portion of the main body portion 310. The outer terminal 350 is formed in a cylindrical shape by a conductive material such as metal. Further, a contact portion 352 having a sharp tip is formed at the tip portion 351 of the outer terminal 350. The outer terminal 350 is slidably disposed on the outer peripheral side of the tip portion 333 of the inner terminal 330 while being insulated from the inner terminal 330 by the bush 360. The outer terminal 350 is urged by the spring 340 from the proximal end portion 331 side of the inner terminal 330 toward the distal end portion 333 side. In this case, as shown in FIGS. 9 and 10, the outer terminal 350 has a length so that the distal end portion 351 protrudes from the distal end portion 333 (contact portion 334) of the inner terminal 330 when no external force is applied. Is stipulated.

  As shown in FIG. 10, the bush 360 is formed in a cylindrical shape from an insulating material such as resin, and is disposed on the inner peripheral surface 353 of the outer terminal 350. The bush 360 is slidable with the inner peripheral surface 361 contacting the outer peripheral surface 335 of the front end 333 of the inner terminal 330 as the outer terminal 350 slides, and the inner diameter of the bush 360 is the front end 333 of the inner terminal 330. The outer diameter is slightly larger than the outer diameter. In addition, the bush 360 has a distal end surface 362 that is positioned closer to the proximal end portion 331 of the inner terminal 330 than the most distal end portion (the distal end portion of the contact portion 352) of the outer terminal 350 and has no distal force applied thereto. The surface 362 is configured to be positioned closer to the most distal end portion of the outer terminal 350 than the tip portion 333 of the inner terminal 330.

  When the resistance value R of the battery 200 is measured using the battery tester 1 having the probe 300, the probe 300 is attached as shown in FIG. 10 after the operation unit 6 is operated as described above. The body portions 31 and 31 of the probe unit 3 thus pressed are pressed against the electrodes 201 and 201 of the battery 200.

  At this time, as shown in FIG. 10, the contact portion 352 formed at the distal end portion 351 of the outer terminal 350 in the probe 300 contacts the electrode 201, and then the outer terminal 350 is moved to the probe 300 by pressing the main body portion 31. And is slid toward the base end 301 side (in the direction of the arrow shown in the figure) against the urging force of the spring 340. Further, as the outer terminal 350 slides, the bush 360 in a state where the inner peripheral surface 361 of the bush 360 disposed on the inner peripheral surface 353 of the outer terminal 350 is in contact with the outer peripheral surface 335 of the front end portion 333 of the inner terminal 330. Is slid.

  Next, as shown in FIG. 11, the distal end portion 333 of the inner terminal 330 approaches the electrode 201 by sliding the outer terminal 350, and subsequently, as shown in FIG. 12, the contact portion 334 formed on the distal end portion 333. Contacts the electrode 201. Here, as shown in FIG. 11, for example, it is assumed that a foreign matter M such as a metal piece has entered the space formed by the inner peripheral surface 361 of the bush 360 and the tip portion 333 (contact portion 334) of the inner terminal 330. In addition, since the bush 360 is slid in a state where the outer peripheral surface 335 of the tip portion 333 is in contact with the inner peripheral surface 361 of the bush 360, the foreign matter M is pushed out of the probe 300 by the tip portion 333. For this reason, it is possible to prevent a situation in which the smooth sliding operation of the outer terminal 350 is hindered by the foreign matter M that has entered, or the outer terminal 350 and the inner terminal 330 are short-circuited, making measurement difficult. Next, when the voltage detection unit 4 and the CPU 8 operate as described above, the resistance value R of the battery 200 is displayed on the display unit 7. Next, the pressing of the main body 31 against the electrode 201 is released, and the measurement is finished.

  As described above, according to the probe 300, the bush 360 is disposed on the inner peripheral surface 353 of the outer terminal 350, so that even if a force is applied in the direction in which the inner terminal 330 is bent at the time of measurement, Since the outer peripheral surface 335 of the terminal 330 abuts on the inner peripheral surface 361 of the bush 360 disposed on the inner peripheral surface 353 of the outer terminal 350, deformation of the inner terminal 330 can be reliably prevented. For this reason, it is possible to reliably prevent malfunction and insulation failure of the probe 300 due to deformation of the inner terminal 330. Further, even if a foreign matter M such as a metal piece enters the space formed by the inner peripheral surface 361 of the bush 360 and the tip portion 333 of the inner terminal 330, the tip portion 333 pushes the foreign matter M out of the probe 300. be able to. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the intrusion of the foreign matter M. Therefore, according to the battery tester 1 including the probe 300, it is possible to reliably prevent a situation in which measurement is difficult due to the malfunction of the probe 300.

  Further, according to the probe 300, the distal end surface 362 of the outer terminal 350 is configured such that the distal end surface 362 is positioned closer to the proximal end portion 331 of the inner terminal 330 than the most distal end portion of the outer terminal 350. The contact portion 352 formed on the portion 351 can be reliably brought into contact with the measurement object. Further, the bush 360 is configured such that the distal end surface 362 is positioned on the most distal end side of the outer terminal 350 with respect to the distal end portion 333 of the inner terminal 330 in a state where no external force is applied, whereby the probe 300 is measured. When pressed, the foreign matter M that has entered the space constituted by the inner peripheral surface 361 of the bush 360 and the tip 333 of the inner terminal 330 can be reliably pushed out of the probe 300. Therefore, according to the battery tester 1 including the probe 300, it is possible to more reliably prevent a situation in which measurement is difficult due to the malfunction of the probe 300.

  In addition, this invention is not limited to said structure. For example, the configuration example provided with the bush 170 that slides with the sliding of the inner terminal 160 and the configuration example that includes the bush 360 that slides with the sliding of the outer terminal 350 have been described above. It is also possible to adopt a configuration including a bush that does not slide. Specifically, the probe 400 shown in the figure includes a bush 470 in place of the bush 170 of the probe 100 described above. In this case, the bush 470 is formed in a cylindrical shape from an insulating material such as resin, and is disposed on the inner peripheral surface 114 of the distal end portion 112 of the outer terminal 110. The bush 470 is slidable in a state where the outer peripheral surface 165 of the distal end portion 163 of the inner terminal 160 is in contact with the inner peripheral surface 471 when the inner terminal 160 is slid, so that the inner diameter is larger than the outer diameter of the distal end portion 163. Slightly larger diameter. Further, the length of the bush 470 is defined such that the distal end surface 472 is positioned closer to the proximal end portion 111 of the outer terminal 110 than the most distal end portion of the outer terminal 110 (the distal end portion of the contact portion 113).

  According to the probe 400, the bush 470 is disposed on the inner peripheral surface 114 of the tip 112 of the outer terminal 110, so that even if a force is applied in the direction in which the inner terminal 160 is bent during measurement, the bush 470. Since the outer peripheral surface 165 of the tip 163 of the inner terminal 160 abuts on the inner peripheral surface 471 of the inner terminal 160, deformation of the inner terminal 160 can be reliably prevented. For this reason, it is possible to reliably prevent malfunction and insulation failure of the probe 400 due to deformation of the inner terminal 160. Even if a foreign matter M such as a metal piece enters the space formed by the inner peripheral surface 471 of the bush 470 and the distal end portion 163 of the inner terminal 160, the inner terminal 160 toward the distal end portion 402 side of the probe 400 can be reduced. The foreign matter M can be pushed out of the probe 400 by sliding. For this reason, it is possible to reliably prevent malfunctions and insulation defects caused by the intrusion of the foreign matter M. Therefore, according to the battery tester 1 including the probe 400, it is possible to reliably prevent a situation in which measurement is difficult due to the malfunction of the probe 400.

  Further, according to the probe 400, the bush 470 is configured such that the distal end surface 472 is positioned closer to the proximal end portion 111 of the outer terminal 110 than the most distal end portion (the distal end portion of the contact portion 113) of the outer terminal 110. Thereby, the contact part 113 formed in the front-end | tip part 112 of the outer side terminal 110 can be made to contact a measuring object body reliably. Therefore, according to the battery tester 1 including the probe 400, it is possible to reliably prevent a situation in which measurement is difficult due to poor contact of the probe 100.

  Moreover, although the battery tester 1 has been described above with respect to the example in which the resistance value of the battery 200 is measured, the same effects as described above can be achieved when measuring the resistance values of various measurement objects. In addition, the present invention can be applied to a measuring device that can measure an electrical parameter without being limited to a resistance value.

1 is a configuration diagram showing a configuration of a battery tester 1. FIG. 1 is a front view of a battery tester 1. FIG. 2 is a side view of the probe 100. FIG. 2 is a cross-sectional view of a probe 100. FIG. 4 is a cross-sectional view of a tip portion 102 in a probe 100. FIG. 4 is a cross-sectional view of the probe 100 in a state where a contact portion 113 of an outer terminal 110 and a contact portion 164 of an inner terminal 160 are in contact with an electrode 201. FIG. 3 is a cross-sectional view of a state in which a probe 100 is separated from an electrode 201. 4 is a side view of the probe 300. FIG. 2 is a cross-sectional view of a probe 300. FIG. FIG. 4 is a cross-sectional view of a distal end portion 302 in the probe 300. FIG. 6 is a cross-sectional view of the distal end portion 302 in a state where the probe 300 is pressed against an electrode 201. FIG. 6 is a cross-sectional view of the probe 300 in a state where a contact portion 352 of an outer terminal 350 and a contact portion 334 of an inner terminal 330 are in contact with an electrode 201. 4 is a cross-sectional view of a distal end portion 402 in a probe 400. FIG.

Explanation of symbols

1 Battery Tester 1 Battery Tester 4 Voltage Detection Unit 8 CPU
100, 300, 400 Probe 110, 350 Outer terminal 111, 331 Base end 112, 163, 333, 351 Tip 114, 353, 361, 471 Inner peripheral surface 120, 130, 320 Insulated pipe 150, 340 Spring 160, 330 Inner terminal 164,352 Contact portion 170,360,470 Bushing 171,335 Outer peripheral surface 172,362 Tip surface R Resistance value

Claims (7)

A cylindrical outer terminal having conductivity, and is slidably disposed inside the outer terminal while being insulated from the outer terminal, and attached from the proximal end side to the distal end side of the outer terminal. A probe for measuring electrical parameters, including a columnar inner terminal having conductivity, the tip of which protrudes from the tip of the outer terminal in a state where no external force is applied,
The probe in which the bush which has insulation which is made to slide in the state where the outer peripheral surface contacted the inner peripheral surface of the outside terminal with the slide of the inner terminal is arranged at the tip part of the inner terminal.   The front end surface of the bush is positioned closer to the base end side of the outer terminal than the most distal end portion of the inner terminal, and at least a part of the front end surface is not applied to the outer terminal. The probe of Claim 1 comprised so that it may protrude from the said front-end | tip part. A columnar inner terminal having conductivity, and is arranged on the outer peripheral side of the inner terminal so as to be slidable while being insulated from the inner terminal, and attached from the proximal end side to the distal end side of the inner terminal. A probe for electrical inspection comprising a cylindrical outer terminal having conductivity, the tip of which protrudes from the tip of the inner terminal in a state where no external force is applied,
A probe having an insulating bush arranged on the inner peripheral surface of the outer terminal so that the inner peripheral surface is in contact with the outer peripheral surface of the inner terminal as the outer terminal slides.   The front end surface of the bush is located closer to the base end side of the inner terminal than the most distal end portion of the outer terminal, and the front end surface is more than the front end portion of the inner terminal when no external force is applied. The probe according to claim 3, which is also configured to be positioned on the most distal end side of the outer terminal. A cylindrical outer terminal having conductivity, and is slidably disposed inside the outer terminal while being insulated from the outer terminal, and attached from the proximal end side to the distal end side of the outer terminal. A probe for measuring electrical parameters, including a columnar inner terminal having conductivity, the tip of which protrudes from the tip of the outer terminal in a state where no external force is applied,
The probe in which the bushing which has the insulation which the outer peripheral surface of the said inner side terminal contacts the inner peripheral surface is arrange | positioned at the inner peripheral surface of the said front-end | tip part of the said outer side terminal when the said inner side terminal slides.   The probe according to claim 5, wherein the bush is configured such that a distal end surface thereof is positioned closer to the proximal end portion of the outer terminal than the most distal end portion of the outer terminal.   A measuring apparatus comprising: the probe according to any one of claims 1 to 6; and a measuring unit that measures an electrical parameter based on a signal input via the probe.

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