JP2007225485A - 温度定点セル、温度定点装置及び温度計校正方法 - Google Patents
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- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
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Abstract
【解決手段】炭素を成分とするるつぼと、このるつぼに封入された定点物質とから温度定点るつぼ4が構成されており、この定点物質は、炭素と炭素化合物の包晶組織であり、この温度定点るつぼ4を炉内に設置し周囲温度を上昇または下降せしめ、その時の温度定点るつぼ4の温度を温度計にて測定し、測定された温度変化状態から温度計9を校正する。
【選択図】図1
Description
(社)日本電気計測器工業界編「新編温度計の正しい使い方」、第7章、日本工業出版社(1997年発行) Quinn,T.J.,Chandler, T.R.D.:Temperature,Its Measurement and Control in Science and Industry, Plumb, H.H. (ed.), Vol. 4, Part 1, p.295, Pittsburgh:Instrument Society of America (1972), Coates, P.B.., Chandler, T.R.D.,Andrews, J.W., High Temperature and High Pressure, Vol. 15, p.573 (1983) Sakate,H.,Sakuma,F.,Ono,A.,Metrologia,Vol32, p.129, (1995) 伊藤、計測自動制御学会論文集、19巻、12号、p.978 (1983))
(3)内挿で校正できるため、従来のような高精度標準放射温度計の精密な特性評価も不要となり、校正作業が著しく簡単化され、温度目盛りの供給体系の整備が進む。
(5)2500℃より高温域では、高純度金属粉末の入手が困難で金属炭化物−炭素共晶点の精度が得られていなかったが、高純度タングステン粉末は容易に入手可能でこれを利用したWC−C包晶点により高精度定点が実現できる。
(7)今後高温用熱電対の開発にあたって、安定性や個体差等の特性評価を高精度で行うことが可能になり、熱電対の特性改善にも寄与する。
2 金属−炭素共晶
3 黒体空洞
4 温度定点るつぼ
5 グラファイト製炉心管
6 モニタ用放射温度計
9 被校正放射温度計
10 石英ガラス
11 アルミナ製炉心管
12 ヒータエレメント
15 被校正熱電対
16 モニタ用熱電対
Claims (7)
- 炭素を成分とするるつぼと、該るつぼに封入された定点物質とからなる温度定点セルであって、前記定点物質は、炭化物と炭素の包晶組織であることを特徴とする温度定点セル。
- 温度定点セルを内部に設置し、該温度定点セルの周囲温度を上昇または下降せしめ、その時の前記温度定点セルの温度変化を温度計にて測定する炉を備えた温度定点装置であって、
前記温度定点セルが炭素を成分とするるつぼと、前記るつぼに封入され、炭化物と炭素の包晶組織である定点物質とから成ることを特徴とする温度定点装置。 - 温度定点セルを内部に設置し、該温度定点セルの周囲温度を上昇または下降せしめ、その時の前記温度定点セルの放射光強度変化を照度計または放射計にて測定する炉を備えた温度定点装置であって、
前記温度定点セルが炭素を成分とするるつぼと、前記るつぼに封入され、炭化物と炭素の包晶組織である定点物質とから成ることを特徴とする温度定点装置。 - 炭素を成分とするるつぼと、該るつぼに封入され、炭化物と炭素の包晶組織である定点物質とから成る温度定点セルの周囲温度を上昇または下降せしめ、その時の前記温度定点セルの温度を温度計にて測定し、測定された温度変化状態から前記温度計を校正することを特徴とする温度計校正方法。
- 前記炭化物は、マンガン、クロム、アルミニウム、プルトニウム、シリコン又はタングステンの炭化物であることを特徴とする請求項1記載の温度定点セル。
- 前記炭化物は、マンガン、クロム、アルミニウム、プルトニウム、シリコン又はタングステンの炭化物であることを特徴とする請求項2記載の温度定点装置。
- 前記温度計は、放射温度計または熱電対であることを特徴とする請求項2記載の温度定点装置。
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JP2006048256A JP4639383B2 (ja) | 2006-02-24 | 2006-02-24 | 温度定点セル、温度定点装置及び温度計校正方法 |
DE602007003621T DE602007003621D1 (de) | 2006-02-24 | 2007-02-22 | Temperatur-Festpunkt, Zellentemperatur-Festpunktvorrichtung und Verfahren zur Kalibrierung eines Thermometers |
AT07250749T ATE451599T1 (de) | 2006-02-24 | 2007-02-22 | Temperatur-festpunkt, zellentemperatur- festpunktvorrichtung und verfahren zur kalibrierung eines thermometers |
EP07250749A EP1826541B1 (en) | 2006-02-24 | 2007-02-22 | Temperature fixed-point cell temperature fixed-point device and method of calibration of thermometer |
US11/678,370 US7585106B2 (en) | 2006-02-24 | 2007-02-23 | Temperature fixed-point cell, temperature fixed-point device and method of calibration of thermometer |
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JP4565159B2 (ja) * | 2005-10-14 | 2010-10-20 | 独立行政法人産業技術総合研究所 | 温度定点セル、温度定点装置および温度計校正方法 |
TWI312861B (en) * | 2007-02-13 | 2009-08-01 | Ind Tech Res Inst | Standard radiation source |
US8657487B2 (en) * | 2008-06-11 | 2014-02-25 | Utah State University Research Foundation | Mini-cell, on-orbit, temperature re-calibration apparatus and method |
US8157438B2 (en) * | 2009-08-10 | 2012-04-17 | John Lee Warren | Method and apparatus for generating electricity using ambient heat |
KR101389003B1 (ko) * | 2013-02-05 | 2014-04-24 | 에이피시스템 주식회사 | 온도측정 파이로미터의 교정 장치 |
KR101432159B1 (ko) * | 2013-02-05 | 2014-08-20 | 에이피시스템 주식회사 | 온도측정 파이로미터의 교정 장치 |
CN105067123B (zh) * | 2015-05-13 | 2018-09-14 | 高伟 | 一种高效叠层式高温黑体炉体 |
CN105910731A (zh) * | 2016-04-01 | 2016-08-31 | 中国计量科学研究院 | 基于共晶点的微型固定点装置 |
US10184730B2 (en) | 2016-08-17 | 2019-01-22 | Harris Corporation | Phase change cell |
CN111044179B (zh) * | 2019-12-05 | 2022-01-04 | 成都光明派特贵金属有限公司 | 一种定点炉金固定点瓶的制作方法 |
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US5608838A (en) * | 1994-12-07 | 1997-03-04 | Brookley; Charles E. | Blackbody type heating element for calibration furnace with pyrolytic graphite coating disposed on end cap electrode members |
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KR100542244B1 (ko) * | 2003-09-04 | 2006-01-11 | 한국표준과학연구원 | 온도계 보호관 결합용 고정점 셀 및 고정점 셀을 이용한온도계 수명 예측장치 |
JP4565159B2 (ja) | 2005-10-14 | 2010-10-20 | 独立行政法人産業技術総合研究所 | 温度定点セル、温度定点装置および温度計校正方法 |
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JP3404531B2 (ja) * | 2001-03-02 | 2003-05-12 | 独立行政法人産業技術総合研究所 | 温度校正方法および装置 |
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US20070201534A1 (en) | 2007-08-30 |
EP1826541A1 (en) | 2007-08-29 |
EP1826541B1 (en) | 2009-12-09 |
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