ATE451599T1 - Temperatur-festpunkt, zellentemperatur- festpunktvorrichtung und verfahren zur kalibrierung eines thermometers - Google Patents
Temperatur-festpunkt, zellentemperatur- festpunktvorrichtung und verfahren zur kalibrierung eines thermometersInfo
- Publication number
- ATE451599T1 ATE451599T1 AT07250749T AT07250749T ATE451599T1 AT E451599 T1 ATE451599 T1 AT E451599T1 AT 07250749 T AT07250749 T AT 07250749T AT 07250749 T AT07250749 T AT 07250749T AT E451599 T1 ATE451599 T1 AT E451599T1
- Authority
- AT
- Austria
- Prior art keywords
- temperature
- fixed
- point
- fixed point
- thermometer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/002—Calibrated temperature sources, temperature standards therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Secondary Cells (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006048256A JP4639383B2 (ja) | 2006-02-24 | 2006-02-24 | 温度定点セル、温度定点装置及び温度計校正方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE451599T1 true ATE451599T1 (de) | 2009-12-15 |
Family
ID=38196958
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT07250749T ATE451599T1 (de) | 2006-02-24 | 2007-02-22 | Temperatur-festpunkt, zellentemperatur- festpunktvorrichtung und verfahren zur kalibrierung eines thermometers |
Country Status (5)
Country | Link |
---|---|
US (1) | US7585106B2 (de) |
EP (1) | EP1826541B1 (de) |
JP (1) | JP4639383B2 (de) |
AT (1) | ATE451599T1 (de) |
DE (1) | DE602007003621D1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4565159B2 (ja) * | 2005-10-14 | 2010-10-20 | 独立行政法人産業技術総合研究所 | 温度定点セル、温度定点装置および温度計校正方法 |
TWI312861B (en) * | 2007-02-13 | 2009-08-01 | Ind Tech Res Inst | Standard radiation source |
US8657487B2 (en) * | 2008-06-11 | 2014-02-25 | Utah State University Research Foundation | Mini-cell, on-orbit, temperature re-calibration apparatus and method |
US8157438B2 (en) * | 2009-08-10 | 2012-04-17 | John Lee Warren | Method and apparatus for generating electricity using ambient heat |
KR101389003B1 (ko) * | 2013-02-05 | 2014-04-24 | 에이피시스템 주식회사 | 온도측정 파이로미터의 교정 장치 |
KR101432159B1 (ko) * | 2013-02-05 | 2014-08-20 | 에이피시스템 주식회사 | 온도측정 파이로미터의 교정 장치 |
CN105067123B (zh) * | 2015-05-13 | 2018-09-14 | 高伟 | 一种高效叠层式高温黑体炉体 |
CN105910731A (zh) * | 2016-04-01 | 2016-08-31 | 中国计量科学研究院 | 基于共晶点的微型固定点装置 |
US10184730B2 (en) | 2016-08-17 | 2019-01-22 | Harris Corporation | Phase change cell |
CN111044179B (zh) * | 2019-12-05 | 2022-01-04 | 成都光明派特贵金属有限公司 | 一种定点炉金固定点瓶的制作方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3513705A (en) * | 1968-07-29 | 1970-05-26 | Us Air Force | Method and means for indicating ultrahigh temperatures |
US4469512A (en) * | 1982-07-29 | 1984-09-04 | Showa Aluminum Corporation | Process for producing high-purity aluminum |
JP2678797B2 (ja) * | 1989-10-13 | 1997-11-17 | 日本軽金属株式会社 | 発光分光分析用標準試料 |
US5608838A (en) * | 1994-12-07 | 1997-03-04 | Brookley; Charles E. | Blackbody type heating element for calibration furnace with pyrolytic graphite coating disposed on end cap electrode members |
JP2987459B1 (ja) * | 1998-12-11 | 1999-12-06 | 工業技術院長 | 温度定点るつぼ、温度定点装置及び温度計校正方法 |
JP3404531B2 (ja) * | 2001-03-02 | 2003-05-12 | 独立行政法人産業技術総合研究所 | 温度校正方法および装置 |
GB0114429D0 (en) * | 2001-06-13 | 2001-08-08 | Secretary Trade Ind Brit | System for calibrating thermometers |
KR100542244B1 (ko) * | 2003-09-04 | 2006-01-11 | 한국표준과학연구원 | 온도계 보호관 결합용 고정점 셀 및 고정점 셀을 이용한온도계 수명 예측장치 |
JP4521511B2 (ja) * | 2004-04-27 | 2010-08-11 | 独立行政法人産業技術総合研究所 | 温度定点セル、温度定点装置および温度計校正方法 |
JP4565159B2 (ja) | 2005-10-14 | 2010-10-20 | 独立行政法人産業技術総合研究所 | 温度定点セル、温度定点装置および温度計校正方法 |
-
2006
- 2006-02-24 JP JP2006048256A patent/JP4639383B2/ja active Active
-
2007
- 2007-02-22 DE DE602007003621T patent/DE602007003621D1/de active Active
- 2007-02-22 AT AT07250749T patent/ATE451599T1/de not_active IP Right Cessation
- 2007-02-22 EP EP07250749A patent/EP1826541B1/de active Active
- 2007-02-23 US US11/678,370 patent/US7585106B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
DE602007003621D1 (de) | 2010-01-21 |
US20070201534A1 (en) | 2007-08-30 |
EP1826541A1 (de) | 2007-08-29 |
JP2007225485A (ja) | 2007-09-06 |
EP1826541B1 (de) | 2009-12-09 |
JP4639383B2 (ja) | 2011-02-23 |
US7585106B2 (en) | 2009-09-08 |
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Legal Events
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RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |