JP2007207703A - Method of repairing organic electroluminescent device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide the method for preferably repairing the insulation failure portion of an organic EL device provided with multiple kinds of organic layers having different luminescent colors. <P>SOLUTION: The insulation failure portion is repaired by applying a reverse vias voltage to each organic layers 13R, 13G and 13B with different applying conditions respectively. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a method for repairing an organic electroluminescence device.

  In recent years, organic electroluminescence devices (hereinafter referred to as “organic EL devices”) have been actively studied as next-generation flat display devices.

  An organic EL device generally includes an organic layer including a light-emitting layer, a hole transport layer, an electron transport layer, and the like, and a pair of electrodes (a cathode and an anode) disposed to face each other through the organic layer. Yes. Usually, the organic layer has a very thin layer thickness of, for example, about 100 nm. Therefore, there is a possibility that leakage defects may occur between the electrodes, or a dielectric breakdown voltage between the electrodes may be generated due to the mixing of minute foreign matters or uneven formation of the organic layer.

  When such a defect occurs, black dots, dark lines, and black lines are observed when the organic EL device is driven, and the display quality of the organic EL device is degraded. In addition, if there is a portion that does not have a sufficient withstand voltage even if it does not reach a black spot or the like, a leak current may be generated during driving of the organic EL device. In particular, in recent years, organic EL devices have become larger, and the probability of occurrence of such defects tends to increase, which is a serious problem.

  In view of such circumstances, various methods for repairing defective insulation portions of organic layers have been proposed (for example, Patent Documents 1 and 2).

  For example, Patent Document 1 discloses a technique for repairing a defective insulation portion by applying a forward voltage to an organic light emitting diode and applying a reverse pulse voltage while emitting light. Patent Document 2 discloses a technique for repairing a defective insulation portion by applying a reverse voltage to a light emitting element.

Although not a method for repairing an insulation failure portion of an organic EL device, Patent Document 3 discloses a technique for inspecting a failure of an organic EL device by applying a reverse bias voltage to an organic layer.
Japanese Patent Laid-Open No. 11-162637 JP 2004-31335 A Japanese Patent Laid-Open No. 2003-510863

  However, in the techniques described in Patent Documents 1 and 2, an insulation defect portion of an organic EL device (for example, an organic EL device capable of multicolor display) having a plurality of types of organic layers having different emission colors is preferably repaired. There is a problem that it is difficult to do.

  The present invention has been made in view of the above points, and an object of the present invention is to provide a repair method capable of preferably repairing a defective insulation portion of an organic EL device including a plurality of types of organic layers having different emission colors. Is to provide.

  The repair method according to the present invention is an organic electroluminescence device including a plurality of types of organic layers each including at least a light emitting layer having different emission colors, and a pair of electrodes arranged to face each other via the plurality of types of organic layers. This is a method of repairing a defective insulation portion between a pair of electrodes of the apparatus.

  The first repairing method according to the present invention is characterized in that the defective insulation portion is insulated by applying reverse bias voltages to a plurality of types of organic layers under different application conditions for the respective emission colors.

  In the present specification, the “reverse bias voltage” refers to a voltage having a polarity opposite to a voltage applied between a pair of electrodes when the organic EL device is driven. The absolute value of the reverse bias voltage does not necessarily have to be equal to the absolute value of the voltage value applied between the pair of electrodes when the organic EL device is driven, and depends on the type of emission color of the organic layer. It can be determined as appropriate.

  The term “insulating defective part” refers to a part in which insulation between a pair of electrodes is insufficient. Specifically, a part in which a pair of electrodes are short-circuited and a pair of parts that are not short-circuited. The part where the insulation between electrodes is lower than desired insulation.

  The second repair method according to the present invention is an inspection process for inspecting presence / absence of an insulation defect portion for each of a plurality of organic electroluminescence devices, and only for an organic electroluminescence device in which an insulation failure portion is detected in the inspection process. The organic electroluminescence device includes a repairing step of insulating the defective insulation portion by applying reverse bias voltages to the plurality of types of organic layers under different application conditions for each emission color.

  When the kind of the luminescent color of the organic layer is different, in other words, when the composition of the organic layer is different, the conditions (voltage value, application time, etc.) of the reverse bias voltage suitable for repairing the defective insulation portion are also different. For example, when a reverse bias voltage is applied to an organic layer of a different light emission color under the same application conditions as the reverse bias voltage application suitable for an organic layer of a certain light emission color, the defective insulation portion is not suitably repaired. There is. In extreme cases, the poor insulation portion may be further deteriorated. Furthermore, there is a possibility that the insulating property of the portion that is not the defective insulation portion is lowered.

  As in the repair method according to the present invention, by applying a reverse bias voltage with different application conditions for each emission color, the defective insulation portion is preferably repaired for all of the plurality of types of organic layers different for each emission color. It becomes possible.

  Further, by performing the inspection process as in the second repair method according to the present invention, it is possible to reduce the waste of the repair process.

  In the method for repairing an organic EL device according to the present invention, the application condition may be a reverse bias voltage value and / or an application time. That is, the reverse bias voltage value and / or the application time may be different for each emission color, and the reverse bias voltage may be applied to various organic layers.

  In the method for repairing an organic EL device according to the present invention, the reverse bias voltage may be a pulse voltage. In this case, the application condition may be one or more conditions selected from the group consisting of the reverse bias voltage value, the pulse width of the bias voltage, and the number of pulses of the bias voltage. That is, in other words, the application condition for each emission color is the reverse bias voltage obtained by making one or more conditions selected from the group consisting of the reverse bias voltage value, the pulse width of the bias voltage, and the number of pulses of the bias voltage different from each other. You may apply to various organic layers.

  In the second method for repairing an organic EL device according to the present invention, the inspection for the presence or absence of a defective insulation portion is performed by measuring a capacitance value between a pair of electrodes, measuring a resistance between a pair of electrodes, or applying between a pair of electrodes. The measurement can be performed by at least one selected from the group consisting of measuring the correlation of the current density between the pair of electrodes with respect to the voltage and evaluating the light emission luminance of each organic layer. The evaluation of the light emission luminance of each organic layer can be performed by visual observation in a state where all or a part of the organic layers having the same light emission color are turned on for each organic layer having the same light emission color.

  In the second method for repairing an organic EL device according to the present invention, an organic electroluminescence device in which a further inspection process is performed on the organic electroluminescence device that has undergone the repairing process, and an insulation failure portion is detected in the further inspection step. A further repair step may be performed on this. By doing so, it becomes possible to repair an insulation defect part more reliably.

  From the viewpoint of more reliably repairing a defective insulation part, the further repair process is different from the repair process in application conditions (reverse bias voltage value, application time, reverse bias voltage value, pulse width of bias voltage, number of pulses of bias voltage, etc. The step of applying a reverse bias voltage in step) is preferable.

  ADVANTAGE OF THE INVENTION According to this invention, the insulation defect part of the organic electroluminescent apparatus provided with the multiple types of organic layer from which luminescent color differs can be repaired suitably.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.

  First, the configuration of the organic EL device 1 to be inspected will be described. The restoration method according to the present invention is widely applicable to general organic EL devices, and the passive matrix organic EL device 1 described below is merely an example.

  FIG. 1 is a plan view of an organic EL device 1 according to this embodiment. In FIG. 1, the second electrode 17 is not drawn for convenience of explanation.

  FIG. 2 is a cross-sectional view of a portion cut out along a cut line II-II in FIG.

  FIG. 3 is a cross-sectional view of a portion cut out along a cut line III-III in FIG.

  FIG. 4 is a cross-sectional view of a portion cut out along a cut line IV-IV in FIG.

  FIG. 5 is a cross-sectional view of a portion cut out by a cut line VV in FIG.

  FIG. 6 is a perspective view showing the shape of the partition wall 12.

  The organic EL device 1 according to the present embodiment includes an insulating substrate 10, a first electrode 11, a partition wall 12, an organic layer 13, and a second electrode 17.

  The insulating substrate 10 can be formed from, for example, glass, ceramics, plastic, or the like. The first electrodes 11 are formed on the insulating substrate 10 so as to extend in parallel with each other (in a stripe shape in a plan view). The first electrode 11 has a function as an anode for injecting holes into the organic layer 13. The first electrode 11 may be formed of, for example, a metal such as aluminum (Al) or silver (Ag), or a conductive oxide such as indium tin oxide (ITO) or indium zinc oxide (IZO). it can.

  The partition wall 12 is provided on the insulating substrate 10 and has a first insulating member 12b having a trapezoidal cross section protruding from the insulating substrate 10 and an inverted trapezoidal cross section protruding in a widened shape from the first insulating member 12b. And a plurality of second insulating members 12a. The first insulating member 12b separates the first electrodes 11 formed on the stripes from each other and divides the surface of each first electrode 11 into a plurality of regions in the direction in which the first electrodes 11 extend. Thus, it is formed in a lattice shape in a front view.

  The second insulating member 12a is formed so as to extend in a direction (typically a vertical direction) intersecting the extending direction of the first electrode 11, in other words, in a direction parallel to the extending direction of the second electrode 17. ing. In the present embodiment, the first insulating member 12b and the second insulating member 12a are integrally formed of the same material. The partition wall 12 can be formed of, for example, a novolac resin.

  The plurality of organic layers 13 are provided in each region on the first electrode 11 that is individually divided by the partition 12. Each organic layer 13 includes a hole transport layer 14 formed on the first electrode 11, an organic EL light emitting layer 15 formed on the hole transport layer 14, and the organic EL light emitting layer 15. And an electron transport layer 16 formed. In addition, this invention is not limited to this structure, For example, the organic layer 13 may be comprised only by the organic EL light emitting layer 15. FIG. The organic EL light-emitting layer 15 includes one or more layers selected from the group consisting of a hole transport layer 14, a hole injection layer, an electron transport layer 16, and an electron injection layer. Also good.

  The hole transport layer 14 has a function of improving hole transport efficiency from the first electrode (anode) 11 to the organic EL light emitting layer 15. Examples of the hole transport material for forming the hole transport layer 14 include 3,4-polyethylenedioxythiophene: polystyrene sulfonic acid (PEDOT: PSS), polyaniline, and the like.

  On the other hand, the electron transport layer 16 has a function of improving the electron transport efficiency from the second electrode (cathode) 17 to the organic EL light emitting layer 15. Examples of the electron transport material for forming the electron transport layer 16 include oxadiazole.

  The organic EL light emitting layer 15 is a layer that emits fluorescence by recombining holes and electrons injected from the first electrode 11 and the second electrode 17 respectively. Examples of the organic electroluminescent (EL) light emitting material for forming the organic EL light emitting layer 15 include polyfluorene derivatives (for example, poly-dioctylfluorene), polyspirofluorene derivatives, poly-p-phenylene vinylene derivatives, and the like. Can be mentioned.

  The hole transport layer 14, the organic EL light emitting layer 15, and the electron transport layer 16 each preferably have a thickness of about 50 to 100 nm.

  In the present embodiment, the plurality of organic layers 13 specifically include a plurality of types of organic layers having different emission colors. Specifically, as shown in FIG. 3 and FIG. 4, an organic layer 13 </ b> R having an organic EL light emitting layer 15 </ b> R whose emission color is red (R) and an organic EL light emitting layer 15 </ b> G whose emission color is green (G). A layer 13G, and an organic layer 13B having an organic EL light emitting layer 15B whose emission color is blue (B). These organic layers 13R, 13B, and 13G are alternately arranged in a matrix. As described above, in the present embodiment, the multi-color displayable organic EL device 1 including the three types of organic layers 13R, 13B, and 13G is described as an example. The present invention is also suitably applied to an organic EL device having four or more organic layers and capable of multicolor display.

  The second electrode 17 is formed between each of the second insulating members 12a in parallel with each other in the direction in which the second insulating member 12a extends (in a stripe shape in a plan view), and the plurality of organic layers 13 and It is formed so as to cover the first insulating member 12b. The second electrode 17 has a function as a cathode for injecting electrons into the organic layer 13. For example, the second electrode 17 may be formed by stacking a layer containing an alkali metal, an alkaline earth metal, an alkali metal, or an alkaline earth metal and an aluminum (Al) layer.

  Next, a method for repairing a defective insulation portion of the organic EL device 1 will be described.

  In the present embodiment, a reverse bias voltage is applied to each of the organic layers 13R, organic layers 13G, and organic layers 13B having different emission colors under different application conditions, and is generated in the various organic layers 13R, 13G, and 13B. Repair the defective insulation. By applying a reverse bias voltage to the organic layer 13, Joule heat is generated in the poorly insulated portion, and the organic layer 13 is altered and insulated by the Joule heat. Therefore, the poorly insulated portion can be preferably repaired.

  The organic layer 13R, the organic layer 13G, and the organic layer 13B having different emission colors have the organic EL emission layers 15 having different compositions. In other words, the organic EL light emitting layers 15R, 15G, and 15B have different compositions. Accordingly, reverse bias voltages suitable for repairing defective insulation portions are different among the organic layers 13R, 13G, and 13B. For this reason, for example, when a reverse bias voltage suitable for repairing an insulation failure portion generated in the organic layer 13R is applied, the insulation failure portion generated in the organic layer 13R can be preferably repaired, but other than that Usually, the defective insulation portions generated in the organic layers 13G and 13B cannot be repaired suitably. Depending on the case, it is conceivable that the defective insulation portions generated in the other organic layers 13G and 13B are further deteriorated, and the portions of the organic layers 13G and 13B where the defective insulation portions are not generated are broken down.

  As in the present embodiment, the organic layer 13R and the organic layer 13G are first applied by applying reverse bias voltages to the organic layers 13R, 13G, and 13B having different emission colors under different application conditions. Thus, it is possible to preferably repair all of the defective insulation portions generated in each of the organic layers 13B. In addition, it is possible to suppress deterioration such as dielectric breakdown of a non-defective part of the organic layer 13.

  Hereinafter, specific examples will be described with reference to FIGS.

  FIG. 7 is a voltage-current density graph before and after applying a reverse bias voltage to the organic layer 13G having a green emission color.

  FIG. 8 is a voltage-current efficiency graph before and after applying a reverse bias voltage to the organic layer 13G having a green emission color.

  By applying a reverse bias voltage of 32 V and a pulse width of 0.5 seconds once to the organic layer 13G containing a certain green light emitting material, the defective insulation portion is repaired, and as shown in FIG. The current density when a voltage was applied was reduced. Further, as shown in FIG. 8, the current that did not contribute to the light emission flowing in the poorly insulated portion was suppressed, the current efficiency was increased, and the pixels that were dark spots emitted light.

  FIG. 9 is a voltage-current density graph before and after applying a reverse bias voltage to the organic layer 13B having a blue emission color.

  FIG. 10 is a voltage-current efficiency graph before and after applying a reverse bias voltage to the organic layer 13B having a blue emission color.

  On the other hand, when a reverse bias voltage of 32 V and a pulse width of 0.5 seconds is applied once to the organic layer 13B containing a certain blue light emitting material, as shown in FIGS. Although the current density when a voltage was applied tended to decrease, the current efficiency tended to deteriorate rather, and the defective insulation portion was not preferably repaired.

  When a reverse bias voltage of 20 V to 32 V and a pulse width of 0.5 seconds was applied to the organic layer 13B once, in the range from 20 V to 28 V, the reverse bias voltage increased and the reverse voltage was increased. In addition, the current density when a low forward voltage was applied decreased, and the current efficiency increased. On the other hand, when a reverse bias voltage of 32 V higher than 28 V was applied, the defective insulation portion was not properly repaired as described above. From the above, it was found that it is preferable to apply a reverse bias voltage of 28 V and a pulse width of 0.5 seconds once to the organic layer 13B having a blue emission color.

  Thus, when a reverse bias voltage of 32 V and a pulse width of 0.5 seconds suitable for the organic layer 13G whose emission color is green is applied to all the organic layers 13 once, the insulation failure generated in the organic layer 13G. Although the portion could be repaired suitably, the organic layer 13B whose emission color was blue could not be repaired suitably. A reverse bias voltage of 32 V and a pulse width of 0.5 seconds is applied once to the organic layer 13G whose emission color is green, and 28 V and a pulse width of 0.8 V is applied to the organic layer 13B whose emission color is blue. Only by applying a reverse bias voltage of 5 seconds once, it was possible to suitably repair an insulation failure portion generated in both of the organic layers 13G and 13B.

  As described above, although a suitable reverse bias voltage application condition differs depending on the conditions such as the type of the organic layer 13 and the layer thickness of the organic layer 13, the reverse bias voltage application time is usually 1 ms to 5 seconds. In the following, it is further preferably 10 milliseconds or more and 2 seconds or less. The magnitude (absolute value) of the reverse bias voltage is preferably 10 V or more and 100 V or less, more preferably 15 V or more and 50 V or less.

  Specifically, the reverse bias voltage value (the magnitude (absolute value) of the reverse bias voltage to be applied) and / or the reverse bias voltage is applied to the organic layers 13R, 13G, and 13B having different emission colors. It is preferable to apply a reverse bias voltage at different times.

  The reverse bias voltage may be a pulsed voltage (pulse voltage). In that case, it is preferable to apply the reverse bias voltage by making at least one of the reverse bias voltage value, the pulse width, and the number of pulses to be applied different.

  As described above, the repair of the defective insulation portion by the application of the reverse bias voltage may be performed on all of the manufactured organic EL devices 1, for example. Moreover, you may perform in the process demonstrated below with reference to FIG.

  As shown in FIG. 11, first, a plurality of organic EL devices 1 are inspected for the presence or absence of a defective insulation portion (S1: Step 1). As a result of performing the inspection step (S1), no reverse bias voltage is applied to the organic EL device 1 in which an insulation failure portion is not detected, and the organic EL device 1 in which an insulation failure portion is detected. Only a reverse bias voltage application may be performed (S2: Step 2). Thus, by performing the inspection process, the organic EL device 1 to be subjected to the repairing step (S2) can be selected, and the organic EL device 1 can be repaired more efficiently.

In addition, although the inspection method of the presence or absence of an insulation defect part is not specifically limited, For example, it can test | inspect by measuring the capacitance value between the 1st electrode 11 and the 2nd electrode 17. . Capacitance between the first electrode 11 and second electrode 17 varies depending on the specification of the organic EL device 1 is approximately 10nF / cm ² ~40nF / cm ² approximately. However, when there is a poor insulation portion, the capacitance value between the first electrode 11 and the second electrode 17 is smaller than usual. For this reason, the capacitance value between the first electrode 11 and the second electrode 17 is measured, and the obtained measurement value is compared with the design value (for example, at a value 20% or more smaller than the design value). By determining whether or not there is, it is possible to inspect the presence or absence of defective insulation.

  In addition, when there is a poor insulation portion, the electrical resistance value between the first electrode 11 and the second electrode 17 becomes smaller than the design value. For this reason, the presence or absence of a defective insulation portion can also be inspected by measuring the electrical resistance value between the first electrode 11 and the second electrode 17. More precisely, by measuring the correlation between the current density between the first electrode 11 and the second electrode 17 with respect to the voltage applied between the first electrode 11 and the second electrode 17. The presence or absence of a defective insulation portion can be inspected.

  In addition to the electrical measurement as described above, it can be performed by evaluating the light emission luminance of each organic layer 13. Specifically, it can also be performed by evaluating the presence or absence of black spots, dark spots, black lines, and dark lines by visual inspection or using a machine.

  The evaluation of the light emission luminance of each organic layer 13 is preferably performed for each organic layer 13 having the same light emission color. For example, first, all or a part of the organic layer 13R whose emission color is red is caused to emit light, and the presence or absence of black spots, dark spots, black lines, and dark lines is visually evaluated. Thereafter, all or a part of the organic layer 13G whose emission color is green is caused to emit light, and the presence or absence of black spots, dark spots, black lines, and dark lines is visually evaluated. Finally, all or part of the organic layer 13B whose emission color is blue is caused to emit light, and the presence or absence of black spots, dark spots, black lines, and dark lines is visually evaluated. By doing so, it is possible to evaluate the emission luminance of the organic layer 13 more precisely.

  The presence or absence of the defective insulation portion is determined by measuring the capacitance value between the first electrode 11 and the second electrode 17, measuring the resistance, measuring the correlation between the voltage and the current density, and measuring each organic layer 13. A plurality of evaluations of light emission luminance may be performed in combination. By performing a plurality of inspections in combination, it is possible to surely find a minute insulation failure portion and obtain a highly reliable organic EL device.

  As described above, it is preferable to perform a further inspection process (S3: Step 3) after performing the inspection process (S1) and the repair process (S2).

  Whether or not the defective insulation portion is preferably repaired by the repair process is measured for the capacitance value between the first electrode 11 and the second electrode 17 described above, resistance measurement, measurement of the correlation between voltage and current density, and each organic The layer 13 is inspected by evaluating the light emission luminance or the like (S3), and if a suitable repair has been made, the repair work is terminated there. If a suitable repair has not been performed, that is, if there is still an insulation failure, it is preferable to perform a further repair step (S2). By doing so, reliable repair of the defective insulation part can be realized.

  In order to repair the defective insulation portion more reliably, it is preferable to apply a reverse bias voltage in a further repair process under application conditions different from those in the previous repair process. For example, it is conceivable to apply a reverse bias voltage larger than that in the previous repair process, to change the pulse width of the reverse bias voltage to be applied, or to change the number of pulses to be applied.

  Further, the inspection process (S3) and the repair process (S2) may be repeated.

  As described above, one specific example of the present invention has been described by taking the repair method of the defective insulation portion of the passive matrix type organic EL device 1 as an example, but the repair method according to the present invention is, for example, an active matrix type organic EL device. The present invention can also be suitably applied to repair of defective insulation portions of the EL device 1.

  In the case of the active matrix type organic EL device 1, for example, the reverse breakdown voltage of the switching element (for example, TFT element) is designed to be equal to or higher than the reverse bias voltage applied at the time of restoration, and all the switching elements for driving are turned on. In this state, a reverse bias voltage can be applied. Further, a reverse bias voltage application circuit may be provided in advance.

1 is a plan view of an organic EL device 1. FIG. It is sectional drawing of the part cut out by the cutting line II-II in FIG. It is sectional drawing of the part cut out by the cutting line III-III in FIG. FIG. 4 is a cross-sectional view of a portion cut out along a cut line IV-IV in FIG. 1. It is sectional drawing of the part cut out by the cutting line VV in FIG. 3 is a perspective view showing a shape of a partition wall 12. FIG. It is a voltage-current density graph before and behind applying a reverse bias voltage to the organic layer 13G which has a green luminescent color. It is a voltage-current efficiency graph before and behind applying a reverse bias voltage to the organic layer 13G which has a green luminescent color. It is a voltage-current density graph before and behind applying a reverse bias voltage to the organic layer 13B which has a blue luminescent color. It is a voltage-current efficiency graph before and behind applying a reverse bias voltage to the organic layer 13B which has a blue luminescent color. 3 is a flowchart showing a repair process of the organic EL device 1.

Explanation of symbols

1 Organic EL device
10 Insulating substrate
11 First electrode
12 Bulkhead
12a Second insulating member
12b First insulating member
13 Organic layer
14 Hole transport layer
15 Organic EL light emitting layer
16 Electron transport layer
17 Second electrode

Claims (9)

Between the pair of electrodes of the organic electroluminescence device, each of which includes a plurality of types of organic layers including at least light emitting layers having different emission colors, and a pair of electrodes arranged to face each other via the plurality of types of organic layers A method of repairing a defective insulation part of
A method for repairing an organic electroluminescence device, comprising: insulating the defective portion by applying a reverse bias voltage to the plurality of types of organic layers under different application conditions for each emission color. Between the pair of electrodes of the organic electroluminescence device, each of which includes a plurality of types of organic layers each including at least a light emitting layer having different emission colors, and a pair of electrodes arranged to face each other via the plurality of types of organic layers A method of repairing a defective insulation part of
For each of the plurality of organic electroluminescence devices, an inspection process for inspecting the presence or absence of the defective insulation portion,
Applying reverse bias voltage to multiple types of organic layers of the organic electroluminescence device only under different application conditions for each luminescent color only to the organic electroluminescence device in which the defective insulation portion is detected in the inspection process A repairing step for insulating the defective insulation portion by
A method for repairing an organic electroluminescence device comprising: In the repair method of the organic electroluminescent apparatus described in Claim 1 or 2,
The method for repairing an organic electroluminescence device, wherein the application condition is a reverse bias voltage value and / or an application time. In the repair method of the organic electroluminescent apparatus described in Claim 1 or 2,
The method of repairing an organic electroluminescence device, wherein the reverse bias voltage is a pulse voltage. In the repair method of the organic electroluminescent apparatus described in Claim 4,
The application condition is one or a plurality of conditions selected from the group consisting of a reverse bias voltage value, a pulse width of the bias voltage, and a pulse number of the bias voltage, and a method for repairing an organic electroluminescence device, . In the repair method of the organic electroluminescent apparatus described in Claim 2,
The inspection of the presence or absence of the defective insulation portion is performed by measuring the capacitance value between the pair of electrodes, measuring the resistance between the pair of electrodes, and measuring the current density between the pair of electrodes with respect to the voltage applied between the pair of electrodes. A method for repairing an organic electroluminescence device, comprising performing at least one selected from the group consisting of measurement of correlation and evaluation of light emission luminance of each organic layer. In the repair method of the organic electroluminescent apparatus described in Claim 6,
The evaluation of the light emission luminance of each organic layer is performed for each organic layer having the same light emission color by visual observation with all or a part of the organic layer having the same light emission color turned on. A method for repairing a luminescence device. In the repair method of the organic electroluminescent apparatus described in Claim 2,
The organic electroluminescence device that has undergone the repair process is further subjected to the inspection step, and the further repair process is performed on the organic electroluminescence device in which the defective insulation portion is detected in the further inspection step. A method for repairing an organic electroluminescence device. In the repair method of the organic electroluminescent apparatus described in Claim 8,
The method of repairing an organic electroluminescence device, wherein the further repairing step is a step of applying a reverse bias voltage under an application condition different from that of the repairing step.

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