JP2007139776A5 - - Google Patents

Download PDF

Info

Publication number
JP2007139776A5
JP2007139776A5 JP2006308932A JP2006308932A JP2007139776A5 JP 2007139776 A5 JP2007139776 A5 JP 2007139776A5 JP 2006308932 A JP2006308932 A JP 2006308932A JP 2006308932 A JP2006308932 A JP 2006308932A JP 2007139776 A5 JP2007139776 A5 JP 2007139776A5
Authority
JP
Japan
Prior art keywords
edge
projector
light path
sudden change
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006308932A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007139776A (ja
Filing date
Publication date
Priority claimed from US11/274,578 external-priority patent/US7489408B2/en
Application filed filed Critical
Publication of JP2007139776A publication Critical patent/JP2007139776A/ja
Publication of JP2007139776A5 publication Critical patent/JP2007139776A5/ja
Pending legal-status Critical Current

Links

JP2006308932A 2005-11-15 2006-11-15 光学式エッジ急変部ゲージ Pending JP2007139776A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/274,578 US7489408B2 (en) 2005-11-15 2005-11-15 Optical edge break gage

Publications (2)

Publication Number Publication Date
JP2007139776A JP2007139776A (ja) 2007-06-07
JP2007139776A5 true JP2007139776A5 (https=) 2013-06-06

Family

ID=37680699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006308932A Pending JP2007139776A (ja) 2005-11-15 2006-11-15 光学式エッジ急変部ゲージ

Country Status (5)

Country Link
US (1) US7489408B2 (https=)
EP (1) EP1785693B1 (https=)
JP (1) JP2007139776A (https=)
CN (1) CN101029819B (https=)
DE (1) DE602006005028D1 (https=)

Families Citing this family (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7925075B2 (en) * 2007-05-07 2011-04-12 General Electric Company Inspection system and methods with autocompensation for edge break gauging orientation
GB0714974D0 (en) * 2007-07-31 2007-09-12 Third Dimension Software Ltd Measurement apparatus
CA2606267A1 (fr) * 2007-10-11 2009-04-11 Hydro-Quebec Systeme et methode de cartographie tridimensionnelle d'une surface structurelle
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light
US7812968B2 (en) * 2008-03-05 2010-10-12 Ge Inspection Technologies, Lp Fringe projection system and method for a probe using a coherent fiber bundle
US8917320B2 (en) 2009-03-04 2014-12-23 VISIONx INC. Digital optical comparator
WO2010107434A1 (en) * 2009-03-19 2010-09-23 General Electric Company Optical gage and three-dimensional surface profile measurement method
US8045181B2 (en) * 2009-05-21 2011-10-25 General Electric Company Inspection system and method with multi-image phase shift analysis
US20100309290A1 (en) * 2009-06-08 2010-12-09 Stephen Brooks Myers System for capture and display of stereoscopic content
US8269970B2 (en) 2009-07-02 2012-09-18 Quality Vision International, Inc. Optical comparator with digital gage
US9001029B2 (en) * 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
US9389315B2 (en) 2012-12-19 2016-07-12 Basf Se Detector comprising a transversal optical sensor for detecting a transversal position of a light beam from an object and a longitudinal optical sensor sensing a beam cross-section of the light beam in a sensor region
JP2014182028A (ja) * 2013-03-19 2014-09-29 Omron Corp 限定領域反射型光電センサ
EP3008485A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting at least one object
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
EP3036503B1 (en) 2013-08-19 2019-08-07 Basf Se Optical detector
WO2015024870A1 (en) 2013-08-19 2015-02-26 Basf Se Detector for determining a position of at least one object
CN104036545A (zh) * 2014-06-27 2014-09-10 嘉善天慧光电科技有限公司 一种便携式自适应图像三维重建仪的光源结构
CN106662636B (zh) 2014-07-08 2020-12-25 巴斯夫欧洲公司 用于确定至少一个对象的位置的检测器
WO2016051323A1 (en) 2014-09-29 2016-04-07 Basf Se Detector for optically determining a position of at least one object
US11125880B2 (en) 2014-12-09 2021-09-21 Basf Se Optical detector
JP6841769B2 (ja) 2015-01-30 2021-03-10 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
KR102539263B1 (ko) 2015-09-14 2023-06-05 트리나미엑스 게엠베하 적어도 하나의 물체의 적어도 하나의 이미지를 기록하는 카메라
JP2019523562A (ja) 2016-07-29 2019-08-22 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的検出のための光センサおよび検出器
CN109923372B (zh) 2016-10-25 2021-12-21 特里纳米克斯股份有限公司 采用集成滤波器的红外光学检测器
EP3532864B1 (en) 2016-10-25 2024-08-28 trinamiX GmbH Detector for an optical detection of at least one object
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
CN110770555A (zh) 2017-04-20 2020-02-07 特里纳米克斯股份有限公司 光学检测器
EP3645965B1 (en) 2017-06-26 2022-04-27 trinamiX GmbH Detector for determining a position of at least one object
DE102017223287A1 (de) 2017-12-19 2019-06-19 Lufthansa Technik Ag Verfahren zum Überprüfen des technischen Zustands eines Gegenstands
WO2019243046A1 (en) * 2018-06-18 2019-12-26 Lumileds Holding B.V. Lighting device comprising led and grating
EP3824621B1 (en) 2018-07-19 2025-06-11 Activ Surgical, Inc. Systems and methods for multi-modal sensing of depth in vision systems for automated surgical robots
EP3902458A4 (en) 2018-12-28 2022-09-21 Activ Surgical, Inc. USER INTERFACE ELEMENTS TO ALIGN A REMOTE CAMERA DURING OPERATIONS
JP2022516473A (ja) 2018-12-28 2022-02-28 アクティブ サージカル， インコーポレイテッド 低侵襲性外科手術における到達性、作業空間、および巧妙さを最適化するためのシステムおよび方法
US12292564B2 (en) 2019-04-08 2025-05-06 Activ Surgical, Inc. Systems and methods for medical imaging
WO2020210168A1 (en) 2019-04-08 2020-10-15 Activ Surgical, Inc. Systems and methods for medical imaging
WO2020214821A1 (en) 2019-04-19 2020-10-22 Activ Surgical, Inc. Systems and methods for trocar kinematics
EP4017340A4 (en) 2019-08-21 2023-12-13 Activ Surgical, Inc. Systems and methods for medical imaging
JP2024042593A (ja) * 2022-09-15 2024-03-28 株式会社小野測器 反射光型測定装置

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4641972A (en) 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4794550A (en) * 1986-10-15 1988-12-27 Eastman Kodak Company Extended-range moire contouring
US4983043A (en) 1987-04-17 1991-01-08 Industrial Technology Institute High accuracy structured light profiler
US4727390A (en) * 1987-06-22 1988-02-23 Brown Melvin W Camera mounting bracket
US4952772A (en) 1988-11-16 1990-08-28 Westinghouse Electric Corp. Automatic seam tracker and real time error cumulative control system for an industrial robot
US4984893A (en) 1989-12-01 1991-01-15 Wyko Corporation Phase shifting device and method
US5069548A (en) 1990-08-08 1991-12-03 Industrial Technology Institute Field shift moire system
JPH076775B2 (ja) * 1990-08-31 1995-01-30 株式会社キャディックス 三次元形状データ取込み装置
US5189493A (en) 1990-11-02 1993-02-23 Industrial Technology Institute Moire contouring camera
US5636025A (en) 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
US5307152A (en) 1992-09-29 1994-04-26 Industrial Technology Institute Moire inspection system
US5500737A (en) 1993-07-21 1996-03-19 General Electric Company Method for measuring the contour of a surface
JP3106849B2 (ja) * 1994-05-19 2000-11-06 日産自動車株式会社 塗装面性状測定装置
GB2292605B (en) * 1994-08-24 1998-04-08 Guy Richard John Fowler Scanning arrangement and method
US5825495A (en) 1995-02-27 1998-10-20 Lockheed Martin Corporation Bright field illumination system
WO1996041304A1 (en) 1995-06-07 1996-12-19 The Trustees Of Columbia University In The City Of New York Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus
CA2227183A1 (en) 1995-07-18 1997-02-06 Kevin G. Harding Moire interferometry system and method with extended imaging depth
US6009189A (en) 1996-08-16 1999-12-28 Schaack; David F. Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects
JP3594457B2 (ja) * 1997-06-30 2004-12-02 株式会社ニデック 眼科装置
US6438272B1 (en) 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6636255B1 (en) 1998-01-29 2003-10-21 Fuji Photo Optical Co., Ltd. Three-dimensional image scanner and heat-insulating device for optical apparatus
US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
US6040910A (en) 1998-05-20 2000-03-21 The Penn State Research Foundation Optical phase-shift triangulation technique (PST) for non-contact surface profiling
JP3401783B2 (ja) * 1998-06-23 2003-04-28 株式会社高岳製作所 表面形状計測装置
AU4975399A (en) 1998-07-08 2000-02-01 Lennard H. Bieman Machine vision and semiconductor handling
JP2000097672A (ja) * 1998-09-18 2000-04-07 Sanyo Electric Co Ltd ３次元計測機における制御情報生成方法及び制御情報生成支援システム
US6084712A (en) 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
JP2000292131A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd ３次元情報入力カメラ
EP1192413B1 (de) 1999-06-10 2004-12-01 MPT Präzisionsteile GmbH Mittweida Vorrichtung zur berührungslosen dreidimensionalen vermessung von körpern und verfahren zur bestimmung eines koordinatensystems für messpunktkoordinaten
JP2001012930A (ja) * 1999-06-28 2001-01-19 Nissan Motor Co Ltd 表面欠陥検査装置
US6788210B1 (en) 1999-09-16 2004-09-07 The Research Foundation Of State University Of New York Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
AU2001240138A1 (en) 2000-03-10 2001-09-24 Perceptron, Inc. A non-contact measurement device
US6593587B2 (en) * 2000-03-10 2003-07-15 Perceptron, Inc. Non-contact measurement device for quickly and accurately obtaining dimensional measurement data
US7002589B2 (en) 2000-03-17 2006-02-21 Sun Microsystems, Inc. Blending the edges of multiple overlapping screen images
JP2002056348A (ja) * 2000-08-07 2002-02-20 Tohken Co Ltd オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法
KR100389017B1 (ko) 2000-11-22 2003-06-25 (주) 인텍플러스 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치
US6841780B2 (en) 2001-01-19 2005-01-11 Honeywell International Inc. Method and apparatus for detecting objects
DE10142166A1 (de) 2001-08-29 2003-03-20 Bosch Gmbh Robert Handgerät zur berührungslosen Abstandsmessung
US6910278B2 (en) 2003-01-30 2005-06-28 Lockheed Martin Corporation Apparatus and method for inspecting and marking repair areas on a blade
US7099017B2 (en) * 2003-05-28 2006-08-29 General Electric Company Methods and apparatus for measuring flow opening areas
JP2005121644A (ja) * 2003-09-25 2005-05-12 Brother Ind Ltd ３次元形状検出システム、３次元形状検出装置、及び３次元形状検出プログラム
US7324677B2 (en) 2003-10-14 2008-01-29 Agilent Technologies, Inc. Feature quantitation methods and system
US6945124B1 (en) 2004-10-22 2005-09-20 Pratt & Whitney Canada Corp. Measurement system

Similar Documents

Publication Publication Date Title
JP2007139776A5 (https=)
US7489408B2 (en) Optical edge break gage
US20130057650A1 (en) Optical gage and three-dimensional surface profile measurement method
US9482514B2 (en) Diagnosing multipath interference and eliminating multipath interference in 3D scanners by directed probing
CN103492870B (zh) 与远程投射器协作以输送信息的六自由度激光追踪器
US20160377410A1 (en) Three-dimensional coordinate scanner and method of operation
JP2014515107A5 (https=)
CN105190232A (zh) 三维坐标扫描器和操作方法
JP2009048238A5 (https=)
CN107544135A (zh) 具有测距功能的内视镜及测距方法
CN105698707B (zh) 一种光栅三维形貌测量仪
JP2023121331A (ja) 反射光分布測定装置及び方法
CN101469975A (zh) 光学检测仪器和方法
CN112729128B (zh) 光学式体积测定装置
JP6309938B2 (ja) ３次元位置計測システム、３次元位置計測用プローブ、及びキャリブレータ
TW201432222A (zh) 立體距離測定方法及其系統
CN104061901A (zh) 立体距离测定方法及其系统
JP5487920B2 (ja) 光学式３次元形状計測装置及び光学式３次元形状計測方法
CN117168301A (zh) 基于双目视觉和激光振镜投影的紧固件三维测量装置
US20210180940A1 (en) Three-dimensional coordinate measuring instrument coupled to a camera having a diffractive optical element
JPH03255910A (ja) 三次元位置測定方式