JP2007137933A5 - - Google Patents
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- JP2007137933A5 JP2007137933A5 JP2005329834A JP2005329834A JP2007137933A5 JP 2007137933 A5 JP2007137933 A5 JP 2007137933A5 JP 2005329834 A JP2005329834 A JP 2005329834A JP 2005329834 A JP2005329834 A JP 2005329834A JP 2007137933 A5 JP2007137933 A5 JP 2007137933A5
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- 229920001721 polyimide Polymers 0.000 claims description 18
- 229920006015 heat resistant resin Polymers 0.000 claims description 14
- 125000004427 diamine group Chemical group 0.000 claims description 13
- 150000001875 compounds Chemical class 0.000 claims description 10
- 125000003700 epoxy group Chemical group 0.000 claims description 10
- 239000011342 resin composition Substances 0.000 claims description 10
- 230000009477 glass transition Effects 0.000 claims description 9
- 229920005989 resin Polymers 0.000 claims description 8
- 239000011347 resin Substances 0.000 claims description 8
- 239000009719 polyimide resin Substances 0.000 claims description 7
- 239000004593 Epoxy Substances 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 5
- 229910052751 metal Inorganic materials 0.000 claims description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 4
- 229910052739 hydrogen Inorganic materials 0.000 claims description 4
- 239000001257 hydrogen Substances 0.000 claims description 4
- 239000002253 acid Substances 0.000 claims description 3
- 125000006159 dianhydride group Chemical group 0.000 claims description 3
- SKKKJNPBIGQNEJ-UHFFFAOYSA-N 9h-fluorene-1,9-diamine Chemical compound C1=CC(N)=C2C(N)C3=CC=CC=C3C2=C1 SKKKJNPBIGQNEJ-UHFFFAOYSA-N 0.000 claims description 2
- 229910052757 nitrogen Inorganic materials 0.000 claims 5
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 claims 3
- 125000000217 alkyl group Chemical group 0.000 claims 3
- 125000004432 carbon atom Chemical group C* 0.000 claims 3
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 claims 2
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 claims 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 claims 2
- 125000003545 alkoxy group Chemical group 0.000 claims 2
- 150000004984 aromatic diamines Chemical class 0.000 claims 2
- 229910002091 carbon monoxide Inorganic materials 0.000 claims 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims 2
- 125000004093 cyano group Chemical group *C#N 0.000 claims 2
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 claims 2
- 229910052736 halogen Inorganic materials 0.000 claims 2
- 150000002367 halogens Chemical class 0.000 claims 2
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims 2
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 claims 2
- 229910052760 oxygen Inorganic materials 0.000 claims 2
- 125000001174 sulfone group Chemical group 0.000 claims 2
- 229910052717 sulfur Inorganic materials 0.000 claims 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 claims 1
- SUAKHGWARZSWIH-UHFFFAOYSA-N N,N‐diethylformamide Chemical compound CCN(CC)C=O SUAKHGWARZSWIH-UHFFFAOYSA-N 0.000 claims 1
- 125000002947 alkylene group Chemical group 0.000 claims 1
- 229910052799 carbon Inorganic materials 0.000 claims 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims 1
- 229940116333 ethyl lactate Drugs 0.000 claims 1
- AJFDBNQQDYLMJN-UHFFFAOYSA-N n,n-diethylacetamide Chemical compound CCN(CC)C(C)=O AJFDBNQQDYLMJN-UHFFFAOYSA-N 0.000 claims 1
- 239000003960 organic solvent Substances 0.000 claims 1
- 125000000951 phenoxy group Chemical group [H]C1=C([H])C([H])=C(O*)C([H])=C1[H] 0.000 claims 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims 1
- 125000000843 phenylene group Chemical group C1(=C(C=CC=C1)*)* 0.000 claims 1
- 239000004065 semiconductor Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 description 15
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 14
- 239000000853 adhesive Substances 0.000 description 8
- 230000001070 adhesive effect Effects 0.000 description 8
- 229910052802 copper Inorganic materials 0.000 description 7
- 239000010949 copper Substances 0.000 description 7
- 239000011889 copper foil Substances 0.000 description 7
- 229920003223 poly(pyromellitimide-1,4-diphenyl ether) Polymers 0.000 description 4
- 238000001035 drying Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- 229910016847 F2-WS Inorganic materials 0.000 description 1
- 229920001646 UPILEX Polymers 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
Description
すなわち本発明は、(A)少なくとも酸二無水物残基とジアミン残基を含み、ジアミン残基が一般式(1)で表されるフルオレン系ジアミンの残基を含む、ガラス転移温度が200〜300℃の範囲にあるポリイミド系樹脂、(B)1分子中に2個以上のエポキシ基を有するエポキシ化合物、(C)エポキシ基と反応可能な活性水素を有する化合物を含むことを特徴とする樹脂組成物である。 That is, the present invention includes (A) at least an acid dianhydride residue and a diamine residue, and the diamine residue contains a fluorene-based diamine residue represented by the general formula (1), and has a glass transition temperature of 200 to 200. A resin comprising a polyimide resin in the range of 300 ° C. , (B) an epoxy compound having two or more epoxy groups in one molecule, and (C) a compound having active hydrogen capable of reacting with the epoxy group It is a composition.
本発明において、FPC用接着剤として樹脂組成物を鋭意検討したところ、
(A)少なくとも酸二無水物残基とジアミン残基を含み、ジアミン残基が一般式(1)で表されるフルオレン系ジアミンの残基を含む、ガラス転移温度が200〜300℃の範囲にあるポリイミド系樹脂、
(B)1分子中に2個以上のエポキシ基を有するエポキシ化合物、
(C)エポキシ基と反応可能な活性水素を有する化合物、
を含むことを特徴とする樹脂組成物とすることにより、はんだ耐熱性に優れた耐熱性樹脂積層フィルム、金属層付き積層フィルムが得られることを見出した。
In the present invention, when the resin composition was intensively studied as an adhesive for FPC,
(A) At least an acid dianhydride residue and a diamine residue, and the diamine residue contains a residue of a fluorene diamine represented by the general formula (1), and the glass transition temperature is in the range of 200 to 300 ° C. A certain polyimide resin,
(B) an epoxy compound having two or more epoxy groups in one molecule;
(C) a compound having active hydrogen capable of reacting with an epoxy group,
It was found that a heat-resistant resin laminated film excellent in soldering heat resistance and a laminated film with a metal layer can be obtained by using a resin composition containing
本発明において、(A)成分であるポリイミド系樹脂のガラス転移温度は、200〜320℃の範囲にある。より好ましくは220〜300℃の範囲である。FPC用接着剤として用いる場合、ガラス転移温度が200〜320℃の範囲にあることで、ICのボンディング、あるいは、高温でのプレスにおいて、配線が接着剤層に沈み込まないなど、機械的耐熱性が良好となる。 In the present invention, the glass transition temperature of the polyimide resin as the component (A) is area by the near of 200 to 320 ° C.. More preferably, it is the range of 220-300 degreeC. When used as an adhesive for FPC, the glass transition temperature is in the range of 200 to 320 ° C., so that the wiring does not sink into the adhesive layer during IC bonding or high-temperature pressing, etc. Becomes better.
実施例2〜19
樹脂溶液、ポリイミドフィルム、銅箔を表4のように変えた以外は実施例1と同様の操作を行い、片面銅層付き積層フィルムを得た。ここで用いたポリイミドフィルムは、東レ・デュポン(株)製の”カプトン”100EN(厚み25μm)、(株)カネカ製”アピカル”25NPI(厚み25μm)である。また、銅箔は接着面側を粗化処理した(株)日鉱マテリアルズ製の圧延銅箔BHY(厚み18μm)、古河サーキットフォイル(株)製の電解銅箔 F2−WS(厚み12μm)、日本電解(株)製の電解銅箔USLP(厚み12μm)である。得られた片面銅層付き積層フィルムの接着力、はんだ耐熱性、耐熱性樹脂層のガラス転移温度、ボンディング耐性の結果を表4に示した。接着力測定時の剥離界面は、全てポリイミドフィルムと耐熱性樹脂層の界面であった。
Examples 2 to 19
Except having changed the resin solution, the polyimide film, and the copper foil as shown in Table 4, the same operation as in Example 1 was performed to obtain a laminated film with a single-sided copper layer. The polyimide film used here is “Kapton” 100EN (thickness 25 μm) manufactured by Toray DuPont Co., Ltd., and “Apical” 25 NPI (thickness 25 μm) manufactured by Kaneka Corporation. Moreover, the copper foil is a rolled copper foil BHY (thickness 18 μm) manufactured by Nikko Materials Co., Ltd., and the electrolytic copper foil F2-WS (thickness 12 μm) manufactured by Furukawa Circuit Foil Co., Ltd., Japan. This is an electrolytic copper foil USLP (thickness 12 μm) manufactured by Electrolytic Co., Ltd. Table 4 shows the results of adhesive strength, solder heat resistance, glass transition temperature of the heat-resistant resin layer, and bonding resistance of the obtained laminated film with a single-sided copper layer. The peeling interface at the time of adhesive force measurement was all the interface between the polyimide film and the heat resistant resin layer.
比較例1〜25
樹脂溶液、ポリイミドフィルム、銅箔を表4のように変えた以外は実施例1と同様の操作を行い、片面銅層付き積層フィルムを得た。得られた片面銅層付き積層フィルムの接着力、はんだ耐熱性、耐熱性樹脂層のガラス転移温度、ボンディング耐性の結果を表4に示した。接着力測定時の剥離界面は、全てポリイミドフィルムと耐熱性樹脂層の界面であった。
Comparative Examples 1 to 25
Except having changed the resin solution, the polyimide film, and the copper foil as shown in Table 4, the same operation as in Example 1 was performed to obtain a laminated film with a single-sided copper layer. Table 4 shows the results of adhesive strength, solder heat resistance, glass transition temperature of the heat-resistant resin layer, and bonding resistance of the obtained laminated film with a single-sided copper layer. The peeling interface at the time of adhesive force measurement was all the interface between the polyimide film and the heat resistant resin layer.
実施例20〜29
樹脂溶液、ポリイミドフィルム、銅箔を表5のように変えた以外は実施例1と同様の操作を行い、片面銅層付き積層フィルムを得た。得られた片面銅層付き積層フィルムの接着力、はんだ耐熱性、耐熱性樹脂層のガラス転移温度、ボンディング耐性の結果を表5に示した。接着力測定時の剥離界面は、全てポリイミドフィルムと耐熱性樹脂層の界面であった。
Examples 20-29
Except having changed the resin solution, the polyimide film, and the copper foil as shown in Table 5, the same operation as in Example 1 was performed to obtain a laminated film with a single-sided copper layer. Table 5 shows the adhesive strength, solder heat resistance, glass transition temperature of the heat resistant resin layer, and bonding resistance of the obtained laminated film with a single-sided copper layer. The peeling interface at the time of adhesive force measurement was all the interface between the polyimide film and the heat resistant resin layer.
実施例30
製造例26で得られた樹脂溶液(AP−4)を、表面処理を施していない未処理の、厚さ25μmのポリイミドフィルム(”カプトン”100EN 東レ・デュポン(株)製)に乾燥後の膜厚が3μmになるようにコンマコーターで塗工し、150℃で2分、180℃で5分乾燥した後、さらに230℃で3分乾燥して、ポリイミドフィルム/耐熱性樹脂層の積層体を得た。
Example 30
Membrane after drying the resin solution (AP-4) obtained in Production Example 26 on an untreated polyimide film having a thickness of 25 μm (“Kapton” 100EN manufactured by Toray DuPont Co., Ltd.) that has not been surface-treated. After coating with a comma coater to a thickness of 3 μm, drying at 150 ° C. for 2 minutes and at 180 ° C. for 5 minutes, further drying at 230 ° C. for 3 minutes to form a polyimide film / heat-resistant resin layer laminate Obtained.
実施例31〜35
ポリイミドフィルムの種類と表面処理を表6のように変えた以外は実施例30と同様の操作を行い、片面銅層付き積層フィルムを得た。ここで用いたポリイミドフィルムは、東レ・デュポン(株)製の”カプトン”100EN(厚み25μm)、東レ・デュポン(株)製の”カプトン”100V(厚み25μm)、宇部興産(株)製”ユーピレックス”25S(厚み25μm)である。表面処理は、真空チャンバー内で連続的に処理できる装置を用い、二酸化炭素雰囲気下でプラズマ処理を行った。
Examples 31-35
Except having changed the kind and surface treatment of a polyimide film like Table 6, operation similar to Example 30 was performed and the laminated | multilayer film with a single-sided copper layer were obtained. The polyimide film used here is “Kapton” 100EN (thickness 25 μm) manufactured by Toray DuPont Co., Ltd., “Kapton” 100V (thickness 25 μm) manufactured by Toray DuPont Co., Ltd., “UPILEX manufactured by Ube Industries, Ltd. “25S (thickness 25 μm). For the surface treatment, plasma treatment was performed in a carbon dioxide atmosphere using an apparatus capable of continuous treatment in a vacuum chamber.
Claims (12)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005329834A JP2007137933A (en) | 2005-11-15 | 2005-11-15 | Resin composition, heat resistant resin laminate film using the same, and metal-clad laminate film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005329834A JP2007137933A (en) | 2005-11-15 | 2005-11-15 | Resin composition, heat resistant resin laminate film using the same, and metal-clad laminate film |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007137933A JP2007137933A (en) | 2007-06-07 |
JP2007137933A5 true JP2007137933A5 (en) | 2009-01-08 |
Family
ID=38201216
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005329834A Withdrawn JP2007137933A (en) | 2005-11-15 | 2005-11-15 | Resin composition, heat resistant resin laminate film using the same, and metal-clad laminate film |
Country Status (1)
Country | Link |
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JP (1) | JP2007137933A (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015104843A (en) * | 2013-11-29 | 2015-06-08 | 三星電子株式会社Samsung Electronics Co.,Ltd. | Laminated body, method of preparing the same, and method of fabricating electronic device using said laminated body |
JP6555006B2 (en) * | 2015-08-21 | 2019-08-07 | 東レ株式会社 | Epoxy resin composition, cured resin, prepreg and fiber reinforced composite material |
KR102251517B1 (en) * | 2015-09-30 | 2021-05-12 | 코오롱인더스트리 주식회사 | Polyamic acid, polyimide films, and display device comprising thereof |
KR102592065B1 (en) * | 2017-07-03 | 2023-10-23 | 닛산 가가쿠 가부시키가이샤 | Composition for forming flexible device substrates |
KR102526403B1 (en) * | 2018-04-20 | 2023-04-28 | 유비이 가부시키가이샤 | Polyimide, laminates and electronic devices containing them |
WO2023248810A1 (en) * | 2022-06-24 | 2023-12-28 | 株式会社カネカ | Polyamic acid composition, polyimide production method, laminate production method, and electronic device production method |
-
2005
- 2005-11-15 JP JP2005329834A patent/JP2007137933A/en not_active Withdrawn
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