JP2007017363A5 - - Google Patents
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- Publication number
- JP2007017363A5 JP2007017363A5 JP2005201242A JP2005201242A JP2007017363A5 JP 2007017363 A5 JP2007017363 A5 JP 2007017363A5 JP 2005201242 A JP2005201242 A JP 2005201242A JP 2005201242 A JP2005201242 A JP 2005201242A JP 2007017363 A5 JP2007017363 A5 JP 2007017363A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005201242A JP4859174B2 (ja) | 2005-07-11 | 2005-07-11 | プローブカード |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005201242A JP4859174B2 (ja) | 2005-07-11 | 2005-07-11 | プローブカード |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011187376A Division JP5152941B2 (ja) | 2011-08-30 | 2011-08-30 | プローブカード |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007017363A JP2007017363A (ja) | 2007-01-25 |
JP2007017363A5 true JP2007017363A5 (pt) | 2008-07-03 |
JP4859174B2 JP4859174B2 (ja) | 2012-01-25 |
Family
ID=37754641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005201242A Expired - Fee Related JP4859174B2 (ja) | 2005-07-11 | 2005-07-11 | プローブカード |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4859174B2 (pt) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7847568B2 (en) * | 2007-08-17 | 2010-12-07 | Advanced Micro Devices, Inc. | Multi-site probe |
CN113777369B (zh) * | 2020-06-10 | 2023-12-19 | 台湾中华精测科技股份有限公司 | 悬臂式薄膜探针卡 |
CN115754388B (zh) * | 2022-10-19 | 2023-09-29 | 深圳锐盟半导体有限公司 | 一种探针卡、芯片测试方法、测试机及存储介质 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1116963A (ja) * | 1997-06-25 | 1999-01-22 | Ii S J:Kk | 半導体ウェハーのテスト方法および装置 |
JP2001291749A (ja) * | 2000-04-06 | 2001-10-19 | Seiko Epson Corp | プローブカード及びそれを用いたチップ領域ソート方法 |
JP2001291750A (ja) * | 2000-04-06 | 2001-10-19 | Seiko Epson Corp | プローブカード及びそれを用いたチップ領域ソート方法 |
JP4689070B2 (ja) * | 2001-04-12 | 2011-05-25 | ルネサスエレクトロニクス株式会社 | 半導体素子試験装置およびこれを用いた半導体素子試験方法 |
-
2005
- 2005-07-11 JP JP2005201242A patent/JP4859174B2/ja not_active Expired - Fee Related
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